- Haiqun Lin, Daniel Zelterman:
Modeling Survival Data: Extending the Cox Model. Technometrics 44(1): 85-86 (2002) - Shin Ta Liu:
Permutation Methods: A Distance Function Approach. Technometrics 44(3): 289-290 (2002) - Ricardo A. Maronna, Ruben H. Zamar:
Robust Estimates of Location and Dispersion for High-Dimensional Datasets. Technometrics 44(4): 307-317 (2002) - Michael J. Mazu:
Sampling Methodologies With Applications. Technometrics 44(4): 398-399 (2002) - D. W. McCormack Jr.:
Basic Statistical Methods and Models for the Sciences. Technometrics 44(4): 401-402 (2002) - Stephen A. McGuire:
Interpreting ISO 9001 - 2000 With Statistical Methodology. Technometrics 44(4): 406 (2002) - Paul D. Minton:
Statistics: The Exploration and Analysis of Data. Technometrics 44(3): 297-298 (2002) - Amit Mitra:
Statistical Quality Control. Technometrics 44(4): 397-398 (2002) - Edward J. Mulrow:
The Visual Display of Quantitative Information. Technometrics 44(4): 400 (2002) - Maliha S. Nash:
Practical Time-Frequency Analysis, Gabor and Wavelet Transforms With an Implementation in S. Technometrics 44(2): 196 (2002) - Peter R. Nelson, Edward J. Dudewicz:
Exact Analysis of Means With Unequal Variances. Technometrics 44(2): 152-160 (2002) - Margaret A. Nemeth:
Design and Analysis in Chemical Research. Technometrics 44(2): 190 (2002) - Margaret A. Nemeth:
A Primer for Sampling Solids, Liquids, and Gases. Technometrics 44(2): 190 (2002) - Daniel J. Nordman, William Q. Meeker:
Weibull Prediction Intervals for a Future Number of Failures. Technometrics 44(1): 15-23 (2002) - Richard Craig Van Nostrand:
Design of Experiments Using the Taguchi Approach: 16 Steps to Product and Process Improvement. Technometrics 44(3): 289 (2002) - William I. Notz:
Editor's Report. Technometrics 44(4): 305-306 (2002) - Henrik Øjelund, Philip J. Brown
, Henrik Madsen, Poul Thyregod:
Prediction Based on Mean Subset. Technometrics 44(4): 369-378 (2002) - David J. Olive:
Applications of Robust Distances for Regression. Technometrics 44(1): 64-71 (2002) - Greg F. Piepel, Ruel D. Hicks, Jeff M. Szychowski, Jason L. Loeppky:
Methods for Assessing Curvature and Interaction in Mixture Experiments. Technometrics 44(2): 161-172 (2002) - Gene Placzkowski, S. C. Johnson:
Running YourMachines with SPC. Technometrics 44(1): 90 (2002) - Kenneth Portier:
Robust Diagnostic Regression Analysis. Technometrics 44(1): 80-81 (2002) - Philip Prescott, Angela M. Dean, Norman R. Draper, Susan M. Lewis:
Mixture Experiments: ILL-Conditioning and Quadratic Model Specification. Technometrics 44(3): 260-268 (2002) - Lianfen Qian:
Regularized Radial Basis Function Networks: Theory and Applications. Technometrics 44(3): 294 (2002) - Peihua Qiu:
Statistical Analysis of Microstructures in Materials Science. Technometrics 44(1): 86 (2002) - Peter Reichert, Mark J. Schervish, Mitchell J. Small:
An Efficient Sampling Technique for Bayesian Inference With Computationally Demanding Models. Technometrics 44(4): 318-327 (2002) - Timothy J. Robinson:
Quality Improvement With Design of Experiments. Technometrics 44(2): 188-189 (2002) - Andrew L. Rukhin:
Analysis of Time Series Structure SSA and Related Techniques. Technometrics 44(3): 290 (2002) - Jim Rutherford:
Practical Experiment Designs for Engineers and Scientists. Technometrics 44(4): 400-401 (2002) - Pradipta Sarkar:
Practical Time Series. Technometrics 44(2): 195-196 (2002) - Roger M. Sauter:
Introduction to Statistics and Data Analysis. Technometrics 44(1): 90 (2002)
