Search dblp for Publications

export results for "toc:db/journals/mr/mr62.bht:"

 download as .bib file

@article{DBLP:journals/mr/AdliJ16,
  author       = {A. R. Rezaie Adli and
                  Kaspar M. B. Jansen},
  title        = {Numerical investigation and experimental validation of residual stresses
                  building up in microelectronics packaging},
  journal      = {Microelectron. Reliab.},
  volume       = {62},
  pages        = {26--38},
  year         = {2016},
  url          = {https://doi.org/10.1016/j.microrel.2016.03.015},
  doi          = {10.1016/J.MICROREL.2016.03.015},
  timestamp    = {Sat, 22 Feb 2020 00:00:00 +0100},
  biburl       = {https://dblp.org/rec/journals/mr/AdliJ16.bib},
  bibsource    = {dblp computer science bibliography, https://dblp.org}
}

@article{DBLP:journals/mr/BarinkMJ16,
  author       = {Marco Barink and
                  A. Mavinkurve and
                  J. Janssen},
  title        = {Predicting non-Fickian moisture diffusion in EMCs for application
                  in micro-electronic devices},
  journal      = {Microelectron. Reliab.},
  volume       = {62},
  pages        = {45--49},
  year         = {2016},
  url          = {https://doi.org/10.1016/j.microrel.2016.03.016},
  doi          = {10.1016/J.MICROREL.2016.03.016},
  timestamp    = {Wed, 18 May 2022 01:00:00 +0200},
  biburl       = {https://dblp.org/rec/journals/mr/BarinkMJ16.bib},
  bibsource    = {dblp computer science bibliography, https://dblp.org}
}

@article{DBLP:journals/mr/BatunluA16,
  author       = {Canras Batunlu and
                  Al{-}Hussein Albarbar},
  title        = {Real-time system for monitoring the electro-thermal behaviour of power
                  electronic devices used in boost converters},
  journal      = {Microelectron. Reliab.},
  volume       = {62},
  pages        = {82--90},
  year         = {2016},
  url          = {https://doi.org/10.1016/j.microrel.2016.03.033},
  doi          = {10.1016/J.MICROREL.2016.03.033},
  timestamp    = {Tue, 21 Sep 2021 01:00:00 +0200},
  biburl       = {https://dblp.org/rec/journals/mr/BatunluA16.bib},
  bibsource    = {dblp computer science bibliography, https://dblp.org}
}

@article{DBLP:journals/mr/BoscoSK16,
  author       = {Nick Bosco and
                  Timothy J. Silverman and
                  Sarah Kurtz},
  title        = {Climate specific thermomechanical fatigue of flat plate photovoltaic
                  module solder joints},
  journal      = {Microelectron. Reliab.},
  volume       = {62},
  pages        = {124--129},
  year         = {2016},
  url          = {https://doi.org/10.1016/j.microrel.2016.03.024},
  doi          = {10.1016/J.MICROREL.2016.03.024},
  timestamp    = {Sat, 22 Feb 2020 00:00:00 +0100},
  biburl       = {https://dblp.org/rec/journals/mr/BoscoSK16.bib},
  bibsource    = {dblp computer science bibliography, https://dblp.org}
}

@article{DBLP:journals/mr/DrielSJCEH16,
  author       = {W. D. van Driel and
                  M. Schuld and
                  B. Jacobs and
                  F. Commissaris and
                  J. van der Eyden and
                  B. Hamon},
  title        = {Lumen maintenance predictions for {LED} packages},
  journal      = {Microelectron. Reliab.},
  volume       = {62},
  pages        = {39--44},
  year         = {2016},
  url          = {https://doi.org/10.1016/j.microrel.2016.03.018},
  doi          = {10.1016/J.MICROREL.2016.03.018},
  timestamp    = {Sat, 22 Feb 2020 00:00:00 +0100},
  biburl       = {https://dblp.org/rec/journals/mr/DrielSJCEH16.bib},
  bibsource    = {dblp computer science bibliography, https://dblp.org}
}

@article{DBLP:journals/mr/DrissMZ16,
  author       = {Am{\'{e}}ni Driss and
                  Samah Maalej and
                  Mohamed Chaker Zaghdoudi},
  title        = {Experimentation and modeling of the steady-state and transient thermal
                  performances of a helicoidally grooved cylindrical heat pipe},
  journal      = {Microelectron. Reliab.},
  volume       = {62},
  pages        = {102--112},
  year         = {2016},
  url          = {https://doi.org/10.1016/j.microrel.2016.03.022},
  doi          = {10.1016/J.MICROREL.2016.03.022},
  timestamp    = {Sat, 22 Feb 2020 00:00:00 +0100},
  biburl       = {https://dblp.org/rec/journals/mr/DrissMZ16.bib},
  bibsource    = {dblp computer science bibliography, https://dblp.org}
}

@article{DBLP:journals/mr/FellnerAFT16,
  author       = {Klaus Fellner and
                  Thomas Antretter and
                  Peter Filipp Fuchs and
                  Qi Tao},
  title        = {Numerical simulation of the electrical performance of printed circuit
                  boards under cyclic thermal loads},
  journal      = {Microelectron. Reliab.},
  volume       = {62},
  pages        = {148--155},
  year         = {2016},
  url          = {https://doi.org/10.1016/j.microrel.2016.03.034},
  doi          = {10.1016/J.MICROREL.2016.03.034},
  timestamp    = {Thu, 23 May 2024 01:00:00 +0200},
  biburl       = {https://dblp.org/rec/journals/mr/FellnerAFT16.bib},
  bibsource    = {dblp computer science bibliography, https://dblp.org}
}

@article{DBLP:journals/mr/GielenM16,
  author       = {Alexander W. J. Gielen and
                  F. O. Valega Mackenzie},
  title        = {Thermo-mechanical effects in Majorana type quantum devices},
  journal      = {Microelectron. Reliab.},
  volume       = {62},
  pages        = {50--57},
  year         = {2016},
  url          = {https://doi.org/10.1016/j.microrel.2016.03.019},
  doi          = {10.1016/J.MICROREL.2016.03.019},
  timestamp    = {Sat, 22 Feb 2020 00:00:00 +0100},
  biburl       = {https://dblp.org/rec/journals/mr/GielenM16.bib},
  bibsource    = {dblp computer science bibliography, https://dblp.org}
}

@article{DBLP:journals/mr/GuoZZLZW16,
  author       = {Erjuan Guo and
                  Zhigang Zeng and
                  Yan Zhang and
                  Xiao Long and
                  Haijun Zhou and
                  Xiaohong Wang},
  title        = {The effect of annealing temperature on the electronic parameters and
                  carrier transport mechanism of Pt/n-type Ge Schottky diode},
  journal      = {Microelectron. Reliab.},
  volume       = {62},
  pages        = {63--69},
  year         = {2016},
  url          = {https://doi.org/10.1016/j.microrel.2016.03.025},
  doi          = {10.1016/J.MICROREL.2016.03.025},
  timestamp    = {Sat, 22 Feb 2020 00:00:00 +0100},
  biburl       = {https://dblp.org/rec/journals/mr/GuoZZLZW16.bib},
  bibsource    = {dblp computer science bibliography, https://dblp.org}
}

@article{DBLP:journals/mr/JiangWWS16,
  author       = {Yuanyuan Jiang and
                  Youren Wang and
                  Yi Wu and
                  Quan Sun},
  title        = {Fault prognostic of electronics based on optimal multi-order particle
                  filter},
  journal      = {Microelectron. Reliab.},
  volume       = {62},
  pages        = {167--177},
  year         = {2016},
  url          = {https://doi.org/10.1016/j.microrel.2016.03.030},
  doi          = {10.1016/J.MICROREL.2016.03.030},
  timestamp    = {Sat, 22 Feb 2020 00:00:00 +0100},
  biburl       = {https://dblp.org/rec/journals/mr/JiangWWS16.bib},
  bibsource    = {dblp computer science bibliography, https://dblp.org}
}

@article{DBLP:journals/mr/KuttappaHSM16,
  author       = {Ragh Kuttappa and
                  Houman Homayoun and
                  Hassan Salmani and
                  Hamid Mahmoodi},
  title        = {Reliability analysis of spin transfer torque based look up tables
                  under process variations and {NBTI} aging},
  journal      = {Microelectron. Reliab.},
  volume       = {62},
  pages        = {156--166},
  year         = {2016},
  url          = {https://doi.org/10.1016/j.microrel.2016.03.003},
  doi          = {10.1016/J.MICROREL.2016.03.003},
  timestamp    = {Mon, 26 Oct 2020 00:00:00 +0100},
  biburl       = {https://dblp.org/rec/journals/mr/KuttappaHSM16.bib},
  bibsource    = {dblp computer science bibliography, https://dblp.org}
}

@article{DBLP:journals/mr/LallZYL16,
  author       = {Pradeep Lall and
                  Di Zhang and
                  Vikas Yadav and
                  David Locker},
  title        = {High strain rate constitutive behavior of {SAC105} and {SAC305} leadfree
                  solder during operation at high temperature},
  journal      = {Microelectron. Reliab.},
  volume       = {62},
  pages        = {4--17},
  year         = {2016},
  url          = {https://doi.org/10.1016/j.microrel.2016.03.014},
  doi          = {10.1016/J.MICROREL.2016.03.014},
  timestamp    = {Sat, 22 Feb 2020 00:00:00 +0100},
  biburl       = {https://dblp.org/rec/journals/mr/LallZYL16.bib},
  bibsource    = {dblp computer science bibliography, https://dblp.org}
}

@article{DBLP:journals/mr/LiZXL16,
  author       = {Heng Li and
                  Chunsheng Zhu and
                  Gaowei Xu and
                  Le Luo},
  title        = {Experimental identification of thermal induced warpage in polymer-metal
                  composite films},
  journal      = {Microelectron. Reliab.},
  volume       = {62},
  pages        = {141--147},
  year         = {2016},
  url          = {https://doi.org/10.1016/j.microrel.2016.03.023},
  doi          = {10.1016/J.MICROREL.2016.03.023},
  timestamp    = {Sat, 22 Feb 2020 00:00:00 +0100},
  biburl       = {https://dblp.org/rec/journals/mr/LiZXL16.bib},
  bibsource    = {dblp computer science bibliography, https://dblp.org}
}

@article{DBLP:journals/mr/LuoYWXTRXWQYZZC16,
  author       = {Weichun Luo and
                  Hong Yang and
                  Wenwu Wang and
                  Yefeng Xu and
                  Bo Tang and
                  Shangqing Ren and
                  Hao Xu and
                  Yanrong Wang and
                  Luwei Qi and
                  Jiang Yan and
                  Huilong Zhu and
                  Chao Zhao and
                  Dapeng Chen and
                  Tianchun Ye},
  title        = {Accurate lifetime prediction for channel hot carrier stress on sub-1
                  nm equivalent oxide thickness {HK/MG} nMOSFET with thin titanium nitride
                  capping layer},
  journal      = {Microelectron. Reliab.},
  volume       = {62},
  pages        = {70--73},
  year         = {2016},
  url          = {https://doi.org/10.1016/j.microrel.2016.03.008},
  doi          = {10.1016/J.MICROREL.2016.03.008},
  timestamp    = {Tue, 21 Mar 2023 00:00:00 +0100},
  biburl       = {https://dblp.org/rec/journals/mr/LuoYWXTRXWQYZZC16.bib},
  bibsource    = {dblp computer science bibliography, https://dblp.org}
}

@article{DBLP:journals/mr/PalczynskaGMHM16,
  author       = {Alicja Palczynska and
                  Przemyslaw Jakub Gromala and
                  Dirk Mayer and
                  Bongtae Han and
                  Tobias Melz},
  title        = {In-situ investigation of {EMC} relaxation behavior using piezoresistive
                  stress sensor},
  journal      = {Microelectron. Reliab.},
  volume       = {62},
  pages        = {58--62},
  year         = {2016},
  url          = {https://doi.org/10.1016/j.microrel.2016.03.013},
  doi          = {10.1016/J.MICROREL.2016.03.013},
  timestamp    = {Mon, 26 Oct 2020 00:00:00 +0100},
  biburl       = {https://dblp.org/rec/journals/mr/PalczynskaGMHM16.bib},
  bibsource    = {dblp computer science bibliography, https://dblp.org}
}

@article{DBLP:journals/mr/PechtSW16,
  author       = {Michael G. Pecht and
                  Tadahiro Shibutani and
                  Lifeng Wu},
  title        = {A reliability assessment guide for the transition planning to lead-free
                  electronics for companies whose products are RoHS exempted or excluded},
  journal      = {Microelectron. Reliab.},
  volume       = {62},
  pages        = {113--123},
  year         = {2016},
  url          = {https://doi.org/10.1016/j.microrel.2016.03.020},
  doi          = {10.1016/J.MICROREL.2016.03.020},
  timestamp    = {Sat, 22 Feb 2020 00:00:00 +0100},
  biburl       = {https://dblp.org/rec/journals/mr/PechtSW16.bib},
  bibsource    = {dblp computer science bibliography, https://dblp.org}
}

@article{DBLP:journals/mr/PoshtanRSW16,
  author       = {Emad A. Poshtan and
                  Sven Rzepka and
                  Christian Silber and
                  Bernhard Wunderle},
  title        = {An in-situ numerical-experimental approach for fatigue delamination
                  characterization in microelectronic packages},
  journal      = {Microelectron. Reliab.},
  volume       = {62},
  pages        = {18--25},
  year         = {2016},
  url          = {https://doi.org/10.1016/j.microrel.2016.03.017},
  doi          = {10.1016/J.MICROREL.2016.03.017},
  timestamp    = {Sat, 30 Sep 2023 01:00:00 +0200},
  biburl       = {https://dblp.org/rec/journals/mr/PoshtanRSW16.bib},
  bibsource    = {dblp computer science bibliography, https://dblp.org}
}

@article{DBLP:journals/mr/SajediOTT16,
  author       = {R. Sajedi and
                  B. Osanloo and
                  Faramarz Talati and
                  Mohammad Taghilou},
  title        = {Splitter plate application on the circular and square pin fin heat
                  sinks},
  journal      = {Microelectron. Reliab.},
  volume       = {62},
  pages        = {91--101},
  year         = {2016},
  url          = {https://doi.org/10.1016/j.microrel.2016.03.026},
  doi          = {10.1016/J.MICROREL.2016.03.026},
  timestamp    = {Sat, 22 Feb 2020 00:00:00 +0100},
  biburl       = {https://dblp.org/rec/journals/mr/SajediOTT16.bib},
  bibsource    = {dblp computer science bibliography, https://dblp.org}
}

@article{DBLP:journals/mr/TajaryZ16,
  author       = {Alireza Tajary and
                  Hamid R. Zarandi},
  title        = {Using instruction result locality and re-execution to mitigate silent
                  data corruptions},
  journal      = {Microelectron. Reliab.},
  volume       = {62},
  pages        = {178--190},
  year         = {2016},
  url          = {https://doi.org/10.1016/j.microrel.2016.03.029},
  doi          = {10.1016/J.MICROREL.2016.03.029},
  timestamp    = {Sat, 22 Feb 2020 00:00:00 +0100},
  biburl       = {https://dblp.org/rec/journals/mr/TajaryZ16.bib},
  bibsource    = {dblp computer science bibliography, https://dblp.org}
}

@article{DBLP:journals/mr/WuLLWTSZYWZ16,
  author       = {Wangran Wu and
                  J. Lu and
                  Chang Liu and
                  Heng Wu and
                  Xiaoyu Tang and
                  Jiabao Sun and
                  Rui Zhang and
                  Wenjie Yu and
                  Xi Wang and
                  Yi Zhao},
  title        = {Gate length dependence of bias temperature instability behavior in
                  short channel {SOI} MOSFETs},
  journal      = {Microelectron. Reliab.},
  volume       = {62},
  pages        = {79--81},
  year         = {2016},
  url          = {https://doi.org/10.1016/j.microrel.2016.03.002},
  doi          = {10.1016/J.MICROREL.2016.03.002},
  timestamp    = {Sat, 22 Feb 2020 00:00:00 +0100},
  biburl       = {https://dblp.org/rec/journals/mr/WuLLWTSZYWZ16.bib},
  bibsource    = {dblp computer science bibliography, https://dblp.org}
}

@article{DBLP:journals/mr/Wymyslowski16,
  author       = {Artur Wymyslowski},
  title        = {Guest Editorial: 2015 EuroSimE International Conference on Thermal,
                  Mechanical and Multi-Physics Simulation and Experiments in Micro-Electronics
                  and Micro-Systems},
  journal      = {Microelectron. Reliab.},
  volume       = {62},
  pages        = {1--3},
  year         = {2016},
  url          = {https://doi.org/10.1016/j.microrel.2016.03.032},
  doi          = {10.1016/J.MICROREL.2016.03.032},
  timestamp    = {Sat, 22 Feb 2020 00:00:00 +0100},
  biburl       = {https://dblp.org/rec/journals/mr/Wymyslowski16.bib},
  bibsource    = {dblp computer science bibliography, https://dblp.org}
}

@article{DBLP:journals/mr/YangLL16,
  author       = {Chaoran Yang and
                  Fuliang Le and
                  S. W. Ricky Lee},
  title        = {Experimental investigation of the failure mechanism of Cu-Sn intermetallic
                  compounds in {SAC} solder joints},
  journal      = {Microelectron. Reliab.},
  volume       = {62},
  pages        = {130--140},
  year         = {2016},
  url          = {https://doi.org/10.1016/j.microrel.2016.03.021},
  doi          = {10.1016/J.MICROREL.2016.03.021},
  timestamp    = {Thu, 14 Oct 2021 01:00:00 +0200},
  biburl       = {https://dblp.org/rec/journals/mr/YangLL16.bib},
  bibsource    = {dblp computer science bibliography, https://dblp.org}
}

@article{DBLP:journals/mr/YazdiSWN16,
  author       = {M. Baghaie Yazdi and
                  M. Schmeidl and
                  X. Wu and
                  T. Neyer},
  title        = {A concise study of neutron irradiation effects on power MOSFETs and
                  IGBTs},
  journal      = {Microelectron. Reliab.},
  volume       = {62},
  pages        = {74--78},
  year         = {2016},
  url          = {https://doi.org/10.1016/j.microrel.2016.03.027},
  doi          = {10.1016/J.MICROREL.2016.03.027},
  timestamp    = {Sat, 22 Feb 2020 00:00:00 +0100},
  biburl       = {https://dblp.org/rec/journals/mr/YazdiSWN16.bib},
  bibsource    = {dblp computer science bibliography, https://dblp.org}
}

manage site settings

To protect your privacy, all features that rely on external API calls from your browser are turned off by default. You need to opt-in for them to become active. All settings here will be stored as cookies with your web browser. For more information see our F.A.Q.