- Norman R. Draper, Friedrich Pukelsheim:
Generalized Ridge Analysis Under Linear Restrictions, With Particular Applications to Mixture Experiments Problems. Technometrics 44(3): 250-259 (2002) - Dianne M. Finkelstein
:
Analysis of Failure and Survival Data. Technometrics 44(4): 397 (2002) - Michael Fligner, Joseph S. Verducci, Paul E. Blower Jr.:
A Modification of the Jaccard-Tanimoto Similarity Index for Diverse Selection of Chemical Compounds Using Binary Strings. Technometrics 44(2): 110-119 (2002) - Stephen J. Ganocy:
Bayesian Statistical Modelling. Technometrics 44(3): 291-292 (2002) - Thomas R. Gatliffe:
Calibration and Reliability in Groundwater Modelling: Coping with Uncertainty. Technometrics 44(1): 84-85 (2002) - Subir Ghosh:
Elements of Sampling Theory and Methods. Technometrics 44(2): 191 (2002) - Steven E. Golowich, James M. Landwehr, Scott A. Vander Wiel:
Interplay Between Physics and Statistics for Modeling Optical Fiber Bandwidth. Technometrics 44(3): 215-229 (2002) - Jay H. Goodman:
Applying and Interpreting Statistics: A Comprehensive Guide. Technometrics 44(3): 296 (2002) - J. Brian Gray:
Introduction to Linear Regression Analysis. Technometrics 44(2): 191-192 (2002) - Marvin H. J. Gruber:
The Subjectivity of Scientists and the Bayesian Approach. Technometrics 44(3): 292-293 (2002) - G. Barry Hembree:
The Handbook of Applied Acceptance Sampling: Plans, Procedures, and Principles. Technometrics 44(1): 90-91 (2002) - Tim Hesterberg:
Monte Carlo Strategies in Scientific Computing. Technometrics 44(4): 403-404 (2002) - Richard P. Heydorn:
Design for Reliability. Technometrics 44(4): 401 (2002) - Longcheen Huwang, C. F. Jeff Wu, Ching-Ho Yen:
The Idle Column Method: Design Construction, Properties and Comparisons. Technometrics 44(4): 347-355 (2002) - Snehalata V. Huzurbazar, Mark C. Greenwood:
Workshop Statistics: Discovery With Data, A Bayesian Approach. Technometrics 44(3): 293 (2002) - Hari Iyer:
Collecting Spatial Data: Optimum Design of Experiments for Random Fields, 2nd, Revised Edition. Technometrics 44(3): 296-297 (2002) - Hari Iyer, Thomas Mathew:
Comments on Chiang (2001). Technometrics 44(3): 284-285 (2002) - Donald R. Jensen:
Binomial Distribution Handbook for Scientists and Engineers. Technometrics 44(3): 290-291 (2002) - Wei Jiang, Huaiqing Wu, Fugee Tsung, Vijayan N. Nair, Kwok-Leung Tsui:
Proportional Integral Derivative Charts for Process Monitoring. Technometrics 44(3): 205-214 (2002) - V. Roshan Joseph, C. F. Jeff Wu:
Robust Parameter Design of Multiple-Target Systems. Technometrics 44(4): 338-346 (2002) - Paul Kabaila, Chris J. Lloyd:
The Importance of the Designated Statistic on Buehler Upper Limits on a System Failure Probability. Technometrics 44(4): 390-395 (2002) - James R. Kenyon:
Analysis of Multivariate Survival Data. Technometrics 44(1): 86-87 (2002) - J. Charles Kerkering:
Eliciting and Analyzing Expert Judgment, A Practical Guide. Technometrics 44(2): 193-194 (2002) - Scott M. Kowalski, John A. Cornell, G. Geoffrey Vining:
Split-Plot Designs and Estimation Methods for Mixture Experiments With Process Variables. Technometrics 44(1): 72-79 (2002) - Robert H. Kushler:
Computational Statistics Handbook With MATLAB®. Technometrics 44(4): 405-406 (2002) - Raymond L. Lam, William J. Welch, S. Stanley Young:
Uniform Coverage Designs for Molecule Selection. Technometrics 44(2): 99-109 (2002) - Herbert K. H. Lee, David M. Higdon, Zhuoxin Bi, Marco A. R. Ferreira, Mike West:
Markov Random Field Models for High-Dimensional Parameters in Simulations of Fluid Flow in Porous Media. Technometrics 44(3): 230-241 (2002) - Ta-Hsin Li, Melvin J. Hinich:
A Filter Bank Approach for Modeling and Forecasting Seasonal Patterns. Technometrics 44(1): 1-14 (2002) - Huo Li, Robert W. Mee:
Better Foldover Fractions for Resolution III 2k-p Designs. Technometrics 44(3): 278-283 (2002) - Yachen Lin:
Geometric Data Analysis: An Empirical Approach to Dimensionality Reduction and the Study of Patterns. Technometrics 44(2): 196-197 (2002)
