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H. A. C. Tilmans

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2004
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Robert Modlinski, Ann Witvrouw, Petar Ratchev, Anne Jourdain, Veerle Simons, H. A. C. Tilmans, Jaap M. J. den Toonder, Robert Puers, Ingrid De Wolf:
Creep as a reliability problem in MEMS. Microelectron. Reliab. 44(9-11): 1733-1738 (2004)

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