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2020 – today
- 2020
[c3]Hayoung Lee
, Keewon Cho, Sungho Kang, Wooheon Kang, Seungtaek Lee, Woosik Jeong:
Fail Memory Configuration Set for RA Estimation. ITC 2020: 1-9
2010 – 2019
- 2016
- [j7]Keewon Cho, Wooheon Kang, Hyungjun Cho, Changwook Lee, Sungho Kang:
A Survey of Repair Analysis Algorithms for Memories. ACM Comput. Surv. 49(3): 47:1-47:41 (2016) - [j6]Wooheon Kang, Changwook Lee, Hyunyul Lim, Sungho Kang:
A New 3-D Fuse Architecture to Improve Yield of 3-D Memories. IEEE Trans. Comput. Aided Des. Integr. Circuits Syst. 35(10): 1763-1767 (2016) - [j5]Wooheon Kang, Changwook Lee, Hyunyul Lim, Sungho Kang:
Optimized Built-In Self-Repair for Multiple Memories. IEEE Trans. Very Large Scale Integr. Syst. 24(6): 2174-2183 (2016) - 2015
- [j4]Wooheon Kang, Changwook Lee, Hyunyul Lim, Sungho Kang:
A 3 Dimensional Built-In Self-Repair Scheme for Yield Improvement of 3 Dimensional Memories. IEEE Trans. Reliab. 64(2): 586-595 (2015) - [c2]Hyunyul Lim, Wooheon Kang, Sungyoul Seo, Yong Lee, Sungho Kang:
Low power scan bypass technique with test data reduction. ISQED 2015: 173-176 - 2014
- [j3]Changwook Lee, Wooheon Kang, Donkoo Cho, Sungho Kang:
A New Fuse Architecture and a New Post-Share Redundancy Scheme for Yield Enhancement in 3-D-Stacked Memories. IEEE Trans. Comput. Aided Des. Integr. Circuits Syst. 33(5): 786-797 (2014) - [j2]Wooheon Kang, Hyungjun Cho, Joohwan Lee, Sungho Kang:
A BIRA for Memories With an Optimal Repair Rate Using Spare Memories for Area Reduction. IEEE Trans. Very Large Scale Integr. Syst. 22(11): 2336-2349 (2014) - 2013
- [c1]Wooheon Kang, Changwook Lee, Keewon Cho, Sungho Kang:
A Die Selection and Matching Method with Two Stages for Yield Enhancement of 3-D Memories. Asian Test Symposium 2013: 301-306 - 2010
- [j1]Myung-Hoon Yang, Hyungjun Cho, Wooheon Kang, Sungho Kang:
EOF: Efficient Built-In Redundancy Analysis Methodology With Optimal Repair Rate. IEEE Trans. Comput. Aided Des. Integr. Circuits Syst. 29(7): 1130-1135 (2010)
Coauthor Index
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