• case-insensitive prefix search: default
  e.g., sig matches "SIGIR" as well as "signal"
• exact word search: append dollar sign ($) to word
  e.g., graph$ matches "graph", but not "graphics"
• boolean and: separate words by space
  e.g., codd model
• boolean or: connect words by pipe symbol (|)
  e.g., graph|network

Update May 7, 2017: Please note that we had to disable the phrase search operator (.) and the boolean not operator (-) due to technical problems. For the time being, phrase search queries will yield regular prefix search result, and search terms preceded by a minus will be interpreted as regular (positive) search terms.

found 18 matches

• 2022
• 
  Leon Brackmann, Atousa Jafari, Christopher Bengel, Mahta Mayahinia, Rainer Waser, Dirk J. Wouters, Stephan Menzel, Mehdi B. Tahoori:
  A failure analysis framework of ReRAM In-Memory Logic operations. ITC-Asia 2022: 67-72
• 
  Yi-Ying Chen, Soon-Jyh Chang:
  A Physically Unclonable Function Embedded in a SAR ADC. ITC-Asia 2022: 85-89
• 
  Ya-Chi Cheng, Pai-Yu Tan, Cheng-Wen Wu, Ming-Der Shieh, Chien-Hui Chuang, Gordon Liao:
  A Decision Tree-Based Screening Method for Improving Test Quality of Memory Chips. ITC-Asia 2022: 19-24
• 
  Aobo Cui, Dongrong Zhang, Qiang Ren, Donglin Su:
  A Novel Dual Logic Locking Method to Prevent Counterfeit IP/IC. ITC-Asia 2022: 79-84
• 
  Moritz Fieback, Mottaqiallah Taouil, Said Hamdioui:
  Structured Test Development Approach for Computation-in-Memory Architectures. ITC-Asia 2022: 61-66
• 
  Juan-David Guerrero-Balaguera, Luigi Galasso, Robert Limas Sierra, Ernesto Sánchez, Matteo Sonza Reorda:
  Evaluating the impact of Permanent Faults in a GPU running a Deep Neural Network. ITC-Asia 2022: 96-101
• 
  Hideyuki Ichihara, Naruki Itoh, Tomoo Inoue:
  An Improvement of the No-Reference Test Scheme Based on False Edge Detection for Image Processing Application. ITC-Asia 2022: 90-95
• 
  Duo-Yao Kang, Shiou-Ning Lin, Kuen-Jong Lee:
  Diagnosing Transition Delay Faults under Scan-Based Logic Array. ITC-Asia 2022: 13-18
• 
  Jin-Fu Li:
  Testing and Reliability of Computing-In Memories: Solutions and Challenges. ITC-Asia 2022: 55-60
• 
  Jia-Ruei Liang, Ya-Ni Hsieh, Jiun-Lang Huang:
  Test Response Compaction for Software-Based Self-Test. ITC-Asia 2022: 49-54
• 
  Shian-Yu Lin, Pai-Yu Tan, Cheng-Wen Wu, Ming-Der Shieh, Chien-Hui Chuang, Gordon Liao:
  Weak Die Screening by Feature Prioritized Random Forest for Improving Semiconductor Quality and Reliability. ITC-Asia 2022: 25-30
• 
  Shyue-Kung Lu, Yu-Sheng Wu, Jin-Hua Hong, Kohei Miyase:
  Fault Resilience Techniques for Flash Memory of DNN Accelerators. ITC-Asia 2022: 1-6
• 
  Jiun-Cheng Tsai, Aaron C.-W. Liang, Charles H.-P. Wen:
  Timing-Critical Path Analysis in Circuit Designs Considering Aging with Signal Probability. ITC-Asia 2022: 37-42
• 
  Taiki Utsunomiya, Ryu Hoshino, Kohei Miyase, Shyue-Kung Lu, Xiaoqing Wen, Seiji Kajihara:
  Effective Switching Probability Calculation to Locate Hotspots in Logic Circuits. ITC-Asia 2022: 43-48
• 
  Aibin Yan, Shukai Song, Jixiang Zhang, Jie Cui, Zhengfeng Huang, Tianming Ni, Xiaoqing Wen, Patrick Girard:
  Cost-Optimized and Robust Latch Hardened against Quadruple Node Upsets for Nanoscale CMOS. ITC-Asia 2022: 73-78
• 
  Yu-Cheng Yang, Jin-Fu Li:
  Fault Modeling and Testing of RRAM-based Computing-In Memories. ITC-Asia 2022: 7-12
• 
  Yueling Jenny Zeng, Min Jian Yang, Li-C. Wang:
  Wafer Map Pattern Analytics Driven By Natural Language Queries. ITC-Asia 2022: 31-36
• 
  IEEE International Test Conference in Asia, ITC-Asia 2022, Taipei, Taiwan, August 24-26, 2022. IEEE 2022, ISBN 978-1-6654-5523-7 [contents]