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J. M. Moragues

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Journal Articles

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2005
[j2]
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  dblp key:
  - journals/mr/GoguenheimBGMMLB05
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  - https://dblp.org/rec/journals/mr/GoguenheimBGMMLB05
Didier Goguenheim, Alain Bravaix, S. Gomri, J. M. Moragues, C. Monserie, N. Legrand, Philippe Boivin:
Impact of wafer charging on hot carrier reliability and optimization of latent damage detection methodology in advanced CMOS technologies. Microelectron. Reliab. 45(3-4): 487-492 (2005)
2003
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  - journals/mr/FiritiFHMGPBL03
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Abdellatif Firiti, D. Faujour, Gérald Haller, J. M. Moragues, Vincent Goubier, Philippe Perdu, Felix Beaudoin, Dean Lewis:
Short defect characterization based on TCR parameter extraction. Microelectron. Reliab. 43(9-11): 1563-1568 (2003)

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