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Christine S. Hau-Riege

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Journal Articles

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2004
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Christine S. Hau-Riege:
An introduction to Cu electromigration. Microelectron. Reliab. 44(2): 195-205 (2004)

Conference and Workshop Papers

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2018
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Christine S. Hau-Riege, Huilin Xu, You-Wen Yau, Manasi S. Kakade, Jianfeng Li, Xiaonan Zhang, Hosain Farr:
Electromigration of multi-solder ball test structures. IRPS 2018: 5
2015
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Christine S. Hau-Riege, You-Wen Yau, Kevin Caffey, Rajneesh Kumar, YangYang Sun, Andy Bao, Milind Shah, Lily Zhao, Omar Bchir, Ahmer Syed, Steve Bezuk:
The electromigration behavior of copper pillars for different current directions and pillar shapes. IRPS 2015: 5

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