- Stan Lipovetsky:
Machine Learning in Medicine - A Complete Overview. Technometrics 61(3): 425-426 (2019) - Stan Lipovetsky:
Digital Humanities and Film Studies: Visualising Dziga Vertov's Work. Technometrics 61(4): 562-563 (2019) - Stan Lipovetsky:
Simulating Societal Change: Counterfactual Modelling for Social and Policy Inquiry. Technometrics 61(4): 563-565 (2019) - Joshua Lukemire, Abhyuday Mandal, Weng Kee Wong:
d-QPSO: A Quantum-Behaved Particle Swarm Technique for Finding D-Optimal Designs With Discrete and Continuous Factors and a Binary Response. Technometrics 61(1): 77-87 (2019) - Pulong Ma
, Emily Lei Kang, Amy Braverman, Hai M. Nguyen:
Spatial Statistical Downscaling for Constructing High-Resolution Nature Runs in Global Observing System Simulation Experiments. Technometrics 61(3): 322-340 (2019) - Simon Mak, C. F. Jeff Wu:
Analysis-of-Marginal-Tail-Means (ATM): A Robust Method for Discrete Black-Box Optimization. Technometrics 61(4): 545-559 (2019) - Abhirup Mallik:
Wavelet Packets and Their Statistical Applications. Technometrics 61(3): 426 (2019) - Wilmina M. Marget, Max D. Morris:
Central Composite Experimental Designs for Multiple Responses With Different Models. Technometrics 61(4): 524-532 (2019) - Morteza Marzjarani:
Simulation and the Monte Carlo Method (3rd ed.). Technometrics 61(3): 427-428 (2019) - Morteza Marzjarani:
Exploratory Data Analysis With MATLAB. Technometrics 61(4): 565-566 (2019) - Eric Mittman, Colin Lewis-Beck, William Q. Meeker:
A Hierarchical Model for Heterogenous Reliability Field Data. Technometrics 61(3): 354-368 (2019) - Joyce Nilsson Orsini:
Applied Quantitative Finance (3rd ed.). Technometrics 61(2): 273-280 (2019) - Daniel Peña, Ruey S. Tsay, Ruben H. Zamar:
Empirical Dynamic Quantiles for Visualization of High-Dimensional Time Series. Technometrics 61(4): 429-444 (2019) - Zhengling Qi, Yufeng Liu:
Convex Bidirectional Large Margin Classifiers. Technometrics 61(2): 176-186 (2019) - Wei Qian, Wending Li, Yasuhiro Sogawa, Ryohei Fujimaki, Xitong Yang, Ji Liu:
An Interactive Greedy Approach to Group Sparsity in High Dimensions. Technometrics 61(3): 409-421 (2019) - Wujun Si, Qingyu Yang, Xin Wu:
Material Degradation Modeling and Failure Prediction Using Microstructure Images. Technometrics 61(2): 246-258 (2019) - Nozer D. Singpurwalla, Boya Lai:
Foundations of Info-Metrics (Modeling, Inference and Imperfect Information). Technometrics 61(4): 566-567 (2019) - Lukasz Smaga, Jin-Ting Zhang:
Linear Hypothesis Testing With Functional Data. Technometrics 61(1): 99-110 (2019) - Sobambo Sosina, E. Marielle Remillard, Qiaoying Zhang, Chad Vecitis, Tirthankar Dasgupta:
Response Surface Optimization in the Presence of Internal Noise With Application to Optimal Alignment of Carbon Nanotubes. Technometrics 61(1): 50-65 (2019) - Matthias H. Y. Tan, Guilin Li:
Gaussian Process Modeling Using the Principle of Superposition. Technometrics 61(2): 202-218 (2019) - Alan R. Vazquez, Peter Goos, Eric D. Schoen:
Constructing Two-Level Designs by Concatenation of Strength-3 Orthogonal Arrays. Technometrics 61(2): 219-232 (2019) - Alan R. Vazquez, Hongquan Xu:
Construction of Two-Level Nonregular Designs of Strength Three With Large Run Sizes. Technometrics 61(3): 341-353 (2019) - Wenjia Wang, Benjamin Haaland:
Controlling Sources of Inaccuracy in Stochastic Kriging. Technometrics 61(3): 309-321 (2019) - Boxiang Wang, Hui Zou:
A Multicategory Kernel Distance Weighted Discrimination Method for Multiclass Classification. Technometrics 61(3): 396-408 (2019) - Editorial Announcement. Technometrics 61(1): 1 (2019)
- The 2017 Technometrics Prizes. Technometrics 61(1): 136-138 (2019)
- Correction. Technometrics 61(2): 281 (2019)
- Technometrics Editorial Collaborators. Technometrics 61(4): i-ii (2019)
- Hao Yan, Kamran Paynabar, Massimo Pacella:
Structured Point Cloud Data Analysis Via Regularized Tensor Regression for Process Modeling and Optimization. Technometrics 61(3): 385-395 (2019) - Chun-Hao Yang, James V. Zidek, Samuel W. K. Wong:
Bayesian Analysis of Accumulated Damage Models in Lumber Reliability. Technometrics 61(2): 233-245 (2019)
