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@inproceedings{DBLP:conf/itc-asia/BrackmannJBMWWM22,
  author       = {Leon Brackmann and
                  Atousa Jafari and
                  Christopher Bengel and
                  Mahta Mayahinia and
                  Rainer Waser and
                  Dirk J. Wouters and
                  Stephan Menzel and
                  Mehdi B. Tahoori},
  title        = {A failure analysis framework of ReRAM In-Memory Logic operations},
  booktitle    = {{IEEE} International Test Conference in Asia, ITC-Asia 2022, Taipei,
                  Taiwan, August 24-26, 2022},
  pages        = {67--72},
  publisher    = {{IEEE}},
  year         = {2022},
  url          = {https://doi.org/10.1109/ITCAsia55616.2022.00022},
  doi          = {10.1109/ITCASIA55616.2022.00022},
  timestamp    = {Sat, 30 Sep 2023 01:00:00 +0200},
  biburl       = {https://dblp.org/rec/conf/itc-asia/BrackmannJBMWWM22.bib},
  bibsource    = {dblp computer science bibliography, https://dblp.org}
}

@inproceedings{DBLP:conf/itc-asia/ChenC22,
  author       = {Yi{-}Ying Chen and
                  Soon{-}Jyh Chang},
  title        = {A Physically Unclonable Function Embedded in a {SAR} {ADC}},
  booktitle    = {{IEEE} International Test Conference in Asia, ITC-Asia 2022, Taipei,
                  Taiwan, August 24-26, 2022},
  pages        = {85--89},
  publisher    = {{IEEE}},
  year         = {2022},
  url          = {https://doi.org/10.1109/ITCAsia55616.2022.00025},
  doi          = {10.1109/ITCASIA55616.2022.00025},
  timestamp    = {Mon, 21 Nov 2022 00:00:00 +0100},
  biburl       = {https://dblp.org/rec/conf/itc-asia/ChenC22.bib},
  bibsource    = {dblp computer science bibliography, https://dblp.org}
}

@inproceedings{DBLP:conf/itc-asia/ChengTWSCL22,
  author       = {Ya{-}Chi Cheng and
                  Pai{-}Yu Tan and
                  Cheng{-}Wen Wu and
                  Ming{-}Der Shieh and
                  Chien{-}Hui Chuang and
                  Gordon Liao},
  title        = {A Decision Tree-Based Screening Method for Improving Test Quality
                  of Memory Chips},
  booktitle    = {{IEEE} International Test Conference in Asia, ITC-Asia 2022, Taipei,
                  Taiwan, August 24-26, 2022},
  pages        = {19--24},
  publisher    = {{IEEE}},
  year         = {2022},
  url          = {https://doi.org/10.1109/ITCAsia55616.2022.00014},
  doi          = {10.1109/ITCASIA55616.2022.00014},
  timestamp    = {Sun, 17 Dec 2023 00:00:00 +0100},
  biburl       = {https://dblp.org/rec/conf/itc-asia/ChengTWSCL22.bib},
  bibsource    = {dblp computer science bibliography, https://dblp.org}
}

@inproceedings{DBLP:conf/itc-asia/CuiZRS22,
  author       = {Aobo Cui and
                  Dongrong Zhang and
                  Qiang Ren and
                  Donglin Su},
  title        = {A Novel Dual Logic Locking Method to Prevent Counterfeit {IP/IC}},
  booktitle    = {{IEEE} International Test Conference in Asia, ITC-Asia 2022, Taipei,
                  Taiwan, August 24-26, 2022},
  pages        = {79--84},
  publisher    = {{IEEE}},
  year         = {2022},
  url          = {https://doi.org/10.1109/ITCAsia55616.2022.00024},
  doi          = {10.1109/ITCASIA55616.2022.00024},
  timestamp    = {Mon, 21 Nov 2022 00:00:00 +0100},
  biburl       = {https://dblp.org/rec/conf/itc-asia/CuiZRS22.bib},
  bibsource    = {dblp computer science bibliography, https://dblp.org}
}

@inproceedings{DBLP:conf/itc-asia/FiebackTH22,
  author       = {Moritz Fieback and
                  Mottaqiallah Taouil and
                  Said Hamdioui},
  title        = {Structured Test Development Approach for Computation-in-Memory Architectures},
  booktitle    = {{IEEE} International Test Conference in Asia, ITC-Asia 2022, Taipei,
                  Taiwan, August 24-26, 2022},
  pages        = {61--66},
  publisher    = {{IEEE}},
  year         = {2022},
  url          = {https://doi.org/10.1109/ITCAsia55616.2022.00021},
  doi          = {10.1109/ITCASIA55616.2022.00021},
  timestamp    = {Wed, 07 Dec 2022 00:00:00 +0100},
  biburl       = {https://dblp.org/rec/conf/itc-asia/FiebackTH22.bib},
  bibsource    = {dblp computer science bibliography, https://dblp.org}
}

@inproceedings{DBLP:conf/itc-asia/Guerrero-Balaguera22,
  author       = {Juan{-}David Guerrero{-}Balaguera and
                  Luigi Galasso and
                  Robert Limas Sierra and
                  Ernesto S{\'{a}}nchez and
                  Matteo Sonza Reorda},
  title        = {Evaluating the impact of Permanent Faults in a {GPU} running a Deep
                  Neural Network},
  booktitle    = {{IEEE} International Test Conference in Asia, ITC-Asia 2022, Taipei,
                  Taiwan, August 24-26, 2022},
  pages        = {96--101},
  publisher    = {{IEEE}},
  year         = {2022},
  url          = {https://doi.org/10.1109/ITCAsia55616.2022.00027},
  doi          = {10.1109/ITCASIA55616.2022.00027},
  timestamp    = {Tue, 21 Mar 2023 00:00:00 +0100},
  biburl       = {https://dblp.org/rec/conf/itc-asia/Guerrero-Balaguera22.bib},
  bibsource    = {dblp computer science bibliography, https://dblp.org}
}

@inproceedings{DBLP:conf/itc-asia/IchiharaII22,
  author       = {Hideyuki Ichihara and
                  Naruki Itoh and
                  Tomoo Inoue},
  title        = {An Improvement of the No-Reference Test Scheme Based on False Edge
                  Detection for Image Processing Application},
  booktitle    = {{IEEE} International Test Conference in Asia, ITC-Asia 2022, Taipei,
                  Taiwan, August 24-26, 2022},
  pages        = {90--95},
  publisher    = {{IEEE}},
  year         = {2022},
  url          = {https://doi.org/10.1109/ITCAsia55616.2022.00026},
  doi          = {10.1109/ITCASIA55616.2022.00026},
  timestamp    = {Mon, 21 Nov 2022 00:00:00 +0100},
  biburl       = {https://dblp.org/rec/conf/itc-asia/IchiharaII22.bib},
  bibsource    = {dblp computer science bibliography, https://dblp.org}
}

@inproceedings{DBLP:conf/itc-asia/KangLL22,
  author       = {Duo{-}Yao Kang and
                  Shiou{-}Ning Lin and
                  Kuen{-}Jong Lee},
  title        = {Diagnosing Transition Delay Faults under Scan-Based Logic Array},
  booktitle    = {{IEEE} International Test Conference in Asia, ITC-Asia 2022, Taipei,
                  Taiwan, August 24-26, 2022},
  pages        = {13--18},
  publisher    = {{IEEE}},
  year         = {2022},
  url          = {https://doi.org/10.1109/ITCAsia55616.2022.00013},
  doi          = {10.1109/ITCASIA55616.2022.00013},
  timestamp    = {Mon, 21 Nov 2022 00:00:00 +0100},
  biburl       = {https://dblp.org/rec/conf/itc-asia/KangLL22.bib},
  bibsource    = {dblp computer science bibliography, https://dblp.org}
}

@inproceedings{DBLP:conf/itc-asia/Li22,
  author       = {Jin{-}Fu Li},
  title        = {Testing and Reliability of Computing-In Memories: Solutions and Challenges},
  booktitle    = {{IEEE} International Test Conference in Asia, ITC-Asia 2022, Taipei,
                  Taiwan, August 24-26, 2022},
  pages        = {55--60},
  publisher    = {{IEEE}},
  year         = {2022},
  url          = {https://doi.org/10.1109/ITCAsia55616.2022.00020},
  doi          = {10.1109/ITCASIA55616.2022.00020},
  timestamp    = {Tue, 17 Oct 2023 01:00:00 +0200},
  biburl       = {https://dblp.org/rec/conf/itc-asia/Li22.bib},
  bibsource    = {dblp computer science bibliography, https://dblp.org}
}

@inproceedings{DBLP:conf/itc-asia/LiangHH22,
  author       = {Jia{-}Ruei Liang and
                  Ya{-}Ni Hsieh and
                  Jiun{-}Lang Huang},
  title        = {Test Response Compaction for Software-Based Self-Test},
  booktitle    = {{IEEE} International Test Conference in Asia, ITC-Asia 2022, Taipei,
                  Taiwan, August 24-26, 2022},
  pages        = {49--54},
  publisher    = {{IEEE}},
  year         = {2022},
  url          = {https://doi.org/10.1109/ITCAsia55616.2022.00019},
  doi          = {10.1109/ITCASIA55616.2022.00019},
  timestamp    = {Mon, 21 Nov 2022 00:00:00 +0100},
  biburl       = {https://dblp.org/rec/conf/itc-asia/LiangHH22.bib},
  bibsource    = {dblp computer science bibliography, https://dblp.org}
}

@inproceedings{DBLP:conf/itc-asia/LinTWSCL22,
  author       = {Shian{-}Yu Lin and
                  Pai{-}Yu Tan and
                  Cheng{-}Wen Wu and
                  Ming{-}Der Shieh and
                  Chien{-}Hui Chuang and
                  Gordon Liao},
  title        = {Weak Die Screening by Feature Prioritized Random Forest for Improving
                  Semiconductor Quality and Reliability},
  booktitle    = {{IEEE} International Test Conference in Asia, ITC-Asia 2022, Taipei,
                  Taiwan, August 24-26, 2022},
  pages        = {25--30},
  publisher    = {{IEEE}},
  year         = {2022},
  url          = {https://doi.org/10.1109/ITCAsia55616.2022.00015},
  doi          = {10.1109/ITCASIA55616.2022.00015},
  timestamp    = {Sun, 17 Dec 2023 00:00:00 +0100},
  biburl       = {https://dblp.org/rec/conf/itc-asia/LinTWSCL22.bib},
  bibsource    = {dblp computer science bibliography, https://dblp.org}
}

@inproceedings{DBLP:conf/itc-asia/LuWHM22,
  author       = {Shyue{-}Kung Lu and
                  Yu{-}Sheng Wu and
                  Jin{-}Hua Hong and
                  Kohei Miyase},
  title        = {Fault Resilience Techniques for Flash Memory of {DNN} Accelerators},
  booktitle    = {{IEEE} International Test Conference in Asia, ITC-Asia 2022, Taipei,
                  Taiwan, August 24-26, 2022},
  pages        = {1--6},
  publisher    = {{IEEE}},
  year         = {2022},
  url          = {https://doi.org/10.1109/ITCAsia55616.2022.00011},
  doi          = {10.1109/ITCASIA55616.2022.00011},
  timestamp    = {Mon, 21 Nov 2022 00:00:00 +0100},
  biburl       = {https://dblp.org/rec/conf/itc-asia/LuWHM22.bib},
  bibsource    = {dblp computer science bibliography, https://dblp.org}
}

@inproceedings{DBLP:conf/itc-asia/TsaiLW22,
  author       = {Jiun{-}Cheng Tsai and
                  Aaron C.{-}W. Liang and
                  Charles H.{-}P. Wen},
  title        = {Timing-Critical Path Analysis in Circuit Designs Considering Aging
                  with Signal Probability},
  booktitle    = {{IEEE} International Test Conference in Asia, ITC-Asia 2022, Taipei,
                  Taiwan, August 24-26, 2022},
  pages        = {37--42},
  publisher    = {{IEEE}},
  year         = {2022},
  url          = {https://doi.org/10.1109/ITCAsia55616.2022.00017},
  doi          = {10.1109/ITCASIA55616.2022.00017},
  timestamp    = {Sun, 06 Oct 2024 01:00:00 +0200},
  biburl       = {https://dblp.org/rec/conf/itc-asia/TsaiLW22.bib},
  bibsource    = {dblp computer science bibliography, https://dblp.org}
}

@inproceedings{DBLP:conf/itc-asia/UtsunomiyaHMLWK22,
  author       = {Taiki Utsunomiya and
                  Ryu Hoshino and
                  Kohei Miyase and
                  Shyue{-}Kung Lu and
                  Xiaoqing Wen and
                  Seiji Kajihara},
  title        = {Effective Switching Probability Calculation to Locate Hotspots in
                  Logic Circuits},
  booktitle    = {{IEEE} International Test Conference in Asia, ITC-Asia 2022, Taipei,
                  Taiwan, August 24-26, 2022},
  pages        = {43--48},
  publisher    = {{IEEE}},
  year         = {2022},
  url          = {https://doi.org/10.1109/ITCAsia55616.2022.00018},
  doi          = {10.1109/ITCASIA55616.2022.00018},
  timestamp    = {Mon, 21 Nov 2022 00:00:00 +0100},
  biburl       = {https://dblp.org/rec/conf/itc-asia/UtsunomiyaHMLWK22.bib},
  bibsource    = {dblp computer science bibliography, https://dblp.org}
}

@inproceedings{DBLP:conf/itc-asia/YanSZCHNWG22,
  author       = {Aibin Yan and
                  Shukai Song and
                  Jixiang Zhang and
                  Jie Cui and
                  Zhengfeng Huang and
                  Tianming Ni and
                  Xiaoqing Wen and
                  Patrick Girard},
  title        = {Cost-Optimized and Robust Latch Hardened against Quadruple Node Upsets
                  for Nanoscale {CMOS}},
  booktitle    = {{IEEE} International Test Conference in Asia, ITC-Asia 2022, Taipei,
                  Taiwan, August 24-26, 2022},
  pages        = {73--78},
  publisher    = {{IEEE}},
  year         = {2022},
  url          = {https://doi.org/10.1109/ITCAsia55616.2022.00023},
  doi          = {10.1109/ITCASIA55616.2022.00023},
  timestamp    = {Mon, 21 Nov 2022 00:00:00 +0100},
  biburl       = {https://dblp.org/rec/conf/itc-asia/YanSZCHNWG22.bib},
  bibsource    = {dblp computer science bibliography, https://dblp.org}
}

@inproceedings{DBLP:conf/itc-asia/YangL22,
  author       = {Yu{-}Cheng Yang and
                  Jin{-}Fu Li},
  title        = {Fault Modeling and Testing of RRAM-based Computing-In Memories},
  booktitle    = {{IEEE} International Test Conference in Asia, ITC-Asia 2022, Taipei,
                  Taiwan, August 24-26, 2022},
  pages        = {7--12},
  publisher    = {{IEEE}},
  year         = {2022},
  url          = {https://doi.org/10.1109/ITCAsia55616.2022.00012},
  doi          = {10.1109/ITCASIA55616.2022.00012},
  timestamp    = {Tue, 17 Oct 2023 01:00:00 +0200},
  biburl       = {https://dblp.org/rec/conf/itc-asia/YangL22.bib},
  bibsource    = {dblp computer science bibliography, https://dblp.org}
}

@inproceedings{DBLP:conf/itc-asia/ZengYW22,
  author       = {Yueling Jenny Zeng and
                  Min Jian Yang and
                  Li{-}C. Wang},
  title        = {Wafer Map Pattern Analytics Driven By Natural Language Queries},
  booktitle    = {{IEEE} International Test Conference in Asia, ITC-Asia 2022, Taipei,
                  Taiwan, August 24-26, 2022},
  pages        = {31--36},
  publisher    = {{IEEE}},
  year         = {2022},
  url          = {https://doi.org/10.1109/ITCAsia55616.2022.00016},
  doi          = {10.1109/ITCASIA55616.2022.00016},
  timestamp    = {Mon, 21 Nov 2022 00:00:00 +0100},
  biburl       = {https://dblp.org/rec/conf/itc-asia/ZengYW22.bib},
  bibsource    = {dblp computer science bibliography, https://dblp.org}
}

@proceedings{DBLP:conf/itc-asia/2022,
  title        = {{IEEE} International Test Conference in Asia, ITC-Asia 2022, Taipei,
                  Taiwan, August 24-26, 2022},
  publisher    = {{IEEE}},
  year         = {2022},
  url          = {https://doi.org/10.1109/ITC-Asia55616.2022},
  doi          = {10.1109/ITC-ASIA55616.2022},
  isbn         = {978-1-6654-5523-7},
  timestamp    = {Mon, 21 Nov 2022 00:00:00 +0100},
  biburl       = {https://dblp.org/rec/conf/itc-asia/2022.bib},
  bibsource    = {dblp computer science bibliography, https://dblp.org}
}

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