"Degradation mechanism understanding of NLDEMOS SOI in RF applications."

D. Lachenal et al. (2007)

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DOI: 10.1016/J.MICROREL.2007.07.024

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type: Journal Article

metadata version: 2023-09-30

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D. Lachenal, Alain Bravaix, Frederic Monsieur, Yannick Rey-Tauriac:
Degradation mechanism understanding of NLDEMOS SOI in RF applications. Microelectron. Reliab. 47(9-11): 1634-1638 (2007)

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