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Thomas Sekinger

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Journal Articles

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2001
[j1]
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  - journals/mr/SchwalkePSK01
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  - https://dblp.org/rec/journals/mr/SchwalkePSK01
Udo Schwalke, Martin Pölzl, Thomas Sekinger, Martin Kerber:
Ultra-thick gate oxides: charge generation and its impact on reliability. Microelectron. Reliab. 41(7): 1007-1010 (2001)

Conference and Workshop Papers

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2007
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Michael Treu, Roland Rupp, P. Blaschitz, K. Rüschenschmidt, Thomas Sekinger, Peter Friedrichs, Rudolf Elpelt, D. Peters:
Strategic Considerations for Unipolar SiC Switch Options: JFET vs. MOSFET. IAS 2007: 324-330

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