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F. C. A. Croen

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1990 – 1999

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1998
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Hans J. W. Spoelder, Franciscus M. Vos, Emil M. Petriu, F. C. A. Croen:
A study of the robustness of pseudorandom binary-array-based surface characterization. IEEE Trans. Instrum. Meas. 47(4): 833-838 (1998)

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