default search action
"Ultra-thick gate oxides: charge generation and its impact on reliability."
Udo Schwalke et al. (2001)
- Udo Schwalke, Martin Pölzl, Thomas Sekinger, Martin Kerber:
Ultra-thick gate oxides: charge generation and its impact on reliability. Microelectron. Reliab. 41(7): 1007-1010 (2001)
manage site settings
To protect your privacy, all features that rely on external API calls from your browser are turned off by default. You need to opt-in for them to become active. All settings here will be stored as cookies with your web browser. For more information see our F.A.Q.