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Nicholas G. Rudawski

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Journal Articles

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2017
[j2]
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  - journals/mr/WhitingRHPJLKR17
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  - https://dblp.org/rec/journals/mr/WhitingRHPJLKR17
Patrick G. Whiting, Nicholas G. Rudawski, M. R. Holzworth, Stephen J. Pearton, Kevin S. Jones, Lu Liu, T. S. Kang, Fan Ren:
Nanocrack formation in AlGaN/GaN high electron mobility transistors utilizing Ti/Al/Ni/Au ohmic contacts. Microelectron. Reliab. 70: 41-48 (2017)
2012
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Patrick G. Whiting, Nicholas G. Rudawski, M. R. Holzworth, Stephen J. Pearton, Kevin S. Jones, Lu Liu, T. S. Kang, Fan Ren:
Under-gate defect formation in Ni-gate AlGaN/GaN high electron mobility transistors. Microelectron. Reliab. 52(11): 2542-2546 (2012)

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