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Fabrice Rigaud

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2011
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Fabrice Rigaud, Jean-Michel Portal, Hassen Aziza, Didier Née, Julien Vast, Fabrice Argoud, Bertrand Borot:
Back-end soft and hard defect monitoring using a single test chip. Microelectron. Reliab. 51(6): 1136-1141 (2011)

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