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M. Mamatrishat

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2012
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M. Mamatrishat, T. Kubota, T. Seki, Kuniyuki Kakushima, Parhat Ahmet, Kazuo Tsutsui, Yoshinori Kataoka, Akira Nishiyama, Nobuyuki Sugii, Kenji Natori, Takeo Hattori, Hiroshi Iwai:
Oxide and interface trap densities estimation in ultrathin W/La₂O₃/Si MOS capacitors. Microelectron. Reliab. 52(6): 1039-1042 (2012)

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