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@inproceedings{DBLP:conf/wcre/0006HZT20, author = {Stefan Fischer and Evelyn Nicole Haslinger and Markus Zimmermann and Hannes Thaller}, title = {An Empirical Evaluation for Object Initialization of Member Variables in Unit Testing}, booktitle = {{IEEE} Workshop on Validation, Analysis and Evolution of Software Tests, VST@SANER 2020, London, ON, Canada, February 18, 2020}, pages = {8--11}, publisher = {{IEEE}}, year = {2020}, url = {https://doi.org/10.1109/VST50071.2020.9051634}, doi = {10.1109/VST50071.2020.9051634}, timestamp = {Thu, 16 Apr 2020 16:00:28 +0200}, biburl = {https://dblp.org/rec/conf/wcre/0006HZT20.bib}, bibsource = {dblp computer science bibliography, https://dblp.org} }
@inproceedings{DBLP:conf/wcre/Buchgeher0MP20, author = {Georg Buchgeher and Stefan Fischer and Michael Moser and Josef Pichler}, title = {An Early Investigation of Unit Testing Practices of Component-Based Software Systems}, booktitle = {{IEEE} Workshop on Validation, Analysis and Evolution of Software Tests, VST@SANER 2020, London, ON, Canada, February 18, 2020}, pages = {12--15}, publisher = {{IEEE}}, year = {2020}, url = {https://doi.org/10.1109/VST50071.2020.9051632}, doi = {10.1109/VST50071.2020.9051632}, timestamp = {Thu, 16 Apr 2020 01:00:00 +0200}, biburl = {https://dblp.org/rec/conf/wcre/Buchgeher0MP20.bib}, bibsource = {dblp computer science bibliography, https://dblp.org} }
@inproceedings{DBLP:conf/wcre/LuVD20, author = {Zhong Xi Lu and Sten Vercammen and Serge Demeyer}, title = {Semi-automatic Test Case Expansion for Mutation Testing}, booktitle = {{IEEE} Workshop on Validation, Analysis and Evolution of Software Tests, VST@SANER 2020, London, ON, Canada, February 18, 2020}, pages = {1--7}, publisher = {{IEEE}}, year = {2020}, url = {https://doi.org/10.1109/VST50071.2020.9051637}, doi = {10.1109/VST50071.2020.9051637}, timestamp = {Thu, 14 Oct 2021 01:00:00 +0200}, biburl = {https://dblp.org/rec/conf/wcre/LuVD20.bib}, bibsource = {dblp computer science bibliography, https://dblp.org} }
@inproceedings{DBLP:conf/wcre/SzatmariVB20, author = {Attila Szatm{\'{a}}ri and B{\'{e}}la Vancsics and {\'{A}}rp{\'{a}}d Besz{\'{e}}des}, title = {Do Bug-Fix Types Affect Spectrum-Based Fault Localization Algorithms' Efficiency?}, booktitle = {{IEEE} Workshop on Validation, Analysis and Evolution of Software Tests, VST@SANER 2020, London, ON, Canada, February 18, 2020}, pages = {16--23}, publisher = {{IEEE}}, year = {2020}, url = {https://doi.org/10.1109/VST50071.2020.9051638}, doi = {10.1109/VST50071.2020.9051638}, timestamp = {Sat, 30 Sep 2023 01:00:00 +0200}, biburl = {https://dblp.org/rec/conf/wcre/SzatmariVB20.bib}, bibsource = {dblp computer science bibliography, https://dblp.org} }
@inproceedings{DBLP:conf/wcre/ThallerLE020, author = {Hannes Thaller and Lukas Linsbauer and Alexander Egyed and Stefan Fischer}, title = {Towards Fault Localization via Probabilistic Software Modeling}, booktitle = {{IEEE} Workshop on Validation, Analysis and Evolution of Software Tests, VST@SANER 2020, London, ON, Canada, February 18, 2020}, pages = {24--27}, publisher = {{IEEE}}, year = {2020}, url = {https://doi.org/10.1109/VST50071.2020.9051635}, doi = {10.1109/VST50071.2020.9051635}, timestamp = {Thu, 16 Apr 2020 01:00:00 +0200}, biburl = {https://dblp.org/rec/conf/wcre/ThallerLE020.bib}, bibsource = {dblp computer science bibliography, https://dblp.org} }
@inproceedings{DBLP:conf/wcre/VancsicsGB20, author = {B{\'{e}}la Vancsics and Tam{\'{a}}s Gergely and {\'{A}}rp{\'{a}}d Besz{\'{e}}des}, title = {Simulating the Effect of Test Flakiness on Fault Localization Effectiveness}, booktitle = {{IEEE} Workshop on Validation, Analysis and Evolution of Software Tests, VST@SANER 2020, London, ON, Canada, February 18, 2020}, pages = {28--35}, publisher = {{IEEE}}, year = {2020}, url = {https://doi.org/10.1109/VST50071.2020.9051636}, doi = {10.1109/VST50071.2020.9051636}, timestamp = {Tue, 21 Mar 2023 00:00:00 +0100}, biburl = {https://dblp.org/rec/conf/wcre/VancsicsGB20.bib}, bibsource = {dblp computer science bibliography, https://dblp.org} }
@proceedings{DBLP:conf/wcre/2020vst, title = {{IEEE} Workshop on Validation, Analysis and Evolution of Software Tests, VST@SANER 2020, London, ON, Canada, February 18, 2020}, publisher = {{IEEE}}, year = {2020}, url = {https://ieeexplore.ieee.org/xpl/conhome/9040308/proceeding}, isbn = {978-1-7281-6271-3}, timestamp = {Thu, 16 Apr 2020 01:00:00 +0200}, biburl = {https://dblp.org/rec/conf/wcre/2020vst.bib}, bibsource = {dblp computer science bibliography, https://dblp.org} }
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