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D. Lachenal

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Journal Articles

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2007
[j2]
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  - journals/mr/LachenalBMR07
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  - https://dblp.org/rec/journals/mr/LachenalBMR07
D. Lachenal, Alain Bravaix, Frederic Monsieur, Yannick Rey-Tauriac:
Degradation mechanism understanding of NLDEMOS SOI in RF applications. Microelectron. Reliab. 47(9-11): 1634-1638 (2007)
2005
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Yannick Rey-Tauriac, J. Badoc, B. Reynard, Raúl Andrés Bianchi, D. Lachenal, Alain Bravaix:
Hot-carrier reliability of 20V MOS transistors in 0.13 mum CMOS technology. Microelectron. Reliab. 45(9-11): 1349-1354 (2005)

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