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Publication search results
found 16 matches
- 2024
- Davide Li Calsi, Thomas Laurent, Paolo Arcaini, Fuyuki Ishikawa:
Federated Repair of Deep Neural Networks. DeepTest@ICSE 2024 - Wasim Essbai, Andrea Bombarda, Silvia Bonfanti, Angelo Gargantini:
A Framework for Including Uncertainty in Robustness Evaluation of Bayesian Neural Network Classifiers. DeepTest@ICSE 2024 - Andrei Mancu, Thomas Laurent, Franz Rieger, Paolo Arcaini, Fuyuki Ishikawa, Daniel Rueckert:
More is Not Always Better: Exploring Early Repair of DNNs. DeepTest@ICSE 2024 - Arumoy Shome, Luis Cruz, Arie van Deursen:
Data vs. Model Machine Learning Fairness Testing: An Empirical Study. DeepTest@ICSE 2024 - Lev Sorokin, Niklas Kerscher:
Guiding the Search Towards Failure-Inducing Test Inputs Using Support Vector Machines. DeepTest@ICSE 2024 - Proceedings of the 5th IEEE/ACM International Workshop on Deep Learning for Testing and Testing for Deep Learning, DeepTest 2024, Lisbon, Portugal, 20 April 2024. ACM 2024 [contents]
- 2023
- Hao Bu, Meng Sun:
DeepPatch: A Patching-Based Method for Repairing Deep Neural Networks. DeepTest 2023: 25-32 - Wentao Gao, Jiayuan He, Van-Thuan Pham:
Metamorphic Testing of Machine Translation Models using Back Translation. DeepTest 2023: 1-8 - Yi-Ching Lin, Fang Yu:
DeepSHAP Summary for Adversarial Example Detection. DeepTest 2023: 17-24 - Keita Sakuma, Ryuta Matsuno, Yoshio Kameda:
A Method of Identifying Causes of Prediction Errors to Accelerate MLOps. DeepTest 2023: 9-16 - IEEE/ACM International Workshop on Deep Learning for Testing and Testing for Deep Learning, DeepTest@ICSE 2023, Melbourne, Australia, May 15, 2023. IEEE 2023, ISBN 979-8-3503-3812-6 [contents]
- 2021
- Samuel Ackerman, Parijat Dube, Eitan Farchi, Orna Raz, Marcel Zalmanovici:
Machine Learning Model Drift Detection Via Weak Data Slices. DeepTest@ICSE 2021: 1-8 - A. Giuliano Mirabella, Alberto Martin-Lopez, Sergio Segura, Luis Valencia-Cabrera, Antonio Ruiz-Cortés:
Deep Learning-Based Prediction of Test Input Validity for RESTful APIs. DeepTest@ICSE 2021: 9-16 - Niranjhana Narayanan, Karthik Pattabiraman:
TF-DM: Tool for Studying ML Model Resilience to Data Faults. DeepTest@ICSE 2021: 25-28 - Michael Weiss, Rwiddhi Chakraborty, Paolo Tonella:
A Review and Refinement of Surprise Adequacy. DeepTest@ICSE 2021: 17-24 - 3rd IEEE/ACM International Workshop on Deep Learning for Testing and Testing for Deep Learning, DeepTest@ICSE 2021, Madrid, Spain, June 1, 2021. IEEE 2021, ISBN 978-1-6654-4565-8 [contents]
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