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Kurt G. Eyink

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Journal Articles

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1996
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Gwang Hoon Park, Yoh-Han Pao, Boris Igelnik, Kurt G. Eyink, Steven R. LeClair:
Neural-net computing for interpretation of semiconductor film optical ellipsometry parameters. IEEE Trans. Neural Networks 7(4): 816-829 (1996)

Conference and Workshop Papers

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1994
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Gwang Hoon Park, Yoh-Han Pao, Kurt G. Eyink, Steven R. LeClair, M. S. Soclof:
Neural-Net Based Optical Ellipsometry for Monitoring Growth of Semiconductor Films. AIRTC 1994: 123-128

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