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@inproceedings{DBLP:conf/natw/AkterKSSP20,
  author       = {Naznin Akter and
                  Mustafa Karabiyik and
                  Michael S. Shur and
                  John Suarez and
                  Nezih Pala},
  title        = {{AI} Powered THz {VLSI} Testing Technology},
  booktitle    = {29th {IEEE} North Atlantic Test Workshop, {NATW} 2020, Albany, NY,
                  USA, June 17-24, 2020},
  pages        = {1--5},
  publisher    = {{IEEE}},
  year         = {2020},
  url          = {https://doi.org/10.1109/NATW49237.2020.9153077},
  doi          = {10.1109/NATW49237.2020.9153077},
  timestamp    = {Mon, 26 Jun 2023 01:00:00 +0200},
  biburl       = {https://dblp.org/rec/conf/natw/AkterKSSP20.bib},
  bibsource    = {dblp computer science bibliography, https://dblp.org}
}

@inproceedings{DBLP:conf/natw/GolmohamadiJHLZ20,
  author       = {Marcia Golmohamadi and
                  Ryan Jurasek and
                  Wolfgang Hokenmaier and
                  Donald Labrecque and
                  Ruoyu Zhi and
                  Bret Dale and
                  Nibir Islam and
                  Dave Kinney and
                  Angela Johnson},
  title        = {Verification and Testing Considerations of an In-Memory {AI} Chip},
  booktitle    = {29th {IEEE} North Atlantic Test Workshop, {NATW} 2020, Albany, NY,
                  USA, June 17-24, 2020},
  pages        = {1--6},
  publisher    = {{IEEE}},
  year         = {2020},
  url          = {https://doi.org/10.1109/NATW49237.2020.9153079},
  doi          = {10.1109/NATW49237.2020.9153079},
  timestamp    = {Thu, 06 Aug 2020 01:00:00 +0200},
  biburl       = {https://dblp.org/rec/conf/natw/GolmohamadiJHLZ20.bib},
  bibsource    = {dblp computer science bibliography, https://dblp.org}
}

@inproceedings{DBLP:conf/natw/ImmanuelM20,
  author       = {Joshua Immanuel and
                  Spencer K. Millican},
  title        = {Calculating Signal Controllability using Neural Networks: Improvements
                  to Testability Analysis and Test Point Insertion},
  booktitle    = {29th {IEEE} North Atlantic Test Workshop, {NATW} 2020, Albany, NY,
                  USA, June 17-24, 2020},
  pages        = {1--6},
  publisher    = {{IEEE}},
  year         = {2020},
  url          = {https://doi.org/10.1109/NATW49237.2020.9153082},
  doi          = {10.1109/NATW49237.2020.9153082},
  timestamp    = {Thu, 06 Aug 2020 01:00:00 +0200},
  biburl       = {https://dblp.org/rec/conf/natw/ImmanuelM20.bib},
  bibsource    = {dblp computer science bibliography, https://dblp.org}
}

@inproceedings{DBLP:conf/natw/MossVJ20,
  author       = {Stephen Moss and
                  Elanchezhian Veeramani and
                  Joris Angelo Sundaram Jerome},
  title        = {Passive Intermodulation {(PIM)} Test and Measurement},
  booktitle    = {29th {IEEE} North Atlantic Test Workshop, {NATW} 2020, Albany, NY,
                  USA, June 17-24, 2020},
  pages        = {1--3},
  publisher    = {{IEEE}},
  year         = {2020},
  url          = {https://doi.org/10.1109/NATW49237.2020.9153075},
  doi          = {10.1109/NATW49237.2020.9153075},
  timestamp    = {Thu, 06 Aug 2020 01:00:00 +0200},
  biburl       = {https://dblp.org/rec/conf/natw/MossVJ20.bib},
  bibsource    = {dblp computer science bibliography, https://dblp.org}
}

@inproceedings{DBLP:conf/natw/PaliwodaTNGNCPG20,
  author       = {Peter C. Paliwoda and
                  Maria Toledano{-}Luque and
                  Tanya Nigam and
                  Fernando Guarin and
                  M. Nour and
                  S. Cimino and
                  L. Pantisano and
                  A. Gupta and
                  Oscar Huerta{-}Gonzalez and
                  M. Hauser and
                  W. Liu and
                  A. Vayshenker and
                  D. Ioannou and
                  D. Lee and
                  L. Jiang and
                  P. Yee and
                  Stewart E. Rauch and
                  B. Min},
  title        = {Self-heating characterization and its applications in technology development},
  booktitle    = {29th {IEEE} North Atlantic Test Workshop, {NATW} 2020, Albany, NY,
                  USA, June 17-24, 2020},
  pages        = {1--7},
  publisher    = {{IEEE}},
  year         = {2020},
  url          = {https://doi.org/10.1109/NATW49237.2020.9153081},
  doi          = {10.1109/NATW49237.2020.9153081},
  timestamp    = {Wed, 24 May 2023 01:00:00 +0200},
  biburl       = {https://dblp.org/rec/conf/natw/PaliwodaTNGNCPG20.bib},
  bibsource    = {dblp computer science bibliography, https://dblp.org}
}

@inproceedings{DBLP:conf/natw/PoulosH20,
  author       = {Konstantinos Poulos and
                  Themistoklis Haniotakis},
  title        = {A Built In Test circuit for waveform classification at high frequencies},
  booktitle    = {29th {IEEE} North Atlantic Test Workshop, {NATW} 2020, Albany, NY,
                  USA, June 17-24, 2020},
  pages        = {1--5},
  publisher    = {{IEEE}},
  year         = {2020},
  url          = {https://doi.org/10.1109/NATW49237.2020.9153078},
  doi          = {10.1109/NATW49237.2020.9153078},
  timestamp    = {Thu, 06 Aug 2020 01:00:00 +0200},
  biburl       = {https://dblp.org/rec/conf/natw/PoulosH20.bib},
  bibsource    = {dblp computer science bibliography, https://dblp.org}
}

@inproceedings{DBLP:conf/natw/RauchLVG20,
  author       = {Stewart E. Rauch and
                  Dongho Lee and
                  Alexey Vert and
                  Roy Gupta},
  title        = {Characterization of Thermal Runaway in a Ge Photodiode for Si Photonics},
  booktitle    = {29th {IEEE} North Atlantic Test Workshop, {NATW} 2020, Albany, NY,
                  USA, June 17-24, 2020},
  pages        = {1--4},
  publisher    = {{IEEE}},
  year         = {2020},
  url          = {https://doi.org/10.1109/NATW49237.2020.9153080},
  doi          = {10.1109/NATW49237.2020.9153080},
  timestamp    = {Wed, 19 Apr 2023 01:00:00 +0200},
  biburl       = {https://dblp.org/rec/conf/natw/RauchLVG20.bib},
  bibsource    = {dblp computer science bibliography, https://dblp.org}
}

@proceedings{DBLP:conf/natw/2020,
  title        = {29th {IEEE} North Atlantic Test Workshop, {NATW} 2020, Albany, NY,
                  USA, June 17-24, 2020},
  publisher    = {{IEEE}},
  year         = {2020},
  url          = {https://ieeexplore.ieee.org/xpl/conhome/9145488/proceeding},
  isbn         = {978-1-7281-9699-2},
  timestamp    = {Thu, 06 Aug 2020 01:00:00 +0200},
  biburl       = {https://dblp.org/rec/conf/natw/2020.bib},
  bibsource    = {dblp computer science bibliography, https://dblp.org}
}