"Benefits of field failure distribution modeling to the failure analysis."

Corinne Bergès, Julien Goxe (2013)

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DOI: 10.1016/J.MICROREL.2013.07.050

access: closed

type: Journal Article

metadata version: 2020-02-22

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Corinne Bergès, Julien Goxe:
Benefits of field failure distribution modeling to the failure analysis. Microelectron. Reliab. 53(9-11): 1194-1198 (2013)

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