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Ruud M. Tromp

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1990 – 1999

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1992
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Tung-Sheng Kuan, Philip E. Batson, Randall M. Feenstra, Alan J. Slavin, Ruud M. Tromp:
Application of electron and ion beam analysis techniques to microelectronics. IBM J. Res. Dev. 36(2): 183-207 (1992)

1980 – 1989

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1986
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Joseph E. Demuth, Robert J. Hamers, Ruud M. Tromp, Mark E. Welland:
A scanning tunneling microscope for surface science studies. IBM J. Res. Dev. 30(4): 396-402 (1986)

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