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@inproceedings{DBLP:conf/vts/0002L93,
author = {Xiao Sun and
Fabrizio Lombardi},
title = {On the design for testability of sequential circuits},
booktitle = {11th {IEEE} {VLSI} Test Symposium (VTS'93), 6 Apr 1993-8 Apr 1993,
Atlantic City, NJ, {USA}},
pages = {147--150},
publisher = {{IEEE} Computer Society},
year = {1993},
url = {https://doi.org/10.1109/VTEST.1993.313334},
doi = {10.1109/VTEST.1993.313334},
timestamp = {Fri, 24 Mar 2023 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/vts/0002L93.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/vts/AbujbaraA93,
author = {Hussam Y. Abujbara and
Sami A. Al{-}Arian},
title = {Degrading fault model for {WSI} interconnection lines},
booktitle = {11th {IEEE} {VLSI} Test Symposium (VTS'93), 6 Apr 1993-8 Apr 1993,
Atlantic City, NJ, {USA}},
pages = {182--185},
publisher = {{IEEE} Computer Society},
year = {1993},
url = {https://doi.org/10.1109/VTEST.1993.313326},
doi = {10.1109/VTEST.1993.313326},
timestamp = {Fri, 24 Mar 2023 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/vts/AbujbaraA93.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/vts/AgrawalC93,
author = {Vishwani D. Agrawal and
Tapan J. Chakraborty},
title = {Partial scan testing with single clock control},
booktitle = {11th {IEEE} {VLSI} Test Symposium (VTS'93), 6 Apr 1993-8 Apr 1993,
Atlantic City, NJ, {USA}},
pages = {313--315},
publisher = {{IEEE} Computer Society},
year = {1993},
url = {https://doi.org/10.1109/VTEST.1993.313365},
doi = {10.1109/VTEST.1993.313365},
timestamp = {Fri, 24 Mar 2023 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/vts/AgrawalC93.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/vts/Al-AsaadC93,
author = {Hussain Al{-}Asaad and
Edward C. Czeck},
title = {Concurrent error correction in iterative circuits by recomputing with
partitioning and voting},
booktitle = {11th {IEEE} {VLSI} Test Symposium (VTS'93), 6 Apr 1993-8 Apr 1993,
Atlantic City, NJ, {USA}},
pages = {174--177},
publisher = {{IEEE} Computer Society},
year = {1993},
url = {https://doi.org/10.1109/VTEST.1993.313328},
doi = {10.1109/VTEST.1993.313328},
timestamp = {Fri, 24 Mar 2023 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/vts/Al-AsaadC93.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/vts/AltM93,
author = {J{\"{u}}rgen Alt and
Udo Mahlstedt},
title = {Simulation of non-classical faults on the gate level-fault modeling},
booktitle = {11th {IEEE} {VLSI} Test Symposium (VTS'93), 6 Apr 1993-8 Apr 1993,
Atlantic City, NJ, {USA}},
pages = {351--354},
publisher = {{IEEE} Computer Society},
year = {1993},
url = {https://doi.org/10.1109/VTEST.1993.313377},
doi = {10.1109/VTEST.1993.313377},
timestamp = {Fri, 24 Mar 2023 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/vts/AltM93.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/vts/AraiNK93,
author = {Masatoshi Arai and
Tohru Nakagawa and
Hajime Kitagawa},
title = {A neural inverse function for automatic test pattern generation using
strictly digital neural networks},
booktitle = {11th {IEEE} {VLSI} Test Symposium (VTS'93), 6 Apr 1993-8 Apr 1993,
Atlantic City, NJ, {USA}},
pages = {238--243},
publisher = {{IEEE} Computer Society},
year = {1993},
url = {https://doi.org/10.1109/VTEST.1993.313318},
doi = {10.1109/VTEST.1993.313318},
timestamp = {Fri, 24 Mar 2023 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/vts/AraiNK93.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/vts/BusabaL93,
author = {Fadi Y. Busaba and
Parag K. Lala},
title = {Input and output encoding techniques for on-line error detection in
combinational logic circuits},
booktitle = {11th {IEEE} {VLSI} Test Symposium (VTS'93), 6 Apr 1993-8 Apr 1993,
Atlantic City, NJ, {USA}},
pages = {48--54},
publisher = {{IEEE} Computer Society},
year = {1993},
url = {https://doi.org/10.1109/VTEST.1993.313309},
doi = {10.1109/VTEST.1993.313309},
timestamp = {Fri, 24 Mar 2023 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/vts/BusabaL93.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/vts/ChakrabartyH93,
author = {Krishnendu Chakrabarty and
John P. Hayes},
title = {Aliasing-free error detection {(ALFRED)}},
booktitle = {11th {IEEE} {VLSI} Test Symposium (VTS'93), 6 Apr 1993-8 Apr 1993,
Atlantic City, NJ, {USA}},
pages = {260--266},
publisher = {{IEEE} Computer Society},
year = {1993},
url = {https://doi.org/10.1109/VTEST.1993.313356},
doi = {10.1109/VTEST.1993.313356},
timestamp = {Fri, 24 Mar 2023 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/vts/ChakrabartyH93.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/vts/ChakravartyT93,
author = {Sreejit Chakravarty and
Paul J. Thadikaran},
title = {Simulation and generation of I\({}_{\mbox{DDQ}}\) tests for bridging
faults in combinational circuits},
booktitle = {11th {IEEE} {VLSI} Test Symposium (VTS'93), 6 Apr 1993-8 Apr 1993,
Atlantic City, NJ, {USA}},
pages = {25--32},
publisher = {{IEEE} Computer Society},
year = {1993},
url = {https://doi.org/10.1109/VTEST.1993.313312},
doi = {10.1109/VTEST.1993.313312},
timestamp = {Fri, 24 Mar 2023 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/vts/ChakravartyT93.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/vts/Chau93,
author = {Savio N. Chau},
title = {Fault injection scan design for enhanced {VLSI} design verification},
booktitle = {11th {IEEE} {VLSI} Test Symposium (VTS'93), 6 Apr 1993-8 Apr 1993,
Atlantic City, NJ, {USA}},
pages = {109--111},
publisher = {{IEEE} Computer Society},
year = {1993},
url = {https://doi.org/10.1109/VTEST.1993.313299},
doi = {10.1109/VTEST.1993.313299},
timestamp = {Fri, 24 Mar 2023 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/vts/Chau93.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/vts/DiJ93,
author = {Chennian Di and
Jochen A. G. Jess},
title = {On {CMOS} bridge fault modeling and test pattern evaluation},
booktitle = {11th {IEEE} {VLSI} Test Symposium (VTS'93), 6 Apr 1993-8 Apr 1993,
Atlantic City, NJ, {USA}},
pages = {116--119},
publisher = {{IEEE} Computer Society},
year = {1993},
url = {https://doi.org/10.1109/VTEST.1993.313297},
doi = {10.1109/VTEST.1993.313297},
timestamp = {Fri, 24 Mar 2023 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/vts/DiJ93.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/vts/DufazaCV93,
author = {Christian Dufaza and
Cyril Chevalier and
Lew Fock Chong Lew Yan Voon},
title = {{LFSROM} an algorithm for automatic design synthesis of hardware test
pattern generator},
booktitle = {11th {IEEE} {VLSI} Test Symposium (VTS'93), 6 Apr 1993-8 Apr 1993,
Atlantic City, NJ, {USA}},
pages = {208--214},
publisher = {{IEEE} Computer Society},
year = {1993},
url = {https://doi.org/10.1109/VTEST.1993.313322},
doi = {10.1109/VTEST.1993.313322},
timestamp = {Fri, 24 Mar 2023 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/vts/DufazaCV93.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/vts/DunnBLM93,
author = {Stephen M. Dunn and
D. G. Balazich and
Lawrence K. Lange and
Charlotte C. Montillo},
title = {Pattern generator card, emulation, and debug},
booktitle = {11th {IEEE} {VLSI} Test Symposium (VTS'93), 6 Apr 1993-8 Apr 1993,
Atlantic City, NJ, {USA}},
pages = {358--360},
publisher = {{IEEE} Computer Society},
year = {1993},
url = {https://doi.org/10.1109/VTEST.1993.313379},
doi = {10.1109/VTEST.1993.313379},
timestamp = {Fri, 24 Mar 2023 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/vts/DunnBLM93.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/vts/EdirisooriyaER93,
author = {Geetani Edirisooriya and
Samantha Edirisooriya and
John P. Robinson},
title = {A new built-in self-test method based on prestored testing},
booktitle = {11th {IEEE} {VLSI} Test Symposium (VTS'93), 6 Apr 1993-8 Apr 1993,
Atlantic City, NJ, {USA}},
pages = {10--16},
publisher = {{IEEE} Computer Society},
year = {1993},
url = {https://doi.org/10.1109/VTEST.1993.313315},
doi = {10.1109/VTEST.1993.313315},
timestamp = {Fri, 24 Mar 2023 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/vts/EdirisooriyaER93.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/vts/EdirisooriyaER93a,
author = {Geetani Edirisooriya and
Samantha Edirisooriya and
John P. Robinson},
title = {Time and space correlated errors in signature analysis},
booktitle = {11th {IEEE} {VLSI} Test Symposium (VTS'93), 6 Apr 1993-8 Apr 1993,
Atlantic City, NJ, {USA}},
pages = {275--281},
publisher = {{IEEE} Computer Society},
year = {1993},
url = {https://doi.org/10.1109/VTEST.1993.313357},
doi = {10.1109/VTEST.1993.313357},
timestamp = {Fri, 24 Mar 2023 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/vts/EdirisooriyaER93a.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/vts/FengFKI93,
author = {Shou{-}ping Feng and
Toru Fujiwara and
Tadao Kasami and
Kazuhiko Iwasaki},
title = {On the maximum value of aliasing probabilities for single input signature
registers},
booktitle = {11th {IEEE} {VLSI} Test Symposium (VTS'93), 6 Apr 1993-8 Apr 1993,
Atlantic City, NJ, {USA}},
pages = {267--274},
publisher = {{IEEE} Computer Society},
year = {1993},
url = {https://doi.org/10.1109/VTEST.1993.313359},
doi = {10.1109/VTEST.1993.313359},
timestamp = {Fri, 24 Mar 2023 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/vts/FengFKI93.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/vts/Ferguson93,
author = {F. Joel Ferguson},
title = {Physical design for testability for bridges in {CMOS} circuits},
booktitle = {11th {IEEE} {VLSI} Test Symposium (VTS'93), 6 Apr 1993-8 Apr 1993,
Atlantic City, NJ, {USA}},
pages = {290--295},
publisher = {{IEEE} Computer Society},
year = {1993},
url = {https://doi.org/10.1109/VTEST.1993.313361},
doi = {10.1109/VTEST.1993.313361},
timestamp = {Fri, 24 Mar 2023 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/vts/Ferguson93.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/vts/GaitondeKWM93,
author = {Dinesh D. Gaitonde and
Jitendra Khare and
D. M. H. Walker and
Wojciech P. Maly},
title = {Estimation of reject ratio in testing of combinatorial circuits},
booktitle = {11th {IEEE} {VLSI} Test Symposium (VTS'93), 6 Apr 1993-8 Apr 1993,
Atlantic City, NJ, {USA}},
pages = {319--325},
publisher = {{IEEE} Computer Society},
year = {1993},
url = {https://doi.org/10.1109/VTEST.1993.313370},
doi = {10.1109/VTEST.1993.313370},
timestamp = {Fri, 24 Mar 2023 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/vts/GaitondeKWM93.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/vts/GalaWR93,
author = {Murali M. R. Gala and
Karan L. Watson and
Don E. Ross},
title = {Testability of one dimensional ILAs under multiple faults},
booktitle = {11th {IEEE} {VLSI} Test Symposium (VTS'93), 6 Apr 1993-8 Apr 1993,
Atlantic City, NJ, {USA}},
pages = {178--181},
publisher = {{IEEE} Computer Society},
year = {1993},
url = {https://doi.org/10.1109/VTEST.1993.313327},
doi = {10.1109/VTEST.1993.313327},
timestamp = {Fri, 24 Mar 2023 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/vts/GalaWR93.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/vts/HasanC93,
author = {Zafar Hasan and
Maciej J. Ciesielski},
title = {Functional verification and simulation of {FSM} networks},
booktitle = {11th {IEEE} {VLSI} Test Symposium (VTS'93), 6 Apr 1993-8 Apr 1993,
Atlantic City, NJ, {USA}},
pages = {326--332},
publisher = {{IEEE} Computer Society},
year = {1993},
url = {https://doi.org/10.1109/VTEST.1993.313371},
doi = {10.1109/VTEST.1993.313371},
timestamp = {Fri, 24 Mar 2023 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/vts/HasanC93.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/vts/IngermannF93,
author = {Erik H. Ingermann and
James F. Frenzel},
title = {Sensitivity analysis of a radiation immune {CMOS} logic family under
defect conditions},
booktitle = {11th {IEEE} {VLSI} Test Symposium (VTS'93), 6 Apr 1993-8 Apr 1993,
Atlantic City, NJ, {USA}},
pages = {355--357},
publisher = {{IEEE} Computer Society},
year = {1993},
url = {https://doi.org/10.1109/VTEST.1993.313378},
doi = {10.1109/VTEST.1993.313378},
timestamp = {Fri, 24 Mar 2023 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/vts/IngermannF93.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/vts/IsernF93,
author = {Eugeni Isern and
Joan Figueras},
title = {Analysis of redundant structures in combinational circuits},
booktitle = {11th {IEEE} {VLSI} Test Symposium (VTS'93), 6 Apr 1993-8 Apr 1993,
Atlantic City, NJ, {USA}},
pages = {21--23},
publisher = {{IEEE} Computer Society},
year = {1993},
url = {https://doi.org/10.1109/VTEST.1993.313313},
doi = {10.1109/VTEST.1993.313313},
timestamp = {Wed, 20 Sep 2023 01:00:00 +0200},
biburl = {https://dblp.org/rec/conf/vts/IsernF93.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/vts/JamoussiK93,
author = {Mohamed Jamoussi and
Bozena Kaminska},
title = {Controllability and observability measures for functional-level testability
evaluation},
booktitle = {11th {IEEE} {VLSI} Test Symposium (VTS'93), 6 Apr 1993-8 Apr 1993,
Atlantic City, NJ, {USA}},
pages = {154--157},
publisher = {{IEEE} Computer Society},
year = {1993},
url = {https://doi.org/10.1109/VTEST.1993.313332},
doi = {10.1109/VTEST.1993.313332},
timestamp = {Fri, 24 Mar 2023 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/vts/JamoussiK93.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/vts/JeeF93,
author = {Alvin Jee and
F. Joel Ferguson},
title = {Carafe: an inductive fault analysis tool for {CMOS} {VLSI} circuits},
booktitle = {11th {IEEE} {VLSI} Test Symposium (VTS'93), 6 Apr 1993-8 Apr 1993,
Atlantic City, NJ, {USA}},
pages = {92--98},
publisher = {{IEEE} Computer Society},
year = {1993},
url = {https://doi.org/10.1109/VTEST.1993.313302},
doi = {10.1109/VTEST.1993.313302},
timestamp = {Fri, 24 Mar 2023 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/vts/JeeF93.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/vts/KaoX93,
author = {William H. Kao and
Jean Qincui Xia},
title = {Automatic synthesis of {DUT} board circuits for testing of mixed signal
ICs},
booktitle = {11th {IEEE} {VLSI} Test Symposium (VTS'93), 6 Apr 1993-8 Apr 1993,
Atlantic City, NJ, {USA}},
pages = {230--236},
publisher = {{IEEE} Computer Society},
year = {1993},
url = {https://doi.org/10.1109/VTEST.1993.313319},
doi = {10.1109/VTEST.1993.313319},
timestamp = {Fri, 24 Mar 2023 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/vts/KaoX93.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/vts/KimS93,
author = {Kyuchull Kim and
Kewal K. Saluja},
title = {{CCSTG:} an efficient test pattern generator for sequential circuits},
booktitle = {11th {IEEE} {VLSI} Test Symposium (VTS'93), 6 Apr 1993-8 Apr 1993,
Atlantic City, NJ, {USA}},
pages = {79--84},
publisher = {{IEEE} Computer Society},
year = {1993},
url = {https://doi.org/10.1109/VTEST.1993.313304},
doi = {10.1109/VTEST.1993.313304},
timestamp = {Fri, 24 Mar 2023 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/vts/KimS93.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/vts/KlenkeWA93,
author = {Robert H. Klenke and
Ronald D. Williams and
James H. Aylor},
title = {Parallelization methods for circuit partitioning based parallel automatic
test pattern generation},
booktitle = {11th {IEEE} {VLSI} Test Symposium (VTS'93), 6 Apr 1993-8 Apr 1993,
Atlantic City, NJ, {USA}},
pages = {71--78},
publisher = {{IEEE} Computer Society},
year = {1993},
url = {https://doi.org/10.1109/VTEST.1993.313305},
doi = {10.1109/VTEST.1993.313305},
timestamp = {Fri, 24 Mar 2023 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/vts/KlenkeWA93.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/vts/KodavartiR93,
author = {Ravishankar Kodavarti and
Don E. Ross},
title = {Signal probability calculations using partial functional manipulation},
booktitle = {11th {IEEE} {VLSI} Test Symposium (VTS'93), 6 Apr 1993-8 Apr 1993,
Atlantic City, NJ, {USA}},
pages = {194--200},
publisher = {{IEEE} Computer Society},
year = {1993},
url = {https://doi.org/10.1109/VTEST.1993.313324},
doi = {10.1109/VTEST.1993.313324},
timestamp = {Fri, 24 Mar 2023 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/vts/KodavartiR93.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/vts/KonukL93,
author = {Haluk Konuk and
Tracy Larrabee},
title = {Explorations of sequential {ATPG} using Boolean satisfiability},
booktitle = {11th {IEEE} {VLSI} Test Symposium (VTS'93), 6 Apr 1993-8 Apr 1993,
Atlantic City, NJ, {USA}},
pages = {85--90},
publisher = {{IEEE} Computer Society},
year = {1993},
url = {https://doi.org/10.1109/VTEST.1993.313303},
doi = {10.1109/VTEST.1993.313303},
timestamp = {Fri, 24 Mar 2023 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/vts/KonukL93.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/vts/Kundu93,
author = {Sandip Kundu},
title = {On diagnosis of faults in a scan-chain},
booktitle = {11th {IEEE} {VLSI} Test Symposium (VTS'93), 6 Apr 1993-8 Apr 1993,
Atlantic City, NJ, {USA}},
pages = {303--308},
publisher = {{IEEE} Computer Society},
year = {1993},
url = {https://doi.org/10.1109/VTEST.1993.313363},
doi = {10.1109/VTEST.1993.313363},
timestamp = {Fri, 24 Mar 2023 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/vts/Kundu93.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/vts/KunduP93,
author = {Sandip Kundu and
Ankan K. Pramanick},
title = {Testability preserving Boolean transforms for logic synthesis},
booktitle = {11th {IEEE} {VLSI} Test Symposium (VTS'93), 6 Apr 1993-8 Apr 1993,
Atlantic City, NJ, {USA}},
pages = {131--138},
publisher = {{IEEE} Computer Society},
year = {1993},
url = {https://doi.org/10.1109/VTEST.1993.313336},
doi = {10.1109/VTEST.1993.313336},
timestamp = {Fri, 24 Mar 2023 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/vts/KunduP93.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/vts/LametF93,
author = {Dan Lamet and
James F. Frenzel},
title = {Defect-tolerant cache memory design},
booktitle = {11th {IEEE} {VLSI} Test Symposium (VTS'93), 6 Apr 1993-8 Apr 1993,
Atlantic City, NJ, {USA}},
pages = {159--163},
publisher = {{IEEE} Computer Society},
year = {1993},
url = {https://doi.org/10.1109/VTEST.1993.313331},
doi = {10.1109/VTEST.1993.313331},
timestamp = {Fri, 24 Mar 2023 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/vts/LametF93.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/vts/LeeCP93,
author = {Jaushin Lee and
Vivek Chickermane and
Janak H. Patel},
title = {Impact of high level functional constraints on testability},
booktitle = {11th {IEEE} {VLSI} Test Symposium (VTS'93), 6 Apr 1993-8 Apr 1993,
Atlantic City, NJ, {USA}},
pages = {309--312},
publisher = {{IEEE} Computer Society},
year = {1993},
url = {https://doi.org/10.1109/VTEST.1993.313364},
doi = {10.1109/VTEST.1993.313364},
timestamp = {Fri, 24 Mar 2023 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/vts/LeeCP93.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/vts/LeeP93,
author = {Jaushin Lee and
Janak H. Patel},
title = {Testability analysis based on structural and behavioral information},
booktitle = {11th {IEEE} {VLSI} Test Symposium (VTS'93), 6 Apr 1993-8 Apr 1993,
Atlantic City, NJ, {USA}},
pages = {139--146},
publisher = {{IEEE} Computer Society},
year = {1993},
url = {https://doi.org/10.1109/VTEST.1993.313335},
doi = {10.1109/VTEST.1993.313335},
timestamp = {Fri, 24 Mar 2023 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/vts/LeeP93.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/vts/Liao93,
author = {Guoning Liao},
title = {Error detection, fault location and reconfiguration for 2D mesh processing
element arrays for digital signal processing},
booktitle = {11th {IEEE} {VLSI} Test Symposium (VTS'93), 6 Apr 1993-8 Apr 1993,
Atlantic City, NJ, {USA}},
pages = {55--61},
publisher = {{IEEE} Computer Society},
year = {1993},
url = {https://doi.org/10.1109/VTEST.1993.313308},
doi = {10.1109/VTEST.1993.313308},
timestamp = {Fri, 24 Mar 2023 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/vts/Liao93.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/vts/LuD93,
author = {Yunsheng Lu and
Ramaswami Dandapani},
title = {Hard faults diagnosis in analog circuits using sensitivity analysis},
booktitle = {11th {IEEE} {VLSI} Test Symposium (VTS'93), 6 Apr 1993-8 Apr 1993,
Atlantic City, NJ, {USA}},
pages = {225--229},
publisher = {{IEEE} Computer Society},
year = {1993},
url = {https://doi.org/10.1109/VTEST.1993.313320},
doi = {10.1109/VTEST.1993.313320},
timestamp = {Fri, 24 Mar 2023 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/vts/LuD93.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/vts/Marculescu93,
author = {Radu Marculescu},
title = {Worst-case analysis for pseudorandom testing},
booktitle = {11th {IEEE} {VLSI} Test Symposium (VTS'93), 6 Apr 1993-8 Apr 1993,
Atlantic City, NJ, {USA}},
pages = {187--193},
publisher = {{IEEE} Computer Society},
year = {1993},
url = {https://doi.org/10.1109/VTEST.1993.313325},
doi = {10.1109/VTEST.1993.313325},
timestamp = {Fri, 24 Mar 2023 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/vts/Marculescu93.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/vts/MenonJM93,
author = {Sankaran M. Menon and
Anura P. Jayasumana and
Yashwant K. Malaiya},
title = {Testable design for BiCMOS stuck-open fault detection},
booktitle = {11th {IEEE} {VLSI} Test Symposium (VTS'93), 6 Apr 1993-8 Apr 1993,
Atlantic City, NJ, {USA}},
pages = {296--302},
publisher = {{IEEE} Computer Society},
year = {1993},
url = {https://doi.org/10.1109/VTEST.1993.313362},
doi = {10.1109/VTEST.1993.313362},
timestamp = {Fri, 24 Mar 2023 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/vts/MenonJM93.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/vts/MidkiffB93,
author = {Scott F. Midkiff and
S. Wayne Bollinger},
title = {Classification of bridging faults in {CMOS} circuits: experimental
results and implications for test},
booktitle = {11th {IEEE} {VLSI} Test Symposium (VTS'93), 6 Apr 1993-8 Apr 1993,
Atlantic City, NJ, {USA}},
pages = {112--115},
publisher = {{IEEE} Computer Society},
year = {1993},
url = {https://doi.org/10.1109/VTEST.1993.313298},
doi = {10.1109/VTEST.1993.313298},
timestamp = {Fri, 24 Mar 2023 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/vts/MidkiffB93.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/vts/MinL93,
author = {Yinghua Min and
Zhongcheng Li},
title = {Evaluation of test generation algorithms},
booktitle = {11th {IEEE} {VLSI} Test Symposium (VTS'93), 6 Apr 1993-8 Apr 1993,
Atlantic City, NJ, {USA}},
pages = {348--350},
publisher = {{IEEE} Computer Society},
year = {1993},
url = {https://doi.org/10.1109/VTEST.1993.313376},
doi = {10.1109/VTEST.1993.313376},
timestamp = {Fri, 24 Mar 2023 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/vts/MinL93.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/vts/NaikM93,
author = {Samir B. Naik and
Wojciech P. Maly},
title = {Computer-aided failure analysis of {VLSI} circuits using I\({}_{\mbox{DDQ
}}\) testing},
booktitle = {11th {IEEE} {VLSI} Test Symposium (VTS'93), 6 Apr 1993-8 Apr 1993,
Atlantic City, NJ, {USA}},
pages = {106--108},
publisher = {{IEEE} Computer Society},
year = {1993},
url = {https://doi.org/10.1109/VTEST.1993.313300},
doi = {10.1109/VTEST.1993.313300},
timestamp = {Fri, 24 Mar 2023 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/vts/NaikM93.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/vts/Nicolaidis93,
author = {Michael Nicolaidis},
title = {Finitely self-checking circuits and their application on current sensors},
booktitle = {11th {IEEE} {VLSI} Test Symposium (VTS'93), 6 Apr 1993-8 Apr 1993,
Atlantic City, NJ, {USA}},
pages = {66--69},
publisher = {{IEEE} Computer Society},
year = {1993},
url = {https://doi.org/10.1109/VTEST.1993.313306},
doi = {10.1109/VTEST.1993.313306},
timestamp = {Fri, 24 Mar 2023 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/vts/Nicolaidis93.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/vts/Peter93,
author = {Jean{-}Luc Peter},
title = {{ECC} design of a custom {DRAM} storage unit},
booktitle = {11th {IEEE} {VLSI} Test Symposium (VTS'93), 6 Apr 1993-8 Apr 1993,
Atlantic City, NJ, {USA}},
pages = {171--173},
publisher = {{IEEE} Computer Society},
year = {1993},
url = {https://doi.org/10.1109/VTEST.1993.313329},
doi = {10.1109/VTEST.1993.313329},
timestamp = {Fri, 24 Mar 2023 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/vts/Peter93.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/vts/PomeranzR93,
author = {Irith Pomeranz and
Sudhakar M. Reddy},
title = {Aliasing computation using fault simulation with fault dropping},
booktitle = {11th {IEEE} {VLSI} Test Symposium (VTS'93), 6 Apr 1993-8 Apr 1993,
Atlantic City, NJ, {USA}},
pages = {282--288},
publisher = {{IEEE} Computer Society},
year = {1993},
url = {https://doi.org/10.1109/VTEST.1993.313358},
doi = {10.1109/VTEST.1993.313358},
timestamp = {Fri, 24 Mar 2023 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/vts/PomeranzR93.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/vts/ReohrCPPW93,
author = {William R. Reohr and
Yuen H. Chan and
Donald W. Plass and
Antonio Pelella and
Philip T. Wu},
title = {Design SRAMs for burn-in},
booktitle = {11th {IEEE} {VLSI} Test Symposium (VTS'93), 6 Apr 1993-8 Apr 1993,
Atlantic City, NJ, {USA}},
pages = {164--170},
publisher = {{IEEE} Computer Society},
year = {1993},
url = {https://doi.org/10.1109/VTEST.1993.313330},
doi = {10.1109/VTEST.1993.313330},
timestamp = {Fri, 24 Mar 2023 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/vts/ReohrCPPW93.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/vts/RyanT93,
author = {Christopher A. Ryan and
Joseph G. Tront},
title = {On parallel switch level fault simulation},
booktitle = {11th {IEEE} {VLSI} Test Symposium (VTS'93), 6 Apr 1993-8 Apr 1993,
Atlantic City, NJ, {USA}},
pages = {341--347},
publisher = {{IEEE} Computer Society},
year = {1993},
url = {https://doi.org/10.1109/VTEST.1993.313375},
doi = {10.1109/VTEST.1993.313375},
timestamp = {Fri, 24 Mar 2023 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/vts/RyanT93.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/vts/SinghK93,
author = {Adit D. Singh and
C. Mani Krishna},
title = {The effect of defect clustering on test transparency and defect levels},
booktitle = {11th {IEEE} {VLSI} Test Symposium (VTS'93), 6 Apr 1993-8 Apr 1993,
Atlantic City, NJ, {USA}},
pages = {99--105},
publisher = {{IEEE} Computer Society},
year = {1993},
url = {https://doi.org/10.1109/VTEST.1993.313301},
doi = {10.1109/VTEST.1993.313301},
timestamp = {Fri, 24 Mar 2023 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/vts/SinghK93.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/vts/SongK93,
author = {Sang{-}Hoon Song and
Larry L. Kinney},
title = {Incremental test pattern generation},
booktitle = {11th {IEEE} {VLSI} Test Symposium (VTS'93), 6 Apr 1993-8 Apr 1993,
Atlantic City, NJ, {USA}},
pages = {244--250},
publisher = {{IEEE} Computer Society},
year = {1993},
url = {https://doi.org/10.1109/VTEST.1993.313353},
doi = {10.1109/VTEST.1993.313353},
timestamp = {Fri, 24 Mar 2023 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/vts/SongK93.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/vts/Sparmann93,
author = {Uwe Sparmann},
title = {On the check base selection problem for fast adders},
booktitle = {11th {IEEE} {VLSI} Test Symposium (VTS'93), 6 Apr 1993-8 Apr 1993,
Atlantic City, NJ, {USA}},
pages = {62--65},
publisher = {{IEEE} Computer Society},
year = {1993},
url = {https://doi.org/10.1109/VTEST.1993.313307},
doi = {10.1109/VTEST.1993.313307},
timestamp = {Fri, 24 Mar 2023 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/vts/Sparmann93.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/vts/SrinivasanSAM93,
author = {Sanjay Srinivasan and
Gnanasekaran Swaminathan and
James H. Aylor and
M. Ray Mercer},
title = {Combinational circuit {ATPG} using binary decision diagrams},
booktitle = {11th {IEEE} {VLSI} Test Symposium (VTS'93), 6 Apr 1993-8 Apr 1993,
Atlantic City, NJ, {USA}},
pages = {251--258},
publisher = {{IEEE} Computer Society},
year = {1993},
url = {https://doi.org/10.1109/VTEST.1993.313354},
doi = {10.1109/VTEST.1993.313354},
timestamp = {Fri, 24 Mar 2023 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/vts/SrinivasanSAM93.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/vts/Stivaros93,
author = {Constantine Stivaros},
title = {A model for testing reliable {VLSI} routing architectures},
booktitle = {11th {IEEE} {VLSI} Test Symposium (VTS'93), 6 Apr 1993-8 Apr 1993,
Atlantic City, NJ, {USA}},
pages = {337--339},
publisher = {{IEEE} Computer Society},
year = {1993},
url = {https://doi.org/10.1109/VTEST.1993.313373},
doi = {10.1109/VTEST.1993.313373},
timestamp = {Fri, 24 Mar 2023 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/vts/Stivaros93.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/vts/Taenzler0K93,
author = {Friedrich Taenzler and
Thomas Novak and
Erich Kubalek},
title = {Contactless characterization of microwave integrated circuits by device
internal indirect electro-optic probing},
booktitle = {11th {IEEE} {VLSI} Test Symposium (VTS'93), 6 Apr 1993-8 Apr 1993,
Atlantic City, NJ, {USA}},
pages = {120--122},
publisher = {{IEEE} Computer Society},
year = {1993},
url = {https://doi.org/10.1109/VTEST.1993.313296},
doi = {10.1109/VTEST.1993.313296},
timestamp = {Fri, 24 Mar 2023 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/vts/Taenzler0K93.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/vts/Toida93,
author = {Shunichi Toida},
title = {Revisiting shift register realization for ease of test generation
and testing},
booktitle = {11th {IEEE} {VLSI} Test Symposium (VTS'93), 6 Apr 1993-8 Apr 1993,
Atlantic City, NJ, {USA}},
pages = {151--153},
publisher = {{IEEE} Computer Society},
year = {1993},
url = {https://doi.org/10.1109/VTEST.1993.313333},
doi = {10.1109/VTEST.1993.313333},
timestamp = {Fri, 24 Mar 2023 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/vts/Toida93.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/vts/VargasNH93,
author = {Fabian Luis Vargas and
Michael Nicolaidis and
B. Hamdi},
title = {Quiescent current estimation based on quality requirements},
booktitle = {11th {IEEE} {VLSI} Test Symposium (VTS'93), 6 Apr 1993-8 Apr 1993,
Atlantic City, NJ, {USA}},
pages = {33--39},
publisher = {{IEEE} Computer Society},
year = {1993},
url = {https://doi.org/10.1109/VTEST.1993.313311},
doi = {10.1109/VTEST.1993.313311},
timestamp = {Fri, 24 Mar 2023 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/vts/VargasNH93.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/vts/VarmaVA93,
author = {Kamal K. Varma and
Praveen Vishakantaiah and
Jacob A. Abraham},
title = {Generation of testable designs from behavioral descriptions using
high level synthesis tools},
booktitle = {11th {IEEE} {VLSI} Test Symposium (VTS'93), 6 Apr 1993-8 Apr 1993,
Atlantic City, NJ, {USA}},
pages = {124--130},
publisher = {{IEEE} Computer Society},
year = {1993},
url = {https://doi.org/10.1109/VTEST.1993.313337},
doi = {10.1109/VTEST.1993.313337},
timestamp = {Fri, 24 Mar 2023 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/vts/VarmaVA93.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/vts/VasudevanRGW93,
author = {Beena Vasudevan and
Don E. Ross and
Murali M. R. Gala and
Karan L. Watson},
title = {{LFSR} based deterministic hardware for at-speed {BIST}},
booktitle = {11th {IEEE} {VLSI} Test Symposium (VTS'93), 6 Apr 1993-8 Apr 1993,
Atlantic City, NJ, {USA}},
pages = {201--207},
publisher = {{IEEE} Computer Society},
year = {1993},
url = {https://doi.org/10.1109/VTEST.1993.313323},
doi = {10.1109/VTEST.1993.313323},
timestamp = {Fri, 24 Mar 2023 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/vts/VasudevanRGW93.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/vts/Venkat93,
author = {Kumar Venkat},
title = {A structured design for test methodology},
booktitle = {11th {IEEE} {VLSI} Test Symposium (VTS'93), 6 Apr 1993-8 Apr 1993,
Atlantic City, NJ, {USA}},
pages = {333--336},
publisher = {{IEEE} Computer Society},
year = {1993},
url = {https://doi.org/10.1109/VTEST.1993.313372},
doi = {10.1109/VTEST.1993.313372},
timestamp = {Fri, 24 Mar 2023 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/vts/Venkat93.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/vts/VermeirenSE93,
author = {Wolfgang Vermeiren and
Wolfgang Straube and
G{\"{u}}nter Elst},
title = {Improvement of analog circuit fault detectability using fault detection
observers},
booktitle = {11th {IEEE} {VLSI} Test Symposium (VTS'93), 6 Apr 1993-8 Apr 1993,
Atlantic City, NJ, {USA}},
pages = {218--224},
publisher = {{IEEE} Computer Society},
year = {1993},
url = {https://doi.org/10.1109/VTEST.1993.313321},
doi = {10.1109/VTEST.1993.313321},
timestamp = {Fri, 24 Mar 2023 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/vts/VermeirenSE93.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/vts/Whetsel93,
author = {Lee Whetsel},
title = {An {IEEE} 1149.1 based voltmeter/oscilloscope in a chip},
booktitle = {11th {IEEE} {VLSI} Test Symposium (VTS'93), 6 Apr 1993-8 Apr 1993,
Atlantic City, NJ, {USA}},
pages = {40--46},
publisher = {{IEEE} Computer Society},
year = {1993},
url = {https://doi.org/10.1109/VTEST.1993.313310},
doi = {10.1109/VTEST.1993.313310},
timestamp = {Fri, 24 Mar 2023 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/vts/Whetsel93.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/vts/WuI93,
author = {Yuejian Wu and
Andr{\'{e}} Ivanov},
title = {Minimal hardware multiple signature analysis for {BIST}},
booktitle = {11th {IEEE} {VLSI} Test Symposium (VTS'93), 6 Apr 1993-8 Apr 1993,
Atlantic City, NJ, {USA}},
pages = {17--20},
publisher = {{IEEE} Computer Society},
year = {1993},
url = {https://doi.org/10.1109/VTEST.1993.313314},
doi = {10.1109/VTEST.1993.313314},
timestamp = {Fri, 24 Mar 2023 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/vts/WuI93.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/vts/Zorian93,
author = {Yervant Zorian},
title = {A distributed {BIST} control scheme for complex {VLSI} devices},
booktitle = {11th {IEEE} {VLSI} Test Symposium (VTS'93), 6 Apr 1993-8 Apr 1993,
Atlantic City, NJ, {USA}},
pages = {4--9},
publisher = {{IEEE} Computer Society},
year = {1993},
url = {https://doi.org/10.1109/VTEST.1993.313316},
doi = {10.1109/VTEST.1993.313316},
timestamp = {Fri, 24 Mar 2023 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/vts/Zorian93.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@proceedings{DBLP:conf/vts/1993,
title = {11th {IEEE} {VLSI} Test Symposium (VTS'93), 6 Apr 1993-8 Apr 1993,
Atlantic City, NJ, {USA}},
publisher = {{IEEE} Computer Society},
year = {1993},
url = {https://ieeexplore.ieee.org/xpl/conhome/464/proceeding},
isbn = {0-8186-3830-3},
timestamp = {Wed, 16 Oct 2019 01:00:00 +0200},
biburl = {https://dblp.org/rec/conf/vts/1993.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
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