• case-insensitive prefix search: default
  e.g., sig matches "SIGIR" as well as "signal"
• exact word search: append dollar sign ($) to word
  e.g., graph$ matches "graph", but not "graphics"
• boolean and: separate words by space
  e.g., codd model
• boolean or: connect words by pipe symbol (|)
  e.g., graph|network

Update May 7, 2017: Please note that we had to disable the phrase search operator (.) and the boolean not operator (-) due to technical problems. For the time being, phrase search queries will yield regular prefix search result, and search terms preceded by a minus will be interpreted as regular (positive) search terms.

found 133 matches

• 2002
• 
  Melvin Alexander:
  Six Sigma Simplified: Quantum Improvement Made Easy. Technometrics 44(2): 189-190 (2002)
• 
  Henry W. Altland:
  Applied Regression Analysis for Business and Economics. Technometrics 44(2): 192-193 (2002)
• 
  Christine M. Anderson-Cook:
  Statistical Consulting: A Guide to Effective Communication. Technometrics 44(1): 89 (2002)
• 
  Bruce E. Ankenman, Hui Liu, Alan F. Karr, Jeffrey D. Picka:
  A Class of Experimental Designs for Estimating a Response Surface and Variance Components. Technometrics 44(1): 45-54 (2002)
• 
  Gutti Jogesh Babu:
  Fundamentals of Modern Statistical Methods. Technometrics 44(1): 83 (2002)
• 
  Gutti Jogesh Babu:
  Multivariate Permutation Tests. Technometrics 44(3): 290 (2002)
• 
  Lawrence E. Barker:
  Pattern Classification. Technometrics 44(1): 87 (2002)
• 
  Asit P. Basu:
  Probabilistic Risk Analysis - Foundations and Methods. Technometrics 44(4): 402 (2002)
• 
  Charles K. Bayne:
  Multivariate Analysis of Quality: An Introduction. Technometrics 44(2): 186-187 (2002)
• 
  Scott Beattie, Duncan K. H. Fong, Dennis K. J. Lin:
  A Two-Stage Bayesian Model Selection Strategy for Supersaturated Designs. Technometrics 44(1): 55-63 (2002)
• 
  Barry A. Bodt:
  Modern Statistics for Engineering and Quality Improvement. Technometrics 44(2): 185-186 (2002)
• 
  Barry A. Bodt:
  Computer Intrusion Detection and Network Monitoring. Technometrics 44(3): 294-295 (2002)
• 
  Craig B. Borkowf:
  Time-Series Forecasting. Technometrics 44(2): 194-195 (2002)
• 
  Jacob Van Bowen Jr.:
  Single-Case and Small-n Experimental Designs. Technometrics 44(4): 401 (2002)
• 
  James E. Breneman:
  Probability: The Science of Uncertainty. Technometrics 44(3): 294 (2002)
• 
  Richard K. Burdick:
  Analysis of Messy Data Volume III: Analysis of Covariance. Technometrics 44(3): 288 (2002)
• 
  Katherine Campbell:
  Statistical Analysis of Extreme Values. Technometrics 44(3): 295-296 (2002)
• 
  Enrique del Castillo:
  Closed-Loop Disturbance Identification and Controller Tuning for Discrete Manufacturing Processes. Technometrics 44(2): 134-141 (2002)
• 
  Victor Chan:
  Calculated Bets. Technometrics 44(4): 404 (2002)
• 
  Chris Chatfteld:
  Wavelet Transforms and Time-Frequency Signal Analysis. Technometrics 44(1): 87 (2002)
• 
  Argon Chen, Elsayed A. Elsayed:
  Design and Performance Analysis of the Exponentially Weighted Moving Average Mean Estimate for Processes Subject to Random Step Changes. Technometrics 44(4): 379-389 (2002)
• 
  Shao-Wei Cheng, C. F. Jeff Wu:
  Choice of Optimal Blocking Schemes in Two-Level and Three-Level Designs. Technometrics 44(3): 269-277 (2002)
• 
  Michael R. Chernick:
  Variance Components Estimation: Mixed Models, Methodologies and Applications. Technometrics 44(1): 82-83 (2002)
• 
  Michael R. Chernick:
  Runs and Scans With Applications. Technometrics 44(4): 399 (2002)
• 
  William F. Christensen, Stephan R. Sain:
  Accounting for Dependence in a Flexible Multivariate Receptor Model. Technometrics 44(4): 328-337 (2002)
• 
  Timothy C. Coburn:
  Practical Geostatistics: Modeling and Spatial Analysis. Technometrics 44(1): 83-84 (2002)
• 
  Joseph D. Conklin:
  Applied Logistic Regression. Technometrics 44(1): 81-82 (2002)
• 
  Joseph D. Conklin:
  Classical Competing Risks. Technometrics 44(3): 298 (2002)
• 
  Lih-Yuan Deng, Boxin Tang:
  Design Selection and Classification for Hadamard Matrices Using Generalized Minimum Aberration Criteria. Technometrics 44(2): 173-184 (2002)
• 
  Robert P. Dobrow:
  Applied Stochastic Modelling. Technometrics 44(1): 91 (2002)

skipping 103 more matches