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A. van IJzerloo

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Journal Articles

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2013
[j2]
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  - journals/mr/SmedesPILD13
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  - https://dblp.org/rec/journals/mr/SmedesPILD13
Theo Smedes, M. Polewski, A. van IJzerloo, Jean Luc Lefebvre, M. Dekker:
Pitfalls for CDM calibration procedures. Microelectron. Reliab. 53(2): 190-195 (2013)
2011
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R. T. H. Rongen, A. van IJzerloo, C. Cotofana, K. M. Lan:
Cratering response method to study the effect of ultrasonic energy on Cu-wire bonding quality. Microelectron. Reliab. 51(9-11): 1865-1868 (2011)

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