• case-insensitive prefix search: default
  e.g., sig matches "SIGIR" as well as "signal"
• exact word search: append dollar sign ($) to word
  e.g., graph$ matches "graph", but not "graphics"
• boolean and: separate words by space
  e.g., codd model
• boolean or: connect words by pipe symbol (|)
  e.g., graph|network

Update May 7, 2017: Please note that we had to disable the phrase search operator (.) and the boolean not operator (-) due to technical problems. For the time being, phrase search queries will yield regular prefix search result, and search terms preceded by a minus will be interpreted as regular (positive) search terms.

found 97 matches

• 2003
• 
  Bovas Abraham, Asokan Mulayath Variyath:
  Discussion. Technometrics 45(1): 22-24 (2003)
• 
  Theodore T. Allen, Mikhail Bernshteyn:
  Supersaturated Designs That Maximize the Probability of Identifying Active Factors. Technometrics 45(1): 90-97 (2003)
• 
  Henry W. Altland:
  Applied Functional Data Analysis. Technometrics 45(1): 101-102 (2003)
• 
  Charles Annis:
  Mechanical Reliability Improvement - Probability and Statistics for Experimental Testing. Technometrics 45(4): 367-368 (2003)
• 
  F. R. Anscombe:
  Letter to the Editor. Technometrics 45(1): 45-46 (2003)
• 
  Daniel W. Apley, Hyun Cheol Lee:
  Design of Exponentially Weighted Moving Average Control Charts for Autocorrelated Processes With Model Uncertainty. Technometrics 45(3): 187-198 (2003)
• 
  Daniel W. Apley, Ho-Young Lee:
  Identifying Spatial Variation Patterns in Multivariate Manufacturing Processes - A Blind Separation Approach. Technometrics 45(3): 220-234 (2003)
• 
  Sanjib Basu, Nader Ebrahimi:
  Bayesian Software Reliability Models Based on Martingale Processes. Technometrics 45(2): 150-158 (2003)
• 
  Ron A. Bates, Beatrice Giglio, Henry P. Wynn:
  A Global Selection Procedure for Polynomial Interpolators. Technometrics 45(3): 246-255 (2003)
• 
  Irad Ben-Gal, Gail Morag, Armin Shmilovici:
  Context-Based Statistical Process Control - A Monitoring Procedure for State-Dependent Processes. Technometrics 45(4): 293-311 (2003)
• 
  Derek Bingham, Randy R. Sitter:
  Fractional Factorial Split-Plot Designs for Robust Parameter Experiments. Technometrics 45(1): 80-89 (2003)
• 
  David E. Booth:
  Applied Multivariate Analysis. Technometrics 45(2): 174 (2003)
• 
  Robert V. Brill:
  Statistics in Plain English. Technometrics 45(2): 179-180 (2003)
• 
  Tom Burr:
  Causation, Prediction, and Search. Technometrics 45(3): 272-273 (2003)
• 
  Errol C. Caby:
  Elements of Applied Stochastic Processes. Technometrics 45(3): 270-271 (2003)
• 
  Giovanna Capizzi, Guido Masarotto:
  An Adaptive Exponentially Weighted Moving Average Control Chart. Technometrics 45(3): 199-207 (2003)
• 
  Edward C. Chao:
  Generalized Estimating Equations. Technometrics 45(4): 363-364 (2003)
• 
  Ming-Hui Chen:
  A Contingency Table Approach to Nonparametric Testing. Technometrics 45(1): 105-106 (2003)
• 
  W. Michael Conklin, Stan Lipovetsky:
  Chaos: A Statistical Perspective. Technometrics 45(4): 371 (2003)
• 
  J. Wade Davis:
  Statistical Pattern Recognition. Technometrics 45(4): 368 (2003)
• 
  Felix Famoye:
  Plane Answers to Complex Questions: Theory of Linear Models. Technometrics 45(2): 174-175 (2003)
• 
  Michael Frey:
  Smoothing Spline ANOVA Models. Technometrics 45(3): 269 (2003)
• 
  Laurence L. George:
  The Statistical Analysis of Failure Time Data. Technometrics 45(3): 265-266 (2003)
• 
  Subir Ghosh:
  Nonparametric Analysis of Longitudinal Data in Factorial Experiments. Technometrics 45(2): 171-172 (2003)
• 
  Steven G. Gilmour, Norman R. Draper:
  Confidence Regions Around the Ridge of Optimal Response on Fitted Second-Order Response Surfaces. Technometrics 45(4): 333-339 (2003)
• 
  Peter Goos, Martina Vandebroek:
  D-Optimal Split-Plot Designs With Given Numbers and Sizes of Whole Plots. Technometrics 45(3): 235-245 (2003)
• 
  Richard F. Gunst:
  Regression and ANOVA: An Integrated Approach Using SAS Software. Technometrics 45(2): 170-171 (2003)
• 
  Glen Hartless, James G. Booth, Ramon C. Littell:
  Local Influence of Predictors in Multiple Linear Regression. Technometrics 45(4): 326-332 (2003)
• 
  Douglas M. Hawkins:
  Discussion. Technometrics 45(1): 25-29 (2003)
• 
  William D. Heavlin:
  Designing Experiments for Causal Networks. Technometrics 45(2): 115-129 (2003)

skipping 67 more matches