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@inproceedings{DBLP:conf/ats/AouichiYFRKMCTH23,
author = {Ahmed Aouichi and
Sicong Yuan and
Moritz Fieback and
Siddharth Rao and
Woojin Kim and
Erik Jan Marinissen and
Sebastien Couet and
Mottaqiallah Taouil and
Said Hamdioui},
title = {Device Aware Diagnosis for Unique Defects in STT-MRAMs},
booktitle = {32nd {IEEE} Asian Test Symposium, {ATS} 2023, Beijing, China, October
14-17, 2023},
pages = {1--6},
publisher = {{IEEE}},
year = {2023},
url = {https://doi.org/10.1109/ATS59501.2023.10317952},
doi = {10.1109/ATS59501.2023.10317952},
timestamp = {Mon, 05 Feb 2024 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/ats/AouichiYFRKMCTH23.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/ats/BellarminoCHKSS23,
author = {Nicol{\`{o}} Bellarmino and
Riccardo Cantoro and
Martin Huch and
Tobias Kilian and
Ulf Schlichtmann and
Giovanni Squillero},
title = {Enabling Inter-Product Transfer Learning on {MCU} Performance Screening},
booktitle = {32nd {IEEE} Asian Test Symposium, {ATS} 2023, Beijing, China, October
14-17, 2023},
pages = {1--6},
publisher = {{IEEE}},
year = {2023},
url = {https://doi.org/10.1109/ATS59501.2023.10317992},
doi = {10.1109/ATS59501.2023.10317992},
timestamp = {Fri, 08 Dec 2023 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/ats/BellarminoCHKSS23.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/ats/CaiOWWY23,
author = {Shuo Cai and
Jiangbiao Ouyang and
Yan Wen and
Weizheng Wang and
Fei Yu},
title = {A Low-Delay Quadruple-Node-Upset Self-Recoverable Latch Design},
booktitle = {32nd {IEEE} Asian Test Symposium, {ATS} 2023, Beijing, China, October
14-17, 2023},
pages = {1--5},
publisher = {{IEEE}},
year = {2023},
url = {https://doi.org/10.1109/ATS59501.2023.10317975},
doi = {10.1109/ATS59501.2023.10317975},
timestamp = {Fri, 08 Dec 2023 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/ats/CaiOWWY23.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/ats/ChaoWTYLYL23,
author = {Zhiteng Chao and
Senlin Wang and
Pengyu Tian and
Shuwen Yuan and
Huawei Li and
Jing Ye and
Xiaowei Li},
title = {A Distributed {ATPG} System Combining Test Compaction Based on Pure
MaxSAT},
booktitle = {32nd {IEEE} Asian Test Symposium, {ATS} 2023, Beijing, China, October
14-17, 2023},
pages = {1--6},
publisher = {{IEEE}},
year = {2023},
url = {https://doi.org/10.1109/ATS59501.2023.10317948},
doi = {10.1109/ATS59501.2023.10317948},
timestamp = {Fri, 08 Dec 2023 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/ats/ChaoWTYLYL23.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/ats/ChenHXSXGZ23,
author = {Xin Chen and
Liangzhou Huo and
Yudong Xie and
Zhihao Shen and
Zhiqiang Xiang and
Changhao Gao and
Ying Zhang},
title = {FPGA-Based Cross-Hardware {MBU} Emulation Platform for Layout-Level
Digital {VLSI}},
booktitle = {32nd {IEEE} Asian Test Symposium, {ATS} 2023, Beijing, China, October
14-17, 2023},
pages = {1--6},
publisher = {{IEEE}},
year = {2023},
url = {https://doi.org/10.1109/ATS59501.2023.10317974},
doi = {10.1109/ATS59501.2023.10317974},
timestamp = {Fri, 08 Dec 2023 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/ats/ChenHXSXGZ23.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/ats/ChenZCDP23,
author = {Li{-}Wei Chen and
Xianyue Zhao and
Ziang Chen and
Nan Du and
Ilia Polian},
title = {Side-channel Attacks on Memristive Circuits Under External Disturbances},
booktitle = {32nd {IEEE} Asian Test Symposium, {ATS} 2023, Beijing, China, October
14-17, 2023},
pages = {1--6},
publisher = {{IEEE}},
year = {2023},
url = {https://doi.org/10.1109/ATS59501.2023.10317969},
doi = {10.1109/ATS59501.2023.10317969},
timestamp = {Fri, 08 Dec 2023 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/ats/ChenZCDP23.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/ats/ChengZHCLL23,
author = {Yue Cheng and
Hongji Zou and
Jiayu He and
Chen Chen and
Tun Li and
Han Long},
title = {MMFuzz: Towards Enhancing {RTL} Fuzz Testing Using Metric Feedbacks
Based on Markov Chain},
booktitle = {32nd {IEEE} Asian Test Symposium, {ATS} 2023, Beijing, China, October
14-17, 2023},
pages = {1--6},
publisher = {{IEEE}},
year = {2023},
url = {https://doi.org/10.1109/ATS59501.2023.10317973},
doi = {10.1109/ATS59501.2023.10317973},
timestamp = {Mon, 05 Feb 2024 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/ats/ChengZHCLL23.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/ats/CuiYCZ23,
author = {Jinhua Cui and
Yiyun Yin and
Zhiping Cai and
Jiliang Zhang},
title = {A Comparison Study of the Compatibility Approaches for {SGX} Enclaves},
booktitle = {32nd {IEEE} Asian Test Symposium, {ATS} 2023, Beijing, China, October
14-17, 2023},
pages = {1--6},
publisher = {{IEEE}},
year = {2023},
url = {https://doi.org/10.1109/ATS59501.2023.10317965},
doi = {10.1109/ATS59501.2023.10317965},
timestamp = {Fri, 08 Dec 2023 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/ats/CuiYCZ23.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/ats/DeligiannisFGCBR23,
author = {Nikolaos Ioannis Deligiannis and
Tobias Faller and
Iacopo Guglielminetti and
Riccardo Cantoro and
Bernd Becker and
Matteo Sonza Reorda},
title = {Automatic Identification of Functionally Untestable Cell-Aware Faults
in Microprocessors},
booktitle = {32nd {IEEE} Asian Test Symposium, {ATS} 2023, Beijing, China, October
14-17, 2023},
pages = {1--6},
publisher = {{IEEE}},
year = {2023},
url = {https://doi.org/10.1109/ATS59501.2023.10317988},
doi = {10.1109/ATS59501.2023.10317988},
timestamp = {Mon, 05 Feb 2024 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/ats/DeligiannisFGCBR23.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/ats/GaoWZHDZ23,
author = {Jiaxing Gao and
Baohua Wang and
Yin Zhang and
Yu Huang and
Xiaotian Ding and
Weiming Zhang},
title = {Improve Volume Physical-Aware Diagnosis via Active Pattern Sampling},
booktitle = {32nd {IEEE} Asian Test Symposium, {ATS} 2023, Beijing, China, October
14-17, 2023},
pages = {1--6},
publisher = {{IEEE}},
year = {2023},
url = {https://doi.org/10.1109/ATS59501.2023.10317996},
doi = {10.1109/ATS59501.2023.10317996},
timestamp = {Fri, 08 Dec 2023 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/ats/GaoWZHDZ23.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/ats/HeLC23,
author = {Weiyang He and
Zizhen Liu and
Chip{-}Hong Chang},
title = {An Empirical Study of the Inherent Resistance of Knowledge Distillation
Based Federated Learning to Targeted Poisoning Attacks},
booktitle = {32nd {IEEE} Asian Test Symposium, {ATS} 2023, Beijing, China, October
14-17, 2023},
pages = {1--6},
publisher = {{IEEE}},
year = {2023},
url = {https://doi.org/10.1109/ATS59501.2023.10317993},
doi = {10.1109/ATS59501.2023.10317993},
timestamp = {Fri, 08 Dec 2023 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/ats/HeLC23.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/ats/JainK23,
author = {Anshul Jain and
Binod Kumar},
title = {A Case Study on Formally Verifying an Open-source Deep Learning Accelerator
Design},
booktitle = {32nd {IEEE} Asian Test Symposium, {ATS} 2023, Beijing, China, October
14-17, 2023},
pages = {1--6},
publisher = {{IEEE}},
year = {2023},
url = {https://doi.org/10.1109/ATS59501.2023.10317981},
doi = {10.1109/ATS59501.2023.10317981},
timestamp = {Sun, 17 Dec 2023 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/ats/JainK23.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/ats/KangGSZLXW23,
author = {Shuting Kang and
Heng Guo and
Peng Su and
Lijun Zhang and
Guangzhen Liu and
Yunzhi Xue and
Yanjun Wu},
title = {{ECSAS:} Exploring Critical Scenarios from Action Sequence in Autonomous
Driving},
booktitle = {32nd {IEEE} Asian Test Symposium, {ATS} 2023, Beijing, China, October
14-17, 2023},
pages = {1--6},
publisher = {{IEEE}},
year = {2023},
url = {https://doi.org/10.1109/ATS59501.2023.10317968},
doi = {10.1109/ATS59501.2023.10317968},
timestamp = {Tue, 07 May 2024 01:00:00 +0200},
biburl = {https://dblp.org/rec/conf/ats/KangGSZLXW23.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/ats/KohanRHW23,
author = {Somayeh Sadeghi Kohan and
Jan Dennis Reimer and
Sybille Hellebrand and
Hans{-}Joachim Wunderlich},
title = {Optimizing the Streaming of Sensor Data with Approximate Communication},
booktitle = {32nd {IEEE} Asian Test Symposium, {ATS} 2023, Beijing, China, October
14-17, 2023},
pages = {1--6},
publisher = {{IEEE}},
year = {2023},
url = {https://doi.org/10.1109/ATS59501.2023.10317958},
doi = {10.1109/ATS59501.2023.10317958},
timestamp = {Fri, 08 Dec 2023 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/ats/KohanRHW23.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/ats/KonganapalleSS23,
author = {Gowthami Konganapalle and
Sonali Shukla and
Virendra Singh},
title = {SMASh: {A} State Encoding Methodology Against Attacks on Finite State
Machines},
booktitle = {32nd {IEEE} Asian Test Symposium, {ATS} 2023, Beijing, China, October
14-17, 2023},
pages = {1--6},
publisher = {{IEEE}},
year = {2023},
url = {https://doi.org/10.1109/ATS59501.2023.10318015},
doi = {10.1109/ATS59501.2023.10318015},
timestamp = {Fri, 08 Dec 2023 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/ats/KonganapalleSS23.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/ats/KozumaWII23,
author = {Tamaki Kozuma and
Qilin Wang and
Hideyuki Ichihara and
Tomoo Inoue},
title = {Reliability Analysis of Approximate Multipliers with Recovery Schemes},
booktitle = {32nd {IEEE} Asian Test Symposium, {ATS} 2023, Beijing, China, October
14-17, 2023},
pages = {1--6},
publisher = {{IEEE}},
year = {2023},
url = {https://doi.org/10.1109/ATS59501.2023.10318010},
doi = {10.1109/ATS59501.2023.10318010},
timestamp = {Fri, 08 Dec 2023 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/ats/KozumaWII23.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/ats/KumarRPA23,
author = {Gaurav Kumar and
Anjum Riaz and
Yamuna Prasad and
Satyadev Ahlawat},
title = {On Enhancing the Security of Streaming Scan Network Architecture},
booktitle = {32nd {IEEE} Asian Test Symposium, {ATS} 2023, Beijing, China, October
14-17, 2023},
pages = {1--6},
publisher = {{IEEE}},
year = {2023},
url = {https://doi.org/10.1109/ATS59501.2023.10317941},
doi = {10.1109/ATS59501.2023.10317941},
timestamp = {Mon, 05 Feb 2024 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/ats/KumarRPA23.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/ats/LiLLWTL23,
author = {Wenxing Li and
Hongqin Lyu and
Shengwen Liang and
Tiancheng Wang and
Pengyu Tian and
Huawei Li},
title = {Intelligent Automatic Test Pattern Generation for Digital Circuits
Based on Reinforcement Learning},
booktitle = {32nd {IEEE} Asian Test Symposium, {ATS} 2023, Beijing, China, October
14-17, 2023},
pages = {1--6},
publisher = {{IEEE}},
year = {2023},
url = {https://doi.org/10.1109/ATS59501.2023.10317953},
doi = {10.1109/ATS59501.2023.10317953},
timestamp = {Fri, 08 Dec 2023 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/ats/LiLLWTL23.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/ats/LiLS23,
author = {Yilin Li and
Shan Li and
Haihua Shen},
title = {HTrans: Transformer-Based Method for Hardware Trojan Detection and
Localization},
booktitle = {32nd {IEEE} Asian Test Symposium, {ATS} 2023, Beijing, China, October
14-17, 2023},
pages = {1--6},
publisher = {{IEEE}},
year = {2023},
url = {https://doi.org/10.1109/ATS59501.2023.10317971},
doi = {10.1109/ATS59501.2023.10317971},
timestamp = {Fri, 08 Dec 2023 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/ats/LiLS23.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/ats/LiO23,
author = {Leon Li and
Alex Orailoglu},
title = {ClearLock: Deterring Hardware Reverse Engineering Attacks in a White-Box},
booktitle = {32nd {IEEE} Asian Test Symposium, {ATS} 2023, Beijing, China, October
14-17, 2023},
pages = {1--6},
publisher = {{IEEE}},
year = {2023},
url = {https://doi.org/10.1109/ATS59501.2023.10317947},
doi = {10.1109/ATS59501.2023.10317947},
timestamp = {Fri, 08 Dec 2023 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/ats/LiO23.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/ats/LiWZLL23,
author = {Wen Li and
Ying Wang and
Kaiwei Zou and
Huawei Li and
Xiaowei Li},
title = {Adversarial Testing: {A} Novel On-Line Testing Method for Deep Learning
Processors},
booktitle = {32nd {IEEE} Asian Test Symposium, {ATS} 2023, Beijing, China, October
14-17, 2023},
pages = {1--6},
publisher = {{IEEE}},
year = {2023},
url = {https://doi.org/10.1109/ATS59501.2023.10317994},
doi = {10.1109/ATS59501.2023.10317994},
timestamp = {Fri, 08 Dec 2023 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/ats/LiWZLL23.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/ats/LiYHZ23,
author = {Huawei Li and
Jing Ye and
Wei Hu and
Jiliang Zhang},
title = {Message from the Chairs},
booktitle = {32nd {IEEE} Asian Test Symposium, {ATS} 2023, Beijing, China, October
14-17, 2023},
pages = {1},
publisher = {{IEEE}},
year = {2023},
url = {https://doi.org/10.1109/ATS59501.2023.10317950},
doi = {10.1109/ATS59501.2023.10317950},
timestamp = {Fri, 08 Dec 2023 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/ats/LiYHZ23.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/ats/LuZCZ23,
author = {Zhaojun Lu and
Qi Zhao and
Qidong Chen and
Jiliang Zhang},
title = {A Survey on Fault-Tolerance Methods for SRAM-Based FPGAs in Radiation
Environments},
booktitle = {32nd {IEEE} Asian Test Symposium, {ATS} 2023, Beijing, China, October
14-17, 2023},
pages = {1--6},
publisher = {{IEEE}},
year = {2023},
url = {https://doi.org/10.1109/ATS59501.2023.10318028},
doi = {10.1109/ATS59501.2023.10318028},
timestamp = {Fri, 08 Dec 2023 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/ats/LuZCZ23.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/ats/MuTCCYLL23,
author = {Jianan Mu and
Huajie Tan and
Shuai Chen and
Min Cai and
Jing Ye and
Huawei Li and
Xiaowei Li},
title = {Configurable and High-Level Pipelined Lattice-Based Post Quantum Cryptography
Hardware Accelerator Design},
booktitle = {32nd {IEEE} Asian Test Symposium, {ATS} 2023, Beijing, China, October
14-17, 2023},
pages = {1--6},
publisher = {{IEEE}},
year = {2023},
url = {https://doi.org/10.1109/ATS59501.2023.10318005},
doi = {10.1109/ATS59501.2023.10318005},
timestamp = {Fri, 08 Dec 2023 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/ats/MuTCCYLL23.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/ats/NieJYWWN23,
author = {Mu Nie and
Wen Jiang and
Wankou Yang and
Senling Wang and
Xiaoqing Wen and
Tianming Ni},
title = {Enhancing Defect Diagnosis and Localization in Wafer Map Testing Through
Weakly Supervised Learning},
booktitle = {32nd {IEEE} Asian Test Symposium, {ATS} 2023, Beijing, China, October
14-17, 2023},
pages = {1--6},
publisher = {{IEEE}},
year = {2023},
url = {https://doi.org/10.1109/ATS59501.2023.10317989},
doi = {10.1109/ATS59501.2023.10317989},
timestamp = {Fri, 08 Dec 2023 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/ats/NieJYWWN23.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/ats/ShangCZY23,
author = {Ying Shang and
Kun Chang and
Ruilian Zhao and
Zhigang Yin},
title = {Template-Based and Coverage-Guided Verification Instruction Set Automatic
Generation Method for {DSP} Chip},
booktitle = {32nd {IEEE} Asian Test Symposium, {ATS} 2023, Beijing, China, October
14-17, 2023},
pages = {1--6},
publisher = {{IEEE}},
year = {2023},
url = {https://doi.org/10.1109/ATS59501.2023.10317999},
doi = {10.1109/ATS59501.2023.10317999},
timestamp = {Fri, 08 Dec 2023 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/ats/ShangCZY23.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/ats/TanYRYDX23,
author = {Yongquan Tan and
Yukuan Yang and
Hongping Ren and
Zhuokun Yang and
Qian Dong and
Yunzhi Xue},
title = {Survey on Traffic Flow-Based Autonomous Driving Simulation Tests},
booktitle = {32nd {IEEE} Asian Test Symposium, {ATS} 2023, Beijing, China, October
14-17, 2023},
pages = {1--6},
publisher = {{IEEE}},
year = {2023},
url = {https://doi.org/10.1109/ATS59501.2023.10317945},
doi = {10.1109/ATS59501.2023.10317945},
timestamp = {Fri, 08 Dec 2023 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/ats/TanYRYDX23.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/ats/TangWCG23,
author = {She Tang and
Jian Wang and
Zhe Chen and
Shize Guo},
title = {A Covert Attack Method Against {FPGA} Clouds},
booktitle = {32nd {IEEE} Asian Test Symposium, {ATS} 2023, Beijing, China, October
14-17, 2023},
pages = {1--6},
publisher = {{IEEE}},
year = {2023},
url = {https://doi.org/10.1109/ATS59501.2023.10318003},
doi = {10.1109/ATS59501.2023.10318003},
timestamp = {Fri, 08 Dec 2023 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/ats/TangWCG23.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/ats/TangZGZMH23,
author = {Shibo Tang and
Jiacheng Zhu and
Yifei Gao and
Jing Zhou and
Dejun Mu and
Wei Hu},
title = {Verifying {RISC-V} Privilege Transition Integrity Through Symbolic
Execution},
booktitle = {32nd {IEEE} Asian Test Symposium, {ATS} 2023, Beijing, China, October
14-17, 2023},
pages = {1--6},
publisher = {{IEEE}},
year = {2023},
url = {https://doi.org/10.1109/ATS59501.2023.10317946},
doi = {10.1109/ATS59501.2023.10317946},
timestamp = {Fri, 08 Dec 2023 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/ats/TangZGZMH23.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/ats/WangLLC23,
author = {Chun{-}Yeh Wang and
Chien{-}Hsing Liang and
Jing{-}Jia Liou and
Harry H. Chen},
title = {Signal Reduction of Signature Blocks for Transient Fault Debugging},
booktitle = {32nd {IEEE} Asian Test Symposium, {ATS} 2023, Beijing, China, October
14-17, 2023},
pages = {1--6},
publisher = {{IEEE}},
year = {2023},
url = {https://doi.org/10.1109/ATS59501.2023.10318024},
doi = {10.1109/ATS59501.2023.10318024},
timestamp = {Fri, 08 Dec 2023 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/ats/WangLLC23.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/ats/WangZYYZ23,
author = {Weiwei Wang and
Yongchao Zhang and
Feng You and
Zhigang Yin and
Ruilian Zhao},
title = {Fault Diagnosis of Analog Circuits Based on Multi-Scale 1D Convolutional
Neural Network},
booktitle = {32nd {IEEE} Asian Test Symposium, {ATS} 2023, Beijing, China, October
14-17, 2023},
pages = {1--6},
publisher = {{IEEE}},
year = {2023},
url = {https://doi.org/10.1109/ATS59501.2023.10317956},
doi = {10.1109/ATS59501.2023.10317956},
timestamp = {Fri, 08 Dec 2023 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/ats/WangZYYZ23.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/ats/WuGZTH23,
author = {Lingjuan Wu and
Yifei Gao and
Jiacheng Zhu and
Yu Tai and
Wei Hu},
title = {Security Verification of {RISC-V} System Based on {ISA} Level Information
Flow Tracking},
booktitle = {32nd {IEEE} Asian Test Symposium, {ATS} 2023, Beijing, China, October
14-17, 2023},
pages = {1--6},
publisher = {{IEEE}},
year = {2023},
url = {https://doi.org/10.1109/ATS59501.2023.10317944},
doi = {10.1109/ATS59501.2023.10317944},
timestamp = {Fri, 08 Dec 2023 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/ats/WuGZTH23.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/ats/XunFYAHCPTH23,
author = {Hanzhi Xun and
Moritz Fieback and
Sicong Yuan and
Hassen Aziza and
Mathijs Heidekamp and
Thiago Copetti and
Let{\'{\i}}cia Maria Veiras Bolzani Poehls and
Mottaqiallah Taouil and
Said Hamdioui},
title = {Characterization and Test of Intermittent Over {RESET} in RRAMs},
booktitle = {32nd {IEEE} Asian Test Symposium, {ATS} 2023, Beijing, China, October
14-17, 2023},
pages = {1--6},
publisher = {{IEEE}},
year = {2023},
url = {https://doi.org/10.1109/ATS59501.2023.10317990},
doi = {10.1109/ATS59501.2023.10317990},
timestamp = {Mon, 05 Feb 2024 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/ats/XunFYAHCPTH23.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/ats/YanCHCW23,
author = {Aibin Yan and
Yu Chen and
Zhengfeng Huang and
Jie Cui and
Xiaoqing Wen},
title = {A High-Performance and P-Type FeFET-Based Non-Volatile Latch},
booktitle = {32nd {IEEE} Asian Test Symposium, {ATS} 2023, Beijing, China, October
14-17, 2023},
pages = {1--5},
publisher = {{IEEE}},
year = {2023},
url = {https://doi.org/10.1109/ATS59501.2023.10318017},
doi = {10.1109/ATS59501.2023.10318017},
timestamp = {Fri, 08 Dec 2023 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/ats/YanCHCW23.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/ats/YanLGHNW23,
author = {Aibin Yan and
Xuehua Li and
Zhongyu Gao and
Zhengfeng Huang and
Tianming Ni and
Xiaoqing Wen},
title = {Advanced {DICE} Based Triple-Node-Upset Recovery Latch with Optimized
Overhead for Space Applications},
booktitle = {32nd {IEEE} Asian Test Symposium, {ATS} 2023, Beijing, China, October
14-17, 2023},
pages = {1--5},
publisher = {{IEEE}},
year = {2023},
url = {https://doi.org/10.1109/ATS59501.2023.10317977},
doi = {10.1109/ATS59501.2023.10317977},
timestamp = {Fri, 08 Dec 2023 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/ats/YanLGHNW23.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/ats/YangHWYSFCLLC23,
author = {Yipei Yang and
Junying Huang and
Zongyue Wang and
Jing Ye and
Zihao Sun and
Junfeng Fan and
Shuai Chen and
Huawei Li and
Xiaowei Li and
Yuan Cao},
title = {A Template Attack on Reduction Without Reference Device on Kyber},
booktitle = {32nd {IEEE} Asian Test Symposium, {ATS} 2023, Beijing, China, October
14-17, 2023},
pages = {1--6},
publisher = {{IEEE}},
year = {2023},
url = {https://doi.org/10.1109/ATS59501.2023.10318019},
doi = {10.1109/ATS59501.2023.10318019},
timestamp = {Fri, 08 Dec 2023 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/ats/YangHWYSFCLLC23.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/ats/YangJSW23,
author = {Chengzhen Yang and
Song Jin and
Jianhuang Shen and
Zhuo Wang},
title = {On Tolerating Variations and Faults in Memristor Crossbar Based Neural
Network Accelerators by Network Expansion and Weight Zeroing},
booktitle = {32nd {IEEE} Asian Test Symposium, {ATS} 2023, Beijing, China, October
14-17, 2023},
pages = {1--6},
publisher = {{IEEE}},
year = {2023},
url = {https://doi.org/10.1109/ATS59501.2023.10317978},
doi = {10.1109/ATS59501.2023.10317978},
timestamp = {Fri, 08 Dec 2023 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/ats/YangJSW23.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/ats/YangMZH23,
author = {Fan Yang and
Tedder Meng and
Zhifang Zhang and
Yu Huang},
title = {Industry Session {I:} On Automotive Testing},
booktitle = {32nd {IEEE} Asian Test Symposium, {ATS} 2023, Beijing, China, October
14-17, 2023},
pages = {1},
publisher = {{IEEE}},
year = {2023},
url = {https://doi.org/10.1109/ATS59501.2023.10318022},
doi = {10.1109/ATS59501.2023.10318022},
timestamp = {Fri, 08 Dec 2023 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/ats/YangMZH23.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/ats/YeLWZZH23,
author = {Shi{-}Jie Ye and
Yun{-}Ju Liu and
Liuzheng Wang and
Hui{-}Ling Zhen and
Wei{-}Ming Zhang and
Yu Huang},
title = {Fault Simulation Acceleration Based on {ARM} Multi-core {CPU} Architecture},
booktitle = {32nd {IEEE} Asian Test Symposium, {ATS} 2023, Beijing, China, October
14-17, 2023},
pages = {1--5},
publisher = {{IEEE}},
year = {2023},
url = {https://doi.org/10.1109/ATS59501.2023.10317970},
doi = {10.1109/ATS59501.2023.10317970},
timestamp = {Mon, 11 Dec 2023 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/ats/YeLWZZH23.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/ats/YueLZLC23,
author = {Lei Yue and
Jingwen Li and
Liwei Zheng and
Li Li and
Zhanqi Cui},
title = {Software Fault Localization Based on Combining Information Retrieval
and Mutation Analysis},
booktitle = {32nd {IEEE} Asian Test Symposium, {ATS} 2023, Beijing, China, October
14-17, 2023},
pages = {1--6},
publisher = {{IEEE}},
year = {2023},
url = {https://doi.org/10.1109/ATS59501.2023.10317957},
doi = {10.1109/ATS59501.2023.10317957},
timestamp = {Fri, 08 Dec 2023 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/ats/YueLZLC23.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/ats/ZhangJ23,
author = {Hequan Zhang and
Song Jin},
title = {On Detecting and Defending AdvDrop Adversarial Attacks by Image Blurring
and Adaptive Noising},
booktitle = {32nd {IEEE} Asian Test Symposium, {ATS} 2023, Beijing, China, October
14-17, 2023},
pages = {1--6},
publisher = {{IEEE}},
year = {2023},
url = {https://doi.org/10.1109/ATS59501.2023.10318027},
doi = {10.1109/ATS59501.2023.10318027},
timestamp = {Fri, 08 Dec 2023 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/ats/ZhangJ23.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/ats/ZhangZL23,
author = {Han Zhang and
Yinhao Zhou and
Ying Li},
title = {A Portable Hardware Trojan Detection Using Graph Attention Networks},
booktitle = {32nd {IEEE} Asian Test Symposium, {ATS} 2023, Beijing, China, October
14-17, 2023},
pages = {1--6},
publisher = {{IEEE}},
year = {2023},
url = {https://doi.org/10.1109/ATS59501.2023.10317998},
doi = {10.1109/ATS59501.2023.10317998},
timestamp = {Fri, 08 Dec 2023 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/ats/ZhangZL23.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/ats/ZhongMLH23,
author = {Junna Zhong and
Iris Ma and
Hailong Li and
Yu Huang},
title = {Industry Session {II:} {DFT} on {AI} Chips},
booktitle = {32nd {IEEE} Asian Test Symposium, {ATS} 2023, Beijing, China, October
14-17, 2023},
pages = {1},
publisher = {{IEEE}},
year = {2023},
url = {https://doi.org/10.1109/ATS59501.2023.10317980},
doi = {10.1109/ATS59501.2023.10317980},
timestamp = {Fri, 08 Dec 2023 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/ats/ZhongMLH23.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/ats/ZhouWHFWLW23,
author = {Lirong Zhou and
Junjun Wang and
Zhao Huang and
Lu Fan and
Quan Wang and
Jinhui Liu and
Bo Wan},
title = {A Logic Encryption-Enhanced {PUF} Architecture to Deceive Machine
Learning-Based Modeling Attacks},
booktitle = {32nd {IEEE} Asian Test Symposium, {ATS} 2023, Beijing, China, October
14-17, 2023},
pages = {1--6},
publisher = {{IEEE}},
year = {2023},
url = {https://doi.org/10.1109/ATS59501.2023.10318014},
doi = {10.1109/ATS59501.2023.10318014},
timestamp = {Fri, 08 Dec 2023 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/ats/ZhouWHFWLW23.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@proceedings{DBLP:conf/ats/2023,
title = {32nd {IEEE} Asian Test Symposium, {ATS} 2023, Beijing, China, October
14-17, 2023},
publisher = {{IEEE}},
year = {2023},
url = {https://doi.org/10.1109/ATS59501.2023},
doi = {10.1109/ATS59501.2023},
isbn = {979-8-3503-0310-0},
timestamp = {Fri, 08 Dec 2023 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/ats/2023.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/ats/AddepalliPANSV22,
author = {Hari Addepalli and
Irith Pomeranz and
M. Enamul Amyeen and
Suriyaprakash Natarajan and
Arani Sinha and
Srikanth Venkataraman},
title = {Using Fault Detection Tests to Produce Diagnostic Tests Targeting
Large Sets of Candidate Faults},
booktitle = {{IEEE} 31st Asian Test Symposium, {ATS} 2022, Taichung City, Taiwan,
November 21-24, 2022},
pages = {120--125},
publisher = {{IEEE}},
year = {2022},
url = {https://doi.org/10.1109/ATS56056.2022.00033},
doi = {10.1109/ATS56056.2022.00033},
timestamp = {Wed, 11 Jan 2023 14:55:55 +0100},
biburl = {https://dblp.org/rec/conf/ats/AddepalliPANSV22.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/ats/AditiH22,
author = {Aditi and
Michael S. Hsiao},
title = {Hybrid Rule-based and Machine Learning System for Assertion Generation
from Natural Language Specifications},
booktitle = {{IEEE} 31st Asian Test Symposium, {ATS} 2022, Taichung City, Taiwan,
November 21-24, 2022},
pages = {126--131},
publisher = {{IEEE}},
year = {2022},
url = {https://doi.org/10.1109/ATS56056.2022.00034},
doi = {10.1109/ATS56056.2022.00034},
timestamp = {Wed, 11 Jan 2023 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/ats/AditiH22.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/ats/ChouWSC22,
author = {Yu{-}You Chou and
Cheng{-}Wen Wu and
Ming{-}Der Shieh and
Chao{-}Hsun Chen},
title = {Battery Pack Reliability and Endurance Enhancement for Electric Vehicles
by Dynamic Reconfiguration},
booktitle = {{IEEE} 31st Asian Test Symposium, {ATS} 2022, Taichung City, Taiwan,
November 21-24, 2022},
pages = {66--71},
publisher = {{IEEE}},
year = {2022},
url = {https://doi.org/10.1109/ATS56056.2022.00024},
doi = {10.1109/ATS56056.2022.00024},
timestamp = {Sat, 30 Sep 2023 01:00:00 +0200},
biburl = {https://dblp.org/rec/conf/ats/ChouWSC22.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/ats/DeligiannisFCC022,
author = {Nikolaos Ioannis Deligiannis and
Tobias Faller and
Josie E. Rodriguez Condia and
Riccardo Cantoro and
Bernd Becker and
Matteo Sonza Reorda},
title = {Using Formal Methods to Support the Development of STLs for GPUs},
booktitle = {{IEEE} 31st Asian Test Symposium, {ATS} 2022, Taichung City, Taiwan,
November 21-24, 2022},
pages = {84--89},
publisher = {{IEEE}},
year = {2022},
url = {https://doi.org/10.1109/ATS56056.2022.00027},
doi = {10.1109/ATS56056.2022.00027},
timestamp = {Mon, 05 Feb 2024 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/ats/DeligiannisFCC022.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/ats/DuhWSCF22,
author = {Kuan{-}Hsun Duh and
Cheng{-}Wen Wu and
Ming{-}Der Shieh and
Chao{-}Hsun Chen and
Ming{-}Yan Fan},
title = {Aging Impact of Power MOSFETs in Charger with Different Operation
Frequency},
booktitle = {{IEEE} 31st Asian Test Symposium, {ATS} 2022, Taichung City, Taiwan,
November 21-24, 2022},
pages = {54--59},
publisher = {{IEEE}},
year = {2022},
url = {https://doi.org/10.1109/ATS56056.2022.00022},
doi = {10.1109/ATS56056.2022.00022},
timestamp = {Sat, 30 Sep 2023 01:00:00 +0200},
biburl = {https://dblp.org/rec/conf/ats/DuhWSCF22.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/ats/HsiehTW22,
author = {Tong{-}Yu Hsieh and
Pao{-}Wei Tsui and
Jun{-}Tsung Wu},
title = {On No-Reference Error Detection of an Image Stitching System Based
on Error-Tolerance},
booktitle = {{IEEE} 31st Asian Test Symposium, {ATS} 2022, Taichung City, Taiwan,
November 21-24, 2022},
pages = {150--155},
publisher = {{IEEE}},
year = {2022},
url = {https://doi.org/10.1109/ATS56056.2022.00038},
doi = {10.1109/ATS56056.2022.00038},
timestamp = {Wed, 11 Jan 2023 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/ats/HsiehTW22.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/ats/HuangCZLC22,
author = {Huixian Huang and
Xiaole Cui and
Shuming Zhang and
Ge Li and
Xiaoxin Cui},
title = {An obfuscation scheme of scan chain to protect the cryptographic chips},
booktitle = {{IEEE} 31st Asian Test Symposium, {ATS} 2022, Taichung City, Taiwan,
November 21-24, 2022},
pages = {19--24},
publisher = {{IEEE}},
year = {2022},
url = {https://doi.org/10.1109/ATS56056.2022.00016},
doi = {10.1109/ATS56056.2022.00016},
timestamp = {Wed, 11 Jan 2023 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/ats/HuangCZLC22.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/ats/HuangFH22,
author = {Wan Ju Huang and
Hsiao{-}Wen Fu and
Tsung{-}Chu Huang},
title = {{AN-HRNS:} AN-Coded Hierarchical Residue Number System for Reliable
Neural Network Accelerators},
booktitle = {{IEEE} 31st Asian Test Symposium, {ATS} 2022, Taichung City, Taiwan,
November 21-24, 2022},
pages = {132--137},
publisher = {{IEEE}},
year = {2022},
url = {https://doi.org/10.1109/ATS56056.2022.00035},
doi = {10.1109/ATS56056.2022.00035},
timestamp = {Wed, 11 Jan 2023 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/ats/HuangFH22.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/ats/HuangSLL22,
author = {Hao Huang and
Haihua Shen and
Shan Li and
Huawei Li},
title = {A Hardware Trojan Trigger Localization Method in {RTL} based on Control
Flow Features},
booktitle = {{IEEE} 31st Asian Test Symposium, {ATS} 2022, Taichung City, Taiwan,
November 21-24, 2022},
pages = {138--143},
publisher = {{IEEE}},
year = {2022},
url = {https://doi.org/10.1109/ATS56056.2022.00036},
doi = {10.1109/ATS56056.2022.00036},
timestamp = {Mon, 15 May 2023 01:00:00 +0200},
biburl = {https://dblp.org/rec/conf/ats/HuangSLL22.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/ats/HuangYLC22,
author = {Zih{-}Ming Huang and
Dun{-}An Yang and
Jing{-}Jia Liou and
Harry H. Chen},
title = {FPGA-Based Emulation for Accelerating Transient Fault Reduction Analysis},
booktitle = {{IEEE} 31st Asian Test Symposium, {ATS} 2022, Taichung City, Taiwan,
November 21-24, 2022},
pages = {144--149},
publisher = {{IEEE}},
year = {2022},
url = {https://doi.org/10.1109/ATS56056.2022.00037},
doi = {10.1109/ATS56056.2022.00037},
timestamp = {Wed, 11 Jan 2023 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/ats/HuangYLC22.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/ats/JanaB0BUF22,
author = {Utsav Jana and
Sourav Banerjee and
Binod Kumar and
Madhu B and
Shankar Umapathi and
Masahiro Fujita},
title = {Deep Learning-assisted Scan Chain Diagnosis with Different Fault Models
during Manufacturing Test},
booktitle = {{IEEE} 31st Asian Test Symposium, {ATS} 2022, Taichung City, Taiwan,
November 21-24, 2022},
pages = {72--77},
publisher = {{IEEE}},
year = {2022},
url = {https://doi.org/10.1109/ATS56056.2022.00025},
doi = {10.1109/ATS56056.2022.00025},
timestamp = {Mon, 05 Feb 2024 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/ats/JanaB0BUF22.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/ats/KatoMK22,
author = {Takaaki Kato and
Yousuke Miyake and
Seiji Kajihara},
title = {On Correction of {A} Delay Value Using Ring-Oscillators for Aging
Detection and Prediction},
booktitle = {{IEEE} 31st Asian Test Symposium, {ATS} 2022, Taichung City, Taiwan,
November 21-24, 2022},
pages = {60--65},
publisher = {{IEEE}},
year = {2022},
url = {https://doi.org/10.1109/ATS56056.2022.00023},
doi = {10.1109/ATS56056.2022.00023},
timestamp = {Wed, 11 Jan 2023 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/ats/KatoMK22.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/ats/KoyluFHT22,
author = {Troya {\c{C}}agil K{\"{o}}yl{\"{u}} and
Moritz Fieback and
Said Hamdioui and
Mottaqiallah Taouil},
title = {Using Hopfield Networks to Correct Instruction Faults},
booktitle = {{IEEE} 31st Asian Test Symposium, {ATS} 2022, Taichung City, Taiwan,
November 21-24, 2022},
pages = {102--107},
publisher = {{IEEE}},
year = {2022},
url = {https://doi.org/10.1109/ATS56056.2022.00030},
doi = {10.1109/ATS56056.2022.00030},
timestamp = {Tue, 21 Mar 2023 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/ats/KoyluFHT22.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/ats/KumarRPA22,
author = {Gaurav Kumar and
Anjum Riaz and
Yamuna Prasad and
Satyadev Ahlawat},
title = {A New Access Protocol for Elevating the Security of {IJTAG} Network},
booktitle = {{IEEE} 31st Asian Test Symposium, {ATS} 2022, Taichung City, Taiwan,
November 21-24, 2022},
pages = {31--36},
publisher = {{IEEE}},
year = {2022},
url = {https://doi.org/10.1109/ATS56056.2022.00018},
doi = {10.1109/ATS56056.2022.00018},
timestamp = {Tue, 21 Mar 2023 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/ats/KumarRPA22.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/ats/LiL22,
author = {Jin{-}Fu Li and
Jing{-}Jia Liou},
title = {Foreword: {ATS} 2022},
booktitle = {{IEEE} 31st Asian Test Symposium, {ATS} 2022, Taichung City, Taiwan,
November 21-24, 2022},
pages = {x},
publisher = {{IEEE}},
year = {2022},
url = {https://doi.org/10.1109/ATS56056.2022.00005},
doi = {10.1109/ATS56056.2022.00005},
timestamp = {Tue, 17 Oct 2023 01:00:00 +0200},
biburl = {https://dblp.org/rec/conf/ats/LiL22.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/ats/LuLH22,
author = {Shyue{-}Kung Lu and
Zhi{-}Jia Liu and
Masaki Hashizume},
title = {Fault Securing Techniques for Yield and Reliability Enhancement of
{RRAM}},
booktitle = {{IEEE} 31st Asian Test Symposium, {ATS} 2022, Taichung City, Taiwan,
November 21-24, 2022},
pages = {13--18},
publisher = {{IEEE}},
year = {2022},
url = {https://doi.org/10.1109/ATS56056.2022.00015},
doi = {10.1109/ATS56056.2022.00015},
timestamp = {Wed, 11 Jan 2023 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/ats/LuLH22.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/ats/LylinaWW22,
author = {Natalia Lylina and
Chih{-}Hao Wang and
Hans{-}Joachim Wunderlich},
title = {Online Periodic Test of Reconfigurable Scan Networks},
booktitle = {{IEEE} 31st Asian Test Symposium, {ATS} 2022, Taichung City, Taiwan,
November 21-24, 2022},
pages = {78--83},
publisher = {{IEEE}},
year = {2022},
url = {https://doi.org/10.1109/ATS56056.2022.00026},
doi = {10.1109/ATS56056.2022.00026},
timestamp = {Wed, 11 Jan 2023 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/ats/LylinaWW22.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/ats/MamgainMTB22,
author = {Ankush Mamgain and
Salvador Mir and
Jai Narayan Tripathi and
Manuel J. Barrag{\'{a}}n},
title = {On-chip calibration for high-speed harmonic cancellation-based sinusoidal
signal generators},
booktitle = {{IEEE} 31st Asian Test Symposium, {ATS} 2022, Taichung City, Taiwan,
November 21-24, 2022},
pages = {43--48},
publisher = {{IEEE}},
year = {2022},
url = {https://doi.org/10.1109/ATS56056.2022.00020},
doi = {10.1109/ATS56056.2022.00020},
timestamp = {Sat, 30 Sep 2023 01:00:00 +0200},
biburl = {https://dblp.org/rec/conf/ats/MamgainMTB22.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/ats/NieCS22,
author = {Xiaofan Nie and
Liwei Chen and
Gang Shi},
title = {PointerChecker: Tag-Based and Hardware-Assisted Memory Safety against
Memory Corruption},
booktitle = {{IEEE} 31st Asian Test Symposium, {ATS} 2022, Taichung City, Taiwan,
November 21-24, 2022},
pages = {96--101},
publisher = {{IEEE}},
year = {2022},
url = {https://doi.org/10.1109/ATS56056.2022.00029},
doi = {10.1109/ATS56056.2022.00029},
timestamp = {Wed, 11 Jan 2023 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/ats/NieCS22.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/ats/OhmatsuOIYLH22,
author = {Masao Ohmatsu and
Yuto Ohtera and
Yuki Ikiri and
Hiroyuki Yotsuyanagi and
Shyue{-}Kung Lu and
Masaki Hashizume},
title = {Enhanced Interconnect Test Method for Resistive Open Defects in Final
Tests with Relaxation Oscillators},
booktitle = {{IEEE} 31st Asian Test Symposium, {ATS} 2022, Taichung City, Taiwan,
November 21-24, 2022},
pages = {49--53},
publisher = {{IEEE}},
year = {2022},
url = {https://doi.org/10.1109/ATS56056.2022.00021},
doi = {10.1109/ATS56056.2022.00021},
timestamp = {Wed, 11 Jan 2023 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/ats/OhmatsuOIYLH22.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/ats/Pomeranz22,
author = {Irith Pomeranz},
title = {Two-Dimensional Test Generation Objective},
booktitle = {{IEEE} 31st Asian Test Symposium, {ATS} 2022, Taichung City, Taiwan,
November 21-24, 2022},
pages = {108--113},
publisher = {{IEEE}},
year = {2022},
url = {https://doi.org/10.1109/ATS56056.2022.00031},
doi = {10.1109/ATS56056.2022.00031},
timestamp = {Wed, 11 Jan 2023 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/ats/Pomeranz22.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/ats/Pomeranz22a,
author = {Irith Pomeranz},
title = {Selecting Path Delay Faults Through the Largest Subcircuits of Uncovered
Lines},
booktitle = {{IEEE} 31st Asian Test Symposium, {ATS} 2022, Taichung City, Taiwan,
November 21-24, 2022},
pages = {114--119},
publisher = {{IEEE}},
year = {2022},
url = {https://doi.org/10.1109/ATS56056.2022.00032},
doi = {10.1109/ATS56056.2022.00032},
timestamp = {Wed, 11 Jan 2023 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/ats/Pomeranz22a.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/ats/Pomeranz22b,
author = {Irith Pomeranz},
title = {Usable Circuits with Imperfect Scan Logic},
booktitle = {{IEEE} 31st Asian Test Symposium, {ATS} 2022, Taichung City, Taiwan,
November 21-24, 2022},
pages = {156--161},
publisher = {{IEEE}},
year = {2022},
url = {https://doi.org/10.1109/ATS56056.2022.00039},
doi = {10.1109/ATS56056.2022.00039},
timestamp = {Wed, 11 Jan 2023 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/ats/Pomeranz22b.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/ats/SatoNKIO0OIZKKH22,
author = {Keno Sato and
Takayuki Nakatani and
Shogo Katayama and
Daisuke Iimori and
Gaku Ogihara and
Takashi Ishida and
Toshiyuki Okamoto and
Tamotsu Ichikawa and
Yujie Zhao and
Kentaroh Katoh and
Anna Kuwana and
Kazumi Hatayama and
Haruo Kobayashi},
title = {High Precision Voltage Measurement System Utilizing Low-End {ATE}
Resource and {BOST}},
booktitle = {{IEEE} 31st Asian Test Symposium, {ATS} 2022, Taichung City, Taiwan,
November 21-24, 2022},
pages = {37--42},
publisher = {{IEEE}},
year = {2022},
url = {https://doi.org/10.1109/ATS56056.2022.00019},
doi = {10.1109/ATS56056.2022.00019},
timestamp = {Wed, 11 Jan 2023 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/ats/SatoNKIO0OIZKKH22.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/ats/WangLLC22,
author = {Sying{-}Jyan Wang and
Katherine Shu{-}Min Li and
Chen{-}Yeh Lin and
Song{-}Kong Chong},
title = {Intrusion Detection and Obfuscation Mechanism for PUF-Based Authentication},
booktitle = {{IEEE} 31st Asian Test Symposium, {ATS} 2022, Taichung City, Taiwan,
November 21-24, 2022},
pages = {90--95},
publisher = {{IEEE}},
year = {2022},
url = {https://doi.org/10.1109/ATS56056.2022.00028},
doi = {10.1109/ATS56056.2022.00028},
timestamp = {Mon, 26 Jun 2023 01:00:00 +0200},
biburl = {https://dblp.org/rec/conf/ats/WangLLC22.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/ats/YanDZH00W22,
author = {Aibin Yan and
Liang Ding and
Zhen Zhou and
Zhengfeng Huang and
Jie Cui and
Patrick Girard and
Xiaoqing Wen},
title = {A Radiation-Hardened Non-Volatile Magnetic Latch with High Reliability
and Persistent Storage},
booktitle = {{IEEE} 31st Asian Test Symposium, {ATS} 2022, Taichung City, Taiwan,
November 21-24, 2022},
pages = {1--6},
publisher = {{IEEE}},
year = {2022},
url = {https://doi.org/10.1109/ATS56056.2022.00013},
doi = {10.1109/ATS56056.2022.00013},
timestamp = {Wed, 11 Jan 2023 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/ats/YanDZH00W22.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/ats/YehLC22,
author = {Shih{-}Chun Yeh and
Kuen{-}Jong Lee and
Dong{-}Yi Chen},
title = {An Authentication-Based Secure {IJTAG} Network},
booktitle = {{IEEE} 31st Asian Test Symposium, {ATS} 2022, Taichung City, Taiwan,
November 21-24, 2022},
pages = {25--30},
publisher = {{IEEE}},
year = {2022},
url = {https://doi.org/10.1109/ATS56056.2022.00017},
doi = {10.1109/ATS56056.2022.00017},
timestamp = {Wed, 11 Jan 2023 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/ats/YehLC22.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/ats/ZhuJS22,
author = {Weidong Zhu and
Jianhui Jiang and
Zhanhui Shi},
title = {Locating Critical-Reliability Gates for Sequential Circuits based
on the Time Window Graph Model},
booktitle = {{IEEE} 31st Asian Test Symposium, {ATS} 2022, Taichung City, Taiwan,
November 21-24, 2022},
pages = {7--12},
publisher = {{IEEE}},
year = {2022},
url = {https://doi.org/10.1109/ATS56056.2022.00014},
doi = {10.1109/ATS56056.2022.00014},
timestamp = {Mon, 05 Feb 2024 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/ats/ZhuJS22.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@proceedings{DBLP:conf/ats/2022,
title = {{IEEE} 31st Asian Test Symposium, {ATS} 2022, Taichung City, Taiwan,
November 21-24, 2022},
publisher = {{IEEE}},
year = {2022},
url = {https://doi.org/10.1109/ATS56056.2022},
doi = {10.1109/ATS56056.2022},
isbn = {978-1-6654-7227-2},
timestamp = {Wed, 11 Jan 2023 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/ats/2022.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/ats/AlmeidaARP21,
author = {Felipe Almeida and
Levent Aksoy and
Jaan Raik and
Samuel Pagliarini},
title = {Side-Channel Attacks on Triple Modular Redundancy Schemes},
booktitle = {30th {IEEE} Asian Test Symposium, {ATS} 2021, Matsuyama, Ehime, Japan,
November 22-25, 2021},
pages = {79--84},
publisher = {{IEEE}},
year = {2021},
url = {https://doi.org/10.1109/ATS52891.2021.00026},
doi = {10.1109/ATS52891.2021.00026},
timestamp = {Sat, 09 Apr 2022 01:00:00 +0200},
biburl = {https://dblp.org/rec/conf/ats/AlmeidaARP21.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/ats/ChiLJ21,
author = {Hung{-}Yao Chi and
Kuen{-}Jong Lee and
Tzu{-}Chun Jao},
title = {Lightweight Hardware-Based Memory Protection Mechanism on IoT Processors},
booktitle = {30th {IEEE} Asian Test Symposium, {ATS} 2021, Matsuyama, Ehime, Japan,
November 22-25, 2021},
pages = {13--18},
publisher = {{IEEE}},
year = {2021},
url = {https://doi.org/10.1109/ATS52891.2021.00015},
doi = {10.1109/ATS52891.2021.00015},
timestamp = {Mon, 17 Jan 2022 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/ats/ChiLJ21.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/ats/CruzVDRH21,
author = {William Souza da Cruz and
Raphael Andreoni Camponogara Viera and
Jean{-}Max Dutertre and
Jean{-}Baptiste Rigaud and
Guillaume Hubert},
title = {Further Analysis of Laser-induced IR-drop},
booktitle = {30th {IEEE} Asian Test Symposium, {ATS} 2021, Matsuyama, Ehime, Japan,
November 22-25, 2021},
pages = {91--96},
publisher = {{IEEE}},
year = {2021},
url = {https://doi.org/10.1109/ATS52891.2021.00028},
doi = {10.1109/ATS52891.2021.00028},
timestamp = {Tue, 07 May 2024 01:00:00 +0200},
biburl = {https://dblp.org/rec/conf/ats/CruzVDRH21.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/ats/DeligiannisCFPB21,
author = {Nikolaos Ioannis Deligiannis and
Riccardo Cantoro and
Tobias Faller and
Tobias Paxian and
Bernd Becker and
Matteo Sonza Reorda},
title = {Effective SAT-based Solutions for Generating Functional Sequences
Maximizing the Sustained Switching Activity in a Pipelined Processor},
booktitle = {30th {IEEE} Asian Test Symposium, {ATS} 2021, Matsuyama, Ehime, Japan,
November 22-25, 2021},
pages = {73--78},
publisher = {{IEEE}},
year = {2021},
url = {https://doi.org/10.1109/ATS52891.2021.00025},
doi = {10.1109/ATS52891.2021.00025},
timestamp = {Tue, 21 Mar 2023 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/ats/DeligiannisCFPB21.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/ats/FujitaNAF21,
author = {Itsuki Fujita and
Yoshikazu Nagamura and
Masayuki Arai and
Satoshi Fukumoto},
title = {Note on CapsNet-Based Wafer Map Defect Pattern Classification},
booktitle = {30th {IEEE} Asian Test Symposium, {ATS} 2021, Matsuyama, Ehime, Japan,
November 22-25, 2021},
pages = {37--42},
publisher = {{IEEE}},
year = {2021},
url = {https://doi.org/10.1109/ATS52891.2021.00019},
doi = {10.1109/ATS52891.2021.00019},
timestamp = {Sun, 02 Oct 2022 01:00:00 +0200},
biburl = {https://dblp.org/rec/conf/ats/FujitaNAF21.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/ats/GrunhagenBEMFT21,
author = {Arne Gr{\"{u}}nhagen and
Julien Branlard and
Annika Eichler and
Gianluca Martino and
G{\"{o}}rschwin Fey and
Marina Tropmann{-}Frick},
title = {Fault Analysis of the Beam Acceleration Control System at the European
{XFEL} using Data Mining},
booktitle = {30th {IEEE} Asian Test Symposium, {ATS} 2021, Matsuyama, Ehime, Japan,
November 22-25, 2021},
pages = {61--66},
publisher = {{IEEE}},
year = {2021},
url = {https://doi.org/10.1109/ATS52891.2021.00023},
doi = {10.1109/ATS52891.2021.00023},
timestamp = {Sat, 30 Sep 2023 01:00:00 +0200},
biburl = {https://dblp.org/rec/conf/ats/GrunhagenBEMFT21.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/ats/Guerrero-Balaguera21,
author = {Juan{-}David Guerrero{-}Balaguera and
Josie E. Rodriguez Condia and
Matteo Sonza Reorda},
title = {A Novel Compaction Approach for {SBST} Test Programs},
booktitle = {30th {IEEE} Asian Test Symposium, {ATS} 2021, Matsuyama, Ehime, Japan,
November 22-25, 2021},
pages = {67--72},
publisher = {{IEEE}},
year = {2021},
url = {https://doi.org/10.1109/ATS52891.2021.00024},
doi = {10.1109/ATS52891.2021.00024},
timestamp = {Sun, 02 Oct 2022 01:00:00 +0200},
biburl = {https://dblp.org/rec/conf/ats/Guerrero-Balaguera21.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/ats/HandiqueDB21,
author = {Mousum Handique and
Jantindra Kumar Deka and
Santosh Biswas},
title = {Detection of Stuck-at and Bridging Fault in Reversible Circuits using
an Augmented Circuit},
booktitle = {30th {IEEE} Asian Test Symposium, {ATS} 2021, Matsuyama, Ehime, Japan,
November 22-25, 2021},
pages = {55--60},
publisher = {{IEEE}},
year = {2021},
url = {https://doi.org/10.1109/ATS52891.2021.00022},
doi = {10.1109/ATS52891.2021.00022},
timestamp = {Mon, 17 Jan 2022 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/ats/HandiqueDB21.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/ats/HolstBW21,
author = {Stefan Holst and
Lim Bumun and
Xiaoqing Wen},
title = {GPU-Accelerated Timing Simulation of Systolic-Array-Based {AI} Accelerators},
booktitle = {30th {IEEE} Asian Test Symposium, {ATS} 2021, Matsuyama, Ehime, Japan,
November 22-25, 2021},
pages = {127--132},
publisher = {{IEEE}},
year = {2021},
url = {https://doi.org/10.1109/ATS52891.2021.00034},
doi = {10.1109/ATS52891.2021.00034},
timestamp = {Mon, 17 Jan 2022 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/ats/HolstBW21.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/ats/IchiharaYI21,
author = {Hideyuki Ichihara and
Kazunori Yukihiro and
Tomoo Inoue},
title = {A Design of Approximate Voting Schemes for Fail-Operational Systems},
booktitle = {30th {IEEE} Asian Test Symposium, {ATS} 2021, Matsuyama, Ehime, Japan,
November 22-25, 2021},
pages = {121--126},
publisher = {{IEEE}},
year = {2021},
url = {https://doi.org/10.1109/ATS52891.2021.00033},
doi = {10.1109/ATS52891.2021.00033},
timestamp = {Mon, 17 Jan 2022 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/ats/IchiharaYI21.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/ats/IwataMM21,
author = {Hiroyuki Iwata and
Yoichi Maeda and
Jun Matsushima},
title = {A Power Reduction Method for Scan Testing in Ultra-Low Power Designs},
booktitle = {30th {IEEE} Asian Test Symposium, {ATS} 2021, Matsuyama, Ehime, Japan,
November 22-25, 2021},
pages = {141},
publisher = {{IEEE}},
year = {2021},
url = {https://doi.org/10.1109/ATS52891.2021.00037},
doi = {10.1109/ATS52891.2021.00037},
timestamp = {Mon, 17 Jan 2022 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/ats/IwataMM21.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/ats/KatayamaAKAIOK21,
author = {Shogo Katayama and
Yudai Abe and
Anna Kuwana and
Koji Asami and
Masahiro Ishida and
Ryuya Ohta and
Haruo Kobayashi},
title = {Application of Residue Sampling to {RF/AMS} Device Testing},
booktitle = {30th {IEEE} Asian Test Symposium, {ATS} 2021, Matsuyama, Ehime, Japan,
November 22-25, 2021},
pages = {19--24},
publisher = {{IEEE}},
year = {2021},
url = {https://doi.org/10.1109/ATS52891.2021.00016},
doi = {10.1109/ATS52891.2021.00016},
timestamp = {Mon, 17 Jan 2022 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/ats/KatayamaAKAIOK21.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/ats/LinCKG21,
author = {Xijiang Lin and
Wu{-}Tung Cheng and
Takeo Kobayashi and
Andreas Glowatz},
title = {On Modeling {CMOS} Library Cells for Cell Internal Fault Test Pattern
Generation},
booktitle = {30th {IEEE} Asian Test Symposium, {ATS} 2021, Matsuyama, Ehime, Japan,
November 22-25, 2021},
pages = {103--108},
publisher = {{IEEE}},
year = {2021},
url = {https://doi.org/10.1109/ATS52891.2021.00030},
doi = {10.1109/ATS52891.2021.00030},
timestamp = {Mon, 17 Jan 2022 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/ats/LinCKG21.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/ats/LinCXYL21,
author = {Ning Lin and
Xiaoming Chen and
Chunwei Xia and
Jing Ye and
Xiaowei Li},
title = {ChaoPIM: {A} PIM-based Protection Framework for {DNN} Accelerators
Using Chaotic Encryption},
booktitle = {30th {IEEE} Asian Test Symposium, {ATS} 2021, Matsuyama, Ehime, Japan,
November 22-25, 2021},
pages = {1--6},
publisher = {{IEEE}},
year = {2021},
url = {https://doi.org/10.1109/ATS52891.2021.00013},
doi = {10.1109/ATS52891.2021.00013},
timestamp = {Mon, 22 May 2023 01:00:00 +0200},
biburl = {https://dblp.org/rec/conf/ats/LinCXYL21.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/ats/MahzoonD21,
author = {Alireza Mahzoon and
Rolf Drechsler},
title = {Polynomial Formal Verification of Prefix Adders},
booktitle = {30th {IEEE} Asian Test Symposium, {ATS} 2021, Matsuyama, Ehime, Japan,
November 22-25, 2021},
pages = {85--90},
publisher = {{IEEE}},
year = {2021},
url = {https://doi.org/10.1109/ATS52891.2021.00027},
doi = {10.1109/ATS52891.2021.00027},
timestamp = {Sat, 30 Sep 2023 01:00:00 +0200},
biburl = {https://dblp.org/rec/conf/ats/MahzoonD21.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/ats/Pomeranz21,
author = {Irith Pomeranz},
title = {Positive and Negative Extra Clocking of {LFSR} Seeds for Reduced Numbers
of Stored Tests},
booktitle = {30th {IEEE} Asian Test Symposium, {ATS} 2021, Matsuyama, Ehime, Japan,
November 22-25, 2021},
pages = {109--114},
publisher = {{IEEE}},
year = {2021},
url = {https://doi.org/10.1109/ATS52891.2021.00031},
doi = {10.1109/ATS52891.2021.00031},
timestamp = {Mon, 17 Jan 2022 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/ats/Pomeranz21.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/ats/SatoNIOIKOIZWKH21,
author = {Keno Sato and
Takayuki Nakatani and
Takashi Ishida and
Toshiyuki Okamoto and
Tamotsu Ichikawa and
Shogo Katayama and
Gaku Ogihara and
Daisuke Iimori and
Yujie Zhao and
Jianglin Wei and
Anna Kuwana and
Kazumi Hatayama and
Haruo Kobayashi},
title = {High Precision Measurement of Sub-Nano Ampere Current in {ATE} Environment},
booktitle = {30th {IEEE} Asian Test Symposium, {ATS} 2021, Matsuyama, Ehime, Japan,
November 22-25, 2021},
pages = {139--140},
publisher = {{IEEE}},
year = {2021},
url = {https://doi.org/10.1109/ATS52891.2021.00036},
doi = {10.1109/ATS52891.2021.00036},
timestamp = {Mon, 21 Mar 2022 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/ats/SatoNIOIKOIZWKH21.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/ats/ShintaniII21,
author = {Michihiro Shintani and
Mamoru Ishizaka and
Michiko Inoue},
title = {Robust Fault-Tolerant Design Based on Checksum and On-Line Testing
for Memristor Neural Network},
booktitle = {30th {IEEE} Asian Test Symposium, {ATS} 2021, Matsuyama, Ehime, Japan,
November 22-25, 2021},
pages = {25--30},
publisher = {{IEEE}},
year = {2021},
url = {https://doi.org/10.1109/ATS52891.2021.00017},
doi = {10.1109/ATS52891.2021.00017},
timestamp = {Tue, 21 Mar 2023 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/ats/ShintaniII21.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/ats/SootkaneungCH21,
author = {Warin Sootkaneung and
Sasithorn Chookaew and
Suppachai Howimanporn},
title = {Temperature-Aware Evaluation and Mitigation of Logic Soft Errors Under
Circuit Variations},
booktitle = {30th {IEEE} Asian Test Symposium, {ATS} 2021, Matsuyama, Ehime, Japan,
November 22-25, 2021},
pages = {31--36},
publisher = {{IEEE}},
year = {2021},
url = {https://doi.org/10.1109/ATS52891.2021.00018},
doi = {10.1109/ATS52891.2021.00018},
timestamp = {Thu, 23 Jun 2022 01:00:00 +0200},
biburl = {https://dblp.org/rec/conf/ats/SootkaneungCH21.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/ats/TangZYW21,
author = {Yu Tang and
Le Zhao and
Wei Yuan and
Xu Wang},
title = {CausalTester: Measuring the Consistency of Replicated Services via
Causality Semantics},
booktitle = {30th {IEEE} Asian Test Symposium, {ATS} 2021, Matsuyama, Ehime, Japan,
November 22-25, 2021},
pages = {49--54},
publisher = {{IEEE}},
year = {2021},
url = {https://doi.org/10.1109/ATS52891.2021.00021},
doi = {10.1109/ATS52891.2021.00021},
timestamp = {Wed, 05 Apr 2023 01:00:00 +0200},
biburl = {https://dblp.org/rec/conf/ats/TangZYW21.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/ats/TranNCTDM21,
author = {Yen Tran and
Toshihiro Nomura and
Mohamed Salim Cherchali and
Claire Tassin and
Yann Deval and
Cristell Maneux},
title = {Investigation of 0.18{\(\mu\)}m {CMOS} Sensitivity to {BTI} and {HCI}
Mechanisms under Extreme Thermal Stress Conditions},
booktitle = {30th {IEEE} Asian Test Symposium, {ATS} 2021, Matsuyama, Ehime, Japan,
November 22-25, 2021},
pages = {97--102},
publisher = {{IEEE}},
year = {2021},
url = {https://doi.org/10.1109/ATS52891.2021.00029},
doi = {10.1109/ATS52891.2021.00029},
timestamp = {Mon, 17 Jan 2022 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/ats/TranNCTDM21.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/ats/WangWJTYH21,
author = {Zhendong Wang and
Rujia Wang and
Zihang Jiang and
Xulong Tang and
Shouyi Yin and
Yang Hu},
title = {Towards a Secure Integrated Heterogeneous Platform via Cooperative
{CPU/GPU} Encryption},
booktitle = {30th {IEEE} Asian Test Symposium, {ATS} 2021, Matsuyama, Ehime, Japan,
November 22-25, 2021},
pages = {115--120},
publisher = {{IEEE}},
year = {2021},
url = {https://doi.org/10.1109/ATS52891.2021.00032},
doi = {10.1109/ATS52891.2021.00032},
timestamp = {Tue, 07 May 2024 01:00:00 +0200},
biburl = {https://dblp.org/rec/conf/ats/WangWJTYH21.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/ats/XuCS21,
author = {Qizhen Xu and
Liwei Chen and
Gang Shi},
title = {Twine Stack: {A} Hybrid Mechanism Achieving Less Cost for Return Address
Protection},
booktitle = {30th {IEEE} Asian Test Symposium, {ATS} 2021, Matsuyama, Ehime, Japan,
November 22-25, 2021},
pages = {7--12},
publisher = {{IEEE}},
year = {2021},
url = {https://doi.org/10.1109/ATS52891.2021.00014},
doi = {10.1109/ATS52891.2021.00014},
timestamp = {Mon, 17 Jan 2022 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/ats/XuCS21.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/ats/YangLC21,
author = {Dun{-}An Yang and
Jing{-}Jia Liou and
Harry H. Chen},
title = {Analyzing Transient Faults and Functional Error Rates of a {RISC-V}
Core: {A} Case Study},
booktitle = {30th {IEEE} Asian Test Symposium, {ATS} 2021, Matsuyama, Ehime, Japan,
November 22-25, 2021},
pages = {133--138},
publisher = {{IEEE}},
year = {2021},
url = {https://doi.org/10.1109/ATS52891.2021.00035},
doi = {10.1109/ATS52891.2021.00035},
timestamp = {Mon, 17 Jan 2022 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/ats/YangLC21.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/ats/YeLSLL21,
author = {Yunying Ye and
Shan Li and
Haihua Shen and
Huawei Li and
Xiaowei Li},
title = {SeGa: {A} Trojan Detection Method Combined With Gate Semantics},
booktitle = {30th {IEEE} Asian Test Symposium, {ATS} 2021, Matsuyama, Ehime, Japan,
November 22-25, 2021},
pages = {43--48},
publisher = {{IEEE}},
year = {2021},
url = {https://doi.org/10.1109/ATS52891.2021.00020},
doi = {10.1109/ATS52891.2021.00020},
timestamp = {Thu, 11 May 2023 01:00:00 +0200},
biburl = {https://dblp.org/rec/conf/ats/YeLSLL21.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@proceedings{DBLP:conf/ats/2021,
title = {30th {IEEE} Asian Test Symposium, {ATS} 2021, Matsuyama, Ehime, Japan,
November 22-25, 2021},
publisher = {{IEEE}},
year = {2021},
url = {https://doi.org/10.1109/ATS52891.2021},
doi = {10.1109/ATS52891.2021},
isbn = {978-1-6654-4051-6},
timestamp = {Mon, 17 Jan 2022 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/ats/2021.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/ats/AlamgirAPSG20,
author = {Arbab Alamgir and
Abu Khari bin A'Ain and
Norlina Paraman and
Usman Ullah Sheikh and
Ian Andrew Grout},
title = {A comparative analysis of {LFSR} cascading for hardware efficiency
and high fault coverage in {BIST} applications},
booktitle = {29th {IEEE} Asian Test Symposium, {ATS} 2020, Penang, Malaysia, November
23-26, 2020},
pages = {1--5},
publisher = {{IEEE}},
year = {2020},
url = {https://doi.org/10.1109/ATS49688.2020.9301561},
doi = {10.1109/ATS49688.2020.9301561},
timestamp = {Sat, 30 Sep 2023 01:00:00 +0200},
biburl = {https://dblp.org/rec/conf/ats/AlamgirAPSG20.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/ats/AliBMK20,
author = {Ghazanfar Ali and
Leila Bagheriye and
Hans A. R. Manhaeve and
Hans G. Kerkhoff},
title = {On-chip {EOL} Prognostics Using Data-Fusion of Embedded Instruments
for Dependable MP-SoCs},
booktitle = {29th {IEEE} Asian Test Symposium, {ATS} 2020, Penang, Malaysia, November
23-26, 2020},
pages = {1--6},
publisher = {{IEEE}},
year = {2020},
url = {https://doi.org/10.1109/ATS49688.2020.9301509},
doi = {10.1109/ATS49688.2020.9301509},
timestamp = {Fri, 15 Jan 2021 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/ats/AliBMK20.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/ats/ByambadorjAYHFI20,
author = {Zolboo Byambadorj and
Koji Asami and
Takahiro J. Yamaguchi and
Akio Higo and
Masahiro Fujita and
Tetsuya Iizuka},
title = {Theoretical Analysis on Noise Performance of Modulated Wideband Converters
for Analog Testing},
booktitle = {29th {IEEE} Asian Test Symposium, {ATS} 2020, Penang, Malaysia, November
23-26, 2020},
pages = {1--6},
publisher = {{IEEE}},
year = {2020},
url = {https://doi.org/10.1109/ATS49688.2020.9301596},
doi = {10.1109/ATS49688.2020.9301596},
timestamp = {Fri, 15 Jan 2021 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/ats/ByambadorjAYHFI20.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/ats/ChaudhuriBC20,
author = {Arjun Chaudhuri and
Sanmitra Banerjee and
Krishnendu Chakrabarty},
title = {NodeRank: Observation-Point Insertion for Fault Localization in Monolithic
3D ICs\({}^{\mbox{{\({_\ast}\)}}}\)},
booktitle = {29th {IEEE} Asian Test Symposium, {ATS} 2020, Penang, Malaysia, November
23-26, 2020},
pages = {1--6},
publisher = {{IEEE}},
year = {2020},
url = {https://doi.org/10.1109/ATS49688.2020.9301589},
doi = {10.1109/ATS49688.2020.9301589},
timestamp = {Mon, 03 Jan 2022 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/ats/ChaudhuriBC20.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/ats/ChaudhuriLFC20,
author = {Arjun Chaudhuri and
Chunsheng Liu and
Xiaoxin Fan and
Krishnendu Chakrabarty},
title = {C-Testing of {AI} Accelerators \({}^{\mbox{*}}\)},
booktitle = {29th {IEEE} Asian Test Symposium, {ATS} 2020, Penang, Malaysia, November
23-26, 2020},
pages = {1--6},
publisher = {{IEEE}},
year = {2020},
url = {https://doi.org/10.1109/ATS49688.2020.9301581},
doi = {10.1109/ATS49688.2020.9301581},
timestamp = {Mon, 03 Jan 2022 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/ats/ChaudhuriLFC20.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/ats/DuanWS20,
author = {Shengyu Duan and
Peng Wang and
Gaole Sai},
title = {{BTI} Aging Monitoring based on {SRAM} Start-up Behavior},
booktitle = {29th {IEEE} Asian Test Symposium, {ATS} 2020, Penang, Malaysia, November
23-26, 2020},
pages = {1--6},
publisher = {{IEEE}},
year = {2020},
url = {https://doi.org/10.1109/ATS49688.2020.9301603},
doi = {10.1109/ATS49688.2020.9301603},
timestamp = {Sat, 30 Sep 2023 01:00:00 +0200},
biburl = {https://dblp.org/rec/conf/ats/DuanWS20.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/ats/GondoMKK20,
author = {Masayuki Gondo and
Yousuke Miyake and
Takaaki Kato and
Seiji Kajihara},
title = {On Evaluation for Aging-Tolerant Ring Oscillators with Accelerated
Life Test And Its Application to {A} Digital Sensor},
booktitle = {29th {IEEE} Asian Test Symposium, {ATS} 2020, Penang, Malaysia, November
23-26, 2020},
pages = {1--6},
publisher = {{IEEE}},
year = {2020},
url = {https://doi.org/10.1109/ATS49688.2020.9301588},
doi = {10.1109/ATS49688.2020.9301588},
timestamp = {Fri, 09 Apr 2021 01:00:00 +0200},
biburl = {https://dblp.org/rec/conf/ats/GondoMKK20.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/ats/Hachiya20,
author = {Koutaro Hachiya},
title = {A Method to Detect Open Defects in Wire Segments of On-Chip Power
Grids},
booktitle = {29th {IEEE} Asian Test Symposium, {ATS} 2020, Penang, Malaysia, November
23-26, 2020},
pages = {1--6},
publisher = {{IEEE}},
year = {2020},
url = {https://doi.org/10.1109/ATS49688.2020.9301528},
doi = {10.1109/ATS49688.2020.9301528},
timestamp = {Fri, 15 Jan 2021 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/ats/Hachiya20.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/ats/HuHYYKC20,
author = {Jian Hu and
Yongyang Hu and
Long Yu and
Haitao Yang and
Yun Kang and
Jie Cheng},
title = {Validating {GCSE} in the scheduling of high-level synthesis},
booktitle = {29th {IEEE} Asian Test Symposium, {ATS} 2020, Penang, Malaysia, November
23-26, 2020},
pages = {1--6},
publisher = {{IEEE}},
year = {2020},
url = {https://doi.org/10.1109/ATS49688.2020.9301546},
doi = {10.1109/ATS49688.2020.9301546},
timestamp = {Fri, 09 Apr 2021 01:00:00 +0200},
biburl = {https://dblp.org/rec/conf/ats/HuHYYKC20.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/ats/HuWTTZ20,
author = {Wei Hu and
Lingjuan Wu and
Yu Tai and
Jing Tan and
Jiliang Zhang},
title = {A Unified Formal Model for Proving Security and Reliability Properties},
booktitle = {29th {IEEE} Asian Test Symposium, {ATS} 2020, Penang, Malaysia, November
23-26, 2020},
pages = {1--6},
publisher = {{IEEE}},
year = {2020},
url = {https://doi.org/10.1109/ATS49688.2020.9301533},
doi = {10.1109/ATS49688.2020.9301533},
timestamp = {Fri, 09 Apr 2021 01:00:00 +0200},
biburl = {https://dblp.org/rec/conf/ats/HuWTTZ20.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/ats/Huang20,
author = {Shi{-}Yu Huang},
title = {Overview of On-Chip Performance Monitors for Clock Signals},
booktitle = {29th {IEEE} Asian Test Symposium, {ATS} 2020, Penang, Malaysia, November
23-26, 2020},
pages = {1--4},
publisher = {{IEEE}},
year = {2020},
url = {https://doi.org/10.1109/ATS49688.2020.9301612},
doi = {10.1109/ATS49688.2020.9301612},
timestamp = {Fri, 15 Jan 2021 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/ats/Huang20.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/ats/HuangLTW20,
author = {Gary K.{-}C. Huang and
Dave Y.{-}W. Lin and
John Z.{-}L. Tang and
Charles H.{-}P. Wen},
title = {{SDPTA:} Soft-Delay-aware Pattern-based Timing Analysis and Its Path-Fixing
Mechanism},
booktitle = {29th {IEEE} Asian Test Symposium, {ATS} 2020, Penang, Malaysia, November
23-26, 2020},
pages = {1--6},
publisher = {{IEEE}},
year = {2020},
url = {https://doi.org/10.1109/ATS49688.2020.9301512},
doi = {10.1109/ATS49688.2020.9301512},
timestamp = {Fri, 09 Apr 2021 01:00:00 +0200},
biburl = {https://dblp.org/rec/conf/ats/HuangLTW20.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/ats/HungLLC20,
author = {Shao{-}Chun Hung and
Yi{-}Chen Lu and
Sung Kyu Lim and
Krishnendu Chakrabarty},
title = {Power Supply Noise-Aware Scan Test Pattern Reshaping for At-Speed
Delay Fault Testing of Monolithic 3D ICs \({}^{\mbox{*}}\)},
booktitle = {29th {IEEE} Asian Test Symposium, {ATS} 2020, Penang, Malaysia, November
23-26, 2020},
pages = {1--6},
publisher = {{IEEE}},
year = {2020},
url = {https://doi.org/10.1109/ATS49688.2020.9301568},
doi = {10.1109/ATS49688.2020.9301568},
timestamp = {Sun, 02 Oct 2022 01:00:00 +0200},
biburl = {https://dblp.org/rec/conf/ats/HungLLC20.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/ats/IbuchiF20,
author = {Takaaki Ibuchi and
Tsuyoshi Funaki},
title = {{EMI} characterization for power conversion circuit with SiC power
devices},
booktitle = {29th {IEEE} Asian Test Symposium, {ATS} 2020, Penang, Malaysia, November
23-26, 2020},
pages = {1--6},
publisher = {{IEEE}},
year = {2020},
url = {https://doi.org/10.1109/ATS49688.2020.9301613},
doi = {10.1109/ATS49688.2020.9301613},
timestamp = {Fri, 15 Jan 2021 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/ats/IbuchiF20.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/ats/JanickiMSU20,
author = {Jakub Janicki and
Grzegorz Mrugalski and
Artur Stelmach and
Szczepan Urban},
title = {Scan Chain Diagnosis-Driven Test Response Compactor},
booktitle = {29th {IEEE} Asian Test Symposium, {ATS} 2020, Penang, Malaysia, November
23-26, 2020},
pages = {1--6},
publisher = {{IEEE}},
year = {2020},
url = {https://doi.org/10.1109/ATS49688.2020.9301584},
doi = {10.1109/ATS49688.2020.9301584},
timestamp = {Fri, 15 Jan 2021 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/ats/JanickiMSU20.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/ats/KaibarttaBD20,
author = {Tanusree Kaibartta and
G. P. Biswas and
Debesh K. Das},
title = {Heuristic Approach for Identification of Random {TSV} Defects in 3D
{IC} During Pre-bond Testing},
booktitle = {29th {IEEE} Asian Test Symposium, {ATS} 2020, Penang, Malaysia, November
23-26, 2020},
pages = {1--6},
publisher = {{IEEE}},
year = {2020},
url = {https://doi.org/10.1109/ATS49688.2020.9301580},
doi = {10.1109/ATS49688.2020.9301580},
timestamp = {Fri, 15 Jan 2021 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/ats/KaibarttaBD20.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/ats/KokO20,
author = {Chee Hoo Kok and
Soon Ee Ong},
title = {{CPU} Utilization Micro-Benchmarking for RealTime Workload Modeling},
booktitle = {29th {IEEE} Asian Test Symposium, {ATS} 2020, Penang, Malaysia, November
23-26, 2020},
pages = {1--2},
publisher = {{IEEE}},
year = {2020},
url = {https://doi.org/10.1109/ATS49688.2020.9301524},
doi = {10.1109/ATS49688.2020.9301524},
timestamp = {Fri, 15 Jan 2021 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/ats/KokO20.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/ats/LiTHS20,
author = {Jin{-}Fu Li and
Tsai{-}Ling Tsai and
Chun{-}Lung Hsu and
Chi{-}Tien Sun},
title = {Testing of Configurable 8T SRAMs for In-Memory Computing},
booktitle = {29th {IEEE} Asian Test Symposium, {ATS} 2020, Penang, Malaysia, November
23-26, 2020},
pages = {1--5},
publisher = {{IEEE}},
year = {2020},
url = {https://doi.org/10.1109/ATS49688.2020.9301535},
doi = {10.1109/ATS49688.2020.9301535},
timestamp = {Tue, 17 Oct 2023 01:00:00 +0200},
biburl = {https://dblp.org/rec/conf/ats/LiTHS20.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/ats/LiuWLBN20,
author = {Chih{-}Yan Liu and
Mu{-}Ting Wu and
James Chien{-}Mo Li and
Gaurav Bhargava and
Chris Nigh},
title = {Systematic Hold-time Fault Diagnosis and Failure Debug in Production
Chips},
booktitle = {29th {IEEE} Asian Test Symposium, {ATS} 2020, Penang, Malaysia, November
23-26, 2020},
pages = {1--7},
publisher = {{IEEE}},
year = {2020},
url = {https://doi.org/10.1109/ATS49688.2020.9301504},
doi = {10.1109/ATS49688.2020.9301504},
timestamp = {Mon, 03 Jan 2022 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/ats/LiuWLBN20.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/ats/MorishitaOS20,
author = {Fukashi Morishita and
Masanori Otsuka and
Wataru Saito},
title = {An {ADC} Test Technique With Dual-Path/Multi-Functional Fine Pattern
Generator Realizing High Accuracy Measurement for {CMOS} Image Sensor},
booktitle = {29th {IEEE} Asian Test Symposium, {ATS} 2020, Penang, Malaysia, November
23-26, 2020},
pages = {1--6},
publisher = {{IEEE}},
year = {2020},
url = {https://doi.org/10.1109/ATS49688.2020.9301531},
doi = {10.1109/ATS49688.2020.9301531},
timestamp = {Sun, 02 Oct 2022 01:00:00 +0200},
biburl = {https://dblp.org/rec/conf/ats/MorishitaOS20.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/ats/NakamuraKYNSS20,
author = {Yohei Nakamura and
Naotaka Kuroda and
Atsushi Yamaguchi and
Ken Nakahara and
Michihiro Shintani and
Takashi Sato},
title = {Influence of Device Parameter Variability on Current Sharing of Parallel-Connected
SiC MOSFETs},
booktitle = {29th {IEEE} Asian Test Symposium, {ATS} 2020, Penang, Malaysia, November
23-26, 2020},
pages = {1--6},
publisher = {{IEEE}},
year = {2020},
url = {https://doi.org/10.1109/ATS49688.2020.9301592},
doi = {10.1109/ATS49688.2020.9301592},
timestamp = {Mon, 17 Jun 2024 01:00:00 +0200},
biburl = {https://dblp.org/rec/conf/ats/NakamuraKYNSS20.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/ats/OgiharaNHSIOIKA20,
author = {Gaku Ogihara and
Takayuki Nakatani and
Akemi Hatta and
Keno Sato and
Takashi Ishida and
Toshiyuki Okamoto and
Tamotsu Ichikawa and
Anna Kuwana and
Riho Aoki and
Shogo Katayama and
Jianglin Wei and
Yujie Zhao and
Jianlong Wang and
Kazumi Hatayama and
Haruo Kobayashi},
title = {Summing Node Test Method: Simultaneous Multiple {AC} Characteristics
Testing of Multiple Operational Amplifiers},
booktitle = {29th {IEEE} Asian Test Symposium, {ATS} 2020, Penang, Malaysia, November
23-26, 2020},
pages = {1--6},
publisher = {{IEEE}},
year = {2020},
url = {https://doi.org/10.1109/ATS49688.2020.9301550},
doi = {10.1109/ATS49688.2020.9301550},
timestamp = {Mon, 21 Mar 2022 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/ats/OgiharaNHSIOIKA20.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/ats/PanZGL20,
author = {Yuqian Pan and
Haichun Zhang and
Mingyang Gong and
Zhenglin Liu},
title = {Unexpected Error Explosion in {NAND} Flash Memory: Observations and
Prediction Scheme},
booktitle = {29th {IEEE} Asian Test Symposium, {ATS} 2020, Penang, Malaysia, November
23-26, 2020},
pages = {1--6},
publisher = {{IEEE}},
year = {2020},
url = {https://doi.org/10.1109/ATS49688.2020.9301575},
doi = {10.1109/ATS49688.2020.9301575},
timestamp = {Fri, 15 Jan 2021 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/ats/PanZGL20.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/ats/ParaiGR20,
author = {Manas Kumar Parai and
Kasturi Ghosh and
Hafizur Rahaman},
title = {Potentiality of Data Fusion in Analog Circuit Fault Diagnosis},
booktitle = {29th {IEEE} Asian Test Symposium, {ATS} 2020, Penang, Malaysia, November
23-26, 2020},
pages = {1--6},
publisher = {{IEEE}},
year = {2020},
url = {https://doi.org/10.1109/ATS49688.2020.9301544},
doi = {10.1109/ATS49688.2020.9301544},
timestamp = {Fri, 15 Jan 2021 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/ats/ParaiGR20.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/ats/PolianABBCESSRW20,
author = {Ilia Polian and
Jens Anders and
Steffen Becker and
Paolo Bernardi and
Krishnendu Chakrabarty and
Nourhan Elhamawy and
Matthias Sauer and
Adit D. Singh and
Matteo Sonza Reorda and
Stefan Wagner},
title = {Exploring the Mysteries of System-Level Test},
booktitle = {29th {IEEE} Asian Test Symposium, {ATS} 2020, Penang, Malaysia, November
23-26, 2020},
pages = {1--6},
publisher = {{IEEE}},
year = {2020},
url = {https://doi.org/10.1109/ATS49688.2020.9301557},
doi = {10.1109/ATS49688.2020.9301557},
timestamp = {Mon, 03 Jan 2022 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/ats/PolianABBCESSRW20.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/ats/QuCC20,
author = {Li Qu and
Xiaole Cui and
Xiaoxin Cui},
title = {A Testability Enhancement Method for the Memristor Ratioed Logic Circuits},
booktitle = {29th {IEEE} Asian Test Symposium, {ATS} 2020, Penang, Malaysia, November
23-26, 2020},
pages = {1--6},
publisher = {{IEEE}},
year = {2020},
url = {https://doi.org/10.1109/ATS49688.2020.9301537},
doi = {10.1109/ATS49688.2020.9301537},
timestamp = {Fri, 15 Jan 2021 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/ats/QuCC20.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/ats/SatoNIOIKHK20,
author = {Keno Sato and
Takayuki Nakatani and
Takashi Ishida and
Toshiyuki Okamoto and
Tamotsu Ichikawa and
Anna Kuwana and
Kazumi Hatayama and
Haruo Kobayashi},
title = {Accurate Testing of Precision Voltage Reference by {DC-AC} Conversion},
booktitle = {29th {IEEE} Asian Test Symposium, {ATS} 2020, Penang, Malaysia, November
23-26, 2020},
pages = {1--2},
publisher = {{IEEE}},
year = {2020},
url = {https://doi.org/10.1109/ATS49688.2020.9301558},
doi = {10.1109/ATS49688.2020.9301558},
timestamp = {Mon, 21 Mar 2022 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/ats/SatoNIOIKHK20.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/ats/ShibasakiAAHKK20,
author = {Yukiko Shibasaki and
Koji Asami and
Riho Aoki and
Akemi Hatta and
Anna Kuwana and
Haruo Kobayashi},
title = {Analysis and Design of Multi-Tone Signal Generation Algorithms for
Reducing Crest Factor},
booktitle = {29th {IEEE} Asian Test Symposium, {ATS} 2020, Penang, Malaysia, November
23-26, 2020},
pages = {1--6},
publisher = {{IEEE}},
year = {2020},
url = {https://doi.org/10.1109/ATS49688.2020.9301549},
doi = {10.1109/ATS49688.2020.9301549},
timestamp = {Fri, 15 Jan 2021 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/ats/ShibasakiAAHKK20.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/ats/ShintaniMI20,
author = {Michihiro Shintani and
Tomoki Mino and
Michiko Inoue},
title = {{LBIST-PUF:} An {LBIST} Scheme Towards Efficient Challenge-Response
Pairs Collection and Machine-Learning Attack Tolerance Improvement},
booktitle = {29th {IEEE} Asian Test Symposium, {ATS} 2020, Penang, Malaysia, November
23-26, 2020},
pages = {1--6},
publisher = {{IEEE}},
year = {2020},
url = {https://doi.org/10.1109/ATS49688.2020.9301590},
doi = {10.1109/ATS49688.2020.9301590},
timestamp = {Tue, 21 Mar 2023 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/ats/ShintaniMI20.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/ats/TanC20,
author = {Fern Nee Tan and
Jia Yun Chuah},
title = {Pre-silicon Noise to Timing Test Methodology},
booktitle = {29th {IEEE} Asian Test Symposium, {ATS} 2020, Penang, Malaysia, November
23-26, 2020},
pages = {1--2},
publisher = {{IEEE}},
year = {2020},
url = {https://doi.org/10.1109/ATS49688.2020.9301514},
doi = {10.1109/ATS49688.2020.9301514},
timestamp = {Fri, 15 Jan 2021 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/ats/TanC20.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/ats/USTFS20,
author = {Vinod G. U and
Vineesh V. S. and
Jaynarayan T. Tudu and
Masahiro Fujita and
Virendra Singh},
title = {LUT-based Circuit Approximation with Targeted Error Guarantees},
booktitle = {29th {IEEE} Asian Test Symposium, {ATS} 2020, Penang, Malaysia, November
23-26, 2020},
pages = {1--6},
publisher = {{IEEE}},
year = {2020},
url = {https://doi.org/10.1109/ATS49688.2020.9301574},
doi = {10.1109/ATS49688.2020.9301574},
timestamp = {Fri, 15 Jan 2021 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/ats/USTFS20.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/ats/UedaSIS20,
author = {Aoi Ueda and
Michihiro Shintani and
Michiko Inoue and
Takashi Sato},
title = {Measurement of BTI-induced Threshold Voltage Shift for Power MOSFETs
under Switching Operation},
booktitle = {29th {IEEE} Asian Test Symposium, {ATS} 2020, Penang, Malaysia, November
23-26, 2020},
pages = {1--6},
publisher = {{IEEE}},
year = {2020},
url = {https://doi.org/10.1109/ATS49688.2020.9301598},
doi = {10.1109/ATS49688.2020.9301598},
timestamp = {Mon, 17 Jun 2024 01:00:00 +0200},
biburl = {https://dblp.org/rec/conf/ats/UedaSIS20.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/ats/WangXC20,
author = {Ming Wang and
Jian Xiao and
Zhikuang Cai},
title = {An effective technique preventing differential cryptanalysis attack},
booktitle = {29th {IEEE} Asian Test Symposium, {ATS} 2020, Penang, Malaysia, November
23-26, 2020},
pages = {1--6},
publisher = {{IEEE}},
year = {2020},
url = {https://doi.org/10.1109/ATS49688.2020.9301510},
doi = {10.1109/ATS49688.2020.9301510},
timestamp = {Fri, 15 Jan 2021 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/ats/WangXC20.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/ats/XiaoHFCLC20,
author = {Jiang{-}Tang Xiao and
Ting{-}Shuo Hsu and
Christian M. Fuchs and
Yu{-}Teng Chang and
Jing{-}Jia Liou and
Harry H. Chen},
title = {An ISA-level Accurate Fault Simulator for System-level Fault Analysis},
booktitle = {29th {IEEE} Asian Test Symposium, {ATS} 2020, Penang, Malaysia, November
23-26, 2020},
pages = {1--6},
publisher = {{IEEE}},
year = {2020},
url = {https://doi.org/10.1109/ATS49688.2020.9301547},
doi = {10.1109/ATS49688.2020.9301547},
timestamp = {Fri, 15 Jan 2021 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/ats/XiaoHFCLC20.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/ats/YanCZCNWG20,
author = {Aibin Yan and
Yan Chen and
Jun Zhou and
Jie Cui and
Tianming Ni and
Xiaoqing Wen and
Patrick Girard},
title = {A Sextuple Cross-Coupled {SRAM} Cell Protected against Double-Node
Upsets},
booktitle = {29th {IEEE} Asian Test Symposium, {ATS} 2020, Penang, Malaysia, November
23-26, 2020},
pages = {1--5},
publisher = {{IEEE}},
year = {2020},
url = {https://doi.org/10.1109/ATS49688.2020.9301569},
doi = {10.1109/ATS49688.2020.9301569},
timestamp = {Fri, 15 Jan 2021 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/ats/YanCZCNWG20.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/ats/YangH20,
author = {Jun{-}Yu Yang and
Shi{-}Yu Huang},
title = {Fault and Soft Error Tolerant Delay-Locked Loop},
booktitle = {29th {IEEE} Asian Test Symposium, {ATS} 2020, Penang, Malaysia, November
23-26, 2020},
pages = {1--6},
publisher = {{IEEE}},
year = {2020},
url = {https://doi.org/10.1109/ATS49688.2020.9301553},
doi = {10.1109/ATS49688.2020.9301553},
timestamp = {Fri, 15 Jan 2021 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/ats/YangH20.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/ats/YangYCZLLH20,
author = {Yipei Yang and
Jing Ye and
Yuan Cao and
Jiliang Zhang and
Xiaowei Li and
Huawei Li and
Yu Hu},
title = {Survey: Hardware Trojan Detection for Netlist},
booktitle = {29th {IEEE} Asian Test Symposium, {ATS} 2020, Penang, Malaysia, November
23-26, 2020},
pages = {1--6},
publisher = {{IEEE}},
year = {2020},
url = {https://doi.org/10.1109/ATS49688.2020.9301614},
doi = {10.1109/ATS49688.2020.9301614},
timestamp = {Mon, 22 May 2023 01:00:00 +0200},
biburl = {https://dblp.org/rec/conf/ats/YangYCZLLH20.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/ats/YinO20,
author = {Teo Sje Yin and
Soon Ee Ong},
title = {Artificial Neuron Hardware {IP} Verification},
booktitle = {29th {IEEE} Asian Test Symposium, {ATS} 2020, Penang, Malaysia, November
23-26, 2020},
pages = {1--2},
publisher = {{IEEE}},
year = {2020},
url = {https://doi.org/10.1109/ATS49688.2020.9301543},
doi = {10.1109/ATS49688.2020.9301543},
timestamp = {Fri, 15 Jan 2021 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/ats/YinO20.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/ats/ZhangPHPHLYW20,
author = {Jiliang Zhang and
Shuang Peng and
Yupeng Hu and
Fei Peng and
Wei Hu and
Jinmei Lai and
Jing Ye and
Xiangqi Wang},
title = {{HRAE:} Hardware-assisted Randomization against Adversarial Example
Attacks},
booktitle = {29th {IEEE} Asian Test Symposium, {ATS} 2020, Penang, Malaysia, November
23-26, 2020},
pages = {1--6},
publisher = {{IEEE}},
year = {2020},
url = {https://doi.org/10.1109/ATS49688.2020.9301586},
doi = {10.1109/ATS49688.2020.9301586},
timestamp = {Tue, 23 May 2023 01:00:00 +0200},
biburl = {https://dblp.org/rec/conf/ats/ZhangPHPHLYW20.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/ats/ZhaoCYWCCLL20,
author = {Yixuan Zhao and
Zhiteng Chao and
Jing Ye and
Wen Wang and
Yuan Cao and
Shuai Chen and
Xiaowei Li and
Huawei Li},
title = {Optimization Space Exploration of Hardware Design for {CRYSTALS-KYBER}},
booktitle = {29th {IEEE} Asian Test Symposium, {ATS} 2020, Penang, Malaysia, November
23-26, 2020},
pages = {1--6},
publisher = {{IEEE}},
year = {2020},
url = {https://doi.org/10.1109/ATS49688.2020.9301498},
doi = {10.1109/ATS49688.2020.9301498},
timestamp = {Mon, 22 May 2023 01:00:00 +0200},
biburl = {https://dblp.org/rec/conf/ats/ZhaoCYWCCLL20.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@proceedings{DBLP:conf/ats/2020,
title = {29th {IEEE} Asian Test Symposium, {ATS} 2020, Penang, Malaysia, November
23-26, 2020},
publisher = {{IEEE}},
year = {2020},
url = {https://doi.org/10.1109/ATS49688.2020},
doi = {10.1109/ATS49688.2020},
isbn = {978-1-7281-7467-9},
timestamp = {Fri, 15 Jan 2021 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/ats/2020.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/ats/0001BFS19,
author = {Binod Kumar and
Atul Kumar Bhosale and
Masahiro Fujita and
Virendra Singh},
title = {Validating Multi-Processor Cache Coherence Mechanisms under Diminished
Observability},
booktitle = {28th {IEEE} Asian Test Symposium, {ATS} 2019, Kolkata, India, December
10-13, 2019},
pages = {99--104},
publisher = {{IEEE}},
year = {2019},
url = {https://doi.org/10.1109/ATS47505.2019.00019},
doi = {10.1109/ATS47505.2019.00019},
timestamp = {Tue, 14 Jan 2020 13:20:27 +0100},
biburl = {https://dblp.org/rec/conf/ats/0001BFS19.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/ats/AraujoPMFK19,
author = {Leandro Santiago de Ara{\'{u}}jo and
Vinay C. Patil and
Leandro Augusto Justen Marzulo and
Felipe Maia Galv{\~{a}}o Fran{\c{c}}a and
Sandip Kundu},
title = {Efficient Testing of Physically Unclonable Functions for Uniqueness},
booktitle = {28th {IEEE} Asian Test Symposium, {ATS} 2019, Kolkata, India, December
10-13, 2019},
pages = {117--122},
publisher = {{IEEE}},
year = {2019},
url = {https://doi.org/10.1109/ATS47505.2019.00022},
doi = {10.1109/ATS47505.2019.00022},
timestamp = {Wed, 07 Dec 2022 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/ats/AraujoPMFK19.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/ats/ChakrabortyAM19,
author = {Anirban Chakraborty and
Manaar Alam and
Debdeep Mukhopadhyay},
title = {Deep Learning Based Diagnostics for Rowhammer Protection of {DRAM}
Chips},
booktitle = {28th {IEEE} Asian Test Symposium, {ATS} 2019, Kolkata, India, December
10-13, 2019},
pages = {86--91},
publisher = {{IEEE}},
year = {2019},
url = {https://doi.org/10.1109/ATS47505.2019.00016},
doi = {10.1109/ATS47505.2019.00016},
timestamp = {Tue, 25 Jul 2023 01:00:00 +0200},
biburl = {https://dblp.org/rec/conf/ats/ChakrabortyAM19.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/ats/ChattopadhyayKR19,
author = {Saranyu Chattopadhyay and
Preeti Kumari and
Biswajit Ray and
Rajat Subhra Chakraborty},
title = {Machine Learning Assisted Accurate Estimation of Usage Duration and
Manufacturer for Recycled and Counterfeit Flash Memory Detection},
booktitle = {28th {IEEE} Asian Test Symposium, {ATS} 2019, Kolkata, India, December
10-13, 2019},
pages = {49--54},
publisher = {{IEEE}},
year = {2019},
url = {https://doi.org/10.1109/ATS47505.2019.000-1},
doi = {10.1109/ATS47505.2019.000-1},
timestamp = {Sat, 30 Sep 2023 01:00:00 +0200},
biburl = {https://dblp.org/rec/conf/ats/ChattopadhyayKR19.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/ats/ChenH19,
author = {Ching{-}Yuan Chen and
Jiun{-}Lang Huang},
title = {Reinforcement-Learning-Based Test Program Generation for Software-Based
Self-Test},
booktitle = {28th {IEEE} Asian Test Symposium, {ATS} 2019, Kolkata, India, December
10-13, 2019},
pages = {73--78},
publisher = {{IEEE}},
year = {2019},
url = {https://doi.org/10.1109/ATS47505.2019.00013},
doi = {10.1109/ATS47505.2019.00013},
timestamp = {Tue, 14 Jan 2020 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/ats/ChenH19.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/ats/ChooOIIMDKH19,
author = {Hau Sim Choo and
Chia Yee Ooi and
Michiko Inoue and
Nordinah Ismail and
Mehrdad Moghbel and
Sreedharan Baskara Dass and
Chee Hoo Kok and
Fawnizu Azmadi Hussin},
title = {Machine-Learning-Based Multiple Abstraction-Level Detection of Hardware
Trojan Inserted at Register-Transfer Level},
booktitle = {28th {IEEE} Asian Test Symposium, {ATS} 2019, Kolkata, India, December
10-13, 2019},
pages = {98},
publisher = {{IEEE}},
year = {2019},
url = {https://doi.org/10.1109/ATS47505.2019.00018},
doi = {10.1109/ATS47505.2019.00018},
timestamp = {Thu, 14 Oct 2021 01:00:00 +0200},
biburl = {https://dblp.org/rec/conf/ats/ChooOIIMDKH19.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/ats/ChoudhuryMS19,
author = {Avishek Choudhury and
Brototi Mondal and
Biplab K. Sikdar},
title = {Latency Aware Fault Tolerant Cache in Multicore Using Dynamic Remapping
Clusters},
booktitle = {28th {IEEE} Asian Test Symposium, {ATS} 2019, Kolkata, India, December
10-13, 2019},
pages = {79},
publisher = {{IEEE}},
year = {2019},
url = {https://doi.org/10.1109/ATS47505.2019.00014},
doi = {10.1109/ATS47505.2019.00014},
timestamp = {Tue, 14 Jan 2020 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/ats/ChoudhuryMS19.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/ats/DebD19,
author = {Arighna Deb and
Debesh K. Das},
title = {Detailed Fault Model for Physical Quantum Circuits},
booktitle = {28th {IEEE} Asian Test Symposium, {ATS} 2019, Kolkata, India, December
10-13, 2019},
pages = {153--158},
publisher = {{IEEE}},
year = {2019},
url = {https://doi.org/10.1109/ATS47505.2019.00028},
doi = {10.1109/ATS47505.2019.00028},
timestamp = {Tue, 14 Jan 2020 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/ats/DebD19.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/ats/DrechlserG19,
author = {Rolf Drechsler and
Daniel Gro{\ss}e},
title = {Ensuring Correctness of Next Generation Devices: From Reconfigurable
to Self-Learning Systems},
booktitle = {28th {IEEE} Asian Test Symposium, {ATS} 2019, Kolkata, India, December
10-13, 2019},
pages = {159--164},
publisher = {{IEEE}},
year = {2019},
url = {https://doi.org/10.1109/ATS47505.2019.00029},
doi = {10.1109/ATS47505.2019.00029},
timestamp = {Thu, 25 Mar 2021 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/ats/DrechlserG19.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/ats/GhoshMCRG19,
author = {Sourav Ghosh and
Dolan Maity and
Arijit Chowdhury and
Surajit Kumar Roy and
Chandan Giri},
title = {Iterative Parallel Test to Detect and Diagnose Multiple Defects for
Digital Microfluidic Biochip},
booktitle = {28th {IEEE} Asian Test Symposium, {ATS} 2019, Kolkata, India, December
10-13, 2019},
pages = {147--152},
publisher = {{IEEE}},
year = {2019},
url = {https://doi.org/10.1109/ATS47505.2019.00027},
doi = {10.1109/ATS47505.2019.00027},
timestamp = {Tue, 14 Jan 2020 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/ats/GhoshMCRG19.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/ats/HiramotoOT19,
author = {Yushiro Hiramoto and
Satoshi Ohtake and
Hiroshi Takahashi},
title = {A Built-In Self-Diagnostic Mechanism for Delay Faults Based on Self-Generation
of Expected Signatures},
booktitle = {28th {IEEE} Asian Test Symposium, {ATS} 2019, Kolkata, India, December
10-13, 2019},
pages = {31--36},
publisher = {{IEEE}},
year = {2019},
url = {https://doi.org/10.1109/ATS47505.2019.000-4},
doi = {10.1109/ATS47505.2019.000-4},
timestamp = {Tue, 14 Jan 2020 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/ats/HiramotoOT19.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/ats/Huang19,
author = {Tsung{-}Chu Huang},
title = {Self-Checking Residue Number System for Low-Power Reliable Neural
Network},
booktitle = {28th {IEEE} Asian Test Symposium, {ATS} 2019, Kolkata, India, December
10-13, 2019},
pages = {37--42},
publisher = {{IEEE}},
year = {2019},
url = {https://doi.org/10.1109/ATS47505.2019.000-3},
doi = {10.1109/ATS47505.2019.000-3},
timestamp = {Tue, 14 Jan 2020 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/ats/Huang19.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/ats/KokOIMDCIH19,
author = {Chee Hoo Kok and
Chia Yee Ooi and
Michiko Inoue and
Mehrdad Moghbel and
Sreedharan Baskara Dass and
Hau Sim Choo and
Nordinah Ismail and
Fawnizu Azmadi Hussin},
title = {Net Classification Based on Testability and Netlist Structural Features
for Hardware Trojan Detection},
booktitle = {28th {IEEE} Asian Test Symposium, {ATS} 2019, Kolkata, India, December
10-13, 2019},
pages = {105--110},
publisher = {{IEEE}},
year = {2019},
url = {https://doi.org/10.1109/ATS47505.2019.00020},
doi = {10.1109/ATS47505.2019.00020},
timestamp = {Thu, 14 Oct 2021 01:00:00 +0200},
biburl = {https://dblp.org/rec/conf/ats/KokOIMDCIH19.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/ats/KumarDKKCM19,
author = {Vinay B. Y. Kumar and
Suman Deb and
Rupesh Kumar and
Mustafa Khairallah and
Anupam Chattopadhyay and
Avi Mendelson},
title = {Recruiting Fault Tolerance Techniques for Microprocessor Security},
booktitle = {28th {IEEE} Asian Test Symposium, {ATS} 2019, Kolkata, India, December
10-13, 2019},
pages = {80--85},
publisher = {{IEEE}},
year = {2019},
url = {https://doi.org/10.1109/ATS47505.2019.00015},
doi = {10.1109/ATS47505.2019.00015},
timestamp = {Tue, 07 May 2024 01:00:00 +0200},
biburl = {https://dblp.org/rec/conf/ats/KumarDKKCM19.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/ats/LuSSL019,
author = {Renjie Lu and
Haihua Shen and
Yu Su and
Huawei Li and
Xiaowei Li},
title = {GramsDet: Hardware Trojan Detection Based on Recurrent Neural Network},
booktitle = {28th {IEEE} Asian Test Symposium, {ATS} 2019, Kolkata, India, December
10-13, 2019},
pages = {111--116},
publisher = {{IEEE}},
year = {2019},
url = {https://doi.org/10.1109/ATS47505.2019.00021},
doi = {10.1109/ATS47505.2019.00021},
timestamp = {Thu, 11 May 2023 01:00:00 +0200},
biburl = {https://dblp.org/rec/conf/ats/LuSSL019.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/ats/MillicanSRA19,
author = {Spencer K. Millican and
Yang Sun and
Soham Roy and
Vishwani D. Agrawal},
title = {Applying Neural Networks to Delay Fault Testing: Test Point Insertion
and Random Circuit Training},
booktitle = {28th {IEEE} Asian Test Symposium, {ATS} 2019, Kolkata, India, December
10-13, 2019},
pages = {13--18},
publisher = {{IEEE}},
year = {2019},
url = {https://doi.org/10.1109/ATS47505.2019.000-7},
doi = {10.1109/ATS47505.2019.000-7},
timestamp = {Tue, 14 Jan 2020 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/ats/MillicanSRA19.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/ats/MomtazC19,
author = {Md Imran Momtaz and
Abhijit Chatterjee},
title = {Hierarchical State Space Checks for Errors in Sensors, Actuators and
Control of Nonlinear Systems: Diagnosis and Compensation},
booktitle = {28th {IEEE} Asian Test Symposium, {ATS} 2019, Kolkata, India, December
10-13, 2019},
pages = {141--146},
publisher = {{IEEE}},
year = {2019},
url = {https://doi.org/10.1109/ATS47505.2019.00026},
doi = {10.1109/ATS47505.2019.00026},
timestamp = {Tue, 14 Jan 2020 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/ats/MomtazC19.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/ats/MondalCPSB19,
author = {Manobendra Nath Mondal and
Animesh Basak Chowdhury and
Manjari Pradhan and
Susmita Sur{-}Kolay and
Bhargab B. Bhattacharya},
title = {Fault Coverage of a Test Set on Structure-Preserving Siblings of a
Circuit-Under-Test},
booktitle = {28th {IEEE} Asian Test Symposium, {ATS} 2019, Kolkata, India, December
10-13, 2019},
pages = {25--30},
publisher = {{IEEE}},
year = {2019},
url = {https://doi.org/10.1109/ATS47505.2019.000-5},
doi = {10.1109/ATS47505.2019.000-5},
timestamp = {Tue, 07 May 2024 01:00:00 +0200},
biburl = {https://dblp.org/rec/conf/ats/MondalCPSB19.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/ats/MuduliS19,
author = {Sujit Kumar Muduli and
Pramod Subramanyan},
title = {Towards Verifiably Secure Systems-on-Chip Platforms},
booktitle = {28th {IEEE} Asian Test Symposium, {ATS} 2019, Kolkata, India, December
10-13, 2019},
pages = {92--97},
publisher = {{IEEE}},
year = {2019},
url = {https://doi.org/10.1109/ATS47505.2019.00017},
doi = {10.1109/ATS47505.2019.00017},
timestamp = {Tue, 14 Jan 2020 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/ats/MuduliS19.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/ats/OzenO19,
author = {Elbruz Ozen and
Alex Orailoglu},
title = {Sanity-Check: Boosting the Reliability of Safety-Critical Deep Neural
Network Applications},
booktitle = {28th {IEEE} Asian Test Symposium, {ATS} 2019, Kolkata, India, December
10-13, 2019},
pages = {7--12},
publisher = {{IEEE}},
year = {2019},
url = {https://doi.org/10.1109/ATS47505.2019.000-8},
doi = {10.1109/ATS47505.2019.000-8},
timestamp = {Thu, 14 Oct 2021 01:00:00 +0200},
biburl = {https://dblp.org/rec/conf/ats/OzenO19.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/ats/RohanBK19,
author = {Aditya Rohan and
Kanad Basu and
Ramesh Karri},
title = {Can Monitoring System State + Counting Custom Instruction Sequences
Aid Malware Detection?},
booktitle = {28th {IEEE} Asian Test Symposium, {ATS} 2019, Kolkata, India, December
10-13, 2019},
pages = {61--66},
publisher = {{IEEE}},
year = {2019},
url = {https://doi.org/10.1109/ATS47505.2019.00007},
doi = {10.1109/ATS47505.2019.00007},
timestamp = {Mon, 15 Jun 2020 01:00:00 +0200},
biburl = {https://dblp.org/rec/conf/ats/RohanBK19.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/ats/S0SJBS19,
author = {Vineesh V. S. and
Binod Kumar and
Rushikesh Shinde and
Akshay Jaiswal and
Harsh Bhargava and
Virendra Singh},
title = {Orion: {A} Technique to Prune State Space Search Directions for Guidance-Based
Formal Verification},
booktitle = {28th {IEEE} Asian Test Symposium, {ATS} 2019, Kolkata, India, December
10-13, 2019},
pages = {123--128},
publisher = {{IEEE}},
year = {2019},
url = {https://doi.org/10.1109/ATS47505.2019.00023},
doi = {10.1109/ATS47505.2019.00023},
timestamp = {Tue, 14 Jan 2020 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/ats/S0SJBS19.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/ats/SanyalPDB19,
author = {Sayandeep Sanyal and
Amit Patra and
Pallab Dasgupta and
Mayukh Bhattacharya},
title = {A Structured Approach for Rapid Identification of Fault-Sensitive
Nets in Analog Circuits},
booktitle = {28th {IEEE} Asian Test Symposium, {ATS} 2019, Kolkata, India, December
10-13, 2019},
pages = {135--140},
publisher = {{IEEE}},
year = {2019},
url = {https://doi.org/10.1109/ATS47505.2019.00025},
doi = {10.1109/ATS47505.2019.00025},
timestamp = {Tue, 14 Jan 2020 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/ats/SanyalPDB19.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/ats/SilvaBH019,
author = {Felipe Augusto da Silva and
Ahmet Cagri Bagbaba and
Said Hamdioui and
Christian Sauer},
title = {Combining Fault Analysis Technologies for {ISO26262} Functional Safety
Verification},
booktitle = {28th {IEEE} Asian Test Symposium, {ATS} 2019, Kolkata, India, December
10-13, 2019},
pages = {129--134},
publisher = {{IEEE}},
year = {2019},
url = {https://doi.org/10.1109/ATS47505.2019.00024},
doi = {10.1109/ATS47505.2019.00024},
timestamp = {Sun, 02 Oct 2022 01:00:00 +0200},
biburl = {https://dblp.org/rec/conf/ats/SilvaBH019.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/ats/WangWTCLKP19,
author = {Naixing Wang and
Chen Wang and
Kun{-}Han Tsai and
Wu{-}Tung Cheng and
Xijiang Lin and
Mark Kassab and
Irith Pomeranz},
title = {{TEA:} {A} Test Generation Algorithm for Designs with Timing Exceptions},
booktitle = {28th {IEEE} Asian Test Symposium, {ATS} 2019, Kolkata, India, December
10-13, 2019},
pages = {19--24},
publisher = {{IEEE}},
year = {2019},
url = {https://doi.org/10.1109/ATS47505.2019.000-6},
doi = {10.1109/ATS47505.2019.000-6},
timestamp = {Wed, 22 Jun 2022 01:00:00 +0200},
biburl = {https://dblp.org/rec/conf/ats/WangWTCLKP19.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/ats/Wu0LCVRHY19,
author = {Cheng{-}Hung Wu and
Yu Huang and
Kuen{-}Jong Lee and
Wu{-}Tung Cheng and
Gaurav Veda and
Sudhakar M. Reddy and
Chun{-}Cheng Hu and
Chong{-}Siao Ye},
title = {Deep Learning Based Test Compression Analyzer},
booktitle = {28th {IEEE} Asian Test Symposium, {ATS} 2019, Kolkata, India, December
10-13, 2019},
pages = {1--6},
publisher = {{IEEE}},
year = {2019},
url = {https://doi.org/10.1109/ATS47505.2019.000-9},
doi = {10.1109/ATS47505.2019.000-9},
timestamp = {Thu, 14 Oct 2021 01:00:00 +0200},
biburl = {https://dblp.org/rec/conf/ats/Wu0LCVRHY19.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/ats/YanWLCSY0W19,
author = {Aibin Yan and
Zhen Wu and
Lu Lu and
Zhili Chen and
Jie Song and
Zuobin Ying and
Patrick Girard and
Xiaoqing Wen},
title = {Novel Radiation Hardened Latch Design with Cost-Effectiveness for
Safety-Critical Terrestrial Applications},
booktitle = {28th {IEEE} Asian Test Symposium, {ATS} 2019, Kolkata, India, December
10-13, 2019},
pages = {43--48},
publisher = {{IEEE}},
year = {2019},
url = {https://doi.org/10.1109/ATS47505.2019.000-2},
doi = {10.1109/ATS47505.2019.000-2},
timestamp = {Tue, 14 Jan 2020 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/ats/YanWLCSY0W19.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/ats/YanWZHCYW019,
author = {Aibin Yan and
Zhen Wu and
Jun Zhou and
Yuanjie Hu and
Yan Chen and
Zuobin Ying and
Xiaoqing Wen and
Patrick Girard},
title = {Design of a Sextuple Cross-Coupled {SRAM} Cell with Optimized Access
Operations for Highly Reliable Terrestrial Applications},
booktitle = {28th {IEEE} Asian Test Symposium, {ATS} 2019, Kolkata, India, December
10-13, 2019},
pages = {55--60},
publisher = {{IEEE}},
year = {2019},
url = {https://doi.org/10.1109/ATS47505.2019.00006},
doi = {10.1109/ATS47505.2019.00006},
timestamp = {Mon, 11 May 2020 01:00:00 +0200},
biburl = {https://dblp.org/rec/conf/ats/YanWZHCYW019.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@proceedings{DBLP:conf/ats/2019,
title = {28th {IEEE} Asian Test Symposium, {ATS} 2019, Kolkata, India, December
10-13, 2019},
publisher = {{IEEE}},
year = {2019},
url = {https://ieeexplore.ieee.org/xpl/conhome/8942393/proceeding},
isbn = {978-1-7281-2695-1},
timestamp = {Tue, 14 Jan 2020 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/ats/2019.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/ats/0010SKHW18,
author = {Chang Liu and
Eric Schneider and
Matthias Kampmann and
Sybille Hellebrand and
Hans{-}Joachim Wunderlich},
title = {Extending Aging Monitors for Early Life and Wear-Out Failure Prevention},
booktitle = {27th {IEEE} Asian Test Symposium, {ATS} 2018, Hefei, China, October
15-18, 2018},
pages = {92--97},
publisher = {{IEEE}},
year = {2018},
url = {https://doi.org/10.1109/ATS.2018.00028},
doi = {10.1109/ATS.2018.00028},
timestamp = {Sat, 30 Sep 2023 01:00:00 +0200},
biburl = {https://dblp.org/rec/conf/ats/0010SKHW18.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/ats/ChenLLR18,
author = {Tian Chen and
Chenxin Lin and
Huaguo Liang and
Fuji Ren},
title = {A Dictionary-Based Test Data Compression Method Using Tri-State Coding},
booktitle = {27th {IEEE} Asian Test Symposium, {ATS} 2018, Hefei, China, October
15-18, 2018},
pages = {42--47},
publisher = {{IEEE}},
year = {2018},
url = {https://doi.org/10.1109/ATS.2018.00019},
doi = {10.1109/ATS.2018.00019},
timestamp = {Fri, 24 Mar 2023 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/ats/ChenLLR18.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/ats/ChenWW18,
author = {Meng{-}Chi Chen and
Tsung{-}Hsuan Wu and
Cheng{-}Wen Wu},
title = {A Built-in Self-Test Scheme for Detecting Defects in FinFET-Based
{SRAM} Circuit},
booktitle = {27th {IEEE} Asian Test Symposium, {ATS} 2018, Hefei, China, October
15-18, 2018},
pages = {19--24},
publisher = {{IEEE}},
year = {2018},
url = {https://doi.org/10.1109/ATS.2018.00015},
doi = {10.1109/ATS.2018.00015},
timestamp = {Sat, 30 Sep 2023 01:00:00 +0200},
biburl = {https://dblp.org/rec/conf/ats/ChenWW18.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/ats/CuiZQL18,
author = {Aijiao Cui and
Wei Zhou and
Gang Qu and
Huawei Li},
title = {A New Scheme to Extract {PUF} Information by Scan Chain},
booktitle = {27th {IEEE} Asian Test Symposium, {ATS} 2018, Hefei, China, October
15-18, 2018},
pages = {104--108},
publisher = {{IEEE}},
year = {2018},
url = {https://doi.org/10.1109/ATS.2018.00030},
doi = {10.1109/ATS.2018.00030},
timestamp = {Thu, 11 May 2023 01:00:00 +0200},
biburl = {https://dblp.org/rec/conf/ats/CuiZQL18.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/ats/DuanHZ18,
author = {Shengyu Duan and
Basel Halak and
Mark Zwolinski},
title = {Cell Flipping with Distributed Refresh for Cache Ageing Minimization},
booktitle = {27th {IEEE} Asian Test Symposium, {ATS} 2018, Hefei, China, October
15-18, 2018},
pages = {98--103},
publisher = {{IEEE}},
year = {2018},
url = {https://doi.org/10.1109/ATS.2018.00029},
doi = {10.1109/ATS.2018.00029},
timestamp = {Sat, 30 Sep 2023 01:00:00 +0200},
biburl = {https://dblp.org/rec/conf/ats/DuanHZ18.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/ats/FuchsMPKW18,
author = {Christian M. Fuchs and
Nadia M. Murillo and
Aske Plaat and
Erik van der Kouwe and
Peng Wang},
title = {Towards Affordable Fault-Tolerant Nanosatellite Computing with Commodity
Hardware},
booktitle = {27th {IEEE} Asian Test Symposium, {ATS} 2018, Hefei, China, October
15-18, 2018},
pages = {127--132},
publisher = {{IEEE}},
year = {2018},
url = {https://doi.org/10.1109/ATS.2018.00034},
doi = {10.1109/ATS.2018.00034},
timestamp = {Fri, 24 Mar 2023 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/ats/FuchsMPKW18.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/ats/GhoshRG18,
author = {Sourav Ghosh and
Hafizur Rahaman and
Chandan Giri},
title = {Test Diagnosis of Digital Microfluidic Biochips Using Image Segmentation},
booktitle = {27th {IEEE} Asian Test Symposium, {ATS} 2018, Hefei, China, October
15-18, 2018},
pages = {185--190},
publisher = {{IEEE}},
year = {2018},
url = {https://doi.org/10.1109/ATS.2018.00043},
doi = {10.1109/ATS.2018.00043},
timestamp = {Fri, 24 Mar 2023 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/ats/GhoshRG18.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/ats/GuoYGHL18,
author = {Qingli Guo and
Jing Ye and
Yue Gong and
Yu Hu and
Xiaowei Li},
title = {{PUF} Based Pay-Per-Device Scheme for {IP} Protection of {CNN} Model},
booktitle = {27th {IEEE} Asian Test Symposium, {ATS} 2018, Hefei, China, October
15-18, 2018},
pages = {115--120},
publisher = {{IEEE}},
year = {2018},
url = {https://doi.org/10.1109/ATS.2018.00032},
doi = {10.1109/ATS.2018.00032},
timestamp = {Mon, 22 May 2023 01:00:00 +0200},
biburl = {https://dblp.org/rec/conf/ats/GuoYGHL18.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/ats/HanWT18,
author = {Yueying Han and
Xiaoxiao Wang and
Mark M. Tehranipoor},
title = {{CIPA:} Concurrent {IC} and {PCB} Authentication Using On-chip Ring
Oscillator Array},
booktitle = {27th {IEEE} Asian Test Symposium, {ATS} 2018, Hefei, China, October
15-18, 2018},
pages = {109--114},
publisher = {{IEEE}},
year = {2018},
url = {https://doi.org/10.1109/ATS.2018.00031},
doi = {10.1109/ATS.2018.00031},
timestamp = {Fri, 24 Mar 2023 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/ats/HanWT18.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/ats/HiraiYH18,
author = {Satoshi Hirai and
Hiroyuki Yotsuyanagi and
Masaki Hashizume},
title = {Test Time Reduction on Testing Delay Faults in 3D ICs Using Boundary
Scan Design},
booktitle = {27th {IEEE} Asian Test Symposium, {ATS} 2018, Hefei, China, October
15-18, 2018},
pages = {7--12},
publisher = {{IEEE}},
year = {2018},
url = {https://doi.org/10.1109/ATS.2018.00013},
doi = {10.1109/ATS.2018.00013},
timestamp = {Fri, 24 Mar 2023 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/ats/HiraiYH18.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/ats/HouHHK18,
author = {Guan{-}Hao Hou and
Wei{-}Chen Huang and
Jiun{-}Lang Huang and
Terry Kuo},
title = {Design and Implementation of an FPGA-Based 16-Channel Data/Timing
Formatter},
booktitle = {27th {IEEE} Asian Test Symposium, {ATS} 2018, Hefei, China, October
15-18, 2018},
pages = {209--214},
publisher = {{IEEE}},
year = {2018},
url = {https://doi.org/10.1109/ATS.2018.00047},
doi = {10.1109/ATS.2018.00047},
timestamp = {Fri, 24 Mar 2023 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/ats/HouHHK18.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/ats/HuangS18,
author = {Tsung{-}Chu Huang and
Jeffae Schroff},
title = {Precompensation, {BIST} and Analogue Berger Codes for Self-Healing
of Neuromorphic {RRAM}},
booktitle = {27th {IEEE} Asian Test Symposium, {ATS} 2018, Hefei, China, October
15-18, 2018},
pages = {173--178},
publisher = {{IEEE}},
year = {2018},
url = {https://doi.org/10.1109/ATS.2018.00041},
doi = {10.1109/ATS.2018.00041},
timestamp = {Fri, 24 Mar 2023 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/ats/HuangS18.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/ats/HuangZSLYN18,
author = {Zhengfeng Huang and
Yangyang Zhang and
Zian Su and
Huaguo Liang and
Huijie Yao and
Tianming Ni},
title = {A Hybrid {DMR} Latch to Tolerate {MNU} Using {TDICE} and {WDICE}},
booktitle = {27th {IEEE} Asian Test Symposium, {ATS} 2018, Hefei, China, October
15-18, 2018},
pages = {121--126},
publisher = {{IEEE}},
year = {2018},
url = {https://doi.org/10.1109/ATS.2018.00033},
doi = {10.1109/ATS.2018.00033},
timestamp = {Fri, 24 Mar 2023 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/ats/HuangZSLYN18.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/ats/IshizakaSI18,
author = {Mamoru Ishizaka and
Michihiro Shintani and
Michiko Inoue},
title = {Area-Efficient and Reliable Hybrid CMOS/Memristor {ECC} Circuit for
ReRAM Storage},
booktitle = {27th {IEEE} Asian Test Symposium, {ATS} 2018, Hefei, China, October
15-18, 2018},
pages = {167--172},
publisher = {{IEEE}},
year = {2018},
url = {https://doi.org/10.1109/ATS.2018.00040},
doi = {10.1109/ATS.2018.00040},
timestamp = {Fri, 24 Mar 2023 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/ats/IshizakaSI18.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/ats/JiangLHYZL18,
author = {Shuhao Jiang and
Jiajun Li and
Xin He and
Guihai Yan and
Xuan Zhang and
Xiaowei Li},
title = {RiskCap: Minimizing Effort of Error Regulation for Approximate Computing},
booktitle = {27th {IEEE} Asian Test Symposium, {ATS} 2018, Hefei, China, October
15-18, 2018},
pages = {133--138},
publisher = {{IEEE}},
year = {2018},
url = {https://doi.org/10.1109/ATS.2018.00035},
doi = {10.1109/ATS.2018.00035},
timestamp = {Fri, 24 Mar 2023 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/ats/JiangLHYZL18.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/ats/LeiMCSC18,
author = {Jun{-}Yang Lei and
Thomas Moon and
Justin Chow and
Suresh K. Sitaraman and
Abhijit Chatterjee},
title = {A Monobit Built-In Test and Diagnostic System for Flexible Electronic
Interconnect},
booktitle = {27th {IEEE} Asian Test Symposium, {ATS} 2018, Hefei, China, October
15-18, 2018},
pages = {191--196},
publisher = {{IEEE}},
year = {2018},
url = {https://doi.org/10.1109/ATS.2018.00044},
doi = {10.1109/ATS.2018.00044},
timestamp = {Fri, 24 Mar 2023 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/ats/LeiMCSC18.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/ats/LiWLH18,
author = {Jian{-}De Li and
Sying{-}Jyan Wang and
Katherine Shu{-}Min Li and
Tsung{-}Yi Ho},
title = {Digital Rights Management for Paper-Based Microfluidic Biochips},
booktitle = {27th {IEEE} Asian Test Symposium, {ATS} 2018, Hefei, China, October
15-18, 2018},
pages = {179--184},
publisher = {{IEEE}},
year = {2018},
url = {https://doi.org/10.1109/ATS.2018.00042},
doi = {10.1109/ATS.2018.00042},
timestamp = {Fri, 24 Mar 2023 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/ats/LiWLH18.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/ats/LiuWYEWC18,
author = {Peng Liu and
Jigang Wu and
Zhiqiang You and
Michael Elimu and
Weizheng Wang and
Shuo Cai},
title = {Defect Analysis and Parallel March Test Algorithm for 3D Hybrid CMOS-Memristor
Memory},
booktitle = {27th {IEEE} Asian Test Symposium, {ATS} 2018, Hefei, China, October
15-18, 2018},
pages = {25--29},
publisher = {{IEEE}},
year = {2018},
url = {https://doi.org/10.1109/ATS.2018.00016},
doi = {10.1109/ATS.2018.00016},
timestamp = {Fri, 24 Mar 2023 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/ats/LiuWYEWC18.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/ats/LuLM18,
author = {Shyue{-}Kung Lu and
Hui{-}Ping Li and
Kohei Miyase},
title = {Progressive {ECC} Techniques for Phase Change Memory},
booktitle = {27th {IEEE} Asian Test Symposium, {ATS} 2018, Hefei, China, October
15-18, 2018},
pages = {161--166},
publisher = {{IEEE}},
year = {2018},
url = {https://doi.org/10.1109/ATS.2018.00039},
doi = {10.1109/ATS.2018.00039},
timestamp = {Fri, 24 Mar 2023 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/ats/LuLM18.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/ats/MaLYHYXZ18,
author = {Gaoliang Ma and
Huaguo Liang and
Liang Yao and
Zhengfeng Huang and
Maoxiang Yi and
Xiumin Xu and
Kai Zhou},
title = {A Low-Cost High-Efficiency True Random Number Generator on FPGAs},
booktitle = {27th {IEEE} Asian Test Symposium, {ATS} 2018, Hefei, China, October
15-18, 2018},
pages = {54--58},
publisher = {{IEEE}},
year = {2018},
url = {https://doi.org/10.1109/ATS.2018.00021},
doi = {10.1109/ATS.2018.00021},
timestamp = {Fri, 24 Mar 2023 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/ats/MaLYHYXZ18.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/ats/MachidaOAK18,
author = {Kosuke Machida and
Uni Ozawa and
Yudai Abe and
Haruo Kobayashi},
title = {Time-to-Digital Converter Architectures Using Two Oscillators with
Different Frequencies},
booktitle = {27th {IEEE} Asian Test Symposium, {ATS} 2018, Hefei, China, October
15-18, 2018},
pages = {203--208},
publisher = {{IEEE}},
year = {2018},
url = {https://doi.org/10.1109/ATS.2018.00046},
doi = {10.1109/ATS.2018.00046},
timestamp = {Fri, 24 Mar 2023 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/ats/MachidaOAK18.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/ats/MaityRGR18,
author = {Dilip Kumar Maity and
Surajit Kumar Roy and
Chandan Giri and
Hafizur Rahaman},
title = {Identification of Faulty {TSV} with a Built-In Self-Test Mechanism},
booktitle = {27th {IEEE} Asian Test Symposium, {ATS} 2018, Hefei, China, October
15-18, 2018},
pages = {1--6},
publisher = {{IEEE}},
year = {2018},
url = {https://doi.org/10.1109/ATS.2018.00012},
doi = {10.1109/ATS.2018.00012},
timestamp = {Fri, 24 Mar 2023 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/ats/MaityRGR18.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/ats/MajumdarJ18,
author = {Amitava Majumdar and
Balakrishna Jayadev},
title = {Handling Clock-Domain Crossings in Dual Clock-Edge Logic for DFx Features},
booktitle = {27th {IEEE} Asian Test Symposium, {ATS} 2018, Hefei, China, October
15-18, 2018},
pages = {36--41},
publisher = {{IEEE}},
year = {2018},
url = {https://doi.org/10.1109/ATS.2018.00018},
doi = {10.1109/ATS.2018.00018},
timestamp = {Thu, 18 Apr 2024 01:00:00 +0200},
biburl = {https://dblp.org/rec/conf/ats/MajumdarJ18.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/ats/OshimaKWSK18,
author = {Shigeyuki Oshima and
Takaaki Kato and
Senling Wang and
Yasuo Sato and
Seiji Kajihara},
title = {On Flip-Flop Selection for Multi-cycle Scan Test with Partial Observation
in Logic {BIST}},
booktitle = {27th {IEEE} Asian Test Symposium, {ATS} 2018, Hefei, China, October
15-18, 2018},
pages = {30--35},
publisher = {{IEEE}},
year = {2018},
url = {https://doi.org/10.1109/ATS.2018.00017},
doi = {10.1109/ATS.2018.00017},
timestamp = {Fri, 24 Mar 2023 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/ats/OshimaKWSK18.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/ats/OuyangHWYX18,
author = {Yiming Ouyang and
Lizhu Hu and
Yifeng Wu and
Jianfeng Yang and
Kun Xing},
title = {Dynamic Fine-Grain Power Gating Design in WiNoC},
booktitle = {27th {IEEE} Asian Test Symposium, {ATS} 2018, Hefei, China, October
15-18, 2018},
pages = {139--148},
publisher = {{IEEE}},
year = {2018},
url = {https://doi.org/10.1109/ATS.2018.00036},
doi = {10.1109/ATS.2018.00036},
timestamp = {Fri, 24 Mar 2023 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/ats/OuyangHWYX18.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/ats/SasakiZKK18,
author = {Yuto Sasaki and
Yujie Zhao and
Anna Kuwana and
Haruo Kobayashi},
title = {Highly Efficient Waveform Acquisition Condition in Equivalent-Time
Sampling System},
booktitle = {27th {IEEE} Asian Test Symposium, {ATS} 2018, Hefei, China, October
15-18, 2018},
pages = {197--202},
publisher = {{IEEE}},
year = {2018},
url = {https://doi.org/10.1109/ATS.2018.00045},
doi = {10.1109/ATS.2018.00045},
timestamp = {Fri, 24 Mar 2023 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/ats/SasakiZKK18.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/ats/TsengLW18,
author = {Tien{-}Hung Tseng and
Shou{-}Chun Li and
Kai{-}Chiang Wu},
title = {Lifetime Reliability Trojan Based on Exploring Malicious Aging},
booktitle = {27th {IEEE} Asian Test Symposium, {ATS} 2018, Hefei, China, October
15-18, 2018},
pages = {74--79},
publisher = {{IEEE}},
year = {2018},
url = {https://doi.org/10.1109/ATS.2018.00025},
doi = {10.1109/ATS.2018.00025},
timestamp = {Fri, 24 Mar 2023 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/ats/TsengLW18.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/ats/WangAHTIMM18,
author = {Senling Wang and
Tomoki Aono and
Yoshinobu Higami and
Hiroshi Takahashi and
Hiroyuki Iwata and
Yoichi Maeda and
Jun Matsushima},
title = {Capture-Pattern-Control to Address the Fault Detection Degradation
Problem of Multi-cycle Test in Logic {BIST}},
booktitle = {27th {IEEE} Asian Test Symposium, {ATS} 2018, Hefei, China, October
15-18, 2018},
pages = {155--160},
publisher = {{IEEE}},
year = {2018},
url = {https://doi.org/10.1109/ATS.2018.00038},
doi = {10.1109/ATS.2018.00038},
timestamp = {Fri, 24 Mar 2023 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/ats/WangAHTIMM18.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/ats/WuKL18,
author = {Chia{-}Chi Wu and
Man{-}Hsuan Kuo and
Kuen{-}Jong Lee},
title = {A Dynamic-Key Secure Scan Structure Against Scan-Based Side Channel
and Memory Cold Boot Attacks},
booktitle = {27th {IEEE} Asian Test Symposium, {ATS} 2018, Hefei, China, October
15-18, 2018},
pages = {48--53},
publisher = {{IEEE}},
year = {2018},
url = {https://doi.org/10.1109/ATS.2018.00020},
doi = {10.1109/ATS.2018.00020},
timestamp = {Fri, 24 Mar 2023 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/ats/WuKL18.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/ats/XuLZMHYNL18,
author = {Xiumin Xu and
Huaguo Liang and
Kai Zhou and
Gaoliang Ma and
Zhengfeng Huang and
Maoxiang Yi and
Tianming Ni and
Yingchun Lu},
title = {An All-Digital and Jitter-Quantizing True Random Number Generator
in SRAM-Based FPGAs},
booktitle = {27th {IEEE} Asian Test Symposium, {ATS} 2018, Hefei, China, October
15-18, 2018},
pages = {59--62},
publisher = {{IEEE}},
year = {2018},
url = {https://doi.org/10.1109/ATS.2018.00022},
doi = {10.1109/ATS.2018.00022},
timestamp = {Fri, 24 Mar 2023 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/ats/XuLZMHYNL18.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/ats/YanLYCY18,
author = {Aibin Yan and
Yafei Ling and
Kang Yang and
Zhili Chen and
Maoxiang Yi},
title = {Aging-Temperature-and-Propagation Induced Pulse-Broadening Aware Soft
Error Rate Estimation for nano-Scale {CMOS}},
booktitle = {27th {IEEE} Asian Test Symposium, {ATS} 2018, Hefei, China, October
15-18, 2018},
pages = {86--91},
publisher = {{IEEE}},
year = {2018},
url = {https://doi.org/10.1109/ATS.2018.00027},
doi = {10.1109/ATS.2018.00027},
timestamp = {Fri, 24 Mar 2023 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/ats/YanLYCY18.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/ats/YeH018,
author = {Jing Ye and
Yu Hu and
Xiaowei Li},
title = {Hardware Trojan in {FPGA} {CNN} Accelerator},
booktitle = {27th {IEEE} Asian Test Symposium, {ATS} 2018, Hefei, China, October
15-18, 2018},
pages = {68--73},
publisher = {{IEEE}},
year = {2018},
url = {https://doi.org/10.1109/ATS.2018.00024},
doi = {10.1109/ATS.2018.00024},
timestamp = {Mon, 22 May 2023 01:00:00 +0200},
biburl = {https://dblp.org/rec/conf/ats/YeH018.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/ats/ZhangWHMKWQ18,
author = {Yucong Zhang and
Xiaoqing Wen and
Stefan Holst and
Kohei Miyase and
Seiji Kajihara and
Hans{-}Joachim Wunderlich and
Jun Qian},
title = {Clock-Skew-Aware Scan Chain Grouping for Mitigating Shift Timing Failures
in Low-Power Scan Testing},
booktitle = {27th {IEEE} Asian Test Symposium, {ATS} 2018, Hefei, China, October
15-18, 2018},
pages = {149--154},
publisher = {{IEEE}},
year = {2018},
url = {https://doi.org/10.1109/ATS.2018.00037},
doi = {10.1109/ATS.2018.00037},
timestamp = {Fri, 24 Mar 2023 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/ats/ZhangWHMKWQ18.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/ats/ZhaoSLL18,
author = {Wei Zhao and
Haihua Shen and
Huawei Li and
Xiaowei Li},
title = {Hardware Trojan Detection Based on Signal Correlation},
booktitle = {27th {IEEE} Asian Test Symposium, {ATS} 2018, Hefei, China, October
15-18, 2018},
pages = {80--85},
publisher = {{IEEE}},
year = {2018},
url = {https://doi.org/10.1109/ATS.2018.00026},
doi = {10.1109/ATS.2018.00026},
timestamp = {Thu, 11 May 2023 01:00:00 +0200},
biburl = {https://dblp.org/rec/conf/ats/ZhaoSLL18.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/ats/ZhouLJHYXY18,
author = {Kai Zhou and
Huaguo Liang and
Yue Jiang and
Zhengfeng Huang and
Maoxiang Yi and
Xiumin Xu and
Yao Yao},
title = {A High Reliability {FPGA} Chip Identification Generator Based on PDLs},
booktitle = {27th {IEEE} Asian Test Symposium, {ATS} 2018, Hefei, China, October
15-18, 2018},
pages = {63--67},
publisher = {{IEEE}},
year = {2018},
url = {https://doi.org/10.1109/ATS.2018.00023},
doi = {10.1109/ATS.2018.00023},
timestamp = {Fri, 24 Mar 2023 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/ats/ZhouLJHYXY18.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/ats/ZhuCXHS18,
author = {Aijun Zhu and
Duanyong Chen and
Chuan{-}pei Xu and
Cong Hu and
Aiguo Song},
title = {A Fault Check Graph Approach for Photonic Router in Network on Chip},
booktitle = {27th {IEEE} Asian Test Symposium, {ATS} 2018, Hefei, China, October
15-18, 2018},
pages = {13--18},
publisher = {{IEEE}},
year = {2018},
url = {https://doi.org/10.1109/ATS.2018.00014},
doi = {10.1109/ATS.2018.00014},
timestamp = {Fri, 24 Mar 2023 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/ats/ZhuCXHS18.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@proceedings{DBLP:conf/ats/2018,
title = {27th {IEEE} Asian Test Symposium, {ATS} 2018, Hefei, China, October
15-18, 2018},
publisher = {{IEEE}},
year = {2018},
url = {https://ieeexplore.ieee.org/xpl/conhome/8566099/proceeding},
isbn = {978-1-5386-9466-4},
timestamp = {Wed, 16 Oct 2019 01:00:00 +0200},
biburl = {https://dblp.org/rec/conf/ats/2018.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/ats/AhlawatVTS17,
author = {Satyadev Ahlawat and
Darshit Vaghani and
Jaynarayan T. Tudu and
Virendra Singh},
title = {On Securing Scan Design from Scan-Based Side-Channel Attacks},
booktitle = {26th {IEEE} Asian Test Symposium, {ATS} 2017, Taipei City, Taiwan,
November 27-30, 2017},
pages = {58--63},
publisher = {{IEEE} Computer Society},
year = {2017},
url = {https://doi.org/10.1109/ATS.2017.23},
doi = {10.1109/ATS.2017.23},
timestamp = {Fri, 24 Mar 2023 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/ats/AhlawatVTS17.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/ats/AndjelkovicKKVS17,
author = {Marko S. Andjelkovic and
Milos Krstic and
Rolf Kraemer and
Varadan Savulimedu Veeravalli and
Andreas Steininger},
title = {A Critical Charge Model for Estimating the {SET} and {SEU} Sensitivity:
{A} Muller C-Element Case Study},
booktitle = {26th {IEEE} Asian Test Symposium, {ATS} 2017, Taipei City, Taiwan,
November 27-30, 2017},
pages = {82--87},
publisher = {{IEEE} Computer Society},
year = {2017},
url = {https://doi.org/10.1109/ATS.2017.27},
doi = {10.1109/ATS.2017.27},
timestamp = {Mon, 05 Feb 2024 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/ats/AndjelkovicKKVS17.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/ats/ChangYLC17,
author = {Chih{-}Ming Chang and
Kai{-}Jie Yang and
James Chien{-}Mo Li and
Hung Chen},
title = {Test Pattern Compression for Probabilistic Circuits},
booktitle = {26th {IEEE} Asian Test Symposium, {ATS} 2017, Taipei City, Taiwan,
November 27-30, 2017},
pages = {23--27},
publisher = {{IEEE} Computer Society},
year = {2017},
url = {https://doi.org/10.1109/ATS.2017.17},
doi = {10.1109/ATS.2017.17},
timestamp = {Fri, 24 Mar 2023 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/ats/ChangYLC17.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/ats/ChaoLSWL17,
author = {Huina Chao and
Huawei Li and
Xiaoyu Song and
Tiancheng Wang and
Xiaowei Li},
title = {On Evaluating and Constraining Assertions Using Conflicts in Absent
Scenarios},
booktitle = {26th {IEEE} Asian Test Symposium, {ATS} 2017, Taipei City, Taiwan,
November 27-30, 2017},
pages = {195--200},
publisher = {{IEEE} Computer Society},
year = {2017},
url = {https://doi.org/10.1109/ATS.2017.45},
doi = {10.1109/ATS.2017.45},
timestamp = {Thu, 11 May 2023 01:00:00 +0200},
biburl = {https://dblp.org/rec/conf/ats/ChaoLSWL17.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/ats/Chen17,
author = {Yung{-}Chih Chen},
title = {Tree-Based Logic Encryption for Resisting {SAT} Attack},
booktitle = {26th {IEEE} Asian Test Symposium, {ATS} 2017, Taipei City, Taiwan,
November 27-30, 2017},
pages = {46--51},
publisher = {{IEEE} Computer Society},
year = {2017},
url = {https://doi.org/10.1109/ATS.2017.21},
doi = {10.1109/ATS.2017.21},
timestamp = {Fri, 24 Mar 2023 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/ats/Chen17.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/ats/ChenKL17,
author = {Chang{-}Wen Chen and
Yi{-}Cheng Kong and
Kuen{-}Jong Lee},
title = {Test Compression with Single-Input Data Spreader and Multiple Test
Sessions},
booktitle = {26th {IEEE} Asian Test Symposium, {ATS} 2017, Taipei City, Taiwan,
November 27-30, 2017},
pages = {28--33},
publisher = {{IEEE} Computer Society},
year = {2017},
url = {https://doi.org/10.1109/ATS.2017.18},
doi = {10.1109/ATS.2017.18},
timestamp = {Fri, 24 Mar 2023 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/ats/ChenKL17.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/ats/ChengKBYSETRPFC17,
author = {Wu{-}Tung Cheng and
Randy Klingenberg and
Brady Benware and
Wu Yang and
Manish Sharma and
Geir Eide and
Yue Tian and
Sudhakar M. Reddy and
Yan Pan and
Sherwin Fernandes and
Atul Chittora},
title = {Automatic Identification of Yield Limiting Layout Patterns Using Root
Cause Deconvolution on Volume Scan Diagnosis Data},
booktitle = {26th {IEEE} Asian Test Symposium, {ATS} 2017, Taipei City, Taiwan,
November 27-30, 2017},
pages = {219--224},
publisher = {{IEEE} Computer Society},
year = {2017},
url = {https://doi.org/10.1109/ATS.2017.49},
doi = {10.1109/ATS.2017.49},
timestamp = {Fri, 24 Mar 2023 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/ats/ChengKBYSETRPFC17.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/ats/CuiLLC17,
author = {Xiaole Cui and
Yichi Luo and
Qiujun Lin and
Xiaoxin Cui},
title = {A Heuristic Algorithm for Automatic Generation of March Tests},
booktitle = {26th {IEEE} Asian Test Symposium, {ATS} 2017, Taipei City, Taiwan,
November 27-30, 2017},
pages = {266--271},
publisher = {{IEEE} Computer Society},
year = {2017},
url = {https://doi.org/10.1109/ATS.2017.57},
doi = {10.1109/ATS.2017.57},
timestamp = {Fri, 24 Mar 2023 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/ats/CuiLLC17.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/ats/CuiQQL17,
author = {Aijiao Cui and
Xuesen Qian and
Gang Qu and
Huawei Li},
title = {A New Active {IC} Metering Technique Based on Locking Scan Cells},
booktitle = {26th {IEEE} Asian Test Symposium, {ATS} 2017, Taipei City, Taiwan,
November 27-30, 2017},
pages = {40--45},
publisher = {{IEEE} Computer Society},
year = {2017},
url = {https://doi.org/10.1109/ATS.2017.20},
doi = {10.1109/ATS.2017.20},
timestamp = {Thu, 11 May 2023 01:00:00 +0200},
biburl = {https://dblp.org/rec/conf/ats/CuiQQL17.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/ats/DhotreED17,
author = {Harshad Dhotre and
Stephan Eggersgl{\"{u}}{\ss} and
Rolf Drechsler},
title = {Identification of Efficient Clustering Techniques for Test Power Activity
on the Layout},
booktitle = {26th {IEEE} Asian Test Symposium, {ATS} 2017, Taipei City, Taiwan,
November 27-30, 2017},
pages = {108--113},
publisher = {{IEEE} Computer Society},
year = {2017},
url = {https://doi.org/10.1109/ATS.2017.31},
doi = {10.1109/ATS.2017.31},
timestamp = {Fri, 24 Mar 2023 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/ats/DhotreED17.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/ats/FuchsSMP17,
author = {Christian M. Fuchs and
Todor P. Stefanov and
Nadia Murillo and
Aske Plaat},
title = {Bringing Fault-Tolerant GigaHertz-Computing to Space: {A} Multi-stage
Software-Side Fault-Tolerance Approach for Miniaturized Spacecraft},
booktitle = {26th {IEEE} Asian Test Symposium, {ATS} 2017, Taipei City, Taiwan,
November 27-30, 2017},
pages = {100--107},
publisher = {{IEEE} Computer Society},
year = {2017},
url = {https://doi.org/10.1109/ATS.2017.30},
doi = {10.1109/ATS.2017.30},
timestamp = {Fri, 24 Mar 2023 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/ats/FuchsSMP17.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/ats/GaoHHL17,
author = {Zih{-}Huan Gao and
Hau Hsu and
Ting{-}Shuo Hsu and
Jing{-}Jia Liou},
title = {Post-Silicon Test Flow for Aging Prediction},
booktitle = {26th {IEEE} Asian Test Symposium, {ATS} 2017, Taipei City, Taiwan,
November 27-30, 2017},
pages = {70--75},
publisher = {{IEEE} Computer Society},
year = {2017},
url = {https://doi.org/10.1109/ATS.2017.25},
doi = {10.1109/ATS.2017.25},
timestamp = {Fri, 24 Mar 2023 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/ats/GaoHHL17.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/ats/HamdiouiPLWRY17,
author = {Said Hamdioui and
Peyman Pouyan and
Huawei Li and
Ying Wang and
Arijit Raychowdhury and
Insik Yoon},
title = {Test and Reliability of Emerging Non-volatile Memories},
booktitle = {26th {IEEE} Asian Test Symposium, {ATS} 2017, Taipei City, Taiwan,
November 27-30, 2017},
pages = {175--183},
publisher = {{IEEE} Computer Society},
year = {2017},
url = {https://doi.org/10.1109/ATS.2017.42},
doi = {10.1109/ATS.2017.42},
timestamp = {Fri, 24 Mar 2023 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/ats/HamdiouiPLWRY17.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/ats/HeQKL17,
author = {Si{-}Rong He and
Nguyen Cao Qui and
Yu{-}Hsuan Kuo and
Chien{-}Nan Jimmy Liu},
title = {An Incremental Aging Analysis Method Based on Delta Circuit Simulation
Technique},
booktitle = {26th {IEEE} Asian Test Symposium, {ATS} 2017, Taipei City, Taiwan,
November 27-30, 2017},
pages = {64--69},
publisher = {{IEEE} Computer Society},
year = {2017},
url = {https://doi.org/10.1109/ATS.2017.24},
doi = {10.1109/ATS.2017.24},
timestamp = {Fri, 24 Mar 2023 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/ats/HeQKL17.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/ats/HossainYSIO17,
author = {Fakir Sharif Hossain and
Tomokazu Yoneda and
Michihiro Shintani and
Michiko Inoue and
Alex Orailoglu},
title = {Intra-Die-Variation-Aware Side Channel Analysis for Hardware Trojan
Detection},
booktitle = {26th {IEEE} Asian Test Symposium, {ATS} 2017, Taipei City, Taiwan,
November 27-30, 2017},
pages = {52--57},
publisher = {{IEEE} Computer Society},
year = {2017},
url = {https://doi.org/10.1109/ATS.2017.22},
doi = {10.1109/ATS.2017.22},
timestamp = {Fri, 24 Mar 2023 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/ats/HossainYSIO17.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/ats/HsiehCC17,
author = {Tong{-}Yu Hsieh and
Tai{-}Ang Cheng and
Chao{-}Ru Chen},
title = {Error-Tolerability Evaluation and Test for Images in Face Detection
Applications},
booktitle = {26th {IEEE} Asian Test Symposium, {ATS} 2017, Taipei City, Taiwan,
November 27-30, 2017},
pages = {206--211},
publisher = {{IEEE} Computer Society},
year = {2017},
url = {https://doi.org/10.1109/ATS.2017.47},
doi = {10.1109/ATS.2017.47},
timestamp = {Fri, 24 Mar 2023 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/ats/HsiehCC17.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/ats/HuangBKTDC17,
author = {Yu Huang and
Brady Benware and
Randy Klingenberg and
Huaxing Tang and
Jayant Dsouza and
Wu{-}Tung Cheng},
title = {Scan Chain Diagnosis Based on Unsupervised Machine Learning},
booktitle = {26th {IEEE} Asian Test Symposium, {ATS} 2017, Taipei City, Taiwan,
November 27-30, 2017},
pages = {225--230},
publisher = {{IEEE} Computer Society},
year = {2017},
url = {https://doi.org/10.1109/ATS.2017.50},
doi = {10.1109/ATS.2017.50},
timestamp = {Fri, 24 Mar 2023 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/ats/HuangBKTDC17.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/ats/HuangLHLHK17,
author = {Yang{-}Kai Huang and
Kuan{-}Te Li and
Chih{-}Lung Hsiao and
Chia{-}An Lee and
Jiun{-}Lang Huang and
Terry Kuo},
title = {Design and Implementation of an EG-Pool Based {FPGA} Formatter with
Temperature Compensation},
booktitle = {26th {IEEE} Asian Test Symposium, {ATS} 2017, Taipei City, Taiwan,
November 27-30, 2017},
pages = {88--93},
publisher = {{IEEE} Computer Society},
year = {2017},
url = {https://doi.org/10.1109/ATS.2017.28},
doi = {10.1109/ATS.2017.28},
timestamp = {Fri, 24 Mar 2023 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/ats/HuangLHLHK17.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/ats/IwataGTF17,
author = {Kentaro Iwata and
Amir Masoud Gharehbaghi and
Mehdi Baradaran Tahoori and
Masahiro Fujita},
title = {Post Silicon Debugging of Electrical Bugs Using Trace Buffers},
booktitle = {26th {IEEE} Asian Test Symposium, {ATS} 2017, Taipei City, Taiwan,
November 27-30, 2017},
pages = {189--194},
publisher = {{IEEE} Computer Society},
year = {2017},
url = {https://doi.org/10.1109/ATS.2017.44},
doi = {10.1109/ATS.2017.44},
timestamp = {Fri, 24 Mar 2023 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/ats/IwataGTF17.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/ats/KambaraYMHL17,
author = {Ayumu Kambara and
Hiroyuki Yotsuyanagi and
Daichi Miyoshi and
Masaki Hashizume and
Shyue{-}Kung Lu},
title = {Open Defect Detection with a Built-in Test Circuit by {IDDT} Appearance
Time in {CMOS} ICs},
booktitle = {26th {IEEE} Asian Test Symposium, {ATS} 2017, Taipei City, Taiwan,
November 27-30, 2017},
pages = {242--247},
publisher = {{IEEE} Computer Society},
year = {2017},
url = {https://doi.org/10.1109/ATS.2017.53},
doi = {10.1109/ATS.2017.53},
timestamp = {Fri, 24 Mar 2023 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/ats/KambaraYMHL17.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/ats/Kato17,
author = {Kentaro Kato},
title = {Deterministic Path Delay Measurement Using Short Cycle Test Pattern},
booktitle = {26th {IEEE} Asian Test Symposium, {ATS} 2017, Taipei City, Taiwan,
November 27-30, 2017},
pages = {151--156},
publisher = {{IEEE} Computer Society},
year = {2017},
url = {https://doi.org/10.1109/ATS.2017.38},
doi = {10.1109/ATS.2017.38},
timestamp = {Fri, 24 Mar 2023 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/ats/Kato17.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/ats/KoH17,
author = {Yen{-}Chun Ko and
Shih{-}Hsu Huang},
title = {3D {IC} Memory {BIST} Controller Allocation for Test Time Minimization
Under Power Constraints},
booktitle = {26th {IEEE} Asian Test Symposium, {ATS} 2017, Taipei City, Taiwan,
November 27-30, 2017},
pages = {260--265},
publisher = {{IEEE} Computer Society},
year = {2017},
url = {https://doi.org/10.1109/ATS.2017.56},
doi = {10.1109/ATS.2017.56},
timestamp = {Fri, 24 Mar 2023 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/ats/KoH17.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/ats/KogaAI17,
author = {Keitaro Koga and
Hiromitsu Awano and
Makoto Ikeda},
title = {Yield Enhancement by Repair Circuits for Ultra-Fine Pitch Stacked-Chip
Connections},
booktitle = {26th {IEEE} Asian Test Symposium, {ATS} 2017, Taipei City, Taiwan,
November 27-30, 2017},
pages = {201--205},
publisher = {{IEEE} Computer Society},
year = {2017},
url = {https://doi.org/10.1109/ATS.2017.46},
doi = {10.1109/ATS.2017.46},
timestamp = {Fri, 24 Mar 2023 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/ats/KogaAI17.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/ats/LawWLH17,
author = {Pok Man Preston Law and
Cheng{-}Wen Wu and
Long{-}Yi Lin and
Hao{-}Chiao Hong},
title = {An Enhanced Boundary Scan Architecture for Inter-Die Interconnect
Leakage Measurement in 2.5D and 3D Packages},
booktitle = {26th {IEEE} Asian Test Symposium, {ATS} 2017, Taipei City, Taiwan,
November 27-30, 2017},
pages = {5--10},
publisher = {{IEEE} Computer Society},
year = {2017},
url = {https://doi.org/10.1109/ATS.2017.14},
doi = {10.1109/ATS.2017.14},
timestamp = {Sat, 30 Sep 2023 01:00:00 +0200},
biburl = {https://dblp.org/rec/conf/ats/LawWLH17.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/ats/LianHC17,
author = {Guan{-}Hao Lian and
Shi{-}Yu Huang and
Wei{-}yi Chen},
title = {Cloud-Based {PVT} Monitoring System for IoT Devices},
booktitle = {26th {IEEE} Asian Test Symposium, {ATS} 2017, Taipei City, Taiwan,
November 27-30, 2017},
pages = {76--81},
publisher = {{IEEE} Computer Society},
year = {2017},
url = {https://doi.org/10.1109/ATS.2017.26},
doi = {10.1109/ATS.2017.26},
timestamp = {Fri, 24 Mar 2023 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/ats/LianHC17.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/ats/LuYHY17,
author = {Shyue{-}Kung Lu and
Shu{-}Chi Yu and
Masaki Hashizume and
Hiroyuki Yotsuyanagi},
title = {Fault-Aware Page Address Remapping Techniques for Enhancing Yield
and Reliability of Flash Memories},
booktitle = {26th {IEEE} Asian Test Symposium, {ATS} 2017, Taipei City, Taiwan,
November 27-30, 2017},
pages = {254--259},
publisher = {{IEEE} Computer Society},
year = {2017},
url = {https://doi.org/10.1109/ATS.2017.55},
doi = {10.1109/ATS.2017.55},
timestamp = {Fri, 24 Mar 2023 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/ats/LuYHY17.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/ats/MaedaMP17,
author = {Yoichi Maeda and
Jun Matsushima and
Ron Press},
title = {Automotive {IC} On-line Test Techniques and the Application of Deterministic
ATPG-Based Runtime Test},
booktitle = {26th {IEEE} Asian Test Symposium, {ATS} 2017, Taipei City, Taiwan,
November 27-30, 2017},
pages = {237--241},
publisher = {{IEEE} Computer Society},
year = {2017},
url = {https://doi.org/10.1109/ATS.2017.52},
doi = {10.1109/ATS.2017.52},
timestamp = {Fri, 24 Mar 2023 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/ats/MaedaMP17.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/ats/MajumdarJCL17,
author = {Amitava Majumdar and
Balakrishna Jayadev and
Da Cheng and
Albert Lin},
title = {Architecture for Reliable Scan-Dump in the Presence of Multiple Asynchronous
Clock Domains in {FPGA} SoCs},
booktitle = {26th {IEEE} Asian Test Symposium, {ATS} 2017, Taipei City, Taiwan,
November 27-30, 2017},
pages = {139--144},
publisher = {{IEEE} Computer Society},
year = {2017},
url = {https://doi.org/10.1109/ATS.2017.36},
doi = {10.1109/ATS.2017.36},
timestamp = {Thu, 18 Apr 2024 01:00:00 +0200},
biburl = {https://dblp.org/rec/conf/ats/MajumdarJCL17.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/ats/MittalB17,
author = {Soumya Mittal and
R. D. (Shawn) Blanton},
title = {{PADLOC:} Physically-Aware Defect Localization and Characterization},
booktitle = {26th {IEEE} Asian Test Symposium, {ATS} 2017, Taipei City, Taiwan,
November 27-30, 2017},
pages = {212--218},
publisher = {{IEEE} Computer Society},
year = {2017},
url = {https://doi.org/10.1109/ATS.2017.48},
doi = {10.1109/ATS.2017.48},
timestamp = {Fri, 24 Mar 2023 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/ats/MittalB17.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/ats/MondalD17,
author = {Joyati Mondal and
Debesh Kumar Das},
title = {Design for Testability Technique of Reversible Logic Circuits Based
on Exclusive Testing},
booktitle = {26th {IEEE} Asian Test Symposium, {ATS} 2017, Taipei City, Taiwan,
November 27-30, 2017},
pages = {248--253},
publisher = {{IEEE} Computer Society},
year = {2017},
url = {https://doi.org/10.1109/ATS.2017.54},
doi = {10.1109/ATS.2017.54},
timestamp = {Fri, 24 Mar 2023 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/ats/MondalD17.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/ats/OzawaIJSTTSK17,
author = {Yuki Ozawa and
Takashi Ida and
Richen Jiang and
Shotaro Sakurai and
Seiya Takigami and
Nobukazu Tsukiji and
Ryoji Shiota and
Haruo Kobayashi},
title = {{SAR} {TDC} Architecture with Self-Calibration Employing Trigger Circuit},
booktitle = {26th {IEEE} Asian Test Symposium, {ATS} 2017, Taipei City, Taiwan,
November 27-30, 2017},
pages = {94--99},
publisher = {{IEEE} Computer Society},
year = {2017},
url = {https://doi.org/10.1109/ATS.2017.29},
doi = {10.1109/ATS.2017.29},
timestamp = {Fri, 24 Mar 2023 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/ats/OzawaIJSTTSK17.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/ats/PeiRJ17,
author = {Songwei Pei and
Alrashdi Ahmed Rabehb and
Song Jin},
title = {On-Chip Ring Oscillator Based Scheme for {TSV} Delay Measurement},
booktitle = {26th {IEEE} Asian Test Symposium, {ATS} 2017, Taipei City, Taiwan,
November 27-30, 2017},
pages = {11--16},
publisher = {{IEEE} Computer Society},
year = {2017},
url = {https://doi.org/10.1109/ATS.2017.15},
doi = {10.1109/ATS.2017.15},
timestamp = {Fri, 24 Mar 2023 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/ats/PeiRJ17.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/ats/PiplaniFSCH17,
author = {Surya Piplani and
Humberto Fonseca and
Vivek Mohan Sharma and
Daniele Cervini and
David Hardisty},
title = {Test and Debug Strategy for High Speed {JESD204B} Rx {PHY}},
booktitle = {26th {IEEE} Asian Test Symposium, {ATS} 2017, Taipei City, Taiwan,
November 27-30, 2017},
pages = {184--188},
publisher = {{IEEE} Computer Society},
year = {2017},
url = {https://doi.org/10.1109/ATS.2017.43},
doi = {10.1109/ATS.2017.43},
timestamp = {Fri, 24 Mar 2023 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/ats/PiplaniFSCH17.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/ats/Pomeranz17,
author = {Irith Pomeranz},
title = {Test Compaction with Dynamic Updating of Faults for Coverage of Undetected
Transition Fault Sites},
booktitle = {26th {IEEE} Asian Test Symposium, {ATS} 2017, Taipei City, Taiwan,
November 27-30, 2017},
pages = {34--39},
publisher = {{IEEE} Computer Society},
year = {2017},
url = {https://doi.org/10.1109/ATS.2017.19},
doi = {10.1109/ATS.2017.19},
timestamp = {Fri, 24 Mar 2023 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/ats/Pomeranz17.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/ats/Pomeranz17a,
author = {Irith Pomeranz},
title = {Compaction of a Transparent-Scan Sequence to Reduce the Fail Data
Volume for Scan Chain Faults},
booktitle = {26th {IEEE} Asian Test Symposium, {ATS} 2017, Taipei City, Taiwan,
November 27-30, 2017},
pages = {133--138},
publisher = {{IEEE} Computer Society},
year = {2017},
url = {https://doi.org/10.1109/ATS.2017.35},
doi = {10.1109/ATS.2017.35},
timestamp = {Fri, 24 Mar 2023 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/ats/Pomeranz17a.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/ats/PotluriMNHT17,
author = {Seetal Potluri and
Aaron Mathew and
Rambabu Nerukonda and
Ismed Hartanto and
Shahin Toutounchi},
title = {Cell-Aware {ATPG} to Improve Defect Coverage for {FPGA} IPs and Next
Generation Zynq{\textregistered} MPSoCs},
booktitle = {26th {IEEE} Asian Test Symposium, {ATS} 2017, Taipei City, Taiwan,
November 27-30, 2017},
pages = {157--162},
publisher = {{IEEE} Computer Society},
year = {2017},
url = {https://doi.org/10.1109/ATS.2017.39},
doi = {10.1109/ATS.2017.39},
timestamp = {Fri, 24 Mar 2023 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/ats/PotluriMNHT17.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/ats/TangICK17,
author = {Jack Tang and
Mohamed Ibrahim and
Krishnendu Chakrabarty and
Ramesh Karri},
title = {Security Implications of Cyberphysical Flow-Based Microfluidic Biochips},
booktitle = {26th {IEEE} Asian Test Symposium, {ATS} 2017, Taipei City, Taiwan,
November 27-30, 2017},
pages = {115--120},
publisher = {{IEEE} Computer Society},
year = {2017},
url = {https://doi.org/10.1109/ATS.2017.32},
doi = {10.1109/ATS.2017.32},
timestamp = {Fri, 24 Mar 2023 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/ats/TangICK17.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/ats/TangJPJR17,
author = {Huaxing Tang and
Arvind Jain and
Sanil Kumark Pillai and
Dharmesh Joshi and
Shamitha Rao},
title = {Using Cell Aware Diagnostic Patterns to Improve Diagnosis Resolution
for Cell Internal Defects},
booktitle = {26th {IEEE} Asian Test Symposium, {ATS} 2017, Taipei City, Taiwan,
November 27-30, 2017},
pages = {231--236},
publisher = {{IEEE} Computer Society},
year = {2017},
url = {https://doi.org/10.1109/ATS.2017.51},
doi = {10.1109/ATS.2017.51},
timestamp = {Fri, 24 Mar 2023 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/ats/TangJPJR17.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/ats/TsaiG17,
author = {Kun{-}Han Tsai and
Srinivasan Gopalakrishnan},
title = {Test Coverage Analysis for Designs with Timing Exceptions},
booktitle = {26th {IEEE} Asian Test Symposium, {ATS} 2017, Taipei City, Taiwan,
November 27-30, 2017},
pages = {169--174},
publisher = {{IEEE} Computer Society},
year = {2017},
url = {https://doi.org/10.1109/ATS.2017.41},
doi = {10.1109/ATS.2017.41},
timestamp = {Fri, 24 Mar 2023 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/ats/TsaiG17.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/ats/UllKW17,
author = {Dominik Ull and
Michael A. Kochte and
Hans{-}Joachim Wunderlich},
title = {Structure-Oriented Test of Reconfigurable Scan Networks},
booktitle = {26th {IEEE} Asian Test Symposium, {ATS} 2017, Taipei City, Taiwan,
November 27-30, 2017},
pages = {127--132},
publisher = {{IEEE} Computer Society},
year = {2017},
url = {https://doi.org/10.1109/ATS.2017.34},
doi = {10.1109/ATS.2017.34},
timestamp = {Fri, 24 Mar 2023 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/ats/UllKW17.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/ats/WangCLL17,
author = {Sying{-}Jyan Wang and
Hsiang{-}Hsueh Chen and
Chin{-}Hung Lien and
Katherine Shu{-}Min Li},
title = {Testing Clock Distribution Networks},
booktitle = {26th {IEEE} Asian Test Symposium, {ATS} 2017, Taipei City, Taiwan,
November 27-30, 2017},
pages = {163--168},
publisher = {{IEEE} Computer Society},
year = {2017},
url = {https://doi.org/10.1109/ATS.2017.40},
doi = {10.1109/ATS.2017.40},
timestamp = {Fri, 24 Mar 2023 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/ats/WangCLL17.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/ats/WangHTSKS17,
author = {Senling Wang and
Yoshinobu Higami and
Hiroshi Takahashi and
Masayuki Sato and
Mitsunori Katsu and
Shoichi Sekiguchi},
title = {Testing of Interconnect Defects in Memory Based Reconfigurable Logic
Device {(MRLD)}},
booktitle = {26th {IEEE} Asian Test Symposium, {ATS} 2017, Taipei City, Taiwan,
November 27-30, 2017},
pages = {17--22},
publisher = {{IEEE} Computer Society},
year = {2017},
url = {https://doi.org/10.1109/ATS.2017.16},
doi = {10.1109/ATS.2017.16},
timestamp = {Fri, 24 Mar 2023 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/ats/WangHTSKS17.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/ats/ZhangHWMKQ17,
author = {Yucong Zhang and
Stefan Holst and
Xiaoqing Wen and
Kohei Miyase and
Seiji Kajihara and
Jun Qian},
title = {Scan Chain Grouping for Mitigating IR-Drop-Induced Test Data Corruption},
booktitle = {26th {IEEE} Asian Test Symposium, {ATS} 2017, Taipei City, Taiwan,
November 27-30, 2017},
pages = {145--150},
publisher = {{IEEE} Computer Society},
year = {2017},
url = {https://doi.org/10.1109/ATS.2017.37},
doi = {10.1109/ATS.2017.37},
timestamp = {Fri, 24 Mar 2023 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/ats/ZhangHWMKQ17.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/ats/ZhouCLQ17,
author = {Wei Zhou and
Aijiao Cui and
Huawei Li and
Gang Qu},
title = {How to Secure Scan Design Against Scan-Based Side-Channel Attacks?},
booktitle = {26th {IEEE} Asian Test Symposium, {ATS} 2017, Taipei City, Taiwan,
November 27-30, 2017},
pages = {121--126},
publisher = {{IEEE} Computer Society},
year = {2017},
url = {https://doi.org/10.1109/ATS.2017.33},
doi = {10.1109/ATS.2017.33},
timestamp = {Thu, 11 May 2023 01:00:00 +0200},
biburl = {https://dblp.org/rec/conf/ats/ZhouCLQ17.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@proceedings{DBLP:conf/ats/2017,
title = {26th {IEEE} Asian Test Symposium, {ATS} 2017, Taipei City, Taiwan,
November 27-30, 2017},
publisher = {{IEEE} Computer Society},
year = {2017},
url = {https://ieeexplore.ieee.org/xpl/conhome/8267185/proceeding},
isbn = {978-1-5386-2437-1},
timestamp = {Wed, 16 Oct 2019 01:00:00 +0200},
biburl = {https://dblp.org/rec/conf/ats/2017.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/ats/AmyeenPV16,
author = {M. Enamul Amyeen and
Irith Pomeranz and
Srikanth Venkataraman},
title = {A Joint Diagnostic Test Generation Procedure with Dynamic Test Compaction},
booktitle = {25th {IEEE} Asian Test Symposium, {ATS} 2016, Hiroshima, Japan, November
21-24, 2016},
pages = {138--143},
publisher = {{IEEE} Computer Society},
year = {2016},
url = {https://doi.org/10.1109/ATS.2016.15},
doi = {10.1109/ATS.2016.15},
timestamp = {Fri, 24 Mar 2023 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/ats/AmyeenPV16.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/ats/BianS0HCS16,
author = {Song Bian and
Michihiro Shintani and
Zheng Wang and
Masayuki Hiromoto and
Anupam Chattopadhyay and
Takashi Sato},
title = {Runtime {NBTI} Mitigation for Processor Lifespan Extension via Selective
Node Control},
booktitle = {25th {IEEE} Asian Test Symposium, {ATS} 2016, Hiroshima, Japan, November
21-24, 2016},
pages = {234--239},
publisher = {{IEEE} Computer Society},
year = {2016},
url = {https://doi.org/10.1109/ATS.2016.31},
doi = {10.1109/ATS.2016.31},
timestamp = {Mon, 17 Jun 2024 01:00:00 +0200},
biburl = {https://dblp.org/rec/conf/ats/BianS0HCS16.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/ats/CantoroPPR16,
author = {Riccardo Cantoro and
Marco Palena and
Paolo Pasini and
Matteo Sonza Reorda},
title = {Test Time Minimization in Reconfigurable Scan Networks},
booktitle = {25th {IEEE} Asian Test Symposium, {ATS} 2016, Hiroshima, Japan, November
21-24, 2016},
pages = {119--124},
publisher = {{IEEE} Computer Society},
year = {2016},
url = {https://doi.org/10.1109/ATS.2016.58},
doi = {10.1109/ATS.2016.58},
timestamp = {Fri, 24 Mar 2023 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/ats/CantoroPPR16.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/ats/ChenCCW16,
author = {Harry H. Chen and
Simon Y.{-}H. Chen and
Po{-}Yao Chuang and
Cheng{-}Wen Wu},
title = {Efficient Cell-Aware Fault Modeling by Switch-Level Test Generation},
booktitle = {25th {IEEE} Asian Test Symposium, {ATS} 2016, Hiroshima, Japan, November
21-24, 2016},
pages = {197--202},
publisher = {{IEEE} Computer Society},
year = {2016},
url = {https://doi.org/10.1109/ATS.2016.33},
doi = {10.1109/ATS.2016.33},
timestamp = {Sat, 30 Sep 2023 01:00:00 +0200},
biburl = {https://dblp.org/rec/conf/ats/ChenCCW16.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/ats/ChenK16,
author = {Te{-}Hui Chen and
David C. Keezer},
title = {An Ultra-High-Speed Test Module and FPGA-Based Development Platform},
booktitle = {25th {IEEE} Asian Test Symposium, {ATS} 2016, Hiroshima, Japan, November
21-24, 2016},
pages = {269--274},
publisher = {{IEEE} Computer Society},
year = {2016},
url = {https://doi.org/10.1109/ATS.2016.26},
doi = {10.1109/ATS.2016.26},
timestamp = {Fri, 24 Mar 2023 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/ats/ChenK16.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/ats/DalirsaniW16,
author = {Atefe Dalirsani and
Hans{-}Joachim Wunderlich},
title = {Functional Diagnosis for Graceful Degradation of NoC Switches},
booktitle = {25th {IEEE} Asian Test Symposium, {ATS} 2016, Hiroshima, Japan, November
21-24, 2016},
pages = {246--251},
publisher = {{IEEE} Computer Society},
year = {2016},
url = {https://doi.org/10.1109/ATS.2016.18},
doi = {10.1109/ATS.2016.18},
timestamp = {Fri, 24 Mar 2023 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/ats/DalirsaniW16.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/ats/DangMOA16,
author = {Khanh N. Dang and
Michael Conrad Meyer and
Yuichi Okuyama and
Abderazek Ben Abdallah},
title = {Reliability Assessment and Quantitative Evaluation of Soft-Error Resilient
3D Network-on-Chip Systems},
booktitle = {25th {IEEE} Asian Test Symposium, {ATS} 2016, Hiroshima, Japan, November
21-24, 2016},
pages = {161--166},
publisher = {{IEEE} Computer Society},
year = {2016},
url = {https://doi.org/10.1109/ATS.2016.37},
doi = {10.1109/ATS.2016.37},
timestamp = {Fri, 24 Mar 2023 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/ats/DangMOA16.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/ats/DhotreDPH16,
author = {Harshad Dhotre and
Mehdi Dehbashi and
Ulrike Pfannkuchen and
Klaus Hofmann},
title = {Automated Optimization of Scan Chain Structure for Test Compression-Based
Designs},
booktitle = {25th {IEEE} Asian Test Symposium, {ATS} 2016, Hiroshima, Japan, November
21-24, 2016},
pages = {185--190},
publisher = {{IEEE} Computer Society},
year = {2016},
url = {https://doi.org/10.1109/ATS.2016.60},
doi = {10.1109/ATS.2016.60},
timestamp = {Fri, 24 Mar 2023 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/ats/DhotreDPH16.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/ats/EggersglussHTMW16,
author = {Stephan Eggersgl{\"{u}}{\ss} and
Stefan Holst and
Daniel Tille and
Kohei Miyase and
Xiaoqing Wen},
title = {Formal Test Point Insertion for Region-based Low-Capture-Power Compact
At-Speed Scan Test},
booktitle = {25th {IEEE} Asian Test Symposium, {ATS} 2016, Hiroshima, Japan, November
21-24, 2016},
pages = {173--178},
publisher = {{IEEE} Computer Society},
year = {2016},
url = {https://doi.org/10.1109/ATS.2016.41},
doi = {10.1109/ATS.2016.41},
timestamp = {Fri, 24 Mar 2023 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/ats/EggersglussHTMW16.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/ats/GharehbaghiF16,
author = {Amir Masoud Gharehbaghi and
Masahiro Fujita},
title = {A New Approach for Debugging Logic Circuits without Explicitly Debugging
Their Functionality},
booktitle = {25th {IEEE} Asian Test Symposium, {ATS} 2016, Hiroshima, Japan, November
21-24, 2016},
pages = {31--36},
publisher = {{IEEE} Computer Society},
year = {2016},
url = {https://doi.org/10.1109/ATS.2016.54},
doi = {10.1109/ATS.2016.54},
timestamp = {Fri, 24 Mar 2023 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/ats/GharehbaghiF16.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/ats/GomezW16,
author = {Laura Rodr{\'{\i}}guez G{\'{o}}mez and
Hans{-}Joachim Wunderlich},
title = {A Neural-Network-Based Fault Classifier},
booktitle = {25th {IEEE} Asian Test Symposium, {ATS} 2016, Hiroshima, Japan, November
21-24, 2016},
pages = {144--149},
publisher = {{IEEE} Computer Society},
year = {2016},
url = {https://doi.org/10.1109/ATS.2016.46},
doi = {10.1109/ATS.2016.46},
timestamp = {Fri, 24 Mar 2023 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/ats/GomezW16.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/ats/GuoYGH016,
author = {Qingli Guo and
Jing Ye and
Yue Gong and
Yu Hu and
Xiaowei Li},
title = {Efficient Attack on Non-linear Current Mirror {PUF} with Genetic Algorithm},
booktitle = {25th {IEEE} Asian Test Symposium, {ATS} 2016, Hiroshima, Japan, November
21-24, 2016},
pages = {49--54},
publisher = {{IEEE} Computer Society},
year = {2016},
url = {https://doi.org/10.1109/ATS.2016.21},
doi = {10.1109/ATS.2016.21},
timestamp = {Mon, 22 May 2023 01:00:00 +0200},
biburl = {https://dblp.org/rec/conf/ats/GuoYGH016.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/ats/HeydarzadehLN16,
author = {Mehrdad Heydarzadeh and
Hao Luo and
Mehrdad Nourani},
title = {Model-Free Testing of Analog Circuits},
booktitle = {25th {IEEE} Asian Test Symposium, {ATS} 2016, Hiroshima, Japan, November
21-24, 2016},
pages = {102--106},
publisher = {{IEEE} Computer Society},
year = {2016},
url = {https://doi.org/10.1109/ATS.2016.19},
doi = {10.1109/ATS.2016.19},
timestamp = {Fri, 24 Mar 2023 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/ats/HeydarzadehLN16.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/ats/HolstSWKYWK16,
author = {Stefan Holst and
Eric Schneider and
Xiaoqing Wen and
Seiji Kajihara and
Yuta Yamato and
Hans{-}Joachim Wunderlich and
Michael A. Kochte},
title = {Timing-Accurate Estimation of IR-Drop Impact on Logic- and Clock-Paths
During At-Speed Scan Test},
booktitle = {25th {IEEE} Asian Test Symposium, {ATS} 2016, Hiroshima, Japan, November
21-24, 2016},
pages = {19--24},
publisher = {{IEEE} Computer Society},
year = {2016},
url = {https://doi.org/10.1109/ATS.2016.49},
doi = {10.1109/ATS.2016.49},
timestamp = {Fri, 24 Mar 2023 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/ats/HolstSWKYWK16.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/ats/HongL16,
author = {Hao{-}Chiao Hong and
Long{-}Yi Lin},
title = {A Study on the Transfer Function Based Analog Fault Model for Linear
and Time-Invariant Continuous-Time Analog Circuits},
booktitle = {25th {IEEE} Asian Test Symposium, {ATS} 2016, Hiroshima, Japan, November
21-24, 2016},
pages = {92--95},
publisher = {{IEEE} Computer Society},
year = {2016},
url = {https://doi.org/10.1109/ATS.2016.38},
doi = {10.1109/ATS.2016.38},
timestamp = {Fri, 24 Mar 2023 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/ats/HongL16.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/ats/HouLHSC16,
author = {Po{-}Fan Hou and
Yi{-}Tsung Lin and
Jiun{-}Lang Huang and
Ann Shih and
Zoe F. Conroy},
title = {An IR-Drop Aware Test Pattern Generator for Scan-Based At-Speed Testing},
booktitle = {25th {IEEE} Asian Test Symposium, {ATS} 2016, Hiroshima, Japan, November
21-24, 2016},
pages = {167--172},
publisher = {{IEEE} Computer Society},
year = {2016},
url = {https://doi.org/10.1109/ATS.2016.23},
doi = {10.1109/ATS.2016.23},
timestamp = {Fri, 24 Mar 2023 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/ats/HouLHSC16.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/ats/HuA16,
author = {Shih{-}Hsin Hu and
Jacob A. Abraham},
title = {Quality Aware Error Detection in 2-D Separable Linear Transformation},
booktitle = {25th {IEEE} Asian Test Symposium, {ATS} 2016, Hiroshima, Japan, November
21-24, 2016},
pages = {257--262},
publisher = {{IEEE} Computer Society},
year = {2016},
url = {https://doi.org/10.1109/ATS.2016.10},
doi = {10.1109/ATS.2016.10},
timestamp = {Fri, 24 Mar 2023 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/ats/HuA16.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/ats/Huang16,
author = {Shi{-}Yu Huang},
title = {Pre-Bond and Post-Bond Testing of TSVs and Die-to-Die Interconnects},
booktitle = {25th {IEEE} Asian Test Symposium, {ATS} 2016, Hiroshima, Japan, November
21-24, 2016},
pages = {80--85},
publisher = {{IEEE} Computer Society},
year = {2016},
url = {https://doi.org/10.1109/ATS.2016.67},
doi = {10.1109/ATS.2016.67},
timestamp = {Fri, 24 Mar 2023 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/ats/Huang16.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/ats/HuangZ16,
author = {Shi{-}Yu Huang and
Chih{-}Chieh Zheng},
title = {Die-to-Die Clock Skew Characterization and Tuning for 2.5D ICs},
booktitle = {25th {IEEE} Asian Test Symposium, {ATS} 2016, Hiroshima, Japan, November
21-24, 2016},
pages = {221--226},
publisher = {{IEEE} Computer Society},
year = {2016},
url = {https://doi.org/10.1109/ATS.2016.11},
doi = {10.1109/ATS.2016.11},
timestamp = {Fri, 24 Mar 2023 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/ats/HuangZ16.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/ats/InuyamaAI16,
author = {Shingo Inuyama and
Masayuki Arai and
Kazuhiko Iwasaki},
title = {Critical-Area-Aware Test Pattern Generation and Reordering},
booktitle = {25th {IEEE} Asian Test Symposium, {ATS} 2016, Hiroshima, Japan, November
21-24, 2016},
pages = {191--196},
publisher = {{IEEE} Computer Society},
year = {2016},
url = {https://doi.org/10.1109/ATS.2016.48},
doi = {10.1109/ATS.2016.48},
timestamp = {Fri, 24 Mar 2023 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/ats/InuyamaAI16.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/ats/IslamK16,
author = {Md. Nazmul Islam and
Sandip Kundu},
title = {Modeling Residual Lifetime of an {IC} Considering Spatial and Inter-Temporal
Temperature Variations},
booktitle = {25th {IEEE} Asian Test Symposium, {ATS} 2016, Hiroshima, Japan, November
21-24, 2016},
pages = {240--245},
publisher = {{IEEE} Computer Society},
year = {2016},
url = {https://doi.org/10.1109/ATS.2016.29},
doi = {10.1109/ATS.2016.29},
timestamp = {Fri, 24 Mar 2023 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/ats/IslamK16.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/ats/IwataM16,
author = {Hiroyuki Iwata and
Jun Matsushima},
title = {Multi-configuration Scan Structure for Various Purposes},
booktitle = {25th {IEEE} Asian Test Symposium, {ATS} 2016, Hiroshima, Japan, November
21-24, 2016},
pages = {131},
publisher = {{IEEE} Computer Society},
year = {2016},
url = {https://doi.org/10.1109/ATS.2016.32},
doi = {10.1109/ATS.2016.32},
timestamp = {Fri, 24 Mar 2023 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/ats/IwataM16.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/ats/KampmannH16,
author = {Matthias Kampmann and
Sybille Hellebrand},
title = {X Marks the Spot: Scan-Flip-Flop Clustering for Faster-than-at-Speed
Test},
booktitle = {25th {IEEE} Asian Test Symposium, {ATS} 2016, Hiroshima, Japan, November
21-24, 2016},
pages = {1--6},
publisher = {{IEEE} Computer Society},
year = {2016},
url = {https://doi.org/10.1109/ATS.2016.20},
doi = {10.1109/ATS.2016.20},
timestamp = {Sat, 30 Sep 2023 01:00:00 +0200},
biburl = {https://dblp.org/rec/conf/ats/KampmannH16.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/ats/KatoWSKW16,
author = {Takaaki Kato and
Senling Wang and
Yasuo Sato and
Seiji Kajihara and
Xiaoqing Wen},
title = {A Flexible Power Control Method for Right Power Testing of Scan-Based
Logic {BIST}},
booktitle = {25th {IEEE} Asian Test Symposium, {ATS} 2016, Hiroshima, Japan, November
21-24, 2016},
pages = {203--208},
publisher = {{IEEE} Computer Society},
year = {2016},
url = {https://doi.org/10.1109/ATS.2016.59},
doi = {10.1109/ATS.2016.59},
timestamp = {Fri, 24 Mar 2023 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/ats/KatoWSKW16.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/ats/KawabataASYK16,
author = {Masayuki Kawabata and
Koji Asami and
Shohei Shibuya and
Tomonori Yanagida and
Haruo Kobayashi},
title = {Rectangular Waveform Generation with Harmonics Suppression},
booktitle = {25th {IEEE} Asian Test Symposium, {ATS} 2016, Hiroshima, Japan, November
21-24, 2016},
pages = {125},
publisher = {{IEEE} Computer Society},
year = {2016},
url = {https://doi.org/10.1109/ATS.2016.52},
doi = {10.1109/ATS.2016.52},
timestamp = {Fri, 24 Mar 2023 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/ats/KawabataASYK16.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/ats/KochteBSW16,
author = {Michael A. Kochte and
Rafal Baranowski and
Marcel Schaal and
Hans{-}Joachim Wunderlich},
title = {Test Strategies for Reconfigurable Scan Networks},
booktitle = {25th {IEEE} Asian Test Symposium, {ATS} 2016, Hiroshima, Japan, November
21-24, 2016},
pages = {113--118},
publisher = {{IEEE} Computer Society},
year = {2016},
url = {https://doi.org/10.1109/ATS.2016.35},
doi = {10.1109/ATS.2016.35},
timestamp = {Fri, 24 Mar 2023 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/ats/KochteBSW16.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/ats/Kundu16,
author = {Sandip Kundu},
title = {Managing Reliability of Integrated Circuits: Lifetime Metering and
Design for Healing},
booktitle = {25th {IEEE} Asian Test Symposium, {ATS} 2016, Hiroshima, Japan, November
21-24, 2016},
pages = {227},
publisher = {{IEEE} Computer Society},
year = {2016},
url = {https://doi.org/10.1109/ATS.2016.80},
doi = {10.1109/ATS.2016.80},
timestamp = {Fri, 24 Mar 2023 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/ats/Kundu16.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/ats/LeeO16,
author = {Siaw Chen Lee and
Soon Ee Ong},
title = {rosTest: Universal Test Framework for Real-Time Operating System},
booktitle = {25th {IEEE} Asian Test Symposium, {ATS} 2016, Hiroshima, Japan, November
21-24, 2016},
pages = {129},
publisher = {{IEEE} Computer Society},
year = {2016},
url = {https://doi.org/10.1109/ATS.2016.39},
doi = {10.1109/ATS.2016.39},
timestamp = {Fri, 24 Mar 2023 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/ats/LeeO16.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/ats/LinCLLKC16,
author = {Tzu{-}Ying Lin and
Yong{-}Xiao Chen and
Jin{-}Fu Li and
Chih{-}Yen Lo and
Ding{-}Ming Kwai and
Yung{-}Fa Chou},
title = {A Test Method for Finding Boundary Currents of 1T1R Memristor Memories},
booktitle = {25th {IEEE} Asian Test Symposium, {ATS} 2016, Hiroshima, Japan, November
21-24, 2016},
pages = {281--286},
publisher = {{IEEE} Computer Society},
year = {2016},
url = {https://doi.org/10.1109/ATS.2016.44},
doi = {10.1109/ATS.2016.44},
timestamp = {Tue, 17 Oct 2023 01:00:00 +0200},
biburl = {https://dblp.org/rec/conf/ats/LinCLLKC16.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/ats/LinRC16,
author = {Xijiang Lin and
Sudhakar M. Reddy and
Wu{-}Tung Cheng},
title = {On Achieving Maximal Chain Diagnosis Resolution through Test Pattern
Selection},
booktitle = {25th {IEEE} Asian Test Symposium, {ATS} 2016, Hiroshima, Japan, November
21-24, 2016},
pages = {132--137},
publisher = {{IEEE} Computer Society},
year = {2016},
url = {https://doi.org/10.1109/ATS.2016.22},
doi = {10.1109/ATS.2016.22},
timestamp = {Fri, 24 Mar 2023 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/ats/LinRC16.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/ats/LinWL16,
author = {Sheng{-}Lin Lin and
Cheng{-}Hung Wu and
Kuen{-}Jong Lee},
title = {Repairable Cell-Based Chip Design for Simultaneous Yield Enhancement
and Fault Diagnosis},
booktitle = {25th {IEEE} Asian Test Symposium, {ATS} 2016, Hiroshima, Japan, November
21-24, 2016},
pages = {25--30},
publisher = {{IEEE} Computer Society},
year = {2016},
url = {https://doi.org/10.1109/ATS.2016.27},
doi = {10.1109/ATS.2016.27},
timestamp = {Fri, 24 Mar 2023 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/ats/LinWL16.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/ats/LiuLW16,
author = {Hsuan{-}Wei Liu and
Bing{-}Yang Lin and
Cheng{-}Wen Wu},
title = {Layout-Oriented Defect Set Reduction for Fast Circuit Simulation in
Cell-Aware Test},
booktitle = {25th {IEEE} Asian Test Symposium, {ATS} 2016, Hiroshima, Japan, November
21-24, 2016},
pages = {156--160},
publisher = {{IEEE} Computer Society},
year = {2016},
url = {https://doi.org/10.1109/ATS.2016.25},
doi = {10.1109/ATS.2016.25},
timestamp = {Sat, 30 Sep 2023 01:00:00 +0200},
biburl = {https://dblp.org/rec/conf/ats/LiuLW16.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/ats/LuZH16,
author = {Shyue{-}Kung Lu and
Shang{-}Xiu Zhong and
Masaki Hashizume},
title = {Adaptive {ECC} Techniques for Yield and Reliability Enhancement of
Flash Memories},
booktitle = {25th {IEEE} Asian Test Symposium, {ATS} 2016, Hiroshima, Japan, November
21-24, 2016},
pages = {287--292},
publisher = {{IEEE} Computer Society},
year = {2016},
url = {https://doi.org/10.1109/ATS.2016.64},
doi = {10.1109/ATS.2016.64},
timestamp = {Fri, 24 Mar 2023 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/ats/LuZH16.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/ats/LuoHN16,
author = {Hao Luo and
Mehrdad Heydarzadeh and
Mehrdad Nourani},
title = {Aging-Leakage Tradeoffs Using Multi-Vth Cell Library},
booktitle = {25th {IEEE} Asian Test Symposium, {ATS} 2016, Hiroshima, Japan, November
21-24, 2016},
pages = {298--303},
publisher = {{IEEE} Computer Society},
year = {2016},
url = {https://doi.org/10.1109/ATS.2016.13},
doi = {10.1109/ATS.2016.13},
timestamp = {Fri, 24 Mar 2023 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/ats/LuoHN16.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/ats/MitraDBDH16,
author = {Sayandeep Mitra and
Moumita Das and
Ansuman Banerjee and
Kausik Datta and
Tsung{-}Yi Ho},
title = {A Verification Guided Approach for Selective Program Transformations
for Approximate Computing},
booktitle = {25th {IEEE} Asian Test Symposium, {ATS} 2016, Hiroshima, Japan, November
21-24, 2016},
pages = {37--42},
publisher = {{IEEE} Computer Society},
year = {2016},
url = {https://doi.org/10.1109/ATS.2016.28},
doi = {10.1109/ATS.2016.28},
timestamp = {Fri, 24 Mar 2023 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/ats/MitraDBDH16.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/ats/MizushimaSFMWMM16,
author = {Takeshi Mizushima and
Kazuki Shirahata and
Tasuku Fujibe and
Hidenobu Matsumura and
Daisuke Watanabe and
Hiroyuki Mineo and
Shin Masuda},
title = {An Optical/Electrical Test System for 100-Gb/s Optical Interconnection
Devices for High Volume Production},
booktitle = {25th {IEEE} Asian Test Symposium, {ATS} 2016, Hiroshima, Japan, November
21-24, 2016},
pages = {130},
publisher = {{IEEE} Computer Society},
year = {2016},
url = {https://doi.org/10.1109/ATS.2016.51},
doi = {10.1109/ATS.2016.51},
timestamp = {Fri, 24 Mar 2023 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/ats/MizushimaSFMWMM16.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/ats/MoghaddamMRTZ16,
author = {Elham K. Moghaddam and
Nilanjan Mukherjee and
Janusz Rajski and
Jerzy Tyszer and
Justyna Zawada},
title = {On Test Points Enhancing Hardware Security},
booktitle = {25th {IEEE} Asian Test Symposium, {ATS} 2016, Hiroshima, Japan, November
21-24, 2016},
pages = {61--66},
publisher = {{IEEE} Computer Society},
year = {2016},
url = {https://doi.org/10.1109/ATS.2016.24},
doi = {10.1109/ATS.2016.24},
timestamp = {Fri, 24 Mar 2023 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/ats/MoghaddamMRTZ16.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/ats/MuldreyDC16,
author = {Barry John Muldrey and
Sabyasachi Deyati and
Abhijit Chatterjee},
title = {Concurrent Stimulus and Defect Magnitude Optimization for Detection
of Weakest Shorts and Opens in Analog Circuits},
booktitle = {25th {IEEE} Asian Test Symposium, {ATS} 2016, Hiroshima, Japan, November
21-24, 2016},
pages = {96--101},
publisher = {{IEEE} Computer Society},
year = {2016},
url = {https://doi.org/10.1109/ATS.2016.61},
doi = {10.1109/ATS.2016.61},
timestamp = {Fri, 24 Mar 2023 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/ats/MuldreyDC16.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/ats/PandeyDSC16,
author = {Sujay Pandey and
Sabyasachi Deyati and
Adit D. Singh and
Abhijit Chatterjee},
title = {Noise-Resilient {SRAM} Physically Unclonable Function Design for Security},
booktitle = {25th {IEEE} Asian Test Symposium, {ATS} 2016, Hiroshima, Japan, November
21-24, 2016},
pages = {55--60},
publisher = {{IEEE} Computer Society},
year = {2016},
url = {https://doi.org/10.1109/ATS.2016.65},
doi = {10.1109/ATS.2016.65},
timestamp = {Fri, 24 Mar 2023 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/ats/PandeyDSC16.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/ats/PellereyJSRRTU16,
author = {Francesco Pellerey and
Maksim Jenihhin and
Giovanni Squillero and
Jaan Raik and
Matteo Sonza Reorda and
Valentin Tihhomirov and
Raimund Ubar},
title = {Rejuvenation of NBTI-Impacted Processors Using Evolutionary Generation
of Assembler Programs},
booktitle = {25th {IEEE} Asian Test Symposium, {ATS} 2016, Hiroshima, Japan, November
21-24, 2016},
pages = {304--309},
publisher = {{IEEE} Computer Society},
year = {2016},
url = {https://doi.org/10.1109/ATS.2016.57},
doi = {10.1109/ATS.2016.57},
timestamp = {Fri, 24 Mar 2023 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/ats/PellereyJSRRTU16.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/ats/PomeranzR16,
author = {Irith Pomeranz and
Sudhakar M. Reddy},
title = {On the Switching Activity in Faulty Circuits During Test Application},
booktitle = {25th {IEEE} Asian Test Symposium, {ATS} 2016, Hiroshima, Japan, November
21-24, 2016},
pages = {13--18},
publisher = {{IEEE} Computer Society},
year = {2016},
url = {https://doi.org/10.1109/ATS.2016.12},
doi = {10.1109/ATS.2016.12},
timestamp = {Fri, 24 Mar 2023 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/ats/PomeranzR16.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/ats/QiuLWLG016,
author = {Yingxin Qiu and
Huawei Li and
Tiancheng Wang and
Bo Liu and
Yingke Gao and
Xiaowei Li},
title = {Property Coverage Analysis Based Trustworthiness Verification for
Potential Threats from {EDA} Tools},
booktitle = {25th {IEEE} Asian Test Symposium, {ATS} 2016, Hiroshima, Japan, November
21-24, 2016},
pages = {43--48},
publisher = {{IEEE} Computer Society},
year = {2016},
url = {https://doi.org/10.1109/ATS.2016.45},
doi = {10.1109/ATS.2016.45},
timestamp = {Thu, 11 May 2023 01:00:00 +0200},
biburl = {https://dblp.org/rec/conf/ats/QiuLWLG016.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/ats/RamanathanS16,
author = {Parameswaran Ramanathan and
Kewal K. Saluja},
title = {Crypt-Delay: Encrypting {IP} Cores with Capabilities for Gate-level
Logic and Delay Simulations},
booktitle = {25th {IEEE} Asian Test Symposium, {ATS} 2016, Hiroshima, Japan, November
21-24, 2016},
pages = {7--12},
publisher = {{IEEE} Computer Society},
year = {2016},
url = {https://doi.org/10.1109/ATS.2016.47},
doi = {10.1109/ATS.2016.47},
timestamp = {Fri, 24 Mar 2023 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/ats/RamanathanS16.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/ats/SatishkumarV16,
author = {Jayalaxmi Satishkumar and
Nagesh Vaidya},
title = {Achieving Acceptable Bit Error Rate for 40 Gbps Link Using Signal
Conditioning Techniques},
booktitle = {25th {IEEE} Asian Test Symposium, {ATS} 2016, Hiroshima, Japan, November
21-24, 2016},
pages = {126},
publisher = {{IEEE} Computer Society},
year = {2016},
url = {https://doi.org/10.1109/ATS.2016.14},
doi = {10.1109/ATS.2016.14},
timestamp = {Fri, 24 Mar 2023 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/ats/SatishkumarV16.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/ats/SauerJRMWBP16,
author = {Matthias Sauer and
Jie Jiang and
Sven Reimer and
Kohei Miyase and
Xiaoqing Wen and
Bernd Becker and
Ilia Polian},
title = {On Optimal Power-Aware Path Sensitization},
booktitle = {25th {IEEE} Asian Test Symposium, {ATS} 2016, Hiroshima, Japan, November
21-24, 2016},
pages = {179--184},
publisher = {{IEEE} Computer Society},
year = {2016},
url = {https://doi.org/10.1109/ATS.2016.63},
doi = {10.1109/ATS.2016.63},
timestamp = {Thu, 11 Apr 2024 01:00:00 +0200},
biburl = {https://dblp.org/rec/conf/ats/SauerJRMWBP16.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/ats/SchneiderW16,
author = {Eric Schneider and
Hans{-}Joachim Wunderlich},
title = {High-Throughput Transistor-Level Fault Simulation on GPUs},
booktitle = {25th {IEEE} Asian Test Symposium, {ATS} 2016, Hiroshima, Japan, November
21-24, 2016},
pages = {150--155},
publisher = {{IEEE} Computer Society},
year = {2016},
url = {https://doi.org/10.1109/ATS.2016.9},
doi = {10.1109/ATS.2016.9},
timestamp = {Fri, 24 Mar 2023 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/ats/SchneiderW16.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/ats/ShenSXYZ16,
author = {Hao Shen and
Lance Shen and
Pierce Xu and
Wu Yang and
Junna Zhong},
title = {Application of Data Mining Based Scan Diagnosis Yield Analysis in
a Foundry and Fabless Working Environment},
booktitle = {25th {IEEE} Asian Test Symposium, {ATS} 2016, Hiroshima, Japan, November
21-24, 2016},
pages = {128},
publisher = {{IEEE} Computer Society},
year = {2016},
url = {https://doi.org/10.1109/ATS.2016.66},
doi = {10.1109/ATS.2016.66},
timestamp = {Fri, 24 Mar 2023 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/ats/ShenSXYZ16.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/ats/ShirahataMFMIIW16,
author = {Kazuki Shirahata and
Takeshi Mizushima and
Tasuku Fujibe and
Hidenobu Matsumura and
Tomoyuki Itakura and
Masahiro Ishida and
Daisuke Watanabe and
Shin Masuda},
title = {An Optical Interconnection Test Method Applicable to 100-Gb/s Transceivers
Using an {ATE} Based Hardware},
booktitle = {25th {IEEE} Asian Test Symposium, {ATS} 2016, Hiroshima, Japan, November
21-24, 2016},
pages = {263--268},
publisher = {{IEEE} Computer Society},
year = {2016},
url = {https://doi.org/10.1109/ATS.2016.53},
doi = {10.1109/ATS.2016.53},
timestamp = {Fri, 24 Mar 2023 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/ats/ShirahataMFMIIW16.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/ats/SinghGPBKP16,
author = {Jasvir Singh and
Anuj Grover and
Mausumi Pohit and
Anurag Singh Baghel and
Gurjit Kaur and
Shalini Pathak},
title = {Scan Chain Adaptation through {ECO}},
booktitle = {25th {IEEE} Asian Test Symposium, {ATS} 2016, Hiroshima, Japan, November
21-24, 2016},
pages = {107--112},
publisher = {{IEEE} Computer Society},
year = {2016},
url = {https://doi.org/10.1109/ATS.2016.16},
doi = {10.1109/ATS.2016.16},
timestamp = {Fri, 24 Mar 2023 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/ats/SinghGPBKP16.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/ats/SootkaneungCH16,
author = {Warin Sootkaneung and
Sasithorn Chookaew and
Suppachai Howimanporn},
title = {Combined Impact of {BTI} and Temperature Effect Inversion on Circuit
Performance},
booktitle = {25th {IEEE} Asian Test Symposium, {ATS} 2016, Hiroshima, Japan, November
21-24, 2016},
pages = {310--315},
publisher = {{IEEE} Computer Society},
year = {2016},
url = {https://doi.org/10.1109/ATS.2016.34},
doi = {10.1109/ATS.2016.34},
timestamp = {Fri, 24 Mar 2023 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/ats/SootkaneungCH16.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/ats/SrimaniGR16,
author = {Supriyo Srimani and
Kasturi Ghosh and
Hafizur Rahaman},
title = {Parametric Fault Detection in Analog Circuits: {A} Statistical Approach},
booktitle = {25th {IEEE} Asian Test Symposium, {ATS} 2016, Hiroshima, Japan, November
21-24, 2016},
pages = {275--280},
publisher = {{IEEE} Computer Society},
year = {2016},
url = {https://doi.org/10.1109/ATS.2016.55},
doi = {10.1109/ATS.2016.55},
timestamp = {Fri, 24 Mar 2023 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/ats/SrimaniGR16.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/ats/TahooriC16,
author = {Mehdi Baradaran Tahoori and
Krishnendu Chakrabarty},
title = {Test and Reliability Issues in 2.5D and 3D Integration},
booktitle = {25th {IEEE} Asian Test Symposium, {ATS} 2016, Hiroshima, Japan, November
21-24, 2016},
pages = {73},
publisher = {{IEEE} Computer Society},
year = {2016},
url = {https://doi.org/10.1109/ATS.2016.79},
doi = {10.1109/ATS.2016.79},
timestamp = {Fri, 24 Mar 2023 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/ats/TahooriC16.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/ats/TanLW16,
author = {Lai Pheng Tan and
Shen Shen Lee and
Kian Hui Wong},
title = {Design and Implementation of {EMIB} Testing on 2.5D {FPGA} Transceiver},
booktitle = {25th {IEEE} Asian Test Symposium, {ATS} 2016, Hiroshima, Japan, November
21-24, 2016},
pages = {127},
publisher = {{IEEE} Computer Society},
year = {2016},
url = {https://doi.org/10.1109/ATS.2016.62},
doi = {10.1109/ATS.2016.62},
timestamp = {Fri, 24 Mar 2023 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/ats/TanLW16.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/ats/UezonoTSNK16,
author = {Takumi Uezono and
Tadanobu Toba and
Ken{-}ichi Shimbo and
Fumihiko Nagasaki and
Kenji Kawamura},
title = {Evaluation Technique for Soft-Error Rate in Terrestrial Environment
Utilizing Low-Energy Neutron Irradiation},
booktitle = {25th {IEEE} Asian Test Symposium, {ATS} 2016, Hiroshima, Japan, November
21-24, 2016},
pages = {293--297},
publisher = {{IEEE} Computer Society},
year = {2016},
url = {https://doi.org/10.1109/ATS.2016.36},
doi = {10.1109/ATS.2016.36},
timestamp = {Fri, 24 Mar 2023 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/ats/UezonoTSNK16.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/ats/WangAHHTIM16,
author = {Senling Wang and
Hanan T. Al{-}Awadhi and
Soh Hamada and
Yoshinobu Higami and
Hiroshi Takahashi and
Hiroyuki Iwata and
Jun Matsushima},
title = {Structure-Based Methods for Selecting Fault-Detection-Strengthened
{FF} under Multi-cycle Test with Sequential Observation},
booktitle = {25th {IEEE} Asian Test Symposium, {ATS} 2016, Hiroshima, Japan, November
21-24, 2016},
pages = {209--214},
publisher = {{IEEE} Computer Society},
year = {2016},
url = {https://doi.org/10.1109/ATS.2016.40},
doi = {10.1109/ATS.2016.40},
timestamp = {Fri, 24 Mar 2023 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/ats/WangAHHTIM16.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/ats/WangC16,
author = {Ran Wang and
Krishnendu Chakrabarty},
title = {Testing of Interposer-Based 2.5D Integrated Circuits: Challenges and
Solutions},
booktitle = {25th {IEEE} Asian Test Symposium, {ATS} 2016, Hiroshima, Japan, November
21-24, 2016},
pages = {74--79},
publisher = {{IEEE} Computer Society},
year = {2016},
url = {https://doi.org/10.1109/ATS.2016.50},
doi = {10.1109/ATS.2016.50},
timestamp = {Fri, 24 Mar 2023 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/ats/WangC16.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/ats/WangCL16,
author = {Sying{-}Jyan Wang and
Ting{-}Jui Choi and
Katherine Shu{-}Min Li},
title = {Side-Channel Attack on Flipped Scan Chains},
booktitle = {25th {IEEE} Asian Test Symposium, {ATS} 2016, Hiroshima, Japan, November
21-24, 2016},
pages = {67--72},
publisher = {{IEEE} Computer Society},
year = {2016},
url = {https://doi.org/10.1109/ATS.2016.43},
doi = {10.1109/ATS.2016.43},
timestamp = {Fri, 24 Mar 2023 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/ats/WangCL16.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/ats/WangWCT16,
author = {Shengcheng Wang and
Ran Wang and
Krishnendu Chakrabarty and
Mehdi Baradaran Tahoori},
title = {Multicast Test Architecture and Test Scheduling for Interposer-Based
2.5D ICs},
booktitle = {25th {IEEE} Asian Test Symposium, {ATS} 2016, Hiroshima, Japan, November
21-24, 2016},
pages = {86--91},
publisher = {{IEEE} Computer Society},
year = {2016},
url = {https://doi.org/10.1109/ATS.2016.42},
doi = {10.1109/ATS.2016.42},
timestamp = {Fri, 24 Mar 2023 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/ats/WangWCT16.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/ats/YanHFXL16,
author = {Aibin Yan and
Zhengfeng Huang and
Xiangsheng Fang and
Xiaolin Xu and
Huaguo Liang},
title = {Novel Low Cost and Double Node Upset Tolerant Latch Design for Nanoscale
{CMOS} Technology},
booktitle = {25th {IEEE} Asian Test Symposium, {ATS} 2016, Hiroshima, Japan, November
21-24, 2016},
pages = {252--256},
publisher = {{IEEE} Computer Society},
year = {2016},
url = {https://doi.org/10.1109/ATS.2016.17},
doi = {10.1109/ATS.2016.17},
timestamp = {Fri, 24 Mar 2023 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/ats/YanHFXL16.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/ats/YeKLW16,
author = {Jin{-}Cun Ye and
Michael A. Kochte and
Kuen{-}Jong Lee and
Hans{-}Joachim Wunderlich},
title = {Autonomous Testing for 3D-ICs with {IEEE} Std. 1687},
booktitle = {25th {IEEE} Asian Test Symposium, {ATS} 2016, Hiroshima, Japan, November
21-24, 2016},
pages = {215--220},
publisher = {{IEEE} Computer Society},
year = {2016},
url = {https://doi.org/10.1109/ATS.2016.56},
doi = {10.1109/ATS.2016.56},
timestamp = {Fri, 24 Mar 2023 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/ats/YeKLW16.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/ats/ZhaoK16,
author = {Yong Zhao and
Hans G. Kerkhoff},
title = {Highly Dependable Multi-processor SoCs Employing Lifetime Prediction
Based on Health Monitors},
booktitle = {25th {IEEE} Asian Test Symposium, {ATS} 2016, Hiroshima, Japan, November
21-24, 2016},
pages = {228--233},
publisher = {{IEEE} Computer Society},
year = {2016},
url = {https://doi.org/10.1109/ATS.2016.30},
doi = {10.1109/ATS.2016.30},
timestamp = {Fri, 24 Mar 2023 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/ats/ZhaoK16.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@proceedings{DBLP:conf/ats/2016,
title = {25th {IEEE} Asian Test Symposium, {ATS} 2016, Hiroshima, Japan, November
21-24, 2016},
publisher = {{IEEE} Computer Society},
year = {2016},
url = {https://ieeexplore.ieee.org/xpl/conhome/7795842/proceeding},
isbn = {978-1-5090-3809-1},
timestamp = {Wed, 16 Oct 2019 01:00:00 +0200},
biburl = {https://dblp.org/rec/conf/ats/2016.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/ats/AhlawatTMS15,
author = {Satyadev Ahlawat and
Jaynarayan T. Tudu and
Anzhela Yu. Matrosova and
Virendra Singh},
title = {A New Scan Flip Flop Design to Eliminate Performance Penalty of Scan},
booktitle = {24th {IEEE} Asian Test Symposium, {ATS} 2015, Mumbai, India, November
22-25, 2015},
pages = {25--30},
publisher = {{IEEE} Computer Society},
year = {2015},
url = {https://doi.org/10.1109/ATS.2015.12},
doi = {10.1109/ATS.2015.12},
timestamp = {Fri, 24 Mar 2023 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/ats/AhlawatTMS15.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/ats/AsadaWHMKKSWQ15,
author = {Koji Asada and
Xiaoqing Wen and
Stefan Holst and
Kohei Miyase and
Seiji Kajihara and
Michael A. Kochte and
Eric Schneider and
Hans{-}Joachim Wunderlich and
Jun Qian},
title = {Logic/Clock-Path-Aware At-Speed Scan Test Generation for Avoiding
False Capture Failures and Reducing Clock Stretch},
booktitle = {24th {IEEE} Asian Test Symposium, {ATS} 2015, Mumbai, India, November
22-25, 2015},
pages = {103--108},
publisher = {{IEEE} Computer Society},
year = {2015},
url = {https://doi.org/10.1109/ATS.2015.25},
doi = {10.1109/ATS.2015.25},
timestamp = {Fri, 24 Mar 2023 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/ats/AsadaWHMKKSWQ15.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/ats/BehnamA15,
author = {Payman Behnam and
Bijan Alizadeh},
title = {In-Circuit Mutation-Based Automatic Correction of Certain Design Errors
Using {SAT} Mechanisms},
booktitle = {24th {IEEE} Asian Test Symposium, {ATS} 2015, Mumbai, India, November
22-25, 2015},
pages = {199--204},
publisher = {{IEEE} Computer Society},
year = {2015},
url = {https://doi.org/10.1109/ATS.2015.41},
doi = {10.1109/ATS.2015.41},
timestamp = {Fri, 24 Mar 2023 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/ats/BehnamA15.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/ats/CantoroMRZL15,
author = {Riccardo Cantoro and
Mehrdad Montazeri and
Matteo Sonza Reorda and
Farrokh Ghani Zadegan and
Erik Larsson},
title = {On the testability of {IEEE} 1687 networks},
booktitle = {24th {IEEE} Asian Test Symposium, {ATS} 2015, Mumbai, India, November
22-25, 2015},
pages = {211--216},
publisher = {{IEEE} Computer Society},
year = {2015},
url = {https://doi.org/10.1109/ATS.2015.7447934},
doi = {10.1109/ATS.2015.7447934},
timestamp = {Fri, 24 Mar 2023 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/ats/CantoroMRZL15.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/ats/ChangYHW15,
author = {Chun{-}Hao Chang and
Kuen{-}Wei Yeh and
Jiun{-}Lang Huang and
Laung{-}Terng Wang},
title = {{SDC-TPG:} {A} Deterministic Zero-Inflation Parallel Test Pattern
Generator},
booktitle = {24th {IEEE} Asian Test Symposium, {ATS} 2015, Mumbai, India, November
22-25, 2015},
pages = {43--48},
publisher = {{IEEE} Computer Society},
year = {2015},
url = {https://doi.org/10.1109/ATS.2015.15},
doi = {10.1109/ATS.2015.15},
timestamp = {Fri, 24 Mar 2023 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/ats/ChangYHW15.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/ats/ChiangHCPL15,
author = {Kuan{-}Ying Chiang and
Yu{-}Hao Ho and
Yo{-}Wei Chen and
Cheng{-}Sheng Pan and
James Chien{-}Mo Li},
title = {Fault Simulation and Test Pattern Generation for Cross-gate Defects
in FinFET Circuits},
booktitle = {24th {IEEE} Asian Test Symposium, {ATS} 2015, Mumbai, India, November
22-25, 2015},
pages = {181--186},
publisher = {{IEEE} Computer Society},
year = {2015},
url = {https://doi.org/10.1109/ATS.2015.38},
doi = {10.1109/ATS.2015.38},
timestamp = {Fri, 24 Mar 2023 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/ats/ChiangHCPL15.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/ats/ChintaluriPNNR15,
author = {Ashwin Chintaluri and
Abhinav Parihar and
Suriyaprakash Natarajan and
Helia Naeimi and
Arijit Raychowdhury},
title = {A Model Study of Defects and Faults in Embedded Spin Transfer Torque
{(STT)} {MRAM} Arrays},
booktitle = {24th {IEEE} Asian Test Symposium, {ATS} 2015, Mumbai, India, November
22-25, 2015},
pages = {187--192},
publisher = {{IEEE} Computer Society},
year = {2015},
url = {https://doi.org/10.1109/ATS.2015.39},
doi = {10.1109/ATS.2015.39},
timestamp = {Fri, 24 Mar 2023 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/ats/ChintaluriPNNR15.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/ats/ChouCL15,
author = {Che{-}Wei Chou and
Yong{-}Xiao Chen and
Jin{-}Fu Li},
title = {Testing Inter-Word Coupling Faults of Wide {I/O} DRAMs},
booktitle = {24th {IEEE} Asian Test Symposium, {ATS} 2015, Mumbai, India, November
22-25, 2015},
pages = {67--72},
publisher = {{IEEE} Computer Society},
year = {2015},
url = {https://doi.org/10.1109/ATS.2015.19},
doi = {10.1109/ATS.2015.19},
timestamp = {Tue, 17 Oct 2023 01:00:00 +0200},
biburl = {https://dblp.org/rec/conf/ats/ChouCL15.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/ats/DeyatiMSC15,
author = {Sabyasachi Deyati and
Barry John Muldrey and
Adit D. Singh and
Abhijit Chatterjee},
title = {Challenge Engineering and Design of Analog Push Pull Amplifier Based
Physically Unclonable Function for Hardware Security},
booktitle = {24th {IEEE} Asian Test Symposium, {ATS} 2015, Mumbai, India, November
22-25, 2015},
pages = {127--132},
publisher = {{IEEE} Computer Society},
year = {2015},
url = {https://doi.org/10.1109/ATS.2015.29},
doi = {10.1109/ATS.2015.29},
timestamp = {Fri, 24 Mar 2023 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/ats/DeyatiMSC15.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/ats/DuttaCBD15,
author = {Saikat Dutta and
Soumi Chattopadhyay and
Ansuman Banerjee and
Pallab Dasgupta},
title = {A New Approach for Minimal Environment Construction for Modular Property
Verification},
booktitle = {24th {IEEE} Asian Test Symposium, {ATS} 2015, Mumbai, India, November
22-25, 2015},
pages = {205--210},
publisher = {{IEEE} Computer Society},
year = {2015},
url = {https://doi.org/10.1109/ATS.2015.42},
doi = {10.1109/ATS.2015.42},
timestamp = {Mon, 26 Jun 2023 01:00:00 +0200},
biburl = {https://dblp.org/rec/conf/ats/DuttaCBD15.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/ats/FlenkerSF15,
author = {Tino Flenker and
Andr{\'{e}} S{\"{u}}lflow and
G{\"{o}}rschwin Fey},
title = {Diagnostic Tests and Diagnosis for Delay Faults Using Path Segmentation},
booktitle = {24th {IEEE} Asian Test Symposium, {ATS} 2015, Mumbai, India, November
22-25, 2015},
pages = {145--150},
publisher = {{IEEE} Computer Society},
year = {2015},
url = {https://doi.org/10.1109/ATS.2015.32},
doi = {10.1109/ATS.2015.32},
timestamp = {Fri, 24 Mar 2023 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/ats/FlenkerSF15.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/ats/Fujita15,
author = {Masahiro Fujita},
title = {Detection of test Patterns with Unreachable States through Efficient
Inductive-Invariant Identification},
booktitle = {24th {IEEE} Asian Test Symposium, {ATS} 2015, Mumbai, India, November
22-25, 2015},
pages = {31--36},
publisher = {{IEEE} Computer Society},
year = {2015},
url = {https://doi.org/10.1109/ATS.2015.13},
doi = {10.1109/ATS.2015.13},
timestamp = {Fri, 24 Mar 2023 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/ats/Fujita15.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/ats/GuptaGMK15,
author = {Sukrat Gupta and
Neel Gala and
G. S. Madhusudan and
V. Kamakoti},
title = {{SHAKTI-F:} {A} Fault Tolerant Microprocessor Architecture},
booktitle = {24th {IEEE} Asian Test Symposium, {ATS} 2015, Mumbai, India, November
22-25, 2015},
pages = {163--168},
publisher = {{IEEE} Computer Society},
year = {2015},
url = {https://doi.org/10.1109/ATS.2015.35},
doi = {10.1109/ATS.2015.35},
timestamp = {Fri, 24 Mar 2023 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/ats/GuptaGMK15.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/ats/IshidaNMIA15,
author = {Masahiro Ishida and
Toru Nakura and
Akira Matsukawa and
Rimon Ikeno and
Kunihiro Asada},
title = {A Technique for Analyzing On-Chip Power Supply Impedance},
booktitle = {24th {IEEE} Asian Test Symposium, {ATS} 2015, Mumbai, India, November
22-25, 2015},
pages = {193--198},
publisher = {{IEEE} Computer Society},
year = {2015},
url = {https://doi.org/10.1109/ATS.2015.40},
doi = {10.1109/ATS.2015.40},
timestamp = {Fri, 24 Mar 2023 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/ats/IshidaNMIA15.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/ats/JiangXS15,
author = {Zhou Jiang and
Dong Xiang and
Kele Shen},
title = {A Novel Scan Segmentation Design for Power Controllability and Reduction
in At-Speed Test},
booktitle = {24th {IEEE} Asian Test Symposium, {ATS} 2015, Mumbai, India, November
22-25, 2015},
pages = {7--12},
publisher = {{IEEE} Computer Society},
year = {2015},
url = {https://doi.org/10.1109/ATS.2015.9},
doi = {10.1109/ATS.2015.9},
timestamp = {Fri, 24 Mar 2023 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/ats/JiangXS15.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/ats/KampmannKSIHW15,
author = {Matthias Kampmann and
Michael A. Kochte and
Eric Schneider and
Thomas Indlekofer and
Sybille Hellebrand and
Hans{-}Joachim Wunderlich},
title = {Optimized Selection of Frequencies for Faster-Than-at-Speed Test},
booktitle = {24th {IEEE} Asian Test Symposium, {ATS} 2015, Mumbai, India, November
22-25, 2015},
pages = {109--114},
publisher = {{IEEE} Computer Society},
year = {2015},
url = {https://doi.org/10.1109/ATS.2015.26},
doi = {10.1109/ATS.2015.26},
timestamp = {Sat, 30 Sep 2023 01:00:00 +0200},
biburl = {https://dblp.org/rec/conf/ats/KampmannKSIHW15.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/ats/KarmakarAC15,
author = {Rajit Karmakar and
Aditya Agarwal and
Santanu Chattopadhyay},
title = {Test Infrastructure Development and Test Scheduling of 3D-Stacked
ICs under Resource and Power Constraints},
booktitle = {24th {IEEE} Asian Test Symposium, {ATS} 2015, Mumbai, India, November
22-25, 2015},
pages = {73--78},
publisher = {{IEEE} Computer Society},
year = {2015},
url = {https://doi.org/10.1109/ATS.2015.20},
doi = {10.1109/ATS.2015.20},
timestamp = {Fri, 24 Mar 2023 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/ats/KarmakarAC15.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/ats/KimAJP15,
author = {Dooyoung Kim and
Muhammad Adil Ansari and
Jihun Jung and
Sungju Park},
title = {Scan-Puf: Puf Elements Selection Methods for Viable {IC} Identification},
booktitle = {24th {IEEE} Asian Test Symposium, {ATS} 2015, Mumbai, India, November
22-25, 2015},
pages = {121--126},
publisher = {{IEEE} Computer Society},
year = {2015},
url = {https://doi.org/10.1109/ATS.2015.28},
doi = {10.1109/ATS.2015.28},
timestamp = {Fri, 24 Mar 2023 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/ats/KimAJP15.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/ats/KimiMYIKY15,
author = {Yuta Kimi and
Go Matsukawa and
Shuhei Yoshida and
Shintaro Izumi and
Hiroshi Kawaguchi and
Masahiko Yoshimoto},
title = {Analysis of Soft Error Propagation Considering Masking Effects on
Re-Convergent Path},
booktitle = {24th {IEEE} Asian Test Symposium, {ATS} 2015, Mumbai, India, November
22-25, 2015},
pages = {139--144},
publisher = {{IEEE} Computer Society},
year = {2015},
url = {https://doi.org/10.1109/ATS.2015.31},
doi = {10.1109/ATS.2015.31},
timestamp = {Mon, 11 Mar 2024 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/ats/KimiMYIKY15.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/ats/KinseherZP15,
author = {Josef Kinseher and
Leonardo Bonet Zordan and
Ilia Polian},
title = {On the Use of Assist Circuits for Improved Coupling Fault Detection
in SRAMs},
booktitle = {24th {IEEE} Asian Test Symposium, {ATS} 2015, Mumbai, India, November
22-25, 2015},
pages = {61--66},
publisher = {{IEEE} Computer Society},
year = {2015},
url = {https://doi.org/10.1109/ATS.2015.18},
doi = {10.1109/ATS.2015.18},
timestamp = {Fri, 24 Mar 2023 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/ats/KinseherZP15.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/ats/KochteDBOMW15,
author = {Michael A. Kochte and
Atefe Dalirsani and
Andrea Bernabei and
Martin Oma{\~{n}}a and
Cecilia Metra and
Hans{-}Joachim Wunderlich},
title = {Intermittent and Transient Fault Diagnosis on Sparse Code Signatures},
booktitle = {24th {IEEE} Asian Test Symposium, {ATS} 2015, Mumbai, India, November
22-25, 2015},
pages = {157--162},
publisher = {{IEEE} Computer Society},
year = {2015},
url = {https://doi.org/10.1109/ATS.2015.34},
doi = {10.1109/ATS.2015.34},
timestamp = {Fri, 24 Mar 2023 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/ats/KochteDBOMW15.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/ats/LinCR15,
author = {Xijiang Lin and
Wu{-}Tung Cheng and
Janusz Rajski},
title = {On Improving Transition Test Set Quality to Detect {CMOS} Transistor
Stuck-Open Faults},
booktitle = {24th {IEEE} Asian Test Symposium, {ATS} 2015, Mumbai, India, November
22-25, 2015},
pages = {97--102},
publisher = {{IEEE} Computer Society},
year = {2015},
url = {https://doi.org/10.1109/ATS.2015.24},
doi = {10.1109/ATS.2015.24},
timestamp = {Fri, 24 Mar 2023 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/ats/LinCR15.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/ats/LiuA15,
author = {Hejia Liu and
Vishwani D. Agrawal},
title = {Securing {IEEE} 1687-2014 Standard Instrumentation Access by {LFSR}
Key},
booktitle = {24th {IEEE} Asian Test Symposium, {ATS} 2015, Mumbai, India, November
22-25, 2015},
pages = {91--96},
publisher = {{IEEE} Computer Society},
year = {2015},
url = {https://doi.org/10.1109/ATS.2015.23},
doi = {10.1109/ATS.2015.23},
timestamp = {Fri, 24 Mar 2023 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/ats/LiuA15.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/ats/LiuWLLL15,
author = {Guopei Liu and
Ying Wang and
Sen Li and
Huawei Li and
Xiaowei Li},
title = {A Lightweight Timing Channel Protection for Shared Memory Controllers},
booktitle = {24th {IEEE} Asian Test Symposium, {ATS} 2015, Mumbai, India, November
22-25, 2015},
pages = {55--60},
publisher = {{IEEE} Computer Society},
year = {2015},
url = {https://doi.org/10.1109/ATS.2015.17},
doi = {10.1109/ATS.2015.17},
timestamp = {Thu, 11 May 2023 01:00:00 +0200},
biburl = {https://dblp.org/rec/conf/ats/LiuWLLL15.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/ats/LuTH15,
author = {Shyue{-}Kung Lu and
Cheng{-}Ju Tsai and
Masaki Hashizume},
title = {Integration of Hard Repair Techniques with {ECC} for Enhancing Fabrication
Yield and Reliability of Embedded Memories},
booktitle = {24th {IEEE} Asian Test Symposium, {ATS} 2015, Mumbai, India, November
22-25, 2015},
pages = {49--54},
publisher = {{IEEE} Computer Society},
year = {2015},
url = {https://doi.org/10.1109/ATS.2015.16},
doi = {10.1109/ATS.2015.16},
timestamp = {Fri, 24 Mar 2023 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/ats/LuTH15.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/ats/MBS15,
author = {Adithyalal P. M and
Shankar Balachandran and
Virendra Singh},
title = {A Soft Error Resilient Low Leakage {SRAM} Cell Design},
booktitle = {24th {IEEE} Asian Test Symposium, {ATS} 2015, Mumbai, India, November
22-25, 2015},
pages = {133--138},
publisher = {{IEEE} Computer Society},
year = {2015},
url = {https://doi.org/10.1109/ATS.2015.30},
doi = {10.1109/ATS.2015.30},
timestamp = {Fri, 24 Mar 2023 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/ats/MBS15.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/ats/MandalSCPC15,
author = {Swagata Mandal and
Suman Sau and
Amlan Chakrabarti and
Sushanta Kumar Pal and
Subhasish Chattopadhyay},
title = {{FPGA} Implementation of High Speed Latency Optimized Optical Communication
System Based on Orthogonal Concatenated Code},
booktitle = {24th {IEEE} Asian Test Symposium, {ATS} 2015, Mumbai, India, November
22-25, 2015},
pages = {169--174},
publisher = {{IEEE} Computer Society},
year = {2015},
url = {https://doi.org/10.1109/ATS.2015.36},
doi = {10.1109/ATS.2015.36},
timestamp = {Fri, 24 Mar 2023 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/ats/MandalSCPC15.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/ats/MasudaNHF15,
author = {Tetsuya Masuda and
Jun Nishimaki and
Toshinori Hosokawa and
Hideo Fujiwara},
title = {A Test Generation Method for Data Paths Using Easily Testable Functional
Time Expansion Models and Controller Augmentation},
booktitle = {24th {IEEE} Asian Test Symposium, {ATS} 2015, Mumbai, India, November
22-25, 2015},
pages = {37--42},
publisher = {{IEEE} Computer Society},
year = {2015},
url = {https://doi.org/10.1109/ATS.2015.14},
doi = {10.1109/ATS.2015.14},
timestamp = {Fri, 24 Mar 2023 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/ats/MasudaNHF15.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/ats/MondalDB15,
author = {Joyati Mondal and
Debesh K. Das and
Bhargab B. Bhattacharya},
title = {Design-for-testability in reversible logic circuits based on bit-swapping},
booktitle = {24th {IEEE} Asian Test Symposium, {ATS} 2015, Mumbai, India, November
22-25, 2015},
pages = {217--222},
publisher = {{IEEE} Computer Society},
year = {2015},
url = {https://doi.org/10.1109/ATS.2015.8125669},
doi = {10.1109/ATS.2015.8125669},
timestamp = {Tue, 04 Feb 2020 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/ats/MondalDB15.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/ats/MrugalskiRSTW15,
author = {Grzegorz Mrugalski and
Janusz Rajski and
Jedrzej Solecki and
Jerzy Tyszer and
Chen Wang},
title = {TestExpress - New Time-Effective Scan-Based Deterministic Test Paradigm},
booktitle = {24th {IEEE} Asian Test Symposium, {ATS} 2015, Mumbai, India, November
22-25, 2015},
pages = {19--24},
publisher = {{IEEE} Computer Society},
year = {2015},
url = {https://doi.org/10.1109/ATS.2015.11},
doi = {10.1109/ATS.2015.11},
timestamp = {Fri, 24 Mar 2023 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/ats/MrugalskiRSTW15.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/ats/NuthakkiC15,
author = {Srinivasa Shashank Nuthakki and
Santanu Chattopadhyay},
title = {An Integrated Approach for Improving Compression and Diagnostic Properties
of Test Sets},
booktitle = {24th {IEEE} Asian Test Symposium, {ATS} 2015, Mumbai, India, November
22-25, 2015},
pages = {151--156},
publisher = {{IEEE} Computer Society},
year = {2015},
url = {https://doi.org/10.1109/ATS.2015.33},
doi = {10.1109/ATS.2015.33},
timestamp = {Sat, 30 Sep 2023 01:00:00 +0200},
biburl = {https://dblp.org/rec/conf/ats/NuthakkiC15.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/ats/PrasanthPA15,
author = {V. Prasanth and
Rubin A. Parekhji and
Bharadwaj S. Amrutur},
title = {Improved Methods for Accurate Safety Analysis of Real-Life Systems},
booktitle = {24th {IEEE} Asian Test Symposium, {ATS} 2015, Mumbai, India, November
22-25, 2015},
pages = {175--180},
publisher = {{IEEE} Computer Society},
year = {2015},
url = {https://doi.org/10.1109/ATS.2015.37},
doi = {10.1109/ATS.2015.37},
timestamp = {Fri, 24 Mar 2023 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/ats/PrasanthPA15.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/ats/Seo0LLYKK15,
author = {Sungyoul Seo and
Yong Lee and
Hyeonchan Lim and
Joohwan Lee and
Hongbom Yoo and
Yojoung Kim and
Sungho Kang},
title = {Scan Chain Reordering-Aware X-Filling and Stitching for Scan Shift
Power Reduction},
booktitle = {24th {IEEE} Asian Test Symposium, {ATS} 2015, Mumbai, India, November
22-25, 2015},
pages = {1--6},
publisher = {{IEEE} Computer Society},
year = {2015},
url = {https://doi.org/10.1109/ATS.2015.8},
doi = {10.1109/ATS.2015.8},
timestamp = {Wed, 28 Feb 2024 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/ats/Seo0LLYKK15.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/ats/ShibinCKPM15,
author = {Konstantin Shibin and
Vivek Chickermane and
Brion L. Keller and
Christos Papameletis and
Erik Jan Marinissen},
title = {At-Speed Testing of Inter-Die Connections of 3D-SICs in the Presence
of Shore Logic},
booktitle = {24th {IEEE} Asian Test Symposium, {ATS} 2015, Mumbai, India, November
22-25, 2015},
pages = {79--84},
publisher = {{IEEE} Computer Society},
year = {2015},
url = {https://doi.org/10.1109/ATS.2015.21},
doi = {10.1109/ATS.2015.21},
timestamp = {Mon, 05 Feb 2024 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/ats/ShibinCKPM15.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/ats/SinghSS15,
author = {Virendra Singh and
Adit D. Singh and
Kewal K. Saluja},
title = {A Methodology for Identifying High Timing Variability Paths in Complex
Designs},
booktitle = {24th {IEEE} Asian Test Symposium, {ATS} 2015, Mumbai, India, November
22-25, 2015},
pages = {115--120},
publisher = {{IEEE} Computer Society},
year = {2015},
url = {https://doi.org/10.1109/ATS.2015.27},
doi = {10.1109/ATS.2015.27},
timestamp = {Fri, 24 Mar 2023 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/ats/SinghSS15.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/ats/YoshimuraTYH15,
author = {Masayoshi Yoshimura and
Yoshiyasu Takahashi and
Hiroshi Yamazaki and
Toshinori Hosokawa},
title = {A Don't Care Filling Method to Reduce Capture Power Based on Correlation
of {FF} Transitions},
booktitle = {24th {IEEE} Asian Test Symposium, {ATS} 2015, Mumbai, India, November
22-25, 2015},
pages = {13--18},
publisher = {{IEEE} Computer Society},
year = {2015},
url = {https://doi.org/10.1109/ATS.2015.10},
doi = {10.1109/ATS.2015.10},
timestamp = {Fri, 24 Mar 2023 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/ats/YoshimuraTYH15.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/ats/ZhouLWLWL15,
author = {Jun Zhou and
Huawei Li and
Tiancheng Wang and
Sen Li and
Ying Wang and
Xiaowei Li},
title = {TWiN: {A} Turn-Guided Reliable Routing Scheme for Wireless 3D NoCs},
booktitle = {24th {IEEE} Asian Test Symposium, {ATS} 2015, Mumbai, India, November
22-25, 2015},
pages = {85--90},
publisher = {{IEEE} Computer Society},
year = {2015},
url = {https://doi.org/10.1109/ATS.2015.22},
doi = {10.1109/ATS.2015.22},
timestamp = {Thu, 11 May 2023 01:00:00 +0200},
biburl = {https://dblp.org/rec/conf/ats/ZhouLWLWL15.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@proceedings{DBLP:conf/ats/2015,
title = {24th {IEEE} Asian Test Symposium, {ATS} 2015, Mumbai, India, November
22-25, 2015},
publisher = {{IEEE} Computer Society},
year = {2015},
url = {https://ieeexplore.ieee.org/xpl/conhome/7421875/proceeding},
isbn = {978-1-4673-9739-1},
timestamp = {Wed, 16 Oct 2019 01:00:00 +0200},
biburl = {https://dblp.org/rec/conf/ats/2015.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/ats/AliYYHI14,
author = {Yussuf Ali and
Yuta Yamato and
Tomokazu Yoneda and
Kazumi Hatayama and
Michiko Inoue},
title = {Parallel Path Delay Fault Simulation for Multi/Many-Core Processors
with {SIMD} Units},
booktitle = {23rd {IEEE} Asian Test Symposium, {ATS} 2014, Hangzhou, China, November
16-19, 2014},
pages = {292--297},
publisher = {{IEEE} Computer Society},
year = {2014},
url = {https://doi.org/10.1109/ATS.2014.61},
doi = {10.1109/ATS.2014.61},
timestamp = {Fri, 24 Mar 2023 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/ats/AliYYHI14.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/ats/BanerjeeGCA14,
author = {Suvadeep Banerjee and
{\'{A}}lvaro G{\'{o}}mez{-}Pau and
Abhijit Chatterjee and
Jacob A. Abraham},
title = {Error Resilient Real-Time State Variable Systems for Signal Processing
and Control},
booktitle = {23rd {IEEE} Asian Test Symposium, {ATS} 2014, Hangzhou, China, November
16-19, 2014},
pages = {39--44},
publisher = {{IEEE} Computer Society},
year = {2014},
url = {https://doi.org/10.1109/ATS.2014.19},
doi = {10.1109/ATS.2014.19},
timestamp = {Fri, 24 Mar 2023 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/ats/BanerjeeGCA14.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/ats/BiGHNYJ14,
author = {Yu Bi and
Pierre{-}Emmanuel Gaillardon and
Xiaobo Sharon Hu and
Michael T. Niemier and
Jiann{-}Shiun Yuan and
Yier Jin},
title = {Leveraging Emerging Technology for Hardware Security - Case Study
on Silicon Nanowire FETs and Graphene SymFETs},
booktitle = {23rd {IEEE} Asian Test Symposium, {ATS} 2014, Hangzhou, China, November
16-19, 2014},
pages = {342--347},
publisher = {{IEEE} Computer Society},
year = {2014},
url = {https://doi.org/10.1109/ATS.2014.69},
doi = {10.1109/ATS.2014.69},
timestamp = {Fri, 24 Mar 2023 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/ats/BiGHNYJ14.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/ats/ChaG14,
author = {Byeongju Cha and
Sandeep K. Gupta},
title = {A Resizing Method to Minimize Effects of Hardware Trojans},
booktitle = {23rd {IEEE} Asian Test Symposium, {ATS} 2014, Hangzhou, China, November
16-19, 2014},
pages = {192--199},
publisher = {{IEEE} Computer Society},
year = {2014},
url = {https://doi.org/10.1109/ATS.2014.44},
doi = {10.1109/ATS.2014.44},
timestamp = {Tue, 26 Sep 2023 01:00:00 +0200},
biburl = {https://dblp.org/rec/conf/ats/ChaG14.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/ats/ChandraCK14,
author = {Anshuman Chandra and
Subramanian Chebiyam and
Rohit Kapur},
title = {A Case Study on Implementing Compressed {DFT} Architecture},
booktitle = {23rd {IEEE} Asian Test Symposium, {ATS} 2014, Hangzhou, China, November
16-19, 2014},
pages = {336--341},
publisher = {{IEEE} Computer Society},
year = {2014},
url = {https://doi.org/10.1109/ATS.2014.68},
doi = {10.1109/ATS.2014.68},
timestamp = {Fri, 24 Mar 2023 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/ats/ChandraCK14.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/ats/Chen14,
author = {Harry H. Chen},
title = {Perspectives on Test Data Mining from Industrial Experience},
booktitle = {23rd {IEEE} Asian Test Symposium, {ATS} 2014, Hangzhou, China, November
16-19, 2014},
pages = {242--247},
publisher = {{IEEE} Computer Society},
year = {2014},
url = {https://doi.org/10.1109/ATS.2014.52},
doi = {10.1109/ATS.2014.52},
timestamp = {Fri, 24 Mar 2023 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/ats/Chen14.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/ats/ChenL14,
author = {Yong{-}Xiao Chen and
Jin{-}Fu Li},
title = {Testing of Non-volatile Logic-Based System Chips},
booktitle = {23rd {IEEE} Asian Test Symposium, {ATS} 2014, Hangzhou, China, November
16-19, 2014},
pages = {224--229},
publisher = {{IEEE} Computer Society},
year = {2014},
url = {https://doi.org/10.1109/ATS.2014.49},
doi = {10.1109/ATS.2014.49},
timestamp = {Tue, 17 Oct 2023 01:00:00 +0200},
biburl = {https://dblp.org/rec/conf/ats/ChenL14.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/ats/ChengL014,
author = {Yun Cheng and
Huawei Li and
Xiaowei Li},
title = {An On-Line Timing Error Detection Method for Silicon Debug},
booktitle = {23rd {IEEE} Asian Test Symposium, {ATS} 2014, Hangzhou, China, November
16-19, 2014},
pages = {263--268},
publisher = {{IEEE} Computer Society},
year = {2014},
url = {https://doi.org/10.1109/ATS.2014.63},
doi = {10.1109/ATS.2014.63},
timestamp = {Thu, 11 May 2023 01:00:00 +0200},
biburl = {https://dblp.org/rec/conf/ats/ChengL014.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/ats/ChengWGG14,
author = {Da Cheng and
Fangzhou Wang and
Feng Gao and
Sandeep K. Gupta},
title = {Optimal Redundancy Designs for CNFET-Based Circuits},
booktitle = {23rd {IEEE} Asian Test Symposium, {ATS} 2014, Hangzhou, China, November
16-19, 2014},
pages = {25--32},
publisher = {{IEEE} Computer Society},
year = {2014},
url = {https://doi.org/10.1109/ATS.2014.17},
doi = {10.1109/ATS.2014.17},
timestamp = {Fri, 22 Sep 2023 01:00:00 +0200},
biburl = {https://dblp.org/rec/conf/ats/ChengWGG14.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/ats/DalirsaniHIESRW14,
author = {Atefe Dalirsani and
Nadereh Hatami and
Michael E. Imhof and
Marcus Eggenberger and
Gert Schley and
Martin Radetzki and
Hans{-}Joachim Wunderlich},
title = {On Covering Structural Defects in NoCs by Functional Tests},
booktitle = {23rd {IEEE} Asian Test Symposium, {ATS} 2014, Hangzhou, China, November
16-19, 2014},
pages = {87--92},
publisher = {{IEEE} Computer Society},
year = {2014},
url = {https://doi.org/10.1109/ATS.2014.27},
doi = {10.1109/ATS.2014.27},
timestamp = {Fri, 24 Mar 2023 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/ats/DalirsaniHIESRW14.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/ats/DeyatiMSC14,
author = {Sabyasachi Deyati and
Barry John Muldrey and
Adit D. Singh and
Abhijit Chatterjee},
title = {High Resolution Pulse Propagation Driven Trojan Detection in Digital
Logic: Optimization Algorithms and Infrastructure},
booktitle = {23rd {IEEE} Asian Test Symposium, {ATS} 2014, Hangzhou, China, November
16-19, 2014},
pages = {200--205},
publisher = {{IEEE} Computer Society},
year = {2014},
url = {https://doi.org/10.1109/ATS.2014.45},
doi = {10.1109/ATS.2014.45},
timestamp = {Fri, 24 Mar 2023 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/ats/DeyatiMSC14.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/ats/ErbSSRB14,
author = {Dominik Erb and
Karsten Scheibler and
Matthias Sauer and
Sudhakar M. Reddy and
Bernd Becker},
title = {Circuit Parameter Independent Test Pattern Generation for Interconnect
Open Defects},
booktitle = {23rd {IEEE} Asian Test Symposium, {ATS} 2014, Hangzhou, China, November
16-19, 2014},
pages = {131--136},
publisher = {{IEEE} Computer Society},
year = {2014},
url = {https://doi.org/10.1109/ATS.2014.34},
doi = {10.1109/ATS.2014.34},
timestamp = {Fri, 24 Mar 2023 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/ats/ErbSSRB14.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/ats/FanXZ14,
author = {Junfeng Fan and
Hua Xie and
Yiwei Zhang},
title = {On the Use of Scan Chain to Improve Physical Attacks (Extended Abstract)},
booktitle = {23rd {IEEE} Asian Test Symposium, {ATS} 2014, Hangzhou, China, November
16-19, 2014},
pages = {354--357},
publisher = {{IEEE} Computer Society},
year = {2014},
url = {https://doi.org/10.1109/ATS.2014.71},
doi = {10.1109/ATS.2014.71},
timestamp = {Fri, 24 Mar 2023 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/ats/FanXZ14.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/ats/FirouziYKCT14,
author = {Farshad Firouzi and
Fangming Ye and
Saman Kiamehr and
Krishnendu Chakrabarty and
Mehdi Baradaran Tahoori},
title = {Adaptive Mitigation of Parameter Variations},
booktitle = {23rd {IEEE} Asian Test Symposium, {ATS} 2014, Hangzhou, China, November
16-19, 2014},
pages = {51--56},
publisher = {{IEEE} Computer Society},
year = {2014},
url = {https://doi.org/10.1109/ATS.2014.21},
doi = {10.1109/ATS.2014.21},
timestamp = {Fri, 24 Mar 2023 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/ats/FirouziYKCT14.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/ats/GentH14,
author = {Kelson Gent and
Michael S. Hsiao},
title = {Dual-Purpose Mixed-Level Test Generation Using Swarm Intelligence},
booktitle = {23rd {IEEE} Asian Test Symposium, {ATS} 2014, Hangzhou, China, November
16-19, 2014},
pages = {230--235},
publisher = {{IEEE} Computer Society},
year = {2014},
url = {https://doi.org/10.1109/ATS.2014.50},
doi = {10.1109/ATS.2014.50},
timestamp = {Fri, 24 Mar 2023 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/ats/GentH14.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/ats/Gizdarski14,
author = {Emil Gizdarski},
title = {Two-Step Dynamic Encoding for Linear Decompressors},
booktitle = {23rd {IEEE} Asian Test Symposium, {ATS} 2014, Hangzhou, China, November
16-19, 2014},
pages = {330--335},
publisher = {{IEEE} Computer Society},
year = {2014},
url = {https://doi.org/10.1109/ATS.2014.67},
doi = {10.1109/ATS.2014.67},
timestamp = {Fri, 24 Mar 2023 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/ats/Gizdarski14.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/ats/HanCOK14,
author = {Taewoo Han and
Inhyuk Choi and
Hyunggoy Oh and
Sungho Kang},
title = {A Scalable and Parallel Test Access Strategy for NoC-Based Multicore
System},
booktitle = {23rd {IEEE} Asian Test Symposium, {ATS} 2014, Hangzhou, China, November
16-19, 2014},
pages = {81--86},
publisher = {{IEEE} Computer Society},
year = {2014},
url = {https://doi.org/10.1109/ATS.2014.26},
doi = {10.1109/ATS.2014.26},
timestamp = {Tue, 27 Feb 2024 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/ats/HanCOK14.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/ats/Hashimoto14,
author = {Masanori Hashimoto},
title = {Opportunities and Verification Challenges of Run-Time Performance
Adaptation},
booktitle = {23rd {IEEE} Asian Test Symposium, {ATS} 2014, Hangzhou, China, November
16-19, 2014},
pages = {248--253},
publisher = {{IEEE} Computer Society},
year = {2014},
url = {https://doi.org/10.1109/ATS.2014.53},
doi = {10.1109/ATS.2014.53},
timestamp = {Fri, 24 Mar 2023 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/ats/Hashimoto14.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/ats/HoseyRXFT14,
author = {Alison Hosey and
Md. Tauhidur Rahman and
Kan Xiao and
Domenic Forte and
Mohammad Tehranipoor},
title = {Advanced Analysis of Cell Stability for Reliable {SRAM} PUFs},
booktitle = {23rd {IEEE} Asian Test Symposium, {ATS} 2014, Hangzhou, China, November
16-19, 2014},
pages = {348--353},
publisher = {{IEEE} Computer Society},
year = {2014},
url = {https://doi.org/10.1109/ATS.2014.70},
doi = {10.1109/ATS.2014.70},
timestamp = {Fri, 24 Mar 2023 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/ats/HoseyRXFT14.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/ats/HuangLZTC14,
author = {Shi{-}Yu Huang and
Hua{-}Xuan Li and
Zeng{-}Fu Zeng and
Kun{-}Han Tsai and
Wu{-}Tung Cheng},
title = {On-Line Transition-Time Monitoring for Die-to-Die Interconnects in
3D ICs},
booktitle = {23rd {IEEE} Asian Test Symposium, {ATS} 2014, Hangzhou, China, November
16-19, 2014},
pages = {162--167},
publisher = {{IEEE} Computer Society},
year = {2014},
url = {https://doi.org/10.1109/ATS.2014.39},
doi = {10.1109/ATS.2014.39},
timestamp = {Fri, 24 Mar 2023 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/ats/HuangLZTC14.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/ats/HungLH14,
author = {Shao{-}Feng Hung and
Long{-}Yi Lin and
Hao{-}Chiao Hong},
title = {A Cost-Effective Stimulus Generator for Battery Channel Characterization
in Electric Vehicles},
booktitle = {23rd {IEEE} Asian Test Symposium, {ATS} 2014, Hangzhou, China, November
16-19, 2014},
pages = {63--67},
publisher = {{IEEE} Computer Society},
year = {2014},
url = {https://doi.org/10.1109/ATS.2014.23},
doi = {10.1109/ATS.2014.23},
timestamp = {Fri, 24 Mar 2023 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/ats/HungLH14.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/ats/JiaoF14,
author = {Jiajia Jiao and
Yuzhuo Fu},
title = {A Heuristically Mechanical Model for Accurate and Fast Soft Error
Analysis},
booktitle = {23rd {IEEE} Asian Test Symposium, {ATS} 2014, Hangzhou, China, November
16-19, 2014},
pages = {33--38},
publisher = {{IEEE} Computer Society},
year = {2014},
url = {https://doi.org/10.1109/ATS.2014.18},
doi = {10.1109/ATS.2014.18},
timestamp = {Fri, 24 Mar 2023 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/ats/JiaoF14.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/ats/JutmanRW14,
author = {Artur Jutman and
Matteo Sonza Reorda and
Hans{-}Joachim Wunderlich},
title = {High Quality System Level Test and Diagnosis},
booktitle = {23rd {IEEE} Asian Test Symposium, {ATS} 2014, Hangzhou, China, November
16-19, 2014},
pages = {298--305},
publisher = {{IEEE} Computer Society},
year = {2014},
url = {https://doi.org/10.1109/ATS.2014.62},
doi = {10.1109/ATS.2014.62},
timestamp = {Fri, 24 Mar 2023 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/ats/JutmanRW14.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/ats/KajiharaMSM14,
author = {Seiji Kajihara and
Yousuke Miyake and
Yasuo Sato and
Yukiya Miura},
title = {An On-Chip Digital Environment Monitor for Field Test},
booktitle = {23rd {IEEE} Asian Test Symposium, {ATS} 2014, Hangzhou, China, November
16-19, 2014},
pages = {254--257},
publisher = {{IEEE} Computer Society},
year = {2014},
url = {https://doi.org/10.1109/ATS.2014.54},
doi = {10.1109/ATS.2014.54},
timestamp = {Fri, 24 Mar 2023 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/ats/KajiharaMSM14.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/ats/KumarMVPTR14,
author = {Chandan Kumar and
Fadi Maamari and
Kiran Vittal and
Wilson Pradeep and
Rajesh Tiwari and
Srivaths Ravi},
title = {Methodology for Early {RTL} Testability and Coverage Analysis and
Its Application to Industrial Designs},
booktitle = {23rd {IEEE} Asian Test Symposium, {ATS} 2014, Hangzhou, China, November
16-19, 2014},
pages = {125--130},
publisher = {{IEEE} Computer Society},
year = {2014},
url = {https://doi.org/10.1109/ATS.2014.33},
doi = {10.1109/ATS.2014.33},
timestamp = {Fri, 24 Mar 2023 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/ats/KumarMVPTR14.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/ats/LiDHC14,
author = {Zipeng Li and
Trung Anh Dinh and
Tsung{-}Yi Ho and
Krishnendu Chakrabarty},
title = {Reliability-Driven Pipelined Scan-Like Testing of Digital Microfluidic
Biochips},
booktitle = {23rd {IEEE} Asian Test Symposium, {ATS} 2014, Hangzhou, China, November
16-19, 2014},
pages = {57--62},
publisher = {{IEEE} Computer Society},
year = {2014},
url = {https://doi.org/10.1109/ATS.2014.22},
doi = {10.1109/ATS.2014.22},
timestamp = {Fri, 24 Mar 2023 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/ats/LiDHC14.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/ats/LiWWHHGC14,
author = {Katherine Shu{-}Min Li and
Sying{-}Jyan Wang and
Jia{-}Lin Wu and
Cheng{-}You Ho and
Yingchieh Ho and
Ruei{-}Ting Gu and
Bo{-}Chuan Cheng},
title = {Optimized Pre-bond Test Methodology for Silicon Interposer Testing},
booktitle = {23rd {IEEE} Asian Test Symposium, {ATS} 2014, Hangzhou, China, November
16-19, 2014},
pages = {13--18},
publisher = {{IEEE} Computer Society},
year = {2014},
url = {https://doi.org/10.1109/ATS.2014.15},
doi = {10.1109/ATS.2014.15},
timestamp = {Fri, 24 Mar 2023 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/ats/LiWWHHGC14.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/ats/LiangWHY14,
author = {Huaguo Liang and
Zhi Wang and
Zhengfeng Huang and
Aibin Yan},
title = {Design of a Radiation Hardened Latch for Low-Power Circuits},
booktitle = {23rd {IEEE} Asian Test Symposium, {ATS} 2014, Hangzhou, China, November
16-19, 2014},
pages = {19--24},
publisher = {{IEEE} Computer Society},
year = {2014},
url = {https://doi.org/10.1109/ATS.2014.16},
doi = {10.1109/ATS.2014.16},
timestamp = {Fri, 24 Mar 2023 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/ats/LiangWHY14.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/ats/LinHC14,
author = {Fan Lin and
Chun{-}Kai Hsu and
Kwang{-}Ting Cheng},
title = {Learning from Production Test Data: Correlation Exploration and Feature
Engineering},
booktitle = {23rd {IEEE} Asian Test Symposium, {ATS} 2014, Hangzhou, China, November
16-19, 2014},
pages = {236--241},
publisher = {{IEEE} Computer Society},
year = {2014},
url = {https://doi.org/10.1109/ATS.2014.51},
doi = {10.1109/ATS.2014.51},
timestamp = {Fri, 24 Mar 2023 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/ats/LinHC14.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/ats/LingJ14,
author = {Li Ling and
Jianhui Jiang},
title = {Exploit Dynamic Voltage and Frequency Scaling for SoC Test Scheduling
under Thermal Constraints},
booktitle = {23rd {IEEE} Asian Test Symposium, {ATS} 2014, Hangzhou, China, November
16-19, 2014},
pages = {180--185},
publisher = {{IEEE} Computer Society},
year = {2014},
url = {https://doi.org/10.1109/ATS.2014.36},
doi = {10.1109/ATS.2014.36},
timestamp = {Fri, 24 Mar 2023 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/ats/LingJ14.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/ats/LuJLHK14,
author = {Shyue{-}Kung Lu and
Hao{-}Cheng Jheng and
Hao{-}Wei Lin and
Masaki Hashizume and
Seiji Kajihara},
title = {Built-In Scrambling Analysis for Yield Enhancement of Embedded Memories},
booktitle = {23rd {IEEE} Asian Test Symposium, {ATS} 2014, Hangzhou, China, November
16-19, 2014},
pages = {137--142},
publisher = {{IEEE} Computer Society},
year = {2014},
url = {https://doi.org/10.1109/ATS.2014.41},
doi = {10.1109/ATS.2014.41},
timestamp = {Fri, 24 Mar 2023 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/ats/LuJLHK14.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/ats/MilewskiMRT14,
author = {Sylwester Milewski and
Grzegorz Mrugalski and
Janusz Rajski and
Jerzy Tyszer},
title = {Low Power Test Compression with Programmable Broadcast-Based Control},
booktitle = {23rd {IEEE} Asian Test Symposium, {ATS} 2014, Hangzhou, China, November
16-19, 2014},
pages = {174--179},
publisher = {{IEEE} Computer Society},
year = {2014},
url = {https://doi.org/10.1109/ATS.2014.35},
doi = {10.1109/ATS.2014.35},
timestamp = {Fri, 24 Mar 2023 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/ats/MilewskiMRT14.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/ats/MitsuyamaO14,
author = {Yukio Mitsuyama and
Hidetoshi Onodera},
title = {Variability and Soft-Error Resilience in Dependable {VLSI} Platform},
booktitle = {23rd {IEEE} Asian Test Symposium, {ATS} 2014, Hangzhou, China, November
16-19, 2014},
pages = {45--50},
publisher = {{IEEE} Computer Society},
year = {2014},
url = {https://doi.org/10.1109/ATS.2014.20},
doi = {10.1109/ATS.2014.20},
timestamp = {Fri, 24 Mar 2023 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/ats/MitsuyamaO14.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/ats/MiyakeSKM14,
author = {Yousuke Miyake and
Yasuo Sato and
Seiji Kajihara and
Yukiya Miura},
title = {Temperature and Voltage Estimation Using Ring-Oscillator-Based Monitor
for Field Test},
booktitle = {23rd {IEEE} Asian Test Symposium, {ATS} 2014, Hangzhou, China, November
16-19, 2014},
pages = {156--161},
publisher = {{IEEE} Computer Society},
year = {2014},
url = {https://doi.org/10.1109/ATS.2014.38},
doi = {10.1109/ATS.2014.38},
timestamp = {Fri, 24 Mar 2023 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/ats/MiyakeSKM14.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/ats/MondalKDR14,
author = {Bappaditya Mondal and
Dipak Kumar Kole and
Debesh Kumar Das and
Hafizur Rahaman},
title = {Generator for Test Set Construction of {SMGF} in Reversible Circuit
by Boolean Difference Method},
booktitle = {23rd {IEEE} Asian Test Symposium, {ATS} 2014, Hangzhou, China, November
16-19, 2014},
pages = {68--73},
publisher = {{IEEE} Computer Society},
year = {2014},
url = {https://doi.org/10.1109/ATS.2014.24},
doi = {10.1109/ATS.2014.24},
timestamp = {Fri, 24 Mar 2023 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/ats/MondalKDR14.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/ats/MoreiraWIRFY14,
author = {Jose Moreira and
Hubert Werkmann and
Masahiro Ishida and
Bernhard Roth and
Volker Filsinger and
Sui{-}Xia Yang},
title = {An {ATE} Based 32 Gbaud {PAM-4} At-Speed Characterization and Testing
Solution},
booktitle = {23rd {IEEE} Asian Test Symposium, {ATS} 2014, Hangzhou, China, November
16-19, 2014},
pages = {218--223},
publisher = {{IEEE} Computer Society},
year = {2014},
url = {https://doi.org/10.1109/ATS.2014.48},
doi = {10.1109/ATS.2014.48},
timestamp = {Fri, 24 Mar 2023 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/ats/MoreiraWIRFY14.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/ats/NagataFM14,
author = {Makoto Nagata and
Daisuke Fujimoto and
Noriyuki Miura},
title = {On-Chip Monitoring for In-Place Diagnosis of Undesired Power Domain
Problems in {IC} Chips},
booktitle = {23rd {IEEE} Asian Test Symposium, {ATS} 2014, Hangzhou, China, November
16-19, 2014},
pages = {258--262},
publisher = {{IEEE} Computer Society},
year = {2014},
url = {https://doi.org/10.1109/ATS.2014.55},
doi = {10.1109/ATS.2014.55},
timestamp = {Fri, 24 Mar 2023 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/ats/NagataFM14.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/ats/PorcheB14,
author = {John A. Porche and
R. D. (Shawn) Blanton},
title = {Physically-Aware Diagnostic Resolution},
booktitle = {23rd {IEEE} Asian Test Symposium, {ATS} 2014, Hangzhou, China, November
16-19, 2014},
pages = {206--211},
publisher = {{IEEE} Computer Society},
year = {2014},
url = {https://doi.org/10.1109/ATS.2014.46},
doi = {10.1109/ATS.2014.46},
timestamp = {Fri, 24 Mar 2023 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/ats/PorcheB14.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/ats/QiuY014,
author = {Jibing Qiu and
Guihai Yan and
Xiaowei Li},
title = {On-Chip Delay Sensor for Environments with Large Temperature Fluctuations},
booktitle = {23rd {IEEE} Asian Test Symposium, {ATS} 2014, Hangzhou, China, November
16-19, 2014},
pages = {275--280},
publisher = {{IEEE} Computer Society},
year = {2014},
url = {https://doi.org/10.1109/ATS.2014.65},
doi = {10.1109/ATS.2014.65},
timestamp = {Fri, 24 Mar 2023 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/ats/QiuY014.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/ats/RenaudBMS14,
author = {Guillaume Renaud and
Manuel J. Barrag{\'{a}}n and
Salvador Mir and
Marc Sabut},
title = {On-Chip Implementation of an Integrator-Based Servo-Loop for {ADC}
Static Linearity Test},
booktitle = {23rd {IEEE} Asian Test Symposium, {ATS} 2014, Hangzhou, China, November
16-19, 2014},
pages = {212--217},
publisher = {{IEEE} Computer Society},
year = {2014},
url = {https://doi.org/10.1109/ATS.2014.47},
doi = {10.1109/ATS.2014.47},
timestamp = {Wed, 28 Jun 2023 01:00:00 +0200},
biburl = {https://dblp.org/rec/conf/ats/RenaudBMS14.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/ats/SadiCEKBT14,
author = {Mehdi Sadi and
Zoe Conroy and
Bill Eklow and
Matthias Kamm and
Nematollah Bidokhti and
Mark Mohammad Tehranipoor},
title = {An All Digital Distributed Sensor Network Based Framework for Continuous
Noise Monitoring and Timing Failure Analysis in SoCs},
booktitle = {23rd {IEEE} Asian Test Symposium, {ATS} 2014, Hangzhou, China, November
16-19, 2014},
pages = {269--274},
publisher = {{IEEE} Computer Society},
year = {2014},
url = {https://doi.org/10.1109/ATS.2014.64},
doi = {10.1109/ATS.2014.64},
timestamp = {Fri, 24 Mar 2023 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/ats/SadiCEKBT14.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/ats/ShenXJ14,
author = {Kele Shen and
Dong Xiang and
Zhou Jiang},
title = {Dual-Speed {TAM} Optimization of 3D SoCs for Mid-bond and Post-bond
Testing},
booktitle = {23rd {IEEE} Asian Test Symposium, {ATS} 2014, Hangzhou, China, November
16-19, 2014},
pages = {7--12},
publisher = {{IEEE} Computer Society},
year = {2014},
url = {https://doi.org/10.1109/ATS.2014.14},
doi = {10.1109/ATS.2014.14},
timestamp = {Fri, 24 Mar 2023 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/ats/ShenXJ14.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/ats/ShiN14,
author = {Xiaobing Shi and
Nicola Nicolici},
title = {On Supporting Sequential Constraints for On-Chip Generation of Post-silicon
Validation Stimuli},
booktitle = {23rd {IEEE} Asian Test Symposium, {ATS} 2014, Hangzhou, China, November
16-19, 2014},
pages = {107--112},
publisher = {{IEEE} Computer Society},
year = {2014},
url = {https://doi.org/10.1109/ATS.2014.30},
doi = {10.1109/ATS.2014.30},
timestamp = {Fri, 24 Mar 2023 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/ats/ShiN14.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/ats/SunBDGVA14,
author = {Zhenzhou Sun and
Alberto Bosio and
Luigi Dilillo and
Patrick Girard and
Arnaud Virazel and
Etienne Auvray},
title = {On the Generation of Diagnostic Test Set for Intra-cell Defects},
booktitle = {23rd {IEEE} Asian Test Symposium, {ATS} 2014, Hangzhou, China, November
16-19, 2014},
pages = {312--317},
publisher = {{IEEE} Computer Society},
year = {2014},
url = {https://doi.org/10.1109/ATS.2014.57},
doi = {10.1109/ATS.2014.57},
timestamp = {Fri, 24 Mar 2023 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/ats/SunBDGVA14.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/ats/TangBRCHHTCS14,
author = {Huaxing Tang and
Brady Benware and
Michael Reese and
Joseph Caroselli and
Thomas Herrmann and
Friedrich Hapke and
Robert Tao and
Wu{-}Tung Cheng and
Manish Sharma},
title = {Diagnosing Cell Internal Defects Using Analog Simulation-Based Fault
Models},
booktitle = {23rd {IEEE} Asian Test Symposium, {ATS} 2014, Hangzhou, China, November
16-19, 2014},
pages = {318--323},
publisher = {{IEEE} Computer Society},
year = {2014},
url = {https://doi.org/10.1109/ATS.2014.58},
doi = {10.1109/ATS.2014.58},
timestamp = {Fri, 24 Mar 2023 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/ats/TangBRCHHTCS14.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/ats/TenentesKAZY14,
author = {Vasileios Tenentes and
S. Saqib Khursheed and
Bashir M. Al{-}Hashimi and
Shida Zhong and
Sheng Yang},
title = {High Quality Testing of Grid Style Power Gating},
booktitle = {23rd {IEEE} Asian Test Symposium, {ATS} 2014, Hangzhou, China, November
16-19, 2014},
pages = {186--191},
publisher = {{IEEE} Computer Society},
year = {2014},
url = {https://doi.org/10.1109/ATS.2014.37},
doi = {10.1109/ATS.2014.37},
timestamp = {Mon, 15 May 2023 01:00:00 +0200},
biburl = {https://dblp.org/rec/conf/ats/TenentesKAZY14.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/ats/TrawkaMMPRJT14,
author = {Maciej Trawka and
Grzegorz Mrugalski and
Nilanjan Mukherjee and
Artur Pogiel and
Janusz Rajski and
Jakub Janicki and
Jerzy Tyszer},
title = {High-Speed Serial Embedded Deterministic Test for System-on-Chip Designs},
booktitle = {23rd {IEEE} Asian Test Symposium, {ATS} 2014, Hangzhou, China, November
16-19, 2014},
pages = {74--80},
publisher = {{IEEE} Computer Society},
year = {2014},
url = {https://doi.org/10.1109/ATS.2014.25},
doi = {10.1109/ATS.2014.25},
timestamp = {Fri, 24 Mar 2023 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/ats/TrawkaMMPRJT14.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/ats/Tsai14,
author = {Kun{-}Han Tsai},
title = {Testability-Driven Fault Sampling for Deterministic Test Coverage
Estimation of Large Designs},
booktitle = {23rd {IEEE} Asian Test Symposium, {ATS} 2014, Hangzhou, China, November
16-19, 2014},
pages = {119--124},
publisher = {{IEEE} Computer Society},
year = {2014},
url = {https://doi.org/10.1109/ATS.2014.32},
doi = {10.1109/ATS.2014.32},
timestamp = {Fri, 24 Mar 2023 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/ats/Tsai14.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/ats/WangCHH14,
author = {Chung{-}Yun Wang and
Yu{-}Yi Chen and
Jiun{-}Lang Huang and
Xuan{-}Lun Huang},
title = {FPGA-Based Subset Sum Delay Lines},
booktitle = {23rd {IEEE} Asian Test Symposium, {ATS} 2014, Hangzhou, China, November
16-19, 2014},
pages = {287--291},
publisher = {{IEEE} Computer Society},
year = {2014},
url = {https://doi.org/10.1109/ATS.2014.60},
doi = {10.1109/ATS.2014.60},
timestamp = {Fri, 24 Mar 2023 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/ats/WangCHH14.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/ats/WangKL14,
author = {Sying{-}Jyan Wang and
Che{-}Wei Kao and
Katherine Shu{-}Min Li},
title = {Improving Output Compaction Efficiency with High Observability Scan
Chains},
booktitle = {23rd {IEEE} Asian Test Symposium, {ATS} 2014, Hangzhou, China, November
16-19, 2014},
pages = {324--329},
publisher = {{IEEE} Computer Society},
year = {2014},
url = {https://doi.org/10.1109/ATS.2014.66},
doi = {10.1109/ATS.2014.66},
timestamp = {Fri, 24 Mar 2023 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/ats/WangKL14.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/ats/WuL14,
author = {Cheng{-}Hung Wu and
Kuen{-}Jong Lee},
title = {An Efficient Diagnosis Pattern Generation Procedure to Distinguish
Stuck-at Faults and Bridging Faults},
booktitle = {23rd {IEEE} Asian Test Symposium, {ATS} 2014, Hangzhou, China, November
16-19, 2014},
pages = {306--311},
publisher = {{IEEE} Computer Society},
year = {2014},
url = {https://doi.org/10.1109/ATS.2014.56},
doi = {10.1109/ATS.2014.56},
timestamp = {Fri, 24 Mar 2023 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/ats/WuL14.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/ats/WuLYHYKCL14,
author = {Kuan{-}Te Wu and
Jin{-}Fu Li and
Yun{-}Chao Yu and
Chih{-}Sheng Hou and
Chi{-}Chun Yang and
Ding{-}Ming Kwai and
Yung{-}Fa Chou and
Chih{-}Yen Lo},
title = {Intra-channel Reconfigurable Interface for {TSV} and Micro Bump Fault
Tolerance in 3-D RAMs},
booktitle = {23rd {IEEE} Asian Test Symposium, {ATS} 2014, Hangzhou, China, November
16-19, 2014},
pages = {143--148},
publisher = {{IEEE} Computer Society},
year = {2014},
url = {https://doi.org/10.1109/ATS.2014.42},
doi = {10.1109/ATS.2014.42},
timestamp = {Tue, 17 Oct 2023 01:00:00 +0200},
biburl = {https://dblp.org/rec/conf/ats/WuLYHYKCL14.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/ats/XueB14,
author = {Cheng Xue and
R. D. (Shawn) Blanton},
title = {Predicting {IC} Defect Level Using Diagnosis},
booktitle = {23rd {IEEE} Asian Test Symposium, {ATS} 2014, Hangzhou, China, November
16-19, 2014},
pages = {113--118},
publisher = {{IEEE} Computer Society},
year = {2014},
url = {https://doi.org/10.1109/ATS.2014.31},
doi = {10.1109/ATS.2014.31},
timestamp = {Fri, 24 Mar 2023 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/ats/XueB14.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/ats/YamaguchiTKA14,
author = {Takahiro J. Yamaguchi and
James S. Tandon and
Satoshi Komatsu and
Kunihiro Asada},
title = {A Novel Circuit for Transition-Edge Detection: Using a Stochastic
Comparator Group to Test Transition-Edge},
booktitle = {23rd {IEEE} Asian Test Symposium, {ATS} 2014, Hangzhou, China, November
16-19, 2014},
pages = {168--173},
publisher = {{IEEE} Computer Society},
year = {2014},
url = {https://doi.org/10.1109/ATS.2014.40},
doi = {10.1109/ATS.2014.40},
timestamp = {Fri, 24 Mar 2023 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/ats/YamaguchiTKA14.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/ats/YangCGWN14,
author = {Fan Yang and
Sreejit Chakravarty and
Arun Gunda and
Nicole Wu and
Jianyu Ning},
title = {Silicon Evaluation of Cell-Aware {ATPG} Tests and Small Delay Tests},
booktitle = {23rd {IEEE} Asian Test Symposium, {ATS} 2014, Hangzhou, China, November
16-19, 2014},
pages = {101--106},
publisher = {{IEEE} Computer Society},
year = {2014},
url = {https://doi.org/10.1109/ATS.2014.29},
doi = {10.1109/ATS.2014.29},
timestamp = {Fri, 24 Mar 2023 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/ats/YangCGWN14.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/ats/YouYLLCLKCW14,
author = {Yun{-}Chao You and
Chi{-}Chun Yang and
Jin{-}Fu Li and
Chih{-}Yen Lo and
Chao{-}Hsun Chen and
Jenn{-}Shiang Lai and
Ding{-}Ming Kwai and
Yung{-}Fa Chou and
Cheng{-}Wen Wu},
title = {BIST-Assisted Tuning Scheme for Minimizing IO-Channel Power of TSV-Based
3D DRAMs},
booktitle = {23rd {IEEE} Asian Test Symposium, {ATS} 2014, Hangzhou, China, November
16-19, 2014},
pages = {1--6},
publisher = {{IEEE} Computer Society},
year = {2014},
url = {https://doi.org/10.1109/ATS.2014.13},
doi = {10.1109/ATS.2014.13},
timestamp = {Tue, 17 Oct 2023 01:00:00 +0200},
biburl = {https://dblp.org/rec/conf/ats/YouYLLCLKCW14.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/ats/ZadeganLJDK14,
author = {Farrokh Ghani Zadegan and
Erik Larsson and
Artur Jutman and
Sergei Devadze and
Rene Krenz{-}Baath},
title = {Design, Verification, and Application of {IEEE} 1687},
booktitle = {23rd {IEEE} Asian Test Symposium, {ATS} 2014, Hangzhou, China, November
16-19, 2014},
pages = {93--100},
publisher = {{IEEE} Computer Society},
year = {2014},
url = {https://doi.org/10.1109/ATS.2014.28},
doi = {10.1109/ATS.2014.28},
timestamp = {Fri, 24 Mar 2023 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/ats/ZadeganLJDK14.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/ats/ZhangG14,
author = {Jizhe Zhang and
Sandeep Gupta},
title = {{SRAM} Array Yield Estimation under Spatially-Correlated Process Variation},
booktitle = {23rd {IEEE} Asian Test Symposium, {ATS} 2014, Hangzhou, China, November
16-19, 2014},
pages = {149--155},
publisher = {{IEEE} Computer Society},
year = {2014},
url = {https://doi.org/10.1109/ATS.2014.43},
doi = {10.1109/ATS.2014.43},
timestamp = {Tue, 26 Sep 2023 01:00:00 +0200},
biburl = {https://dblp.org/rec/conf/ats/ZhangG14.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/ats/ZouHS14,
author = {Jie Zou and
Chao Han and
Adit D. Singh},
title = {Timing Evaluation Tests for Scan Enable Signals with Application to
{TDF} Testing},
booktitle = {23rd {IEEE} Asian Test Symposium, {ATS} 2014, Hangzhou, China, November
16-19, 2014},
pages = {281--286},
publisher = {{IEEE} Computer Society},
year = {2014},
url = {https://doi.org/10.1109/ATS.2014.59},
doi = {10.1109/ATS.2014.59},
timestamp = {Fri, 24 Mar 2023 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/ats/ZouHS14.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@proceedings{DBLP:conf/ats/2014,
title = {23rd {IEEE} Asian Test Symposium, {ATS} 2014, Hangzhou, China, November
16-19, 2014},
publisher = {{IEEE} Computer Society},
year = {2014},
url = {https://ieeexplore.ieee.org/xpl/conhome/6975725/proceeding},
isbn = {978-1-4799-6030-9},
timestamp = {Wed, 16 Oct 2019 01:00:00 +0200},
biburl = {https://dblp.org/rec/conf/ats/2014.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/ats/Ang13,
author = {Chin Hai Ang},
title = {Single Test Clock with Programmable Clock Enable Constraints for Multi-clock
Domain SoC {ATPG} Testing},
booktitle = {22nd Asian Test Symposium, {ATS} 2013, Yilan County, Taiwan, November
18-21, 2013},
pages = {195--200},
publisher = {{IEEE} Computer Society},
year = {2013},
url = {https://doi.org/10.1109/ATS.2013.44},
doi = {10.1109/ATS.2013.44},
timestamp = {Fri, 24 Mar 2023 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/ats/Ang13.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/ats/BaiHWCCLCL13,
author = {Bing{-}Chuan Bai and
Chun{-}Lung Hsu and
Ming{-}Hsueh Wu and
Chen{-}An Chen and
Yee{-}Wen Chen and
Kun{-}Lun Luo and
Liang{-}Chia Cheng and
James Chien{-}Mo Li},
title = {Back-End-of-Line Defect Analysis for Rnv8T Nonvolatile {SRAM}},
booktitle = {22nd Asian Test Symposium, {ATS} 2013, Yilan County, Taiwan, November
18-21, 2013},
pages = {123--127},
publisher = {{IEEE} Computer Society},
year = {2013},
url = {https://doi.org/10.1109/ATS.2013.32},
doi = {10.1109/ATS.2013.32},
timestamp = {Fri, 24 Mar 2023 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/ats/BaiHWCCLCL13.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/ats/BanerjeeCKC13,
author = {Suvadeep Banerjee and
Hyun Woo Choi and
David C. Keezer and
Abhijit Chatterjee},
title = {Enhanced Resolution Time-Domain Reflectometry for High Speed Channels:
Characterizing Spatial Discontinuities with Non-ideal Stimulus},
booktitle = {22nd Asian Test Symposium, {ATS} 2013, Yilan County, Taiwan, November
18-21, 2013},
pages = {277--282},
publisher = {{IEEE} Computer Society},
year = {2013},
url = {https://doi.org/10.1109/ATS.2013.58},
doi = {10.1109/ATS.2013.58},
timestamp = {Fri, 24 Mar 2023 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/ats/BanerjeeCKC13.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/ats/BaoTC13,
author = {Fang Bao and
Mohammad Tehranipoor and
Harry H. Chen},
title = {Worst-Case Critical-Path Delay Analysis Considering Power-Supply Noise},
booktitle = {22nd Asian Test Symposium, {ATS} 2013, Yilan County, Taiwan, November
18-21, 2013},
pages = {37--42},
publisher = {{IEEE} Computer Society},
year = {2013},
url = {https://doi.org/10.1109/ATS.2013.17},
doi = {10.1109/ATS.2013.17},
timestamp = {Mon, 17 Jul 2023 01:00:00 +0200},
biburl = {https://dblp.org/rec/conf/ats/BaoTC13.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/ats/BaranowskiKW13,
author = {Rafal Baranowski and
Michael A. Kochte and
Hans{-}Joachim Wunderlich},
title = {Securing Access to Reconfigurable Scan Networks},
booktitle = {22nd Asian Test Symposium, {ATS} 2013, Yilan County, Taiwan, November
18-21, 2013},
pages = {295--300},
publisher = {{IEEE} Computer Society},
year = {2013},
url = {https://doi.org/10.1109/ATS.2013.61},
doi = {10.1109/ATS.2013.61},
timestamp = {Fri, 24 Mar 2023 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/ats/BaranowskiKW13.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/ats/BernardiCRH13,
author = {Paolo Bernardi and
Lyl M. Ciganda and
Matteo Sonza Reorda and
Said Hamdioui},
title = {An Efficient Method for the Test of Embedded Memory Cores during the
Operational Phase},
booktitle = {22nd Asian Test Symposium, {ATS} 2013, Yilan County, Taiwan, November
18-21, 2013},
pages = {227--232},
publisher = {{IEEE} Computer Society},
year = {2013},
url = {https://doi.org/10.1109/ATS.2013.50},
doi = {10.1109/ATS.2013.50},
timestamp = {Fri, 24 Mar 2023 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/ats/BernardiCRH13.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/ats/BhattaTHC13,
author = {Debesh Bhatta and
Nicholas Tzou and
Sen{-}Wen Hsiao and
Abhijit Chatterjee},
title = {Time Domain Reconstruction of Incoherently Undersampled Periodic Waveforms
Using Bandwidth Interleaving},
booktitle = {22nd Asian Test Symposium, {ATS} 2013, Yilan County, Taiwan, November
18-21, 2013},
pages = {283--288},
publisher = {{IEEE} Computer Society},
year = {2013},
url = {https://doi.org/10.1109/ATS.2013.59},
doi = {10.1109/ATS.2013.59},
timestamp = {Fri, 24 Mar 2023 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/ats/BhattaTHC13.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/ats/ChanNCLY13,
author = {Koay Soon Chan and
Nuzrul Fahmi Nordin and
Kim Chon Chan and
Terk Zyou Lok and
Chee Wai Yong},
title = {Multi-histogram {ADC} {BIST} System for {ADC} Linearity Testing},
booktitle = {22nd Asian Test Symposium, {ATS} 2013, Yilan County, Taiwan, November
18-21, 2013},
pages = {213--214},
publisher = {{IEEE} Computer Society},
year = {2013},
url = {https://doi.org/10.1109/ATS.2013.47},
doi = {10.1109/ATS.2013.47},
timestamp = {Fri, 24 Mar 2023 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/ats/ChanNCLY13.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/ats/ChenCHWLBC13,
author = {Chen{-}An Chen and
Yee{-}Wen Chen and
Chun{-}Lung Hsu and
Ming{-}Hsueh Wu and
Kun{-}Lun Luo and
Bing{-}Chuan Bai and
Liang{-}Chia Cheng},
title = {Cost-Effective TAP-Controlled Serialized Compressed Scan Architecture
for 3D Stacked ICs},
booktitle = {22nd Asian Test Symposium, {ATS} 2013, Yilan County, Taiwan, November
18-21, 2013},
pages = {107--108},
publisher = {{IEEE} Computer Society},
year = {2013},
url = {https://doi.org/10.1109/ATS.2013.29},
doi = {10.1109/ATS.2013.29},
timestamp = {Fri, 24 Mar 2023 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/ats/ChenCHWLBC13.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/ats/ChenT13,
author = {Jifeng Chen and
Mohammad Tehranipoor},
title = {Critical Paths Selection and Test Cost Reduction Considering Process
Variations},
booktitle = {22nd Asian Test Symposium, {ATS} 2013, Yilan County, Taiwan, November
18-21, 2013},
pages = {259--264},
publisher = {{IEEE} Computer Society},
year = {2013},
url = {https://doi.org/10.1109/ATS.2013.55},
doi = {10.1109/ATS.2013.55},
timestamp = {Fri, 24 Mar 2023 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/ats/ChenT13.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/ats/ChengH0CZGG13,
author = {Da Cheng and
Hsunwei Hsiung and
Bin Liu and
Jianing Chen and
Jia Zeng and
Ramesh Govindan and
Sandeep K. Gupta},
title = {A New March Test for Process-Variation Induced Delay Faults in SRAMs},
booktitle = {22nd Asian Test Symposium, {ATS} 2013, Yilan County, Taiwan, November
18-21, 2013},
pages = {115--122},
publisher = {{IEEE} Computer Society},
year = {2013},
url = {https://doi.org/10.1109/ATS.2013.31},
doi = {10.1109/ATS.2013.31},
timestamp = {Fri, 22 Sep 2023 01:00:00 +0200},
biburl = {https://dblp.org/rec/conf/ats/ChengH0CZGG13.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/ats/DuttaKC13,
author = {Arpita Dutta and
Subhadip Kundu and
Santanu Chattopadhyay},
title = {Thermal Aware Don't Care Filling to Reduce Peak Temperature and Thermal
Variance during Testing},
booktitle = {22nd Asian Test Symposium, {ATS} 2013, Yilan County, Taiwan, November
18-21, 2013},
pages = {25--30},
publisher = {{IEEE} Computer Society},
year = {2013},
url = {https://doi.org/10.1109/ATS.2013.15},
doi = {10.1109/ATS.2013.15},
timestamp = {Fri, 24 Mar 2023 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/ats/DuttaKC13.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/ats/Eggersglussv13,
author = {Stephan Eggersgl{\"{u}}{\ss}},
title = {Peak Capture Power Reduction for Compact Test Sets Using Opt-Justification-Fill},
booktitle = {22nd Asian Test Symposium, {ATS} 2013, Yilan County, Taiwan, November
18-21, 2013},
pages = {31--36},
publisher = {{IEEE} Computer Society},
year = {2013},
url = {https://doi.org/10.1109/ATS.2013.16},
doi = {10.1109/ATS.2013.16},
timestamp = {Fri, 24 Mar 2023 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/ats/Eggersglussv13.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/ats/ErbKSWB13,
author = {Dominik Erb and
Michael A. Kochte and
Matthias Sauer and
Hans{-}Joachim Wunderlich and
Bernd Becker},
title = {Accurate Multi-cycle {ATPG} in Presence of X-Values},
booktitle = {22nd Asian Test Symposium, {ATS} 2013, Yilan County, Taiwan, November
18-21, 2013},
pages = {245--250},
publisher = {{IEEE} Computer Society},
year = {2013},
url = {https://doi.org/10.1109/ATS.2013.53},
doi = {10.1109/ATS.2013.53},
timestamp = {Fri, 24 Mar 2023 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/ats/ErbKSWB13.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/ats/FukazawaIII13,
author = {Yuki Fukazawa and
Tsuyoshi Iwagaki and
Hideyuki Ichihara and
Tomoo Inoue},
title = {A Transient Fault Tolerant Test Pattern Generator for On-line Built-in
Self-Test},
booktitle = {22nd Asian Test Symposium, {ATS} 2013, Yilan County, Taiwan, November
18-21, 2013},
pages = {85--90},
publisher = {{IEEE} Computer Society},
year = {2013},
url = {https://doi.org/10.1109/ATS.2013.24},
doi = {10.1109/ATS.2013.24},
timestamp = {Fri, 24 Mar 2023 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/ats/FukazawaIII13.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/ats/GentH13,
author = {Kelson Gent and
Michael S. Hsiao},
title = {Functional Test Generation at the {RTL} Using Swarm Intelligence and
Bounded Model Checking},
booktitle = {22nd Asian Test Symposium, {ATS} 2013, Yilan County, Taiwan, November
18-21, 2013},
pages = {233--238},
publisher = {{IEEE} Computer Society},
year = {2013},
url = {https://doi.org/10.1109/ATS.2013.51},
doi = {10.1109/ATS.2013.51},
timestamp = {Fri, 24 Mar 2023 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/ats/GentH13.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/ats/HanS13,
author = {Chao Han and
Adit D. Singh},
title = {Hazard Initialized {LOC} Tests for {TDF} Undetectable {CMOS} Open
Defects},
booktitle = {22nd Asian Test Symposium, {ATS} 2013, Yilan County, Taiwan, November
18-21, 2013},
pages = {189--194},
publisher = {{IEEE} Computer Society},
year = {2013},
url = {https://doi.org/10.1109/ATS.2013.43},
doi = {10.1109/ATS.2013.43},
timestamp = {Fri, 24 Mar 2023 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/ats/HanS13.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/ats/HashizumeKYL13,
author = {Masaki Hashizume and
Tomoaki Konishi and
Hiroyuki Yotsuyanagi and
Shyue{-}Kung Lu},
title = {Testable Design for Electrical Testing of Open Defects at Interconnects
in 3D ICs},
booktitle = {22nd Asian Test Symposium, {ATS} 2013, Yilan County, Taiwan, November
18-21, 2013},
pages = {13--18},
publisher = {{IEEE} Computer Society},
year = {2013},
url = {https://doi.org/10.1109/ATS.2013.13},
doi = {10.1109/ATS.2013.13},
timestamp = {Fri, 24 Mar 2023 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/ats/HashizumeKYL13.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/ats/HoLW13,
author = {Yingchieh Ho and
Katherine Shu{-}Min Li and
Sying{-}Jyan Wang},
title = {Leakage Monitoring Technique in Near-Threshold Systems with a Time-Based
Bootstrapped Ring Oscillator},
booktitle = {22nd Asian Test Symposium, {ATS} 2013, Yilan County, Taiwan, November
18-21, 2013},
pages = {91--96},
publisher = {{IEEE} Computer Society},
year = {2013},
url = {https://doi.org/10.1109/ATS.2013.25},
doi = {10.1109/ATS.2013.25},
timestamp = {Fri, 24 Mar 2023 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/ats/HoLW13.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/ats/HouL13,
author = {Chih{-}Sheng Hou and
Jin{-}Fu Li},
title = {Testing Disturbance Faults in Various {NAND} Flash Memories},
booktitle = {22nd Asian Test Symposium, {ATS} 2013, Yilan County, Taiwan, November
18-21, 2013},
pages = {221--226},
publisher = {{IEEE} Computer Society},
year = {2013},
url = {https://doi.org/10.1109/ATS.2013.49},
doi = {10.1109/ATS.2013.49},
timestamp = {Tue, 17 Oct 2023 01:00:00 +0200},
biburl = {https://dblp.org/rec/conf/ats/HouL13.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/ats/HsiaoWC13,
author = {Sen{-}Wen Hsiao and
Xian Wang and
Abhijit Chatterjee},
title = {Analog Sensor Based Testing of Phase-Locked Loop Dynamic Performance
Parameters},
booktitle = {22nd Asian Test Symposium, {ATS} 2013, Yilan County, Taiwan, November
18-21, 2013},
pages = {50--55},
publisher = {{IEEE} Computer Society},
year = {2013},
url = {https://doi.org/10.1109/ATS.2013.19},
doi = {10.1109/ATS.2013.19},
timestamp = {Fri, 24 Mar 2023 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/ats/HsiaoWC13.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/ats/HsiehPK13,
author = {Tong{-}Yu Hsieh and
Yi{-}Han Peng and
Chia{-}Chi Ku},
title = {An Efficient Test Methodology for Image Processing Applications Based
on Error-Tolerance},
booktitle = {22nd Asian Test Symposium, {ATS} 2013, Yilan County, Taiwan, November
18-21, 2013},
pages = {289--294},
publisher = {{IEEE} Computer Society},
year = {2013},
url = {https://doi.org/10.1109/ATS.2013.60},
doi = {10.1109/ATS.2013.60},
timestamp = {Fri, 24 Mar 2023 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/ats/HsiehPK13.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/ats/HsiungC0GG13,
author = {Hsunwei Hsiung and
Da Cheng and
Bin Liu and
Ramesh Govindan and
Sandeep K. Gupta},
title = {Interplay of Failure Rate, Performance, and Test Cost in {TCAM} under
Process Variations},
booktitle = {22nd Asian Test Symposium, {ATS} 2013, Yilan County, Taiwan, November
18-21, 2013},
pages = {251--258},
publisher = {{IEEE} Computer Society},
year = {2013},
url = {https://doi.org/10.1109/ATS.2013.54},
doi = {10.1109/ATS.2013.54},
timestamp = {Fri, 22 Sep 2023 01:00:00 +0200},
biburl = {https://dblp.org/rec/conf/ats/HsiungC0GG13.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/ats/HsuHHL13,
author = {Shuo{-}You Hsu and
Chih{-}Hsiang Hsu and
Ting{-}Shuo Hsu and
Jing{-}Jia Liou},
title = {A Region-Based Framework for Design Feature Identification of Systematic
Process Variations},
booktitle = {22nd Asian Test Symposium, {ATS} 2013, Yilan County, Taiwan, November
18-21, 2013},
pages = {265--270},
publisher = {{IEEE} Computer Society},
year = {2013},
url = {https://doi.org/10.1109/ATS.2013.56},
doi = {10.1109/ATS.2013.56},
timestamp = {Fri, 24 Mar 2023 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/ats/HsuHHL13.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/ats/HuangHTCS13,
author = {Li{-}Ren Huang and
Shi{-}Yu Huang and
Kun{-}Han Tsai and
Wu{-}Tung Cheng and
Stephen K. Sunter},
title = {Mid-bond Interposer Wire Test},
booktitle = {22nd Asian Test Symposium, {ATS} 2013, Yilan County, Taiwan, November
18-21, 2013},
pages = {153--158},
publisher = {{IEEE} Computer Society},
year = {2013},
url = {https://doi.org/10.1109/ATS.2013.37},
doi = {10.1109/ATS.2013.37},
timestamp = {Fri, 24 Mar 2023 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/ats/HuangHTCS13.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/ats/JiangACARP13,
author = {Jie Jiang and
Marina Aparicio and
Mariane Comte and
Florence Aza{\"{\i}}s and
Michel Renovell and
Ilia Polian},
title = {{MIRID:} Mixed-Mode IR-Drop Induced Delay Simulator},
booktitle = {22nd Asian Test Symposium, {ATS} 2013, Yilan County, Taiwan, November
18-21, 2013},
pages = {177--182},
publisher = {{IEEE} Computer Society},
year = {2013},
url = {https://doi.org/10.1109/ATS.2013.41},
doi = {10.1109/ATS.2013.41},
timestamp = {Thu, 11 Apr 2024 01:00:00 +0200},
biburl = {https://dblp.org/rec/conf/ats/JiangACARP13.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/ats/KangLCK13,
author = {Wooheon Kang and
Changwook Lee and
Keewon Cho and
Sungho Kang},
title = {A Die Selection and Matching Method with Two Stages for Yield Enhancement
of 3-D Memories},
booktitle = {22nd Asian Test Symposium, {ATS} 2013, Yilan County, Taiwan, November
18-21, 2013},
pages = {301--306},
publisher = {{IEEE} Computer Society},
year = {2013},
url = {https://doi.org/10.1109/ATS.2013.62},
doi = {10.1109/ATS.2013.62},
timestamp = {Fri, 24 Mar 2023 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/ats/KangLCK13.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/ats/KatohDIKLT13,
author = {Kentaroh Katoh and
Yuta Doi and
Satoshi Ito and
Haruo Kobayashi and
Ensi Li and
Nobukazu Takai},
title = {An Analysis of Stochastic Self-Calibration of {TDC} Using Two Ring
Oscillators},
booktitle = {22nd Asian Test Symposium, {ATS} 2013, Yilan County, Taiwan, November
18-21, 2013},
pages = {140--146},
publisher = {{IEEE} Computer Society},
year = {2013},
url = {https://doi.org/10.1109/ATS.2013.35},
doi = {10.1109/ATS.2013.35},
timestamp = {Fri, 24 Mar 2023 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/ats/KatohDIKLT13.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/ats/KumarRRR13,
author = {Amit Kumar and
Janusz Rajski and
Sudhakar M. Reddy and
Thomas Rinderknecht},
title = {On the Generation of Compact Deterministic Test Sets for {BIST} Ready
Designs},
booktitle = {22nd Asian Test Symposium, {ATS} 2013, Yilan County, Taiwan, November
18-21, 2013},
pages = {201--206},
publisher = {{IEEE} Computer Society},
year = {2013},
url = {https://doi.org/10.1109/ATS.2013.45},
doi = {10.1109/ATS.2013.45},
timestamp = {Fri, 24 Mar 2023 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/ats/KumarRRR13.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/ats/LeeA13,
author = {Hsun{-}Cheng Lee and
Jacob A. Abraham},
title = {Digital Calibration for 8-Bit Delay Line {ADC} Using Harmonic Distortion
Correction},
booktitle = {22nd Asian Test Symposium, {ATS} 2013, Yilan County, Taiwan, November
18-21, 2013},
pages = {128--133},
publisher = {{IEEE} Computer Society},
year = {2013},
url = {https://doi.org/10.1109/ATS.2013.33},
doi = {10.1109/ATS.2013.33},
timestamp = {Fri, 24 Mar 2023 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/ats/LeeA13.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/ats/LiHGWHHCL13,
author = {Katherine Shu{-}Min Li and
Cheng{-}You Ho and
Ruei{-}Ting Gu and
Sying{-}Jyan Wang and
Yingchieh Ho and
Jiun{-}Jie Huang and
Bo{-}Chuan Cheng and
An{-}Ting Liu},
title = {A Layout-Aware Test Methodology for Silicon Interposer in System-in-a-Package},
booktitle = {22nd Asian Test Symposium, {ATS} 2013, Yilan County, Taiwan, November
18-21, 2013},
pages = {159--164},
publisher = {{IEEE} Computer Society},
year = {2013},
url = {https://doi.org/10.1109/ATS.2013.38},
doi = {10.1109/ATS.2013.38},
timestamp = {Fri, 24 Mar 2023 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/ats/LiHGWHHCL13.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/ats/LiQZLY13,
author = {Guoliang Li and
Jun Qian and
Yuan Zuo and
Rui Li and
Qinfu Yang},
title = {Scan Test Data Volume Reduction for SoC Designs in {EDT} Environment},
booktitle = {22nd Asian Test Symposium, {ATS} 2013, Yilan County, Taiwan, November
18-21, 2013},
pages = {103--104},
publisher = {{IEEE} Computer Society},
year = {2013},
url = {https://doi.org/10.1109/ATS.2013.27},
doi = {10.1109/ATS.2013.27},
timestamp = {Fri, 24 Mar 2023 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/ats/LiQZLY13.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/ats/LienLHC13,
author = {Wei{-}Cheng Lien and
Kuen{-}Jong Lee and
Tong{-}Yu Hsieh and
Krishnendu Chakrabarty},
title = {A New {LFSR} Reseeding Scheme via Internal Response Feedback},
booktitle = {22nd Asian Test Symposium, {ATS} 2013, Yilan County, Taiwan, November
18-21, 2013},
pages = {97--102},
publisher = {{IEEE} Computer Society},
year = {2013},
url = {https://doi.org/10.1109/ATS.2013.26},
doi = {10.1109/ATS.2013.26},
timestamp = {Fri, 24 Mar 2023 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/ats/LienLHC13.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/ats/LinH13,
author = {Long{-}Yi Lin and
Hao{-}Chiao Hong},
title = {Design of a Fault-Injectable Fleischer-Laker Switched-Capacitor Biquad
for Verifying the Static Linear Behavior Fault Model},
booktitle = {22nd Asian Test Symposium, {ATS} 2013, Yilan County, Taiwan, November
18-21, 2013},
pages = {62--66},
publisher = {{IEEE} Computer Society},
year = {2013},
url = {https://doi.org/10.1109/ATS.2013.20},
doi = {10.1109/ATS.2013.20},
timestamp = {Fri, 24 Mar 2023 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/ats/LinH13.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/ats/LinLW13,
author = {Bing{-}Yang Lin and
Mincent Lee and
Cheng{-}Wen Wu},
title = {Exploration Methodology for 3D Memory Redundancy Architectures under
Redundancy Constraints},
booktitle = {22nd Asian Test Symposium, {ATS} 2013, Yilan County, Taiwan, November
18-21, 2013},
pages = {1--6},
publisher = {{IEEE} Computer Society},
year = {2013},
url = {https://doi.org/10.1109/ATS.2013.11},
doi = {10.1109/ATS.2013.11},
timestamp = {Sat, 30 Sep 2023 01:00:00 +0200},
biburl = {https://dblp.org/rec/conf/ats/LinLW13.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/ats/LuJHHN13,
author = {Shyue{-}Kung Lu and
Hao{-}Cheng Jheng and
Masaki Hashizume and
Jiun{-}Lang Huang and
Pony Ning},
title = {Fault Scrambling Techniques for Yield Enhancement of Embedded Memories},
booktitle = {22nd Asian Test Symposium, {ATS} 2013, Yilan County, Taiwan, November
18-21, 2013},
pages = {215--220},
publisher = {{IEEE} Computer Society},
year = {2013},
url = {https://doi.org/10.1109/ATS.2013.48},
doi = {10.1109/ATS.2013.48},
timestamp = {Fri, 24 Mar 2023 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/ats/LuJHHN13.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/ats/MillicanS13,
author = {Spencer K. Millican and
Kewal K. Saluja},
title = {Formulating Optimal Test Scheduling Problem with Dynamic Voltage and
Frequency Scaling},
booktitle = {22nd Asian Test Symposium, {ATS} 2013, Yilan County, Taiwan, November
18-21, 2013},
pages = {165--170},
publisher = {{IEEE} Computer Society},
year = {2013},
url = {https://doi.org/10.1109/ATS.2013.39},
doi = {10.1109/ATS.2013.39},
timestamp = {Fri, 24 Mar 2023 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/ats/MillicanS13.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/ats/MiyaseSBWK13,
author = {Kohei Miyase and
Matthias Sauer and
Bernd Becker and
Xiaoqing Wen and
Seiji Kajihara},
title = {Search Space Reduction for Low-Power Test Generation},
booktitle = {22nd Asian Test Symposium, {ATS} 2013, Yilan County, Taiwan, November
18-21, 2013},
pages = {171--176},
publisher = {{IEEE} Computer Society},
year = {2013},
url = {https://doi.org/10.1109/ATS.2013.40},
doi = {10.1109/ATS.2013.40},
timestamp = {Fri, 24 Mar 2023 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/ats/MiyaseSBWK13.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/ats/MoreiraRWKHBOL13,
author = {Jose Moreira and
Bernhard Roth and
Hubert Werkmann and
Lars Klapproth and
Michael Howieson and
Mark Broman and
Wend Ouedraogo and
Mitchell Lin},
title = {An Active Test Fixture Approach for 40 Gbps and Above At-Speed Testing
Using a Standard {ATE} System},
booktitle = {22nd Asian Test Symposium, {ATS} 2013, Yilan County, Taiwan, November
18-21, 2013},
pages = {271--276},
publisher = {{IEEE} Computer Society},
year = {2013},
url = {https://doi.org/10.1109/ATS.2013.57},
doi = {10.1109/ATS.2013.57},
timestamp = {Fri, 24 Mar 2023 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/ats/MoreiraRWKHBOL13.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/ats/NikaidoFSNS13,
author = {Masafumi Nikaido and
Yukihisa Funatsu and
Tetsuya Seiyama and
Junpei Nonaka and
Kazuki Shigeta},
title = {Failure Localization of Logic Circuits Using Voltage Contrast Considering
State of Transistors},
booktitle = {22nd Asian Test Symposium, {ATS} 2013, Yilan County, Taiwan, November
18-21, 2013},
pages = {67--72},
publisher = {{IEEE} Computer Society},
year = {2013},
url = {https://doi.org/10.1109/ATS.2013.21},
doi = {10.1109/ATS.2013.21},
timestamp = {Fri, 24 Mar 2023 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/ats/NikaidoFSNS13.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/ats/SarsonSS13,
author = {Peter Sarson and
Gregor Schatzberger and
Robert Seitz},
title = {Automotive {EEPROM} Qualification and Cost Optimization},
booktitle = {22nd Asian Test Symposium, {ATS} 2013, Yilan County, Taiwan, November
18-21, 2013},
pages = {105--106},
publisher = {{IEEE} Computer Society},
year = {2013},
url = {https://doi.org/10.1109/ATS.2013.28},
doi = {10.1109/ATS.2013.28},
timestamp = {Fri, 24 Mar 2023 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/ats/SarsonSS13.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/ats/SatoK13,
author = {Yasuo Sato and
Seiji Kajihara},
title = {A Stochastic Model for NBTI-Induced {LSI} Degradation in Field},
booktitle = {22nd Asian Test Symposium, {ATS} 2013, Yilan County, Taiwan, November
18-21, 2013},
pages = {183--188},
publisher = {{IEEE} Computer Society},
year = {2013},
url = {https://doi.org/10.1109/ATS.2013.42},
doi = {10.1109/ATS.2013.42},
timestamp = {Fri, 24 Mar 2023 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/ats/SatoK13.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/ats/ShihHLLWC13,
author = {Chi{-}Jih Shih and
Shih{-}An Hsieh and
Yi{-}Chang Lu and
James Chien{-}Mo Li and
Tzong{-}Lin Wu and
Krishnendu Chakrabarty},
title = {Test Generation of Path Delay Faults Induced by Defects in Power {TSV}},
booktitle = {22nd Asian Test Symposium, {ATS} 2013, Yilan County, Taiwan, November
18-21, 2013},
pages = {43--48},
publisher = {{IEEE} Computer Society},
year = {2013},
url = {https://doi.org/10.1109/ATS.2013.18},
doi = {10.1109/ATS.2013.18},
timestamp = {Fri, 24 Mar 2023 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/ats/ShihHLLWC13.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/ats/TomitaWSKGTW13,
author = {Akihiro Tomita and
Xiaoqing Wen and
Yasuo Sato and
Seiji Kajihara and
Patrick Girard and
Mohammad Tehranipoor and
Laung{-}Terng Wang},
title = {On Achieving Capture Power Safety in At-Speed Scan-Based Logic {BIST}},
booktitle = {22nd Asian Test Symposium, {ATS} 2013, Yilan County, Taiwan, November
18-21, 2013},
pages = {19--24},
publisher = {{IEEE} Computer Society},
year = {2013},
url = {https://doi.org/10.1109/ATS.2013.14},
doi = {10.1109/ATS.2013.14},
timestamp = {Fri, 24 Mar 2023 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/ats/TomitaWSKGTW13.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/ats/TsaiL13,
author = {Kun{-}Han Tsai and
Xijiang Lin},
title = {Multicycle-aware At-speed Test Methodology},
booktitle = {22nd Asian Test Symposium, {ATS} 2013, Yilan County, Taiwan, November
18-21, 2013},
pages = {49},
publisher = {{IEEE} Computer Society},
year = {2013},
url = {https://doi.org/10.1109/ATS.2013.66},
doi = {10.1109/ATS.2013.66},
timestamp = {Fri, 24 Mar 2023 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/ats/TsaiL13.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/ats/VatajeluDBGTVB13,
author = {Elena I. Vatajelu and
Luigi Dilillo and
Alberto Bosio and
Patrick Girard and
Aida Todri and
Arnaud Virazel and
Nabil Badereddine},
title = {Adaptive Source Bias for Improved Resistive-Open Defect Coverage during
{SRAM} Testing},
booktitle = {22nd Asian Test Symposium, {ATS} 2013, Yilan County, Taiwan, November
18-21, 2013},
pages = {109--114},
publisher = {{IEEE} Computer Society},
year = {2013},
url = {https://doi.org/10.1109/ATS.2013.30},
doi = {10.1109/ATS.2013.30},
timestamp = {Sat, 30 Sep 2023 01:00:00 +0200},
biburl = {https://dblp.org/rec/conf/ats/VatajeluDBGTVB13.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/ats/WangCE13,
author = {Ran Wang and
Krishnendu Chakrabarty and
Bill Eklow},
title = {Post-bond Testing of the Silicon Interposer and Micro-bumps in 2.5D
ICs},
booktitle = {22nd Asian Test Symposium, {ATS} 2013, Yilan County, Taiwan, November
18-21, 2013},
pages = {147--152},
publisher = {{IEEE} Computer Society},
year = {2013},
url = {https://doi.org/10.1109/ATS.2013.36},
doi = {10.1109/ATS.2013.36},
timestamp = {Fri, 24 Mar 2023 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/ats/WangCE13.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/ats/WangKSC13,
author = {Xian Wang and
Blanchard Kenfack and
Estella Silva and
Abhijit Chatterjee},
title = {Built-In Test of Switched-Mode Power Converters: Avoiding {DUT} Damage
Using Alternative Safe Measurements},
booktitle = {22nd Asian Test Symposium, {ATS} 2013, Yilan County, Taiwan, November
18-21, 2013},
pages = {56--61},
publisher = {{IEEE} Computer Society},
year = {2013},
url = {https://doi.org/10.1109/ATS.2013.63},
doi = {10.1109/ATS.2013.63},
timestamp = {Fri, 24 Mar 2023 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/ats/WangKSC13.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/ats/Xiang13,
author = {Dong Xiang},
title = {A Cost-Effective Scheme for Network-on-Chip Router and Interconnect
Testing},
booktitle = {22nd Asian Test Symposium, {ATS} 2013, Yilan County, Taiwan, November
18-21, 2013},
pages = {207--212},
publisher = {{IEEE} Computer Society},
year = {2013},
url = {https://doi.org/10.1109/ATS.2013.46},
doi = {10.1109/ATS.2013.46},
timestamp = {Fri, 24 Mar 2023 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/ats/Xiang13.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/ats/YamazakiTTHYHS13,
author = {Koji Yamazaki and
Toshiyuki Tsutsumi and
Hiroshi Takahashi and
Yoshinobu Higami and
Hironobu Yotsuyanagi and
Masaki Hashizume and
Kewal K. Saluja},
title = {Diagnosing Resistive Open Faults Using Small Delay Fault Simulation},
booktitle = {22nd Asian Test Symposium, {ATS} 2013, Yilan County, Taiwan, November
18-21, 2013},
pages = {79--84},
publisher = {{IEEE} Computer Society},
year = {2013},
url = {https://doi.org/10.1109/ATS.2013.23},
doi = {10.1109/ATS.2013.23},
timestamp = {Fri, 24 Mar 2023 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/ats/YamazakiTTHYHS13.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/ats/YangCL13,
author = {Chi{-}Chun Yang and
Che{-}Wei Chou and
Jin{-}Fu Li},
title = {A {TSV} Repair Scheme Using Enhanced Test Access Architecture for
3-D ICs},
booktitle = {22nd Asian Test Symposium, {ATS} 2013, Yilan County, Taiwan, November
18-21, 2013},
pages = {7--12},
publisher = {{IEEE} Computer Society},
year = {2013},
url = {https://doi.org/10.1109/ATS.2013.12},
doi = {10.1109/ATS.2013.12},
timestamp = {Tue, 17 Oct 2023 01:00:00 +0200},
biburl = {https://dblp.org/rec/conf/ats/YangCL13.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/ats/YeJZCG13,
author = {Fangming Ye and
Shi Jin and
Zhaobo Zhang and
Krishnendu Chakrabarty and
Xinli Gu},
title = {Handling Missing Syndromes in Board-Level Functional-Fault Diagnosis},
booktitle = {22nd Asian Test Symposium, {ATS} 2013, Yilan County, Taiwan, November
18-21, 2013},
pages = {73--78},
publisher = {{IEEE} Computer Society},
year = {2013},
url = {https://doi.org/10.1109/ATS.2013.22},
doi = {10.1109/ATS.2013.22},
timestamp = {Fri, 24 Mar 2023 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/ats/YeJZCG13.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/ats/YiWAKKKSK13,
author = {Ru Yi and
Minghui Wu and
Koji Asami and
Haruo Kobayashi and
Ramin Khatami and
Atsuhiro Katayama and
Isao Shimizu and
Kentaroh Katoh},
title = {Digital Compensation for Timing Mismatches in Interleaved ADCs},
booktitle = {22nd Asian Test Symposium, {ATS} 2013, Yilan County, Taiwan, November
18-21, 2013},
pages = {134--139},
publisher = {{IEEE} Computer Society},
year = {2013},
url = {https://doi.org/10.1109/ATS.2013.34},
doi = {10.1109/ATS.2013.34},
timestamp = {Tue, 31 Oct 2023 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/ats/YiWAKKKSK13.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/ats/ZhouWLL013,
author = {Yanhong Zhou and
Tiancheng Wang and
Tao Lv and
Huawei Li and
Xiaowei Li},
title = {Path Constraint Solving Based Test Generation for Hard-to-Reach States},
booktitle = {22nd Asian Test Symposium, {ATS} 2013, Yilan County, Taiwan, November
18-21, 2013},
pages = {239--244},
publisher = {{IEEE} Computer Society},
year = {2013},
url = {https://doi.org/10.1109/ATS.2013.52},
doi = {10.1109/ATS.2013.52},
timestamp = {Thu, 11 May 2023 01:00:00 +0200},
biburl = {https://dblp.org/rec/conf/ats/ZhouWLL013.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@proceedings{DBLP:conf/ats/2013,
title = {22nd Asian Test Symposium, {ATS} 2013, Yilan County, Taiwan, November
18-21, 2013},
publisher = {{IEEE} Computer Society},
year = {2013},
url = {https://ieeexplore.ieee.org/xpl/conhome/6689800/proceeding},
isbn = {978-0-7695-5080-0},
timestamp = {Wed, 16 Oct 2019 01:00:00 +0200},
biburl = {https://dblp.org/rec/conf/ats/2013.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/ats/AraiSI12,
author = {Masayuki Arai and
Yoshihiro Shimizu and
Kazuhiko Iwasaki},
title = {Note on Layout-Aware Weighted Probabilistic Bridge Fault Coverage},
booktitle = {21st {IEEE} Asian Test Symposium, {ATS} 2012, Niigata, Japan, November
19-22, 2012},
pages = {89--94},
publisher = {{IEEE} Computer Society},
year = {2012},
url = {https://doi.org/10.1109/ATS.2012.53},
doi = {10.1109/ATS.2012.53},
timestamp = {Fri, 24 Mar 2023 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/ats/AraiSI12.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/ats/AzevedoVBDGTPAM12,
author = {Joao Azevedo and
Arnaud Virazel and
Alberto Bosio and
Luigi Dilillo and
Patrick Girard and
Aida Todri and
Guillaume Prenat and
J{\'{e}}r{\'{e}}my Alvarez{-}Herault and
Ken Mackay},
title = {Impact of Resistive-Bridge Defects in {TAS-MRAM} Architectures},
booktitle = {21st {IEEE} Asian Test Symposium, {ATS} 2012, Niigata, Japan, November
19-22, 2012},
pages = {125--130},
publisher = {{IEEE} Computer Society},
year = {2012},
url = {https://doi.org/10.1109/ATS.2012.37},
doi = {10.1109/ATS.2012.37},
timestamp = {Fri, 24 Mar 2023 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/ats/AzevedoVBDGTPAM12.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/ats/BaegBLLJN12,
author = {Sanghyeon Baeg and
Jongsun Bae and
Soonyoung Lee and
Chul Seung Lim and
Sang Hoon Jeon and
Hyeonwoo Nam},
title = {Soft Error Issues with Scaling Technologies},
booktitle = {21st {IEEE} Asian Test Symposium, {ATS} 2012, Niigata, Japan, November
19-22, 2012},
pages = {68},
publisher = {{IEEE} Computer Society},
year = {2012},
url = {https://doi.org/10.1109/ATS.2012.72},
doi = {10.1109/ATS.2012.72},
timestamp = {Fri, 24 Mar 2023 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/ats/BaegBLLJN12.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/ats/BernardiCSRBDGV12,
author = {Paolo Bernardi and
Mauricio de Carvalho and
Ernesto S{\'{a}}nchez and
Matteo Sonza Reorda and
Alberto Bosio and
Luigi Dilillo and
Patrick Girard and
Miroslav Valka},
title = {Peak Power Estimation: {A} Case Study on {CPU} Cores},
booktitle = {21st {IEEE} Asian Test Symposium, {ATS} 2012, Niigata, Japan, November
19-22, 2012},
pages = {167--172},
publisher = {{IEEE} Computer Society},
year = {2012},
url = {https://doi.org/10.1109/ATS.2012.58},
doi = {10.1109/ATS.2012.58},
timestamp = {Fri, 24 Mar 2023 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/ats/BernardiCSRBDGV12.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/ats/BhattaTCC12,
author = {Debesh Bhatta and
Nicholas Tzou and
Hyun Woo Choi and
Abhijit Chatterjee},
title = {Spectral Estimation Based Acquisition of Incoherently Under-sampled
Periodic Signals: Application to Bandwidth Interleaving},
booktitle = {21st {IEEE} Asian Test Symposium, {ATS} 2012, Niigata, Japan, November
19-22, 2012},
pages = {196--201},
publisher = {{IEEE} Computer Society},
year = {2012},
url = {https://doi.org/10.1109/ATS.2012.65},
doi = {10.1109/ATS.2012.65},
timestamp = {Fri, 24 Mar 2023 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/ats/BhattaTCC12.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/ats/BidgoliNN12,
author = {Hossein Sabaghian Bidgoli and
Majid Namaki{-}Shoushtari and
Zainalabedin Navabi},
title = {A Probabilistic and Constraint Based Approach for Low Power Test Generation},
booktitle = {21st {IEEE} Asian Test Symposium, {ATS} 2012, Niigata, Japan, November
19-22, 2012},
pages = {113--118},
publisher = {{IEEE} Computer Society},
year = {2012},
url = {https://doi.org/10.1109/ATS.2012.38},
doi = {10.1109/ATS.2012.38},
timestamp = {Fri, 24 Mar 2023 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/ats/BidgoliNN12.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/ats/BosioDGTV12,
author = {Alberto Bosio and
Luigi Dilillo and
Patrick Girard and
Aida Todri and
Arnaud Virazel},
title = {Why and How Controlling Power Consumption during Test: {A} Survey},
booktitle = {21st {IEEE} Asian Test Symposium, {ATS} 2012, Niigata, Japan, November
19-22, 2012},
pages = {221--226},
publisher = {{IEEE} Computer Society},
year = {2012},
url = {https://doi.org/10.1109/ATS.2012.30},
doi = {10.1109/ATS.2012.30},
timestamp = {Fri, 24 Mar 2023 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/ats/BosioDGTV12.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/ats/ChaG12,
author = {Byeongju Cha and
Sandeep K. Gupta},
title = {Efficient Trojan Detection via Calibration of Process Variations},
booktitle = {21st {IEEE} Asian Test Symposium, {ATS} 2012, Niigata, Japan, November
19-22, 2012},
pages = {355--361},
publisher = {{IEEE} Computer Society},
year = {2012},
url = {https://doi.org/10.1109/ATS.2012.64},
doi = {10.1109/ATS.2012.64},
timestamp = {Tue, 26 Sep 2023 01:00:00 +0200},
biburl = {https://dblp.org/rec/conf/ats/ChaG12.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/ats/ChengK12,
author = {Wu{-}Tung Cheng and
Feng{-}Ming Kuo},
title = {Embedded Tutorial Summary: Diagnosis for Accelerating Yield and Failure
Analysis},
booktitle = {21st {IEEE} Asian Test Symposium, {ATS} 2012, Niigata, Japan, November
19-22, 2012},
pages = {271},
publisher = {{IEEE} Computer Society},
year = {2012},
url = {https://doi.org/10.1109/ATS.2012.73},
doi = {10.1109/ATS.2012.73},
timestamp = {Fri, 24 Mar 2023 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/ats/ChengK12.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/ats/ChouHH12,
author = {Y.{-}H. Chou and
Jiun{-}Lang Huang and
Xuan{-}Lun Huang},
title = {A Built-In Characterization Technique for 1-Bit/Stage Pipelined {ADC}},
booktitle = {21st {IEEE} Asian Test Symposium, {ATS} 2012, Niigata, Japan, November
19-22, 2012},
pages = {284--289},
publisher = {{IEEE} Computer Society},
year = {2012},
url = {https://doi.org/10.1109/ATS.2012.21},
doi = {10.1109/ATS.2012.21},
timestamp = {Tue, 15 Aug 2023 01:00:00 +0200},
biburl = {https://dblp.org/rec/conf/ats/ChouHH12.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/ats/CookUEWRD12,
author = {Alejandro Cook and
Dominik Ull and
Melanie Elm and
Hans{-}Joachim Wunderlich and
Helmut Randoll and
Stefan Dohren},
title = {Reuse of Structural Volume Test Methods for In-System Testing of Automotive
ASICs},
booktitle = {21st {IEEE} Asian Test Symposium, {ATS} 2012, Niigata, Japan, November
19-22, 2012},
pages = {214--219},
publisher = {{IEEE} Computer Society},
year = {2012},
url = {https://doi.org/10.1109/ATS.2012.32},
doi = {10.1109/ATS.2012.32},
timestamp = {Fri, 24 Mar 2023 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/ats/CookUEWRD12.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/ats/CzutroIJMSBPW12,
author = {Alexander Czutro and
Michael E. Imhof and
J. Jiang and
Abdullah Mumtaz and
Matthias Sauer and
Bernd Becker and
Ilia Polian and
Hans{-}Joachim Wunderlich},
title = {Variation-Aware Fault Grading},
booktitle = {21st {IEEE} Asian Test Symposium, {ATS} 2012, Niigata, Japan, November
19-22, 2012},
pages = {344--349},
publisher = {{IEEE} Computer Society},
year = {2012},
url = {https://doi.org/10.1109/ATS.2012.14},
doi = {10.1109/ATS.2012.14},
timestamp = {Fri, 24 Mar 2023 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/ats/CzutroIJMSBPW12.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/ats/DasBD12,
author = {Sourasis Das and
Ansuman Banerjee and
Pallab Dasgupta},
title = {A Generalized Theory for Formal Assertion Coverage},
booktitle = {21st {IEEE} Asian Test Symposium, {ATS} 2012, Niigata, Japan, November
19-22, 2012},
pages = {137--142},
publisher = {{IEEE} Computer Society},
year = {2012},
url = {https://doi.org/10.1109/ATS.2012.20},
doi = {10.1109/ATS.2012.20},
timestamp = {Fri, 24 Mar 2023 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/ats/DasBD12.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/ats/DehbashiF12,
author = {Mehdi Dehbashi and
G{\"{o}}rschwin Fey},
title = {Automated Post-Silicon Debugging of Failing Speedpaths},
booktitle = {21st {IEEE} Asian Test Symposium, {ATS} 2012, Niigata, Japan, November
19-22, 2012},
pages = {13--18},
publisher = {{IEEE} Computer Society},
year = {2012},
url = {https://doi.org/10.1109/ATS.2012.42},
doi = {10.1109/ATS.2012.42},
timestamp = {Fri, 24 Mar 2023 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/ats/DehbashiF12.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/ats/DeutschCPL12,
author = {Sergej Deutsch and
Krishnendu Chakrabarty and
Shreepad Panth and
Sung Kyu Lim},
title = {{TSV} Stress-Aware {ATPG} for 3D Stacked ICs},
booktitle = {21st {IEEE} Asian Test Symposium, {ATS} 2012, Niigata, Japan, November
19-22, 2012},
pages = {31--36},
publisher = {{IEEE} Computer Society},
year = {2012},
url = {https://doi.org/10.1109/ATS.2012.61},
doi = {10.1109/ATS.2012.61},
timestamp = {Fri, 24 Mar 2023 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/ats/DeutschCPL12.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/ats/DevittN12,
author = {Simon J. Devitt and
Kae Nemoto},
title = {Programming a Topological Quantum Computer},
booktitle = {21st {IEEE} Asian Test Symposium, {ATS} 2012, Niigata, Japan, November
19-22, 2012},
pages = {55--60},
publisher = {{IEEE} Computer Society},
year = {2012},
url = {https://doi.org/10.1109/ATS.2012.52},
doi = {10.1109/ATS.2012.52},
timestamp = {Fri, 24 Mar 2023 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/ats/DevittN12.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/ats/EggersglussYC12,
author = {Stephan Eggersgl{\"{u}}{\ss} and
Mahmut Yilmaz and
Krishnendu Chakrabarty},
title = {Robust Timing-Aware Test Generation Using Pseudo-Boolean Optimization},
booktitle = {21st {IEEE} Asian Test Symposium, {ATS} 2012, Niigata, Japan, November
19-22, 2012},
pages = {290--295},
publisher = {{IEEE} Computer Society},
year = {2012},
url = {https://doi.org/10.1109/ATS.2012.35},
doi = {10.1109/ATS.2012.35},
timestamp = {Fri, 24 Mar 2023 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/ats/EggersglussYC12.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/ats/FanSCR12,
author = {Xiaoxin Fan and
Manish Sharma and
Wu{-}Tung Cheng and
Sudhakar M. Reddy},
title = {Diagnosis of Cell Internal Defects with Multi-cycle Test Patterns},
booktitle = {21st {IEEE} Asian Test Symposium, {ATS} 2012, Niigata, Japan, November
19-22, 2012},
pages = {7--12},
publisher = {{IEEE} Computer Society},
year = {2012},
url = {https://doi.org/10.1109/ATS.2012.62},
doi = {10.1109/ATS.2012.62},
timestamp = {Fri, 24 Mar 2023 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/ats/FanSCR12.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/ats/FangL012,
author = {Yuntan Fang and
Huawei Li and
Xiaowei Li},
title = {SoftPCM: Enhancing Energy Efficiency and Lifetime of Phase Change
Memory in Video Applications via Approximate Write},
booktitle = {21st {IEEE} Asian Test Symposium, {ATS} 2012, Niigata, Japan, November
19-22, 2012},
pages = {131--136},
publisher = {{IEEE} Computer Society},
year = {2012},
url = {https://doi.org/10.1109/ATS.2012.57},
doi = {10.1109/ATS.2012.57},
timestamp = {Thu, 11 May 2023 01:00:00 +0200},
biburl = {https://dblp.org/rec/conf/ats/FangL012.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/ats/FukuiNF12,
author = {Munetoshi Fukui and
Yasuhiko Nara and
Junichi Fuse},
title = {Characteristics Variability Evaluation of Actual {LSI} Transistors
with Nanoprobing},
booktitle = {21st {IEEE} Asian Test Symposium, {ATS} 2012, Niigata, Japan, November
19-22, 2012},
pages = {4},
publisher = {{IEEE} Computer Society},
year = {2012},
url = {https://doi.org/10.1109/ATS.2012.80},
doi = {10.1109/ATS.2012.80},
timestamp = {Fri, 24 Mar 2023 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/ats/FukuiNF12.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/ats/GharehbaghiF12,
author = {Amir Masoud Gharehbaghi and
Masahiro Fujita},
title = {Error Model Free Automatic Design Error Correction of Complex Processors
Using Formal Methods},
booktitle = {21st {IEEE} Asian Test Symposium, {ATS} 2012, Niigata, Japan, November
19-22, 2012},
pages = {143--148},
publisher = {{IEEE} Computer Society},
year = {2012},
url = {https://doi.org/10.1109/ATS.2012.44},
doi = {10.1109/ATS.2012.44},
timestamp = {Fri, 24 Mar 2023 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/ats/GharehbaghiF12.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/ats/Gu12,
author = {Xinli Gu},
title = {Session Summary {II:} Dependable {VLSI} for Product Reliability},
booktitle = {21st {IEEE} Asian Test Symposium, {ATS} 2012, Niigata, Japan, November
19-22, 2012},
pages = {67},
publisher = {{IEEE} Computer Society},
year = {2012},
url = {https://doi.org/10.1109/ATS.2012.85},
doi = {10.1109/ATS.2012.85},
timestamp = {Fri, 24 Mar 2023 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/ats/Gu12.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/ats/Gu12a,
author = {Xinli Gu},
title = {Session Summary {V:} Is Component Interconnection Test Enough for
Board or System Test},
booktitle = {21st {IEEE} Asian Test Symposium, {ATS} 2012, Niigata, Japan, November
19-22, 2012},
pages = {270},
publisher = {{IEEE} Computer Society},
year = {2012},
url = {https://doi.org/10.1109/ATS.2012.84},
doi = {10.1109/ATS.2012.84},
timestamp = {Fri, 24 Mar 2023 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/ats/Gu12a.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/ats/GuarnieriFC12,
author = {Valerio Guarnieri and
Franco Fummi and
Krishnendu Chakrabarty},
title = {Reduced-Complexity Transition-Fault Test Generation for Non-scan Circuits
through High-Level Mutant Injection},
booktitle = {21st {IEEE} Asian Test Symposium, {ATS} 2012, Niigata, Japan, November
19-22, 2012},
pages = {302--307},
publisher = {{IEEE} Computer Society},
year = {2012},
url = {https://doi.org/10.1109/ATS.2012.47},
doi = {10.1109/ATS.2012.47},
timestamp = {Fri, 24 Mar 2023 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/ats/GuarnieriFC12.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/ats/HolstSW12,
author = {Stefan Holst and
Eric Schneider and
Hans{-}Joachim Wunderlich},
title = {Scan Test Power Simulation on GPGPUs},
booktitle = {21st {IEEE} Asian Test Symposium, {ATS} 2012, Niigata, Japan, November
19-22, 2012},
pages = {155--160},
publisher = {{IEEE} Computer Society},
year = {2012},
url = {https://doi.org/10.1109/ATS.2012.23},
doi = {10.1109/ATS.2012.23},
timestamp = {Fri, 24 Mar 2023 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/ats/HolstSW12.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/ats/HuG012,
author = {Yu Hu and
Xinli Gu and
Xiaowei Li},
title = {In-Field Testing of {NAND} Flash Storage: Why and How?},
booktitle = {21st {IEEE} Asian Test Symposium, {ATS} 2012, Niigata, Japan, November
19-22, 2012},
pages = {69},
publisher = {{IEEE} Computer Society},
year = {2012},
url = {https://doi.org/10.1109/ATS.2012.71},
doi = {10.1109/ATS.2012.71},
timestamp = {Fri, 24 Mar 2023 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/ats/HuG012.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/ats/IwataMMT12,
author = {Hiroyuki Iwata and
Yoichi Maeda and
Jun Matsushima and
Masahiro Takakura},
title = {An Effective At-Speed Scan Testing Approach Using Multiple-Timing
Clock Waveforms},
booktitle = {21st {IEEE} Asian Test Symposium, {ATS} 2012, Niigata, Japan, November
19-22, 2012},
pages = {1},
publisher = {{IEEE} Computer Society},
year = {2012},
url = {https://doi.org/10.1109/ATS.2012.39},
doi = {10.1109/ATS.2012.39},
timestamp = {Fri, 24 Mar 2023 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/ats/IwataMMT12.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/ats/JoMF12,
author = {Satoshi Jo and
Takeshi Matsumoto and
Masahiro Fujita},
title = {SAT-Based Automatic Rectification and Debugging of Combinational Circuits
with {LUT} Insertions},
booktitle = {21st {IEEE} Asian Test Symposium, {ATS} 2012, Niigata, Japan, November
19-22, 2012},
pages = {19--24},
publisher = {{IEEE} Computer Society},
year = {2012},
url = {https://doi.org/10.1109/ATS.2012.55},
doi = {10.1109/ATS.2012.55},
timestamp = {Fri, 24 Mar 2023 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/ats/JoMF12.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/ats/KatoAWGYKKN12,
author = {Keisuke Kato and
Fumitaka Abe and
Kazuyuki Wakabayashi and
Chuan Gao and
Takafumi Yamada and
Haruo Kobayashi and
Osamu Kobayashi and
Kiichi Niitsu},
title = {Two-Tone Signal Generation for Communication Application {ADC} Testing},
booktitle = {21st {IEEE} Asian Test Symposium, {ATS} 2012, Niigata, Japan, November
19-22, 2012},
pages = {179--184},
publisher = {{IEEE} Computer Society},
year = {2012},
url = {https://doi.org/10.1109/ATS.2012.12},
doi = {10.1109/ATS.2012.12},
timestamp = {Fri, 24 Mar 2023 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/ats/KatoAWGYKKN12.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/ats/KriegGSWBH12,
author = {Armin Krieg and
Johannes Grinschgl and
Christian Steger and
Reinhold Weiss and
Holger Bock and
Josef Haid},
title = {Hardware-Accelerated Workload Characterization for Power Modeling
and Fault Injection},
booktitle = {21st {IEEE} Asian Test Symposium, {ATS} 2012, Niigata, Japan, November
19-22, 2012},
pages = {149--154},
publisher = {{IEEE} Computer Society},
year = {2012},
url = {https://doi.org/10.1109/ATS.2012.19},
doi = {10.1109/ATS.2012.19},
timestamp = {Fri, 24 Mar 2023 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/ats/KriegGSWBH12.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/ats/KuoHL12,
author = {Jun{-}Hua Kuo and
Ting{-}Shuo Hsu and
Jing{-}Jia Liou},
title = {Test Cost Reduction for Performance Yield Recovery by Classification
of Multiple-Clock Test Data},
booktitle = {21st {IEEE} Asian Test Symposium, {ATS} 2012, Niigata, Japan, November
19-22, 2012},
pages = {320--325},
publisher = {{IEEE} Computer Society},
year = {2012},
url = {https://doi.org/10.1109/ATS.2012.54},
doi = {10.1109/ATS.2012.54},
timestamp = {Fri, 24 Mar 2023 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/ats/KuoHL12.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/ats/LarssonZ12,
author = {Erik Larsson and
Farrokh Ghani Zadegan},
title = {Accessing Embedded DfT Instruments with {IEEE} {P1687}},
booktitle = {21st {IEEE} Asian Test Symposium, {ATS} 2012, Niigata, Japan, November
19-22, 2012},
pages = {71--76},
publisher = {{IEEE} Computer Society},
year = {2012},
url = {https://doi.org/10.1109/ATS.2012.74},
doi = {10.1109/ATS.2012.74},
timestamp = {Fri, 24 Mar 2023 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/ats/LarssonZ12.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/ats/LiHCSXFF12,
author = {Jianbo Li and
Yu Huang and
Wu{-}Tung Cheng and
Chris Schuermyer and
Dong Xiang and
Eric Faehn and
Ruth Farrugia},
title = {A Hybrid Flow for Memory Failure Bitmap Classification},
booktitle = {21st {IEEE} Asian Test Symposium, {ATS} 2012, Niigata, Japan, November
19-22, 2012},
pages = {314--319},
publisher = {{IEEE} Computer Society},
year = {2012},
url = {https://doi.org/10.1109/ATS.2012.16},
doi = {10.1109/ATS.2012.16},
timestamp = {Fri, 24 Mar 2023 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/ats/LiHCSXFF12.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/ats/LiQLZ12,
author = {Guoliang Li and
Jun Qian and
Peter Li and
Greg Zuo},
title = {Multi-level {EDT} to Reduce Scan Channels in SoC Designs},
booktitle = {21st {IEEE} Asian Test Symposium, {ATS} 2012, Niigata, Japan, November
19-22, 2012},
pages = {77--82},
publisher = {{IEEE} Computer Society},
year = {2012},
url = {https://doi.org/10.1109/ATS.2012.70},
doi = {10.1109/ATS.2012.70},
timestamp = {Fri, 24 Mar 2023 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/ats/LiQLZ12.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/ats/LienLH12,
author = {Wei{-}Cheng Lien and
Kuen{-}Jong Lee and
Tong{-}Yu Hsieh},
title = {A Test-Per-Clock {LFSR} Reseeding Algorithm for Concurrent Reduction
on Test Sequence Length and Test Data Volume},
booktitle = {21st {IEEE} Asian Test Symposium, {ATS} 2012, Niigata, Japan, November
19-22, 2012},
pages = {278--283},
publisher = {{IEEE} Computer Society},
year = {2012},
url = {https://doi.org/10.1109/ATS.2012.11},
doi = {10.1109/ATS.2012.11},
timestamp = {Fri, 24 Mar 2023 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/ats/LienLH12.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/ats/Lin12,
author = {Xijiang Lin},
title = {Power Supply Droop and Its Impacts on Structural At-Speed Testing},
booktitle = {21st {IEEE} Asian Test Symposium, {ATS} 2012, Niigata, Japan, November
19-22, 2012},
pages = {239--244},
publisher = {{IEEE} Computer Society},
year = {2012},
url = {https://doi.org/10.1109/ATS.2012.63},
doi = {10.1109/ATS.2012.63},
timestamp = {Fri, 24 Mar 2023 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/ats/Lin12.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/ats/LinHTC12,
author = {Yu{-}Hsiang Lin and
Shi{-}Yu Huang and
Kun{-}Han Tsai and
Wu{-}Tung Cheng},
title = {Programmable Leakage Test and Binning for TSVs},
booktitle = {21st {IEEE} Asian Test Symposium, {ATS} 2012, Niigata, Japan, November
19-22, 2012},
pages = {43--48},
publisher = {{IEEE} Computer Society},
year = {2012},
url = {https://doi.org/10.1109/ATS.2012.13},
doi = {10.1109/ATS.2012.13},
timestamp = {Fri, 24 Mar 2023 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/ats/LinHTC12.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/ats/LinHW12,
author = {Yi{-}Tsung Lin and
Jiun{-}Lang Huang and
Xiaoqing Wen},
title = {A Transition Isolation Scan Cell Design for Low Shift and Capture
Power},
booktitle = {21st {IEEE} Asian Test Symposium, {ATS} 2012, Niigata, Japan, November
19-22, 2012},
pages = {107--112},
publisher = {{IEEE} Computer Society},
year = {2012},
url = {https://doi.org/10.1109/ATS.2012.29},
doi = {10.1109/ATS.2012.29},
timestamp = {Fri, 24 Mar 2023 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/ats/LinHW12.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/ats/LinR12,
author = {Xijiang Lin and
Janusz Rajski},
title = {On Utilizing Test Cube Properties to Reduce Test Data Volume Further},
booktitle = {21st {IEEE} Asian Test Symposium, {ATS} 2012, Niigata, Japan, November
19-22, 2012},
pages = {83--88},
publisher = {{IEEE} Computer Society},
year = {2012},
url = {https://doi.org/10.1109/ATS.2012.41},
doi = {10.1109/ATS.2012.41},
timestamp = {Fri, 24 Mar 2023 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/ats/LinR12.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/ats/LuLN12,
author = {Shyue{-}Kung Lu and
Tsu{-}Lin Li and
Pony Ning},
title = {Scrambling and Data Inversion Techniques for Yield Enhancement of
NROM-Based ROMs},
booktitle = {21st {IEEE} Asian Test Symposium, {ATS} 2012, Niigata, Japan, November
19-22, 2012},
pages = {308--313},
publisher = {{IEEE} Computer Society},
year = {2012},
url = {https://doi.org/10.1109/ATS.2012.36},
doi = {10.1109/ATS.2012.36},
timestamp = {Fri, 24 Mar 2023 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/ats/LuLN12.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/ats/MahfuzulO12,
author = {Islam A. K. M. Mahfuzul and
Hidetoshi Onodera},
title = {On-Chip Detection of Process Shift and Process Spread for Silicon
Debugging and Model-Hardware Correlation},
booktitle = {21st {IEEE} Asian Test Symposium, {ATS} 2012, Niigata, Japan, November
19-22, 2012},
pages = {350--354},
publisher = {{IEEE} Computer Society},
year = {2012},
url = {https://doi.org/10.1109/ATS.2012.66},
doi = {10.1109/ATS.2012.66},
timestamp = {Fri, 24 Mar 2023 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/ats/MahfuzulO12.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/ats/MeehlPZ12,
author = {Dale Meehl and
Bassilios Petrakis and
Ping Zhang},
title = {{LBIST/ATPG} Technologies for On-Demand Digital Logic Testing in Automotive
Circuits},
booktitle = {21st {IEEE} Asian Test Symposium, {ATS} 2012, Niigata, Japan, November
19-22, 2012},
pages = {2},
publisher = {{IEEE} Computer Society},
year = {2012},
url = {https://doi.org/10.1109/ATS.2012.24},
doi = {10.1109/ATS.2012.24},
timestamp = {Fri, 24 Mar 2023 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/ats/MeehlPZ12.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/ats/Meter12,
author = {Rodney Van Meter},
title = {Counting Gates, Moving Qubits: Evaluating the Execution Cost of Quantum
Circuits},
booktitle = {21st {IEEE} Asian Test Symposium, {ATS} 2012, Niigata, Japan, November
19-22, 2012},
pages = {50--54},
publisher = {{IEEE} Computer Society},
year = {2012},
url = {https://doi.org/10.1109/ATS.2012.67},
doi = {10.1109/ATS.2012.67},
timestamp = {Fri, 24 Mar 2023 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/ats/Meter12.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/ats/MillicanS12,
author = {Spencer K. Millican and
Kewal K. Saluja},
title = {Linear Programming Formulations for Thermal-Aware Test Scheduling
of 3D-Stacked Integrated Circuits},
booktitle = {21st {IEEE} Asian Test Symposium, {ATS} 2012, Niigata, Japan, November
19-22, 2012},
pages = {37--42},
publisher = {{IEEE} Computer Society},
year = {2012},
url = {https://doi.org/10.1109/ATS.2012.28},
doi = {10.1109/ATS.2012.28},
timestamp = {Fri, 24 Mar 2023 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/ats/MillicanS12.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/ats/MitraGRCB12,
author = {Debasis Mitra and
Sarmishtha Ghoshal and
Hafizur Rahaman and
Krishnendu Chakrabarty and
Bhargab B. Bhattacharya},
title = {On-Line Error Detection in Digital Microfluidic Biochips},
booktitle = {21st {IEEE} Asian Test Symposium, {ATS} 2012, Niigata, Japan, November
19-22, 2012},
pages = {332--337},
publisher = {{IEEE} Computer Society},
year = {2012},
url = {https://doi.org/10.1109/ATS.2012.56},
doi = {10.1109/ATS.2012.56},
timestamp = {Fri, 24 Mar 2023 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/ats/MitraGRCB12.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/ats/Moreira12,
author = {Jose Moreira},
title = {Design of a High Bandwidth Interposer for Performance Evaluation of
{ATE} Test Fixtures at the {DUT} Socket},
booktitle = {21st {IEEE} Asian Test Symposium, {ATS} 2012, Niigata, Japan, November
19-22, 2012},
pages = {191--195},
publisher = {{IEEE} Computer Society},
year = {2012},
url = {https://doi.org/10.1109/ATS.2012.34},
doi = {10.1109/ATS.2012.34},
timestamp = {Fri, 24 Mar 2023 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/ats/Moreira12.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/ats/MoreiraRM12,
author = {Jose Moreira and
Bernhard Roth and
Callum McCowan},
title = {An Active Test Fixture Approach for Testing 28 Gbps Applications Using
a Lower Data Rate {ATE} System},
booktitle = {21st {IEEE} Asian Test Symposium, {ATS} 2012, Niigata, Japan, November
19-22, 2012},
pages = {264--269},
publisher = {{IEEE} Computer Society},
year = {2012},
url = {https://doi.org/10.1109/ATS.2012.33},
doi = {10.1109/ATS.2012.33},
timestamp = {Fri, 24 Mar 2023 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/ats/MoreiraRM12.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/ats/NakuraIA12,
author = {Toru Nakura and
Tetsuya Iizuka and
Kunihiro Asada},
title = {Impact of All-Digital {PLL} on SoC Testing},
booktitle = {21st {IEEE} Asian Test Symposium, {ATS} 2012, Niigata, Japan, November
19-22, 2012},
pages = {252--257},
publisher = {{IEEE} Computer Society},
year = {2012},
url = {https://doi.org/10.1109/ATS.2012.22},
doi = {10.1109/ATS.2012.22},
timestamp = {Fri, 24 Mar 2023 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/ats/NakuraIA12.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/ats/NiiTIYFO12,
author = {Koji Nii and
Yasumasa Tsukamoto and
Yuichiro Ishii and
Makoto Yabuuchi and
Hidehiro Fujiwara and
Kazuyoshi Okamoto},
title = {A Test Screening Method for 28 nm {HK/MG} Single-Port and Dual-Port
SRAMs Considering with Dynamic Stability and Read/Write Disturb Issues},
booktitle = {21st {IEEE} Asian Test Symposium, {ATS} 2012, Niigata, Japan, November
19-22, 2012},
pages = {246--251},
publisher = {{IEEE} Computer Society},
year = {2012},
url = {https://doi.org/10.1109/ATS.2012.59},
doi = {10.1109/ATS.2012.59},
timestamp = {Fri, 24 Mar 2023 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/ats/NiiTIYFO12.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/ats/NiitsuYIK12,
author = {Kiichi Niitsu and
Takahiro J. Yamaguchi and
Masahiro Ishida and
Haruo Kobayashi},
title = {Post-Silicon Jitter Measurements},
booktitle = {21st {IEEE} Asian Test Symposium, {ATS} 2012, Niigata, Japan, November
19-22, 2012},
pages = {258--263},
publisher = {{IEEE} Computer Society},
year = {2012},
url = {https://doi.org/10.1109/ATS.2012.15},
doi = {10.1109/ATS.2012.15},
timestamp = {Fri, 24 Mar 2023 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/ats/NiitsuYIK12.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/ats/OhkawaM12,
author = {Yoshihiro Ohkawa and
Yukiya Miura},
title = {Dual Edge Triggered Flip-Flops for Noise Blocking and Application
to Signal Delay Detection},
booktitle = {21st {IEEE} Asian Test Symposium, {ATS} 2012, Niigata, Japan, November
19-22, 2012},
pages = {119--124},
publisher = {{IEEE} Computer Society},
year = {2012},
url = {https://doi.org/10.1109/ATS.2012.31},
doi = {10.1109/ATS.2012.31},
timestamp = {Fri, 24 Mar 2023 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/ats/OhkawaM12.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/ats/Okawara12,
author = {Hideo Okawara},
title = {F-matrix (ABCD-matrix) Circuit Simulation Built in {IC} Test Program},
booktitle = {21st {IEEE} Asian Test Symposium, {ATS} 2012, Niigata, Japan, November
19-22, 2012},
pages = {5},
publisher = {{IEEE} Computer Society},
year = {2012},
url = {https://doi.org/10.1109/ATS.2012.17},
doi = {10.1109/ATS.2012.17},
timestamp = {Fri, 24 Mar 2023 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/ats/Okawara12.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/ats/Polian12,
author = {Ilia Polian},
title = {Session Summary {I:} Quantum informatics: Classical circuit synthesis,
resource optimisation and benchmarking},
booktitle = {21st {IEEE} Asian Test Symposium, {ATS} 2012, Niigata, Japan, November
19-22, 2012},
pages = {49},
publisher = {{IEEE} Computer Society},
year = {2012},
url = {https://doi.org/10.1109/ATS.2012.88},
doi = {10.1109/ATS.2012.88},
timestamp = {Fri, 24 Mar 2023 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/ats/Polian12.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/ats/Qian12,
author = {Jun Qian},
title = {A Few Design Techniques for the "Dependability" of a {SOC}},
booktitle = {21st {IEEE} Asian Test Symposium, {ATS} 2012, Niigata, Japan, November
19-22, 2012},
pages = {70},
publisher = {{IEEE} Computer Society},
year = {2012},
url = {https://doi.org/10.1109/ATS.2012.77},
doi = {10.1109/ATS.2012.77},
timestamp = {Fri, 24 Mar 2023 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/ats/Qian12.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/ats/RoyRDB12,
author = {Pranab Roy and
Hafizur Rahaman and
Parthasarathi Dasgupta and
Bhargab B. Bhattacharya},
title = {A New Look Ahead Technique for Customized Testing in Digital Microfluidic
Biochips},
booktitle = {21st {IEEE} Asian Test Symposium, {ATS} 2012, Niigata, Japan, November
19-22, 2012},
pages = {25--30},
publisher = {{IEEE} Computer Society},
year = {2012},
url = {https://doi.org/10.1109/ATS.2012.51},
doi = {10.1109/ATS.2012.51},
timestamp = {Fri, 24 Mar 2023 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/ats/RoyRDB12.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/ats/SatoWKMK12,
author = {Yasuo Sato and
Senling Wang and
Takaaki Kato and
Kohei Miyase and
Seiji Kajihara},
title = {Low Power {BIST} for Scan-Shift and Capture Power},
booktitle = {21st {IEEE} Asian Test Symposium, {ATS} 2012, Niigata, Japan, November
19-22, 2012},
pages = {173--178},
publisher = {{IEEE} Computer Society},
year = {2012},
url = {https://doi.org/10.1109/ATS.2012.27},
doi = {10.1109/ATS.2012.27},
timestamp = {Fri, 24 Mar 2023 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/ats/SatoWKMK12.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/ats/SbiaiN12,
author = {Takieddine Sbiai and
Kazuteru Namba},
title = {NoC Dynamically Reconfigurable as {TAM}},
booktitle = {21st {IEEE} Asian Test Symposium, {ATS} 2012, Niigata, Japan, November
19-22, 2012},
pages = {326--331},
publisher = {{IEEE} Computer Society},
year = {2012},
url = {https://doi.org/10.1109/ATS.2012.18},
doi = {10.1109/ATS.2012.18},
timestamp = {Fri, 24 Mar 2023 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/ats/SbiaiN12.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/ats/SindiaA12,
author = {Suraj Sindia and
Vishwani D. Agrawal},
title = {Tailoring Tests for Functional Binning of Integrated Circuits},
booktitle = {21st {IEEE} Asian Test Symposium, {ATS} 2012, Niigata, Japan, November
19-22, 2012},
pages = {95--100},
publisher = {{IEEE} Computer Society},
year = {2012},
url = {https://doi.org/10.1109/ATS.2012.78},
doi = {10.1109/ATS.2012.78},
timestamp = {Fri, 24 Mar 2023 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/ats/SindiaA12.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/ats/TakahashiWSK12,
author = {Nobutaka Takahashi and
Toshiaki Watanabe and
Takehisa Suzuki and
Manabu Kimura},
title = {Portable/Desktop Testing Solution for Engineering with Cloud},
booktitle = {21st {IEEE} Asian Test Symposium, {ATS} 2012, Niigata, Japan, November
19-22, 2012},
pages = {3},
publisher = {{IEEE} Computer Society},
year = {2012},
url = {https://doi.org/10.1109/ATS.2012.69},
doi = {10.1109/ATS.2012.69},
timestamp = {Fri, 24 Mar 2023 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/ats/TakahashiWSK12.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/ats/ValkaBDGTVDG12,
author = {Miroslav Valka and
Alberto Bosio and
Luigi Dilillo and
Patrick Girard and
Aida Todri and
Arnaud Virazel and
P. Debaud and
S. Guilhot},
title = {Power Supply Noise Sensor Based on Timing Uncertainty Measurements},
booktitle = {21st {IEEE} Asian Test Symposium, {ATS} 2012, Niigata, Japan, November
19-22, 2012},
pages = {161--166},
publisher = {{IEEE} Computer Society},
year = {2012},
url = {https://doi.org/10.1109/ATS.2012.46},
doi = {10.1109/ATS.2012.46},
timestamp = {Fri, 24 Mar 2023 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/ats/ValkaBDGTVDG12.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/ats/Varma12,
author = {Prab Varma},
title = {Current and Future Directions in Automatic Test Pattern Generation
for Power Delivery Network Validation},
booktitle = {21st {IEEE} Asian Test Symposium, {ATS} 2012, Niigata, Japan, November
19-22, 2012},
pages = {233--238},
publisher = {{IEEE} Computer Society},
year = {2012},
url = {https://doi.org/10.1109/ATS.2012.68},
doi = {10.1109/ATS.2012.68},
timestamp = {Fri, 24 Mar 2023 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/ats/Varma12.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/ats/WangSMK12,
author = {Senling Wang and
Yasuo Sato and
Kohei Miyase and
Seiji Kajihara},
title = {A Scan-Out Power Reduction Method for Multi-cycle {BIST}},
booktitle = {21st {IEEE} Asian Test Symposium, {ATS} 2012, Niigata, Japan, November
19-22, 2012},
pages = {272--277},
publisher = {{IEEE} Computer Society},
year = {2012},
url = {https://doi.org/10.1109/ATS.2012.50},
doi = {10.1109/ATS.2012.50},
timestamp = {Fri, 24 Mar 2023 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/ats/WangSMK12.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/ats/WenR12,
author = {Xiaoqing Wen and
Sudhakar M. Reddy},
title = {Session Summary {III:} Power-Aware Testing: Present and Future},
booktitle = {21st {IEEE} Asian Test Symposium, {ATS} 2012, Niigata, Japan, November
19-22, 2012},
pages = {220},
publisher = {{IEEE} Computer Society},
year = {2012},
url = {https://doi.org/10.1109/ATS.2012.86},
doi = {10.1109/ATS.2012.86},
timestamp = {Fri, 24 Mar 2023 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/ats/WenR12.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/ats/XiangSD12,
author = {Dong Xiang and
Kele Shen and
Yangdong Deng},
title = {A Thermal-Driven Test Application Scheme for 3-Dimensional ICs},
booktitle = {21st {IEEE} Asian Test Symposium, {ATS} 2012, Niigata, Japan, November
19-22, 2012},
pages = {101--106},
publisher = {{IEEE} Computer Society},
year = {2012},
url = {https://doi.org/10.1109/ATS.2012.26},
doi = {10.1109/ATS.2012.26},
timestamp = {Fri, 24 Mar 2023 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/ats/XiangSD12.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/ats/Yamaguchi12,
author = {Takahiro J. Yamaguchi},
title = {Session Summary {IV:} Post-Silicon Measurements and Tests: Analog
Test and High-Speed {I/O} Test {II}},
booktitle = {21st {IEEE} Asian Test Symposium, {ATS} 2012, Niigata, Japan, November
19-22, 2012},
pages = {245},
publisher = {{IEEE} Computer Society},
year = {2012},
url = {https://doi.org/10.1109/ATS.2012.87},
doi = {10.1109/ATS.2012.87},
timestamp = {Fri, 24 Mar 2023 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/ats/Yamaguchi12.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/ats/YamaguchiANAKKM12,
author = {Takahiro J. Yamaguchi and
Kunihiro Asada and
Kiichi Niitsu and
Mohamed Abbas and
Satoshi Komatsu and
Haruo Kobayashi and
Jose A. Moreira},
title = {A New Procedure for Measuring High-Accuracy Probability Density Functions},
booktitle = {21st {IEEE} Asian Test Symposium, {ATS} 2012, Niigata, Japan, November
19-22, 2012},
pages = {185--190},
publisher = {{IEEE} Computer Society},
year = {2012},
url = {https://doi.org/10.1109/ATS.2012.25},
doi = {10.1109/ATS.2012.25},
timestamp = {Fri, 24 Mar 2023 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/ats/YamaguchiANAKKM12.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/ats/Yamashita12,
author = {Shigeru Yamashita},
title = {An Optimization Problem for Topological Quantum Computation},
booktitle = {21st {IEEE} Asian Test Symposium, {ATS} 2012, Niigata, Japan, November
19-22, 2012},
pages = {61--66},
publisher = {{IEEE} Computer Society},
year = {2012},
url = {https://doi.org/10.1109/ATS.2012.45},
doi = {10.1109/ATS.2012.45},
timestamp = {Fri, 24 Mar 2023 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/ats/Yamashita12.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/ats/YeZCG12,
author = {Fangming Ye and
Zhaobo Zhang and
Krishnendu Chakrabarty and
Xinli Gu},
title = {Adaptive Board-Level Functional Fault Diagnosis Using Decision Trees},
booktitle = {21st {IEEE} Asian Test Symposium, {ATS} 2012, Niigata, Japan, November
19-22, 2012},
pages = {202--207},
publisher = {{IEEE} Computer Society},
year = {2012},
url = {https://doi.org/10.1109/ATS.2012.48},
doi = {10.1109/ATS.2012.48},
timestamp = {Fri, 24 Mar 2023 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/ats/YeZCG12.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/ats/YeZCG12a,
author = {Fangming Ye and
Zhaobo Zhang and
Krishnendu Chakrabarty and
Xinli Gu},
title = {Board-Level Functional Fault Diagnosis Using Learning Based on Incremental
Support-Vector Machines},
booktitle = {21st {IEEE} Asian Test Symposium, {ATS} 2012, Niigata, Japan, November
19-22, 2012},
pages = {208--213},
publisher = {{IEEE} Computer Society},
year = {2012},
url = {https://doi.org/10.1109/ATS.2012.49},
doi = {10.1109/ATS.2012.49},
timestamp = {Fri, 24 Mar 2023 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/ats/YeZCG12a.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/ats/ZeidlerWKK12,
author = {Steffen Zeidler and
Christoph Wolf and
Milos Krstic and
Rolf Kraemer},
title = {Functional Pattern Generation for Asynchronous Designs in a Test Processor
Environment},
booktitle = {21st {IEEE} Asian Test Symposium, {ATS} 2012, Niigata, Japan, November
19-22, 2012},
pages = {296--301},
publisher = {{IEEE} Computer Society},
year = {2012},
url = {https://doi.org/10.1109/ATS.2012.40},
doi = {10.1109/ATS.2012.40},
timestamp = {Mon, 05 Feb 2024 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/ats/ZeidlerWKK12.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/ats/ZhangREP12,
author = {Ying Zhang and
Ahmed Rezine and
Petru Eles and
Zebo Peng},
title = {Automatic Test Program Generation for Out-of-Order Superscalar Processors},
booktitle = {21st {IEEE} Asian Test Symposium, {ATS} 2012, Niigata, Japan, November
19-22, 2012},
pages = {338--343},
publisher = {{IEEE} Computer Society},
year = {2012},
url = {https://doi.org/10.1109/ATS.2012.43},
doi = {10.1109/ATS.2012.43},
timestamp = {Fri, 24 Mar 2023 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/ats/ZhangREP12.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/ats/ZhaoT12,
author = {Wei Zhao and
Mohammad Tehranipoor},
title = {PowerMAX: Fast Power Analysis during Test},
booktitle = {21st {IEEE} Asian Test Symposium, {ATS} 2012, Niigata, Japan, November
19-22, 2012},
pages = {227--232},
publisher = {{IEEE} Computer Society},
year = {2012},
url = {https://doi.org/10.1109/ATS.2012.60},
doi = {10.1109/ATS.2012.60},
timestamp = {Fri, 24 Mar 2023 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/ats/ZhaoT12.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/ats/Zorian12,
author = {Yervant Zorian},
title = {Addressing Test Challenges in Advanced Technology Nodes},
booktitle = {21st {IEEE} Asian Test Symposium, {ATS} 2012, Niigata, Japan, November
19-22, 2012},
pages = {6},
publisher = {{IEEE} Computer Society},
year = {2012},
url = {https://doi.org/10.1109/ATS.2012.79},
doi = {10.1109/ATS.2012.79},
timestamp = {Fri, 24 Mar 2023 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/ats/Zorian12.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@proceedings{DBLP:conf/ats/2012,
title = {21st {IEEE} Asian Test Symposium, {ATS} 2012, Niigata, Japan, November
19-22, 2012},
publisher = {{IEEE} Computer Society},
year = {2012},
url = {https://ieeexplore.ieee.org/xpl/conhome/6392591/proceeding},
isbn = {978-1-4673-4555-2},
timestamp = {Wed, 16 Oct 2019 01:00:00 +0200},
biburl = {https://dblp.org/rec/conf/ats/2012.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/ats/AlmuribKL11,
author = {Haider A. F. Almurib and
T. Nandha Kumar and
Fabrizio Lombardi},
title = {A Single-Configuration Method for Application-Dependent Testing of
SRAM-based {FPGA} Interconnects},
booktitle = {Proceedings of the 20th {IEEE} Asian Test Symposium, {ATS} 2011, New
Delhi, India, November 20-23, 2011},
pages = {444--450},
publisher = {{IEEE} Computer Society},
year = {2011},
url = {https://doi.org/10.1109/ATS.2011.12},
doi = {10.1109/ATS.2011.12},
timestamp = {Mon, 26 Jun 2023 01:00:00 +0200},
biburl = {https://dblp.org/rec/conf/ats/AlmuribKL11.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/ats/ArslanO11,
author = {Baris Arslan and
Alex Orailoglu},
title = {Adaptive Test Framework for Achieving Target Test Quality at Minimal
Cost},
booktitle = {Proceedings of the 20th {IEEE} Asian Test Symposium, {ATS} 2011, New
Delhi, India, November 20-23, 2011},
pages = {323--328},
publisher = {{IEEE} Computer Society},
year = {2011},
url = {https://doi.org/10.1109/ATS.2011.91},
doi = {10.1109/ATS.2011.91},
timestamp = {Fri, 24 Mar 2023 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/ats/ArslanO11.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/ats/AsianFLRH11,
author = {Manuel J. Barragan Asian and
Rafaella Fiorelli and
Gildas L{\'{e}}ger and
Adoraci{\'{o}}n Rueda and
Jos{\'{e}} L. Huertas},
title = {Improving the Accuracy of {RF} Alternate Test Using Multi-VDD Conditions:
Application to Envelope-Based Test of LNAs},
booktitle = {Proceedings of the 20th {IEEE} Asian Test Symposium, {ATS} 2011, New
Delhi, India, November 20-23, 2011},
pages = {359--364},
publisher = {{IEEE} Computer Society},
year = {2011},
url = {https://doi.org/10.1109/ATS.2011.15},
doi = {10.1109/ATS.2011.15},
timestamp = {Fri, 24 Mar 2023 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/ats/AsianFLRH11.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/ats/BaoPCT11,
author = {Fang Bao and
Ke Peng and
Krishnendu Chakrabarty and
Mohammad Tehranipoor},
title = {On Generation of 1-Detect {TDF} Pattern Set with Significantly Increased
{SDD} Coverage},
booktitle = {Proceedings of the 20th {IEEE} Asian Test Symposium, {ATS} 2011, New
Delhi, India, November 20-23, 2011},
pages = {120--125},
publisher = {{IEEE} Computer Society},
year = {2011},
url = {https://doi.org/10.1109/ATS.2011.10},
doi = {10.1109/ATS.2011.10},
timestamp = {Fri, 24 Mar 2023 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/ats/BaoPCT11.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/ats/BernardiR11,
author = {Paolo Bernardi and
Matteo Sonza Reorda},
title = {A New Architecture to Cross-Fertilize On-Line and Manufacturing Testing},
booktitle = {Proceedings of the 20th {IEEE} Asian Test Symposium, {ATS} 2011, New
Delhi, India, November 20-23, 2011},
pages = {142--147},
publisher = {{IEEE} Computer Society},
year = {2011},
url = {https://doi.org/10.1109/ATS.2011.42},
doi = {10.1109/ATS.2011.42},
timestamp = {Fri, 24 Mar 2023 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/ats/BernardiR11.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/ats/BhattaWC11,
author = {Debesh Bhatta and
Joshua W. Wells and
Abhijit Chatterjee},
title = {Time Domain Characterization and Test of High Speed Signals Using
Incoherent Sub-sampling},
booktitle = {Proceedings of the 20th {IEEE} Asian Test Symposium, {ATS} 2011, New
Delhi, India, November 20-23, 2011},
pages = {21--26},
publisher = {{IEEE} Computer Society},
year = {2011},
url = {https://doi.org/10.1109/ATS.2011.77},
doi = {10.1109/ATS.2011.77},
timestamp = {Fri, 24 Mar 2023 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/ats/BhattaWC11.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/ats/BhattacharyaMSD11,
author = {Gunjan Bhattacharya and
Ilora Maity and
Biplab K. Sikdar and
Baisakhi Das},
title = {Exploring Impact of Faults on Branch Predictors' Power for Diagnosis
of Faulty Module},
booktitle = {Proceedings of the 20th {IEEE} Asian Test Symposium, {ATS} 2011, New
Delhi, India, November 20-23, 2011},
pages = {226--231},
publisher = {{IEEE} Computer Society},
year = {2011},
url = {https://doi.org/10.1109/ATS.2011.41},
doi = {10.1109/ATS.2011.41},
timestamp = {Fri, 24 Mar 2023 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/ats/BhattacharyaMSD11.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/ats/BosioDGTVMW11,
author = {Alberto Bosio and
Luigi Dilillo and
Patrick Girard and
Aida Todri and
Arnaud Virazel and
Kohei Miyase and
Xiaoqing Wen},
title = {Power-Aware Test Pattern Generation for At-Speed {LOS} Testing},
booktitle = {Proceedings of the 20th {IEEE} Asian Test Symposium, {ATS} 2011, New
Delhi, India, November 20-23, 2011},
pages = {506--510},
publisher = {{IEEE} Computer Society},
year = {2011},
url = {https://doi.org/10.1109/ATS.2011.50},
doi = {10.1109/ATS.2011.50},
timestamp = {Fri, 24 Mar 2023 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/ats/BosioDGTVMW11.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/ats/CarloGIRP11,
author = {Stefano Di Carlo and
Giulio Gambardella and
Marco Indaco and
Daniele Rolfo and
Paolo Prinetto},
title = {MarciaTesta: An Automatic Generator of Test Programs for Microprocessors'
Data Caches},
booktitle = {Proceedings of the 20th {IEEE} Asian Test Symposium, {ATS} 2011, New
Delhi, India, November 20-23, 2011},
pages = {401--406},
publisher = {{IEEE} Computer Society},
year = {2011},
url = {https://doi.org/10.1109/ATS.2011.78},
doi = {10.1109/ATS.2011.78},
timestamp = {Fri, 24 Mar 2023 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/ats/CarloGIRP11.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/ats/ChaG11,
author = {Jae Chul Cha and
Sandeep K. Gupta},
title = {Yield-per-Area Optimization for 6T-SRAMs Using an Integrated Approach
to Exploit Spares and {ECC} to Efficiently Combat High Defect and
Soft-Error Rates},
booktitle = {Proceedings of the 20th {IEEE} Asian Test Symposium, {ATS} 2011, New
Delhi, India, November 20-23, 2011},
pages = {126--135},
publisher = {{IEEE} Computer Society},
year = {2011},
url = {https://doi.org/10.1109/ATS.2011.71},
doi = {10.1109/ATS.2011.71},
timestamp = {Tue, 26 Sep 2023 01:00:00 +0200},
biburl = {https://dblp.org/rec/conf/ats/ChaG11.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/ats/ChaKK11,
author = {Jaewon Cha and
Ilwoong Kim and
Sungho Kang},
title = {New Fault Detection Algorithm for Multi-level Cell Flash Memroies},
booktitle = {Proceedings of the 20th {IEEE} Asian Test Symposium, {ATS} 2011, New
Delhi, India, November 20-23, 2011},
pages = {341--346},
publisher = {{IEEE} Computer Society},
year = {2011},
url = {https://doi.org/10.1109/ATS.2011.13},
doi = {10.1109/ATS.2011.13},
timestamp = {Fri, 24 Mar 2023 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/ats/ChaKK11.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/ats/Chakravarty11,
author = {Sreejit Chakravarty},
title = {A Process Monitor Based Speed Binning and Die Matching Algorithm},
booktitle = {Proceedings of the 20th {IEEE} Asian Test Symposium, {ATS} 2011, New
Delhi, India, November 20-23, 2011},
pages = {311--316},
publisher = {{IEEE} Computer Society},
year = {2011},
url = {https://doi.org/10.1109/ATS.2011.96},
doi = {10.1109/ATS.2011.96},
timestamp = {Fri, 24 Mar 2023 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/ats/Chakravarty11.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/ats/ChandraSK11,
author = {Anshuman Chandra and
Jyotirmoy Saikia and
Rohit Kapur},
title = {Breaking the Test Application Time Barriers in Compression: Adaptive
Scan-Cyclical {(AS-C)}},
booktitle = {Proceedings of the 20th {IEEE} Asian Test Symposium, {ATS} 2011, New
Delhi, India, November 20-23, 2011},
pages = {432--437},
publisher = {{IEEE} Computer Society},
year = {2011},
url = {https://doi.org/10.1109/ATS.2011.70},
doi = {10.1109/ATS.2011.70},
timestamp = {Fri, 24 Mar 2023 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/ats/ChandraSK11.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/ats/ChenHLTCCL11,
author = {Po{-}Juei Chen and
Wei{-}Li Hsu and
James Chien{-}Mo Li and
Nan{-}Hsin Tseng and
Kuo{-}Yin Chen and
Wei{-}pin Changchien and
Charles C. C. Liu},
title = {An Accurate Timing-Aware Diagnosis Algorithm for Multiple Small Delay
Defects},
booktitle = {Proceedings of the 20th {IEEE} Asian Test Symposium, {ATS} 2011, New
Delhi, India, November 20-23, 2011},
pages = {291--296},
publisher = {{IEEE} Computer Society},
year = {2011},
url = {https://doi.org/10.1109/ATS.2011.23},
doi = {10.1109/ATS.2011.23},
timestamp = {Fri, 24 Mar 2023 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/ats/ChenHLTCCL11.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/ats/ChenLXH11,
author = {Zhen Chen and
Jia Li and
Dong Xiang and
Yu Huang},
title = {Virtual Circuit Model for Low Power Scan Testing in Linear Decompressor-Based
Compression Environment},
booktitle = {Proceedings of the 20th {IEEE} Asian Test Symposium, {ATS} 2011, New
Delhi, India, November 20-23, 2011},
pages = {96--101},
publisher = {{IEEE} Computer Society},
year = {2011},
url = {https://doi.org/10.1109/ATS.2011.62},
doi = {10.1109/ATS.2011.62},
timestamp = {Thu, 25 Apr 2024 01:00:00 +0200},
biburl = {https://dblp.org/rec/conf/ats/ChenLXH11.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/ats/ChenSXB11,
author = {Zhen Chen and
Sharad C. Seth and
Dong Xiang and
Bhargab B. Bhattacharya},
title = {Diagnosis of Multiple Scan-Chain Faults in the Presence of System
Logic Defects},
booktitle = {Proceedings of the 20th {IEEE} Asian Test Symposium, {ATS} 2011, New
Delhi, India, November 20-23, 2011},
pages = {297--302},
publisher = {{IEEE} Computer Society},
year = {2011},
url = {https://doi.org/10.1109/ATS.2011.61},
doi = {10.1109/ATS.2011.61},
timestamp = {Fri, 24 Mar 2023 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/ats/ChenSXB11.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/ats/ChengZHLL11,
author = {Yuanqing Cheng and
Lei Zhang and
Yinhe Han and
Jun Liu and
Xiaowei Li},
title = {Wrapper Chain Design for Testing TSVs Minimization in Circuit-Partitioned
3D SoC},
booktitle = {Proceedings of the 20th {IEEE} Asian Test Symposium, {ATS} 2011, New
Delhi, India, November 20-23, 2011},
pages = {181--186},
publisher = {{IEEE} Computer Society},
year = {2011},
url = {https://doi.org/10.1109/ATS.2011.40},
doi = {10.1109/ATS.2011.40},
timestamp = {Tue, 23 May 2023 01:00:00 +0200},
biburl = {https://dblp.org/rec/conf/ats/ChengZHLL11.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/ats/ChiMGW11,
author = {Chun{-}Chuan Chi and
Erik Jan Marinissen and
Sandeep Kumar Goel and
Cheng{-}Wen Wu},
title = {Multi-visit TAMs to Reduce the Post-Bond Test Length of 2.5D-SICs
with a Passive Silicon Interposer Base},
booktitle = {Proceedings of the 20th {IEEE} Asian Test Symposium, {ATS} 2011, New
Delhi, India, November 20-23, 2011},
pages = {451--456},
publisher = {{IEEE} Computer Society},
year = {2011},
url = {https://doi.org/10.1109/ATS.2011.36},
doi = {10.1109/ATS.2011.36},
timestamp = {Mon, 05 Feb 2024 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/ats/ChiMGW11.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/ats/CookHIW11,
author = {Alejandro Cook and
Sybille Hellebrand and
Thomas Indlekofer and
Hans{-}Joachim Wunderlich},
title = {Diagnostic Test of Robust Circuits},
booktitle = {Proceedings of the 20th {IEEE} Asian Test Symposium, {ATS} 2011, New
Delhi, India, November 20-23, 2011},
pages = {285--290},
publisher = {{IEEE} Computer Society},
year = {2011},
url = {https://doi.org/10.1109/ATS.2011.55},
doi = {10.1109/ATS.2011.55},
timestamp = {Fri, 24 Mar 2023 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/ats/CookHIW11.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/ats/DarbinyanHSVZ11,
author = {K. Darbinyan and
Gurgen Harutyunyan and
Samvel K. Shoukourian and
Valery A. Vardanian and
Yervant Zorian},
title = {A Robust Solution for Embedded Memory Test and Repair},
booktitle = {Proceedings of the 20th {IEEE} Asian Test Symposium, {ATS} 2011, New
Delhi, India, November 20-23, 2011},
pages = {461--462},
publisher = {{IEEE} Computer Society},
year = {2011},
url = {https://doi.org/10.1109/ATS.2011.98},
doi = {10.1109/ATS.2011.98},
timestamp = {Fri, 24 Mar 2023 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/ats/DarbinyanHSVZ11.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/ats/DasG11,
author = {Prasanjeet Das and
Sandeep K. Gupta},
title = {On Generating Vectors for Accurate Post-Silicon Delay Characterization},
booktitle = {Proceedings of the 20th {IEEE} Asian Test Symposium, {ATS} 2011, New
Delhi, India, November 20-23, 2011},
pages = {251--260},
publisher = {{IEEE} Computer Society},
year = {2011},
url = {https://doi.org/10.1109/ATS.2011.39},
doi = {10.1109/ATS.2011.39},
timestamp = {Tue, 26 Sep 2023 01:00:00 +0200},
biburl = {https://dblp.org/rec/conf/ats/DasG11.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/ats/DeutschCKMKMG11,
author = {Sergej Deutsch and
Vivek Chickermane and
Brion L. Keller and
Subhasish Mukherjee and
Mario Konijnenburg and
Erik Jan Marinissen and
Sandeep Kumar Goel},
title = {Automation of 3D-DfT Insertion},
booktitle = {Proceedings of the 20th {IEEE} Asian Test Symposium, {ATS} 2011, New
Delhi, India, November 20-23, 2011},
pages = {395--400},
publisher = {{IEEE} Computer Society},
year = {2011},
url = {https://doi.org/10.1109/ATS.2011.58},
doi = {10.1109/ATS.2011.58},
timestamp = {Mon, 05 Feb 2024 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/ats/DeutschCKMKMG11.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/ats/DevanathanBM11,
author = {V. R. Devanathan and
Sunil Bhavsar and
Rajat Mehrotra},
title = {Physical-Aware Memory {BIST} Datapath Synthesis: Architecture and
Case-Studies on Complex SoCs},
booktitle = {Proceedings of the 20th {IEEE} Asian Test Symposium, {ATS} 2011, New
Delhi, India, November 20-23, 2011},
pages = {457--458},
publisher = {{IEEE} Computer Society},
year = {2011},
url = {https://doi.org/10.1109/ATS.2011.102},
doi = {10.1109/ATS.2011.102},
timestamp = {Fri, 24 Mar 2023 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/ats/DevanathanBM11.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/ats/FanTRCB11,
author = {Xiaoxin Fan and
Huaxing Tang and
Sudhakar M. Reddy and
Wu{-}Tung Cheng and
Brady Benware},
title = {On Using Design Partitioning to Reduce Diagnosis Memory Footprint},
booktitle = {Proceedings of the 20th {IEEE} Asian Test Symposium, {ATS} 2011, New
Delhi, India, November 20-23, 2011},
pages = {219--225},
publisher = {{IEEE} Computer Society},
year = {2011},
url = {https://doi.org/10.1109/ATS.2011.45},
doi = {10.1109/ATS.2011.45},
timestamp = {Fri, 24 Mar 2023 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/ats/FanTRCB11.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/ats/FangLL11,
author = {Yuntan Fang and
Huawei Li and
Xiaowei Li},
title = {A Fault Criticality Evaluation Framework of Digital Systems for Error
Tolerant Video Applications},
booktitle = {Proceedings of the 20th {IEEE} Asian Test Symposium, {ATS} 2011, New
Delhi, India, November 20-23, 2011},
pages = {329--334},
publisher = {{IEEE} Computer Society},
year = {2011},
url = {https://doi.org/10.1109/ATS.2011.72},
doi = {10.1109/ATS.2011.72},
timestamp = {Thu, 11 May 2023 01:00:00 +0200},
biburl = {https://dblp.org/rec/conf/ats/FangLL11.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/ats/FilipekFIMRTT11,
author = {Michal Filipek and
Yoshiaki Fukui and
Hiroyuki Iwata and
Grzegorz Mrugalski and
Janusz Rajski and
Masahiro Takakura and
Jerzy Tyszer},
title = {Low Power Decompressor and {PRPG} with Constant Value Broadcast},
booktitle = {Proceedings of the 20th {IEEE} Asian Test Symposium, {ATS} 2011, New
Delhi, India, November 20-23, 2011},
pages = {84--89},
publisher = {{IEEE} Computer Society},
year = {2011},
url = {https://doi.org/10.1109/ATS.2011.47},
doi = {10.1109/ATS.2011.47},
timestamp = {Fri, 24 Mar 2023 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/ats/FilipekFIMRTT11.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/ats/FranzonDTM11,
author = {Paul D. Franzon and
W. Rhett Davis and
Thorlindur Thorolfsson and
Samson Melamed},
title = {3D Specific Systems: Design and {CAD}},
booktitle = {Proceedings of the 20th {IEEE} Asian Test Symposium, {ATS} 2011, New
Delhi, India, November 20-23, 2011},
pages = {470--473},
publisher = {{IEEE} Computer Society},
year = {2011},
url = {https://doi.org/10.1109/ATS.2011.99},
doi = {10.1109/ATS.2011.99},
timestamp = {Fri, 24 Mar 2023 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/ats/FranzonDTM11.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/ats/Fujita11,
author = {Masahiro Fujita},
title = {High Level Verification and Its Use at Pos-Silicon Debugging and Patching},
booktitle = {Proceedings of the 20th {IEEE} Asian Test Symposium, {ATS} 2011, New
Delhi, India, November 20-23, 2011},
pages = {464--469},
publisher = {{IEEE} Computer Society},
year = {2011},
url = {https://doi.org/10.1109/ATS.2011.51},
doi = {10.1109/ATS.2011.51},
timestamp = {Fri, 24 Mar 2023 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/ats/Fujita11.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/ats/GoelGMPR11,
author = {Ashish Goel and
Swaroop Ghosh and
Mesut Meterelliyoz and
Jeff Parkhurst and
Kaushik Roy},
title = {Integrated Design {\&} Test: Conquering the Conflicting Requirements
of Low-Power, Variation-Tolerance and Test Cost},
booktitle = {Proceedings of the 20th {IEEE} Asian Test Symposium, {ATS} 2011, New
Delhi, India, November 20-23, 2011},
pages = {486--491},
publisher = {{IEEE} Computer Society},
year = {2011},
url = {https://doi.org/10.1109/ATS.2011.100},
doi = {10.1109/ATS.2011.100},
timestamp = {Fri, 24 Mar 2023 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/ats/GoelGMPR11.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/ats/GrayKWB11,
author = {Carl Gray and
David C. Keezer and
Howard Wang and
Keren Bergman},
title = {Burst-Mode Transmission and Data Recovery for Multi-GHz Optical Packet
Switching Network Testing},
booktitle = {Proceedings of the 20th {IEEE} Asian Test Symposium, {ATS} 2011, New
Delhi, India, November 20-23, 2011},
pages = {545--551},
publisher = {{IEEE} Computer Society},
year = {2011},
url = {https://doi.org/10.1109/ATS.2011.81},
doi = {10.1109/ATS.2011.81},
timestamp = {Fri, 24 Mar 2023 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/ats/GrayKWB11.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/ats/GuerreiroS11,
author = {Nuno Guerreiro and
Marcelino B. Santos},
title = {Mixed-Signal Fault Equivalence: Search and Evaluation},
booktitle = {Proceedings of the 20th {IEEE} Asian Test Symposium, {ATS} 2011, New
Delhi, India, November 20-23, 2011},
pages = {377--382},
publisher = {{IEEE} Computer Society},
year = {2011},
url = {https://doi.org/10.1109/ATS.2011.19},
doi = {10.1109/ATS.2011.19},
timestamp = {Fri, 24 Mar 2023 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/ats/GuerreiroS11.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/ats/GuptaG11,
author = {Puneet Gupta and
Rajesh K. Gupta},
title = {Underdesigned and Opportunistic Computing},
booktitle = {Proceedings of the 20th {IEEE} Asian Test Symposium, {ATS} 2011, New
Delhi, India, November 20-23, 2011},
pages = {498--499},
publisher = {{IEEE} Computer Society},
year = {2011},
url = {https://doi.org/10.1109/ATS.2011.101},
doi = {10.1109/ATS.2011.101},
timestamp = {Fri, 24 Mar 2023 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/ats/GuptaG11.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/ats/GuptaKC11,
author = {Atul Gupta and
Ajay Kumar and
Manas Chhabra},
title = {Characterizing Pattern Dependent Delay Effects in {DDR} Memory Interfaces},
booktitle = {Proceedings of the 20th {IEEE} Asian Test Symposium, {ATS} 2011, New
Delhi, India, November 20-23, 2011},
pages = {425--431},
publisher = {{IEEE} Computer Society},
year = {2011},
url = {https://doi.org/10.1109/ATS.2011.14},
doi = {10.1109/ATS.2011.14},
timestamp = {Fri, 24 Mar 2023 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/ats/GuptaKC11.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/ats/HamdiouiKIA11,
author = {Said Hamdioui and
Venkataraman Krishnaswami and
Ijeoma Sandra Irobi and
Zaid Al{-}Ars},
title = {A New Test Paradigm for Semiconductor Memories in the Nano-Era},
booktitle = {Proceedings of the 20th {IEEE} Asian Test Symposium, {ATS} 2011, New
Delhi, India, November 20-23, 2011},
pages = {347--352},
publisher = {{IEEE} Computer Society},
year = {2011},
url = {https://doi.org/10.1109/ATS.2011.87},
doi = {10.1109/ATS.2011.87},
timestamp = {Fri, 24 Mar 2023 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/ats/HamdiouiKIA11.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/ats/HamdiouiT11,
author = {Said Hamdioui and
Mottaqiallah Taouil},
title = {Yield Improvement and Test Cost Optimization for 3D Stacked ICs},
booktitle = {Proceedings of the 20th {IEEE} Asian Test Symposium, {ATS} 2011, New
Delhi, India, November 20-23, 2011},
pages = {480--485},
publisher = {{IEEE} Computer Society},
year = {2011},
url = {https://doi.org/10.1109/ATS.2011.88},
doi = {10.1109/ATS.2011.88},
timestamp = {Fri, 24 Mar 2023 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/ats/HamdiouiT11.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/ats/HaronHH11,
author = {Nor Zaidi Haron and
Said Hamdioui},
title = {On Defect Oriented Testing for Hybrid CMOS/Memristor Memory},
booktitle = {Proceedings of the 20th {IEEE} Asian Test Symposium, {ATS} 2011, New
Delhi, India, November 20-23, 2011},
pages = {353--358},
publisher = {{IEEE} Computer Society},
year = {2011},
url = {https://doi.org/10.1109/ATS.2011.66},
doi = {10.1109/ATS.2011.66},
timestamp = {Fri, 24 Mar 2023 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/ats/HaronHH11.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/ats/HigamiFSKT11,
author = {Yoshinobu Higami and
Hiroshi Furutani and
Takao Sakai and
Shuichi Kameyama and
Hiroshi Takahashi},
title = {Test Pattern Selection for Defect-Aware Test},
booktitle = {Proceedings of the 20th {IEEE} Asian Test Symposium, {ATS} 2011, New
Delhi, India, November 20-23, 2011},
pages = {102--107},
publisher = {{IEEE} Computer Society},
year = {2011},
url = {https://doi.org/10.1109/ATS.2011.24},
doi = {10.1109/ATS.2011.24},
timestamp = {Fri, 24 Mar 2023 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/ats/HigamiFSKT11.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/ats/HigamiTKS11,
author = {Yoshinobu Higami and
Hiroshi Takahashi and
Shin{-}ya Kobayashi and
Kewal K. Saluja},
title = {On Detecting Transition Faults in the Presence of Clock Delay Faults},
booktitle = {Proceedings of the 20th {IEEE} Asian Test Symposium, {ATS} 2011, New
Delhi, India, November 20-23, 2011},
pages = {1--6},
publisher = {{IEEE} Computer Society},
year = {2011},
url = {https://doi.org/10.1109/ATS.2011.33},
doi = {10.1109/ATS.2011.33},
timestamp = {Fri, 24 Mar 2023 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/ats/HigamiTKS11.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/ats/HuangHLHLL11,
author = {Keheng Huang and
Yu Hu and
Xiaowei Li and
Gengxin Hua and
Hongjin Liu and
Bo Liu},
title = {Exploiting Free {LUT} Entries to Mitigate Soft Errors in SRAM-based
FPGAs},
booktitle = {Proceedings of the 20th {IEEE} Asian Test Symposium, {ATS} 2011, New
Delhi, India, November 20-23, 2011},
pages = {438--443},
publisher = {{IEEE} Computer Society},
year = {2011},
url = {https://doi.org/10.1109/ATS.2011.25},
doi = {10.1109/ATS.2011.25},
timestamp = {Fri, 24 Mar 2023 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/ats/HuangHLHLL11.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/ats/IchiharaIYI11,
author = {Hideyuki Ichihara and
Yuka Iwamoto and
Yuki Yoshikawa and
Tomoo Inoue},
title = {Test Compression Based on Lossy Image Encoding},
booktitle = {Proceedings of the 20th {IEEE} Asian Test Symposium, {ATS} 2011, New
Delhi, India, November 20-23, 2011},
pages = {273--278},
publisher = {{IEEE} Computer Society},
year = {2011},
url = {https://doi.org/10.1109/ATS.2011.59},
doi = {10.1109/ATS.2011.59},
timestamp = {Fri, 24 Mar 2023 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/ats/IchiharaIYI11.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/ats/IrobiAHT11,
author = {Sandra Irobi and
Zaid Al{-}Ars and
Said Hamdioui and
Claude Thibeault},
title = {Testing for Parasitic Memory Effect in SRAMs},
booktitle = {Proceedings of the 20th {IEEE} Asian Test Symposium, {ATS} 2011, New
Delhi, India, November 20-23, 2011},
pages = {407--412},
publisher = {{IEEE} Computer Society},
year = {2011},
url = {https://doi.org/10.1109/ATS.2011.76},
doi = {10.1109/ATS.2011.76},
timestamp = {Fri, 24 Mar 2023 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/ats/IrobiAHT11.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/ats/IshaqJSP11,
author = {Umair Ishaq and
Jihun Jung and
Jaehoon Song and
Sungju Park},
title = {Efficient Use of Unused Spare Columns to Improve Memory Error Correcting
Rate},
booktitle = {Proceedings of the 20th {IEEE} Asian Test Symposium, {ATS} 2011, New
Delhi, India, November 20-23, 2011},
pages = {335--340},
publisher = {{IEEE} Computer Society},
year = {2011},
url = {https://doi.org/10.1109/ATS.2011.28},
doi = {10.1109/ATS.2011.28},
timestamp = {Fri, 24 Mar 2023 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/ats/IshaqJSP11.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/ats/JangCGNA11,
author = {Eun Jung Jang and
Jaeyong Chung and
Anne E. Gattiker and
Sani R. Nassif and
Jacob A. Abraham},
title = {Post-Silicon Timing Validation Method Using Path Delay Measurements},
booktitle = {Proceedings of the 20th {IEEE} Asian Test Symposium, {ATS} 2011, New
Delhi, India, November 20-23, 2011},
pages = {232--237},
publisher = {{IEEE} Computer Society},
year = {2011},
url = {https://doi.org/10.1109/ATS.2011.32},
doi = {10.1109/ATS.2011.32},
timestamp = {Fri, 24 Mar 2023 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/ats/JangCGNA11.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/ats/JavaheriNKN11,
author = {Fatemeh Javaheri and
Majid Namaki{-}Shoushtari and
Parastoo Kamranfar and
Zainalabedin Navabi},
title = {Mapping Transaction Level Faults to Stuck-At Faults in Communication
Hardware},
booktitle = {Proceedings of the 20th {IEEE} Asian Test Symposium, {ATS} 2011, New
Delhi, India, November 20-23, 2011},
pages = {114--119},
publisher = {{IEEE} Computer Society},
year = {2011},
url = {https://doi.org/10.1109/ATS.2011.94},
doi = {10.1109/ATS.2011.94},
timestamp = {Fri, 24 Mar 2023 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/ats/JavaheriNKN11.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/ats/KarimiKCGP11,
author = {Naghmeh Karimi and
Zhiqiu Kong and
Krishnendu Chakrabarty and
Pallav Gupta and
Srinivas Patil},
title = {Testing of Clock-Domain Crossing Faults in Multi-core System-on-Chip},
booktitle = {Proceedings of the 20th {IEEE} Asian Test Symposium, {ATS} 2011, New
Delhi, India, November 20-23, 2011},
pages = {7--14},
publisher = {{IEEE} Computer Society},
year = {2011},
url = {https://doi.org/10.1109/ATS.2011.68},
doi = {10.1109/ATS.2011.68},
timestamp = {Fri, 24 Mar 2023 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/ats/KarimiKCGP11.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/ats/KavousianosCJP11,
author = {Xrysovalantis Kavousianos and
Krishnendu Chakrabarty and
Arvind Jain and
Rubin A. Parekhji},
title = {Test Scheduling for Multicore SoCs with Dynamic Voltage Scaling and
Multiple Voltage Islands},
booktitle = {Proceedings of the 20th {IEEE} Asian Test Symposium, {ATS} 2011, New
Delhi, India, November 20-23, 2011},
pages = {33--39},
publisher = {{IEEE} Computer Society},
year = {2011},
url = {https://doi.org/10.1109/ATS.2011.53},
doi = {10.1109/ATS.2011.53},
timestamp = {Fri, 24 Mar 2023 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/ats/KavousianosCJP11.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/ats/KhodabandelooHTHBN11,
author = {Behnam Khodabandeloo and
Seyyed Alireza Hoseini and
Sajjad Taheri and
Mohammad Hashem Haghbayan and
Mahmood Reza Babaei and
Zainalabedin Navabi},
title = {Online Test Macro Scheduling and Assignment in MPSoC Design},
booktitle = {Proceedings of the 20th {IEEE} Asian Test Symposium, {ATS} 2011, New
Delhi, India, November 20-23, 2011},
pages = {148--153},
publisher = {{IEEE} Computer Society},
year = {2011},
url = {https://doi.org/10.1109/ATS.2011.95},
doi = {10.1109/ATS.2011.95},
timestamp = {Fri, 24 Mar 2023 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/ats/KhodabandelooHTHBN11.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/ats/KhullarB11,
author = {Shray Khullar and
Swapnil Bahl},
title = {Power Aware Shift and Capture {ATPG} Methodology for Low Power Designs},
booktitle = {Proceedings of the 20th {IEEE} Asian Test Symposium, {ATS} 2011, New
Delhi, India, November 20-23, 2011},
pages = {500--505},
publisher = {{IEEE} Computer Society},
year = {2011},
url = {https://doi.org/10.1109/ATS.2011.65},
doi = {10.1109/ATS.2011.65},
timestamp = {Fri, 24 Mar 2023 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/ats/KhullarB11.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/ats/KimA11,
author = {Hyunjin Kim and
Jacob A. Abraham},
title = {On-Chip Programmable Dual-Capture for Double Data Rate Interface Timing
Test},
booktitle = {Proceedings of the 20th {IEEE} Asian Test Symposium, {ATS} 2011, New
Delhi, India, November 20-23, 2011},
pages = {15--20},
publisher = {{IEEE} Computer Society},
year = {2011},
url = {https://doi.org/10.1109/ATS.2011.31},
doi = {10.1109/ATS.2011.31},
timestamp = {Fri, 24 Mar 2023 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/ats/KimA11.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/ats/KirmsePP11,
author = {Matthias Kirmse and
Uwe Petersohn and
Elief Paffrath},
title = {Optimized Test Error Detection by Probabilistic Retest Recommendation
Models},
booktitle = {Proceedings of the 20th {IEEE} Asian Test Symposium, {ATS} 2011, New
Delhi, India, November 20-23, 2011},
pages = {317--322},
publisher = {{IEEE} Computer Society},
year = {2011},
url = {https://doi.org/10.1109/ATS.2011.11},
doi = {10.1109/ATS.2011.11},
timestamp = {Fri, 24 Mar 2023 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/ats/KirmsePP11.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/ats/KochteKMWW11,
author = {Michael A. Kochte and
Sandip Kundu and
Kohei Miyase and
Xiaoqing Wen and
Hans{-}Joachim Wunderlich},
title = {Efficient BDD-based Fault Simulation in Presence of Unknown Values},
booktitle = {Proceedings of the 20th {IEEE} Asian Test Symposium, {ATS} 2011, New
Delhi, India, November 20-23, 2011},
pages = {383--388},
publisher = {{IEEE} Computer Society},
year = {2011},
url = {https://doi.org/10.1109/ATS.2011.52},
doi = {10.1109/ATS.2011.52},
timestamp = {Fri, 24 Mar 2023 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/ats/KochteKMWW11.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/ats/KomuravelliMBD11,
author = {Anvesh Komuravelli and
Srobona Mitra and
Ansuman Banerjee and
Pallab Dasgupta},
title = {Backward Reasoning with Formal Properties: {A} Methodology for Bug
Isolation on Simulation Traces},
booktitle = {Proceedings of the 20th {IEEE} Asian Test Symposium, {ATS} 2011, New
Delhi, India, November 20-23, 2011},
pages = {238--243},
publisher = {{IEEE} Computer Society},
year = {2011},
url = {https://doi.org/10.1109/ATS.2011.54},
doi = {10.1109/ATS.2011.54},
timestamp = {Fri, 24 Mar 2023 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/ats/KomuravelliMBD11.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/ats/LegatBN11,
author = {Uros Legat and
Anton Biasizzo and
Franc Novak},
title = {Soft Error Recovery Technique for Multiprocessor {SOPC}},
booktitle = {Proceedings of the 20th {IEEE} Asian Test Symposium, {ATS} 2011, New
Delhi, India, November 20-23, 2011},
pages = {175--180},
publisher = {{IEEE} Computer Society},
year = {2011},
url = {https://doi.org/10.1109/ATS.2011.22},
doi = {10.1109/ATS.2011.22},
timestamp = {Fri, 24 Mar 2023 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/ats/LegatBN11.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/ats/LinMMNRT11,
author = {Xijiang Lin and
Elham K. Moghaddam and
Nilanjan Mukherjee and
Benoit Nadeau{-}Dostie and
Janusz Rajski and
Jerzy Tyszer},
title = {Power Aware Embedded Test},
booktitle = {Proceedings of the 20th {IEEE} Asian Test Symposium, {ATS} 2011, New
Delhi, India, November 20-23, 2011},
pages = {511--516},
publisher = {{IEEE} Computer Society},
year = {2011},
url = {https://doi.org/10.1109/ATS.2011.49},
doi = {10.1109/ATS.2011.49},
timestamp = {Fri, 24 Mar 2023 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/ats/LinMMNRT11.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/ats/MiyaseUEYWKWDBGV11,
author = {Kohei Miyase and
Y. Uchinodan and
Kazunari Enokimoto and
Yuta Yamato and
Xiaoqing Wen and
Seiji Kajihara and
Fangmei Wu and
Luigi Dilillo and
Alberto Bosio and
Patrick Girard and
Arnaud Virazel},
title = {Effective Launch-to-Capture Power Reduction for {LOS} Scheme with
Adjacent-Probability-Based X-Filling},
booktitle = {Proceedings of the 20th {IEEE} Asian Test Symposium, {ATS} 2011, New
Delhi, India, November 20-23, 2011},
pages = {90--95},
publisher = {{IEEE} Computer Society},
year = {2011},
url = {https://doi.org/10.1109/ATS.2011.35},
doi = {10.1109/ATS.2011.35},
timestamp = {Fri, 24 Mar 2023 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/ats/MiyaseUEYWKWDBGV11.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/ats/MoghaddamRRJ11,
author = {Elham K. Moghaddam and
Janusz Rajski and
Sudhakar M. Reddy and
Jakub Janicki},
title = {Low Test Data Volume Low Power At-Speed Delay Tests Using Clock-Gating},
booktitle = {Proceedings of the 20th {IEEE} Asian Test Symposium, {ATS} 2011, New
Delhi, India, November 20-23, 2011},
pages = {267--272},
publisher = {{IEEE} Computer Society},
year = {2011},
url = {https://doi.org/10.1109/ATS.2011.46},
doi = {10.1109/ATS.2011.46},
timestamp = {Fri, 24 Mar 2023 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/ats/MoghaddamRRJ11.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/ats/MrugalskiPMRTU11,
author = {Grzegorz Mrugalski and
Artur Pogiel and
Nilanjan Mukherjee and
Janusz Rajski and
Jerzy Tyszer and
Pawel Urbanek},
title = {Fault Diagnosis in Memory {BIST} Environment with Non-march Tests},
booktitle = {Proceedings of the 20th {IEEE} Asian Test Symposium, {ATS} 2011, New
Delhi, India, November 20-23, 2011},
pages = {419--424},
publisher = {{IEEE} Computer Society},
year = {2011},
url = {https://doi.org/10.1109/ATS.2011.48},
doi = {10.1109/ATS.2011.48},
timestamp = {Fri, 24 Mar 2023 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/ats/MrugalskiPMRTU11.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/ats/MukhopadhyayC11,
author = {Debdeep Mukhopadhyay and
Rajat Subhra Chakraborty},
title = {Testability of Cryptographic Hardware and Detection of Hardware Trojans},
booktitle = {Proceedings of the 20th {IEEE} Asian Test Symposium, {ATS} 2011, New
Delhi, India, November 20-23, 2011},
pages = {517--524},
publisher = {{IEEE} Computer Society},
year = {2011},
url = {https://doi.org/10.1109/ATS.2011.27},
doi = {10.1109/ATS.2011.27},
timestamp = {Fri, 24 Mar 2023 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/ats/MukhopadhyayC11.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/ats/MumtazIHW11,
author = {Abdullah Mumtaz and
Michael E. Imhof and
Stefan Holst and
Hans{-}Joachim Wunderlich},
title = {Embedded Test for Highly Accurate Defect Localization},
booktitle = {Proceedings of the 20th {IEEE} Asian Test Symposium, {ATS} 2011, New
Delhi, India, November 20-23, 2011},
pages = {213--218},
publisher = {{IEEE} Computer Society},
year = {2011},
url = {https://doi.org/10.1109/ATS.2011.60},
doi = {10.1109/ATS.2011.60},
timestamp = {Fri, 24 Mar 2023 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/ats/MumtazIHW11.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/ats/NatarajanWCS11,
author = {Jayaram Natarajan and
Joshua W. Wells and
Abhijit Chatterjee and
Adit D. Singh},
title = {Distributed Comparison Test Driven Multiprocessor Speed-Tuning: Targeting
Performance Gains under Extreme Process Variations},
booktitle = {Proceedings of the 20th {IEEE} Asian Test Symposium, {ATS} 2011, New
Delhi, India, November 20-23, 2011},
pages = {154--160},
publisher = {{IEEE} Computer Society},
year = {2011},
url = {https://doi.org/10.1109/ATS.2011.84},
doi = {10.1109/ATS.2011.84},
timestamp = {Fri, 24 Mar 2023 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/ats/NatarajanWCS11.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/ats/NematiN11,
author = {Nastaran Nemati and
Zainalabedin Navabi},
title = {Adaptation of Standard {RT} Level {BIST} Architectures for System
Level Communication Testing},
booktitle = {Proceedings of the 20th {IEEE} Asian Test Symposium, {ATS} 2011, New
Delhi, India, November 20-23, 2011},
pages = {72--77},
publisher = {{IEEE} Computer Society},
year = {2011},
url = {https://doi.org/10.1109/ATS.2011.103},
doi = {10.1109/ATS.2011.103},
timestamp = {Fri, 24 Mar 2023 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/ats/NematiN11.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/ats/NoiaC11,
author = {Brandon Noia and
Krishnendu Chakrabarty},
title = {Identification of Defective TSVs in Pre-Bond Testing of 3D ICs},
booktitle = {Proceedings of the 20th {IEEE} Asian Test Symposium, {ATS} 2011, New
Delhi, India, November 20-23, 2011},
pages = {187--194},
publisher = {{IEEE} Computer Society},
year = {2011},
url = {https://doi.org/10.1109/ATS.2011.57},
doi = {10.1109/ATS.2011.57},
timestamp = {Fri, 24 Mar 2023 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/ats/NoiaC11.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/ats/NoiaC11a,
author = {Brandon Noia and
Krishnendu Chakrabarty},
title = {Testing and Design-for-Testability Techniques for 3D Integrated Circuits},
booktitle = {Proceedings of the 20th {IEEE} Asian Test Symposium, {ATS} 2011, New
Delhi, India, November 20-23, 2011},
pages = {474--479},
publisher = {{IEEE} Computer Society},
year = {2011},
url = {https://doi.org/10.1109/ATS.2011.67},
doi = {10.1109/ATS.2011.67},
timestamp = {Fri, 24 Mar 2023 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/ats/NoiaC11a.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/ats/Onodera11,
author = {Hidetoshi Onodera},
title = {Dependable {VLSI} Program in Japan: Program Overview and the Current
Status of Dependable {VLSI} Platform Project},
booktitle = {Proceedings of the 20th {IEEE} Asian Test Symposium, {ATS} 2011, New
Delhi, India, November 20-23, 2011},
pages = {492--495},
publisher = {{IEEE} Computer Society},
year = {2011},
url = {https://doi.org/10.1109/ATS.2011.56},
doi = {10.1109/ATS.2011.56},
timestamp = {Fri, 24 Mar 2023 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/ats/Onodera11.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/ats/PaiGCCL11,
author = {Chih{-}Yun Pai and
Ruei{-}Ting Gu and
Bo{-}Chuan Cheng and
Liang{-}Bi Chen and
Katherine Shu{-}Min Li},
title = {A Unified Interconnects Testing Scheme for 3D Integrated Circuits},
booktitle = {Proceedings of the 20th {IEEE} Asian Test Symposium, {ATS} 2011, New
Delhi, India, November 20-23, 2011},
pages = {195--200},
publisher = {{IEEE} Computer Society},
year = {2011},
url = {https://doi.org/10.1109/ATS.2011.38},
doi = {10.1109/ATS.2011.38},
timestamp = {Fri, 24 Mar 2023 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/ats/PaiGCCL11.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/ats/PrabhuHKLGG11,
author = {Sarvesh Prabhu and
Michael S. Hsiao and
Saparya Krishnamoorthy and
Loganathan Lingappan and
Vijay Gangaram and
Jim Grundy},
title = {An Efficient 2-Phase Strategy to Achieve High Branch Coverage},
booktitle = {Proceedings of the 20th {IEEE} Asian Test Symposium, {ATS} 2011, New
Delhi, India, November 20-23, 2011},
pages = {167--174},
publisher = {{IEEE} Computer Society},
year = {2011},
url = {https://doi.org/10.1109/ATS.2011.83},
doi = {10.1109/ATS.2011.83},
timestamp = {Fri, 24 Mar 2023 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/ats/PrabhuHKLGG11.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/ats/QianSC11,
author = {Xi Qian and
Adit D. Singh and
Abhijit Chatterjee},
title = {Diagnosing Multiple Slow Gates for Performance Tuning in the Face
of Extreme Process Variations},
booktitle = {Proceedings of the 20th {IEEE} Asian Test Symposium, {ATS} 2011, New
Delhi, India, November 20-23, 2011},
pages = {303--310},
publisher = {{IEEE} Computer Society},
year = {2011},
url = {https://doi.org/10.1109/ATS.2011.73},
doi = {10.1109/ATS.2011.73},
timestamp = {Fri, 24 Mar 2023 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/ats/QianSC11.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/ats/RazzaqSS11,
author = {Mohammed Abdul Razzaq and
Virendra Singh and
Adit D. Singh},
title = {{SSTKR:} Secure and Testable Scan Design through Test Key Randomization},
booktitle = {Proceedings of the 20th {IEEE} Asian Test Symposium, {ATS} 2011, New
Delhi, India, November 20-23, 2011},
pages = {60--65},
publisher = {{IEEE} Computer Society},
year = {2011},
url = {https://doi.org/10.1109/ATS.2011.85},
doi = {10.1109/ATS.2011.85},
timestamp = {Fri, 24 Mar 2023 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/ats/RazzaqSS11.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/ats/RodriguesK11,
author = {Rance Rodrigues and
Sandip Kundu},
title = {An Online Mechanism to Verify Datapath Execution Using Existing Resources
in Chip Multiprocessors},
booktitle = {Proceedings of the 20th {IEEE} Asian Test Symposium, {ATS} 2011, New
Delhi, India, November 20-23, 2011},
pages = {161--166},
publisher = {{IEEE} Computer Society},
year = {2011},
url = {https://doi.org/10.1109/ATS.2011.82},
doi = {10.1109/ATS.2011.82},
timestamp = {Fri, 24 Mar 2023 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/ats/RodriguesK11.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/ats/SaikiaNKAUFBK11,
author = {Jyotirmoy Saikia and
Pramod Notiyath and
Santosh Kulkarni and
Ashok Anbalan and
Rajesh Uppuluri and
Tammy Fernandes and
Parthajit Bhattacharya and
Rohit Kapur},
title = {Predicting Scan Compression {IP} Configurations for Better QoR},
booktitle = {Proceedings of the 20th {IEEE} Asian Test Symposium, {ATS} 2011, New
Delhi, India, November 20-23, 2011},
pages = {261--266},
publisher = {{IEEE} Computer Society},
year = {2011},
url = {https://doi.org/10.1109/ATS.2011.30},
doi = {10.1109/ATS.2011.30},
timestamp = {Fri, 24 Mar 2023 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/ats/SaikiaNKAUFBK11.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/ats/SatoYMK11,
author = {Yasuo Sato and
Hisato Yamaguchi and
Makoto Matsuzono and
Seiji Kajihara},
title = {Multi-cycle Test with Partial Observation on Scan-Based {BIST} Structure},
booktitle = {Proceedings of the 20th {IEEE} Asian Test Symposium, {ATS} 2011, New
Delhi, India, November 20-23, 2011},
pages = {54--59},
publisher = {{IEEE} Computer Society},
year = {2011},
url = {https://doi.org/10.1109/ATS.2011.34},
doi = {10.1109/ATS.2011.34},
timestamp = {Fri, 24 Mar 2023 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/ats/SatoYMK11.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/ats/SauerJCPB11,
author = {Matthias Sauer and
Jie Jiang and
Alejandro Czutro and
Ilia Polian and
Bernd Becker},
title = {Efficient SAT-Based Search for Longest Sensitisable Paths},
booktitle = {Proceedings of the 20th {IEEE} Asian Test Symposium, {ATS} 2011, New
Delhi, India, November 20-23, 2011},
pages = {108--113},
publisher = {{IEEE} Computer Society},
year = {2011},
url = {https://doi.org/10.1109/ATS.2011.43},
doi = {10.1109/ATS.2011.43},
timestamp = {Thu, 11 Apr 2024 01:00:00 +0200},
biburl = {https://dblp.org/rec/conf/ats/SauerJCPB11.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/ats/Sinanoglu11,
author = {Ozgur Sinanoglu},
title = {Rewind-Support for Peak Capture Power Reduction in Launch-Off-Shift
Testing},
booktitle = {Proceedings of the 20th {IEEE} Asian Test Symposium, {ATS} 2011, New
Delhi, India, November 20-23, 2011},
pages = {78--83},
publisher = {{IEEE} Computer Society},
year = {2011},
url = {https://doi.org/10.1109/ATS.2011.18},
doi = {10.1109/ATS.2011.18},
timestamp = {Fri, 24 Mar 2023 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/ats/Sinanoglu11.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/ats/SindiaAS11,
author = {Suraj Sindia and
Vishwani D. Agrawal and
Virendra Singh},
title = {Test and Diagnosis of Analog Circuits Using Moment Generating Functions},
booktitle = {Proceedings of the 20th {IEEE} Asian Test Symposium, {ATS} 2011, New
Delhi, India, November 20-23, 2011},
pages = {371--376},
publisher = {{IEEE} Computer Society},
year = {2011},
url = {https://doi.org/10.1109/ATS.2011.86},
doi = {10.1109/ATS.2011.86},
timestamp = {Fri, 24 Mar 2023 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/ats/SindiaAS11.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/ats/SpyronasiosASM11,
author = {Alexios Spyronasios and
Louay Abdallah and
Haralampos{-}G. D. Stratigopoulos and
Salvador Mir},
title = {On Replacing an {RF} Test with an Alternative Measurement: Theory
and a Case Study},
booktitle = {Proceedings of the 20th {IEEE} Asian Test Symposium, {ATS} 2011, New
Delhi, India, November 20-23, 2011},
pages = {365--370},
publisher = {{IEEE} Computer Society},
year = {2011},
url = {https://doi.org/10.1109/ATS.2011.44},
doi = {10.1109/ATS.2011.44},
timestamp = {Fri, 24 Mar 2023 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/ats/SpyronasiosASM11.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/ats/TenentesK11,
author = {Vasileios Tenentes and
Xrysovalantis Kavousianos},
title = {Low Power Test-Compression for High Test-Quality and Low Test-Data
Volume},
booktitle = {Proceedings of the 20th {IEEE} Asian Test Symposium, {ATS} 2011, New
Delhi, India, November 20-23, 2011},
pages = {46--53},
publisher = {{IEEE} Computer Society},
year = {2011},
url = {https://doi.org/10.1109/ATS.2011.75},
doi = {10.1109/ATS.2011.75},
timestamp = {Fri, 24 Mar 2023 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/ats/TenentesK11.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/ats/TranVBDGPW11,
author = {D. A. Tran and
Arnaud Virazel and
Alberto Bosio and
Luigi Dilillo and
Patrick Girard and
Serge Pravossoudovitch and
Hans{-}Joachim Wunderlich},
title = {A Hybrid Fault Tolerant Architecture for Robustness Improvement of
Digital Circuits},
booktitle = {Proceedings of the 20th {IEEE} Asian Test Symposium, {ATS} 2011, New
Delhi, India, November 20-23, 2011},
pages = {136--141},
publisher = {{IEEE} Computer Society},
year = {2011},
url = {https://doi.org/10.1109/ATS.2011.89},
doi = {10.1109/ATS.2011.89},
timestamp = {Fri, 24 Mar 2023 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/ats/TranVBDGPW11.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/ats/TsertovUJD11,
author = {Anton Tsertov and
Raimund Ubar and
Artur Jutman and
Sergei Devadze},
title = {Automatic SoC Level Test Path Synthesis Based on Partial Functional
Models},
booktitle = {Proceedings of the 20th {IEEE} Asian Test Symposium, {ATS} 2011, New
Delhi, India, November 20-23, 2011},
pages = {532--538},
publisher = {{IEEE} Computer Society},
year = {2011},
url = {https://doi.org/10.1109/ATS.2011.79},
doi = {10.1109/ATS.2011.79},
timestamp = {Fri, 24 Mar 2023 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/ats/TsertovUJD11.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/ats/VatajeluGRF11,
author = {Elena I. Vatajelu and
{\'{A}}lvaro G{\'{o}}mez{-}Pau and
Michel Renovell and
Joan Figueras},
title = {Transient Noise Failures in {SRAM} Cells: Dynamic Noise Margin Metric},
booktitle = {Proceedings of the 20th {IEEE} Asian Test Symposium, {ATS} 2011, New
Delhi, India, November 20-23, 2011},
pages = {413--418},
publisher = {{IEEE} Computer Society},
year = {2011},
url = {https://doi.org/10.1109/ATS.2011.64},
doi = {10.1109/ATS.2011.64},
timestamp = {Sat, 30 Sep 2023 01:00:00 +0200},
biburl = {https://dblp.org/rec/conf/ats/VatajeluGRF11.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/ats/Wehn11,
author = {Norbert Wehn},
title = {Reliability: {A} Cross-Disciplinary and Cross-Layer Approach},
booktitle = {Proceedings of the 20th {IEEE} Asian Test Symposium, {ATS} 2011, New
Delhi, India, November 20-23, 2011},
pages = {496--497},
publisher = {{IEEE} Computer Society},
year = {2011},
url = {https://doi.org/10.1109/ATS.2011.21},
doi = {10.1109/ATS.2011.21},
timestamp = {Fri, 24 Mar 2023 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/ats/Wehn11.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/ats/XiangC11,
author = {Dong Xiang and
Zhen Chen},
title = {Selective Test Response Collection for Low-Power Scan Testing with
Well-Compressed Test Data},
booktitle = {Proceedings of the 20th {IEEE} Asian Test Symposium, {ATS} 2011, New
Delhi, India, November 20-23, 2011},
pages = {40--45},
publisher = {{IEEE} Computer Society},
year = {2011},
url = {https://doi.org/10.1109/ATS.2011.74},
doi = {10.1109/ATS.2011.74},
timestamp = {Fri, 24 Mar 2023 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/ats/XiangC11.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/ats/YaoSR11,
author = {Chunhua Yao and
Kewal K. Saluja and
Parameswaran Ramanathan},
title = {Temperature Dependent Test Scheduling for Multi-core System-on-Chip},
booktitle = {Proceedings of the 20th {IEEE} Asian Test Symposium, {ATS} 2011, New
Delhi, India, November 20-23, 2011},
pages = {27--32},
publisher = {{IEEE} Computer Society},
year = {2011},
url = {https://doi.org/10.1109/ATS.2011.26},
doi = {10.1109/ATS.2011.26},
timestamp = {Fri, 24 Mar 2023 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/ats/YaoSR11.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/ats/YotsuyanagiMH11,
author = {Hiroyuki Yotsuyanagi and
Hiroyuki Makimoto and
Masaki Hashizume},
title = {A Boundary Scan Circuit with Time-to-Digital Converter for Delay Testing},
booktitle = {Proceedings of the 20th {IEEE} Asian Test Symposium, {ATS} 2011, New
Delhi, India, November 20-23, 2011},
pages = {539--544},
publisher = {{IEEE} Computer Society},
year = {2011},
url = {https://doi.org/10.1109/ATS.2011.63},
doi = {10.1109/ATS.2011.63},
timestamp = {Fri, 24 Mar 2023 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/ats/YotsuyanagiMH11.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/ats/YuXQ11,
author = {Yang Yu and
Gang Xi and
Liyan Qiao},
title = {Multiscan-based Test Data Compression Using {UBI} Dictionary and Bitmask},
booktitle = {Proceedings of the 20th {IEEE} Asian Test Symposium, {ATS} 2011, New
Delhi, India, November 20-23, 2011},
pages = {279--284},
publisher = {{IEEE} Computer Society},
year = {2011},
url = {https://doi.org/10.1109/ATS.2011.69},
doi = {10.1109/ATS.2011.69},
timestamp = {Fri, 24 Mar 2023 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/ats/YuXQ11.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/ats/ZadeganIACL11,
author = {Farrokh Ghani Zadegan and
Urban Ingelsson and
Golnaz Asani and
Gunnar Carlsson and
Erik Larsson},
title = {Test Scheduling in an {IEEE} {P1687} Environment with Resource and
Power Constraints},
booktitle = {Proceedings of the 20th {IEEE} Asian Test Symposium, {ATS} 2011, New
Delhi, India, November 20-23, 2011},
pages = {525--531},
publisher = {{IEEE} Computer Society},
year = {2011},
url = {https://doi.org/10.1109/ATS.2011.80},
doi = {10.1109/ATS.2011.80},
timestamp = {Fri, 24 Mar 2023 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/ats/ZadeganIACL11.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/ats/ZaourarKA11,
author = {Lilia Zaourar and
Yann Kieffer and
Chouki Aktouf},
title = {An Innovative Methodology for Scan Chain Insertion and Analysis at
{RTL}},
booktitle = {Proceedings of the 20th {IEEE} Asian Test Symposium, {ATS} 2011, New
Delhi, India, November 20-23, 2011},
pages = {66--71},
publisher = {{IEEE} Computer Society},
year = {2011},
url = {https://doi.org/10.1109/ATS.2011.20},
doi = {10.1109/ATS.2011.20},
timestamp = {Fri, 24 Mar 2023 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/ats/ZaourarKA11.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/ats/ZeidlerWKVK11,
author = {Steffen Zeidler and
Christoph Wolf and
Milos Krstic and
Frank Vater and
Rolf Kraemer},
title = {Design of a Test Processor for Asynchronous Chip Test},
booktitle = {Proceedings of the 20th {IEEE} Asian Test Symposium, {ATS} 2011, New
Delhi, India, November 20-23, 2011},
pages = {244--250},
publisher = {{IEEE} Computer Society},
year = {2011},
url = {https://doi.org/10.1109/ATS.2011.17},
doi = {10.1109/ATS.2011.17},
timestamp = {Mon, 05 Feb 2024 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/ats/ZeidlerWKVK11.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/ats/ZhangWD11,
author = {Hongyan Zhang and
Robert Wille and
Rolf Drechsler},
title = {Improved Fault Diagnosis for Reversible Circuits},
booktitle = {Proceedings of the 20th {IEEE} Asian Test Symposium, {ATS} 2011, New
Delhi, India, November 20-23, 2011},
pages = {207--212},
publisher = {{IEEE} Computer Society},
year = {2011},
url = {https://doi.org/10.1109/ATS.2011.29},
doi = {10.1109/ATS.2011.29},
timestamp = {Fri, 24 Mar 2023 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/ats/ZhangWD11.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/ats/ZhaoKA11,
author = {Yi Zhao and
S. Saqib Khursheed and
Bashir M. Al{-}Hashimi},
title = {Cost-Effective {TSV} Grouping for Yield Improvement of 3D-ICs},
booktitle = {Proceedings of the 20th {IEEE} Asian Test Symposium, {ATS} 2011, New
Delhi, India, November 20-23, 2011},
pages = {201--206},
publisher = {{IEEE} Computer Society},
year = {2011},
url = {https://doi.org/10.1109/ATS.2011.37},
doi = {10.1109/ATS.2011.37},
timestamp = {Fri, 24 Mar 2023 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/ats/ZhaoKA11.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/ats/ZhongKARC11,
author = {Shida Zhong and
S. Saqib Khursheed and
Bashir M. Al{-}Hashimi and
Sudhakar M. Reddy and
Krishnendu Chakrabarty},
title = {Analysis of Resistive Bridge Defect Delay Behavior in the Presence
of Process Variation},
booktitle = {Proceedings of the 20th {IEEE} Asian Test Symposium, {ATS} 2011, New
Delhi, India, November 20-23, 2011},
pages = {389--394},
publisher = {{IEEE} Computer Society},
year = {2011},
url = {https://doi.org/10.1109/ATS.2011.16},
doi = {10.1109/ATS.2011.16},
timestamp = {Fri, 24 Mar 2023 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/ats/ZhongKARC11.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/ats/ZordanBDGPTVB11,
author = {Leonardo Bonet Zordan and
Alberto Bosio and
Luigi Dilillo and
Patrick Girard and
Serge Pravossoudovitch and
Aida Todri and
Arnaud Virazel and
Nabil Badereddine},
title = {Failure Analysis and Test Solutions for Low-Power SRAMs},
booktitle = {Proceedings of the 20th {IEEE} Asian Test Symposium, {ATS} 2011, New
Delhi, India, November 20-23, 2011},
pages = {459--460},
publisher = {{IEEE} Computer Society},
year = {2011},
url = {https://doi.org/10.1109/ATS.2011.97},
doi = {10.1109/ATS.2011.97},
timestamp = {Fri, 24 Mar 2023 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/ats/ZordanBDGPTVB11.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/ats/dAbreu11,
author = {Manuel A. d'Abreu},
title = {Nand Flash Memory - Product Trends, Technology Overview, and Technical
Challenges},
booktitle = {Proceedings of the 20th {IEEE} Asian Test Symposium, {ATS} 2011, New
Delhi, India, November 20-23, 2011},
pages = {463},
publisher = {{IEEE} Computer Society},
year = {2011},
url = {https://doi.org/10.1109/ATS.2011.90},
doi = {10.1109/ATS.2011.90},
timestamp = {Fri, 24 Mar 2023 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/ats/dAbreu11.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@proceedings{DBLP:conf/ats/2011,
title = {Proceedings of the 20th {IEEE} Asian Test Symposium, {ATS} 2011, New
Delhi, India, November 20-23, 2011},
publisher = {{IEEE} Computer Society},
year = {2011},
url = {https://ieeexplore.ieee.org/xpl/conhome/6114262/proceeding},
isbn = {978-1-4577-1984-4},
timestamp = {Wed, 16 Oct 2019 01:00:00 +0200},
biburl = {https://dblp.org/rec/conf/ats/2011.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/ats/AghaeeHPE10,
author = {Nima Aghaee and
Zhiyuan He and
Zebo Peng and
Petru Eles},
title = {Temperature-Aware SoC Test Scheduling Considering Inter-Chip Process
Variation},
booktitle = {Proceedings of the 19th {IEEE} Asian Test Symposium, {ATS} 2010, 1-4
December 2010, Shanghai, China},
pages = {395--398},
publisher = {{IEEE} Computer Society},
year = {2010},
url = {https://doi.org/10.1109/ATS.2010.74},
doi = {10.1109/ATS.2010.74},
timestamp = {Fri, 24 Mar 2023 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/ats/AghaeeHPE10.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/ats/AlawadhiSA10,
author = {Nader Alawadhi and
Ozgur Sinanoglu and
Mohammed Al{-}Mulla},
title = {Pattern Encodability Enhancements for Test Stimulus Decompressors},
booktitle = {Proceedings of the 19th {IEEE} Asian Test Symposium, {ATS} 2010, 1-4
December 2010, Shanghai, China},
pages = {173--178},
publisher = {{IEEE} Computer Society},
year = {2010},
url = {https://doi.org/10.1109/ATS.2010.39},
doi = {10.1109/ATS.2010.39},
timestamp = {Fri, 24 Mar 2023 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/ats/AlawadhiSA10.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/ats/BasithKR10,
author = {Iftekhar Ibne Basith and
Nabeeh Kandalaft and
Rashid Rashidzadeh},
title = {Built-In Self-Test for Capacitive {MEMS} Using a Charge Control Technique},
booktitle = {Proceedings of the 19th {IEEE} Asian Test Symposium, {ATS} 2010, 1-4
December 2010, Shanghai, China},
pages = {135--140},
publisher = {{IEEE} Computer Society},
year = {2010},
url = {https://doi.org/10.1109/ATS.2010.32},
doi = {10.1109/ATS.2010.32},
timestamp = {Fri, 24 Mar 2023 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/ats/BasithKR10.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/ats/BenabboudBDGPVR10,
author = {Youssef Benabboud and
Alberto Bosio and
Luigi Dilillo and
Patrick Girard and
Serge Pravossoudovitch and
Arnaud Virazel and
Olivia Riewer},
title = {A Comprehensive System-on-Chip Logic Diagnosis},
booktitle = {Proceedings of the 19th {IEEE} Asian Test Symposium, {ATS} 2010, 1-4
December 2010, Shanghai, China},
pages = {237--242},
publisher = {{IEEE} Computer Society},
year = {2010},
url = {https://doi.org/10.1109/ATS.2010.49},
doi = {10.1109/ATS.2010.49},
timestamp = {Fri, 24 Mar 2023 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/ats/BenabboudBDGPVR10.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/ats/ChenSZ10,
author = {Bowen Chen and
Haihua Shen and
Wenhui Zhang},
title = {Formula-Oriented Compositional Minimization in Model Checking},
booktitle = {Proceedings of the 19th {IEEE} Asian Test Symposium, {ATS} 2010, 1-4
December 2010, Shanghai, China},
pages = {81--84},
publisher = {{IEEE} Computer Society},
year = {2010},
url = {https://doi.org/10.1109/ATS.2010.23},
doi = {10.1109/ATS.2010.23},
timestamp = {Fri, 24 Mar 2023 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/ats/ChenSZ10.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/ats/ChengH10,
author = {Wu{-}Tung Cheng and
Yu Huang},
title = {Enhance Profiling-Based Scan Chain Diagnosis by Pattern Masking},
booktitle = {Proceedings of the 19th {IEEE} Asian Test Symposium, {ATS} 2010, 1-4
December 2010, Shanghai, China},
pages = {255--260},
publisher = {{IEEE} Computer Society},
year = {2010},
url = {https://doi.org/10.1109/ATS.2010.52},
doi = {10.1109/ATS.2010.52},
timestamp = {Fri, 24 Mar 2023 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/ats/ChengH10.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/ats/ChoiC10,
author = {Hyun Woo Choi and
Abhijit Chatterjee},
title = {Jitter Characterization of Pseudo-random Bit Sequences Using Incoherent
Sub-sampling},
booktitle = {Proceedings of the 19th {IEEE} Asian Test Symposium, {ATS} 2010, 1-4
December 2010, Shanghai, China},
pages = {9--14},
publisher = {{IEEE} Computer Society},
year = {2010},
url = {https://doi.org/10.1109/ATS.2010.11},
doi = {10.1109/ATS.2010.11},
timestamp = {Fri, 24 Mar 2023 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/ats/ChoiC10.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/ats/ChouLCKCW10,
author = {Che{-}Wei Chou and
Jin{-}Fu Li and
Ji{-}Jan Chen and
Ding{-}Ming Kwai and
Yung{-}Fa Chou and
Cheng{-}Wen Wu},
title = {A Test Integration Methodology for 3D Integrated Circuits},
booktitle = {Proceedings of the 19th {IEEE} Asian Test Symposium, {ATS} 2010, 1-4
December 2010, Shanghai, China},
pages = {377--382},
publisher = {{IEEE} Computer Society},
year = {2010},
url = {https://doi.org/10.1109/ATS.2010.71},
doi = {10.1109/ATS.2010.71},
timestamp = {Tue, 17 Oct 2023 01:00:00 +0200},
biburl = {https://dblp.org/rec/conf/ats/ChouLCKCW10.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/ats/DevarakondSNBCSC10,
author = {Shyam Kumar Devarakond and
Shreyas Sen and
Vishwanath Natarajan and
Aritra Banerjee and
Hyun Woo Choi and
Ganesh Srinivasan and
Abhijit Chatterjee},
title = {Digitally Assisted Concurrent Built-In Tuning of {RF} Systems Using
Hamming Distance Proportional Signatures},
booktitle = {Proceedings of the 19th {IEEE} Asian Test Symposium, {ATS} 2010, 1-4
December 2010, Shanghai, China},
pages = {283--288},
publisher = {{IEEE} Computer Society},
year = {2010},
url = {https://doi.org/10.1109/ATS.2010.55},
doi = {10.1109/ATS.2010.55},
timestamp = {Fri, 24 Mar 2023 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/ats/DevarakondSNBCSC10.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/ats/ElmKW10,
author = {Melanie Elm and
Michael A. Kochte and
Hans{-}Joachim Wunderlich},
title = {On Determining the Real Output Xs by SAT-Based Reasoning},
booktitle = {Proceedings of the 19th {IEEE} Asian Test Symposium, {ATS} 2010, 1-4
December 2010, Shanghai, China},
pages = {39--44},
publisher = {{IEEE} Computer Society},
year = {2010},
url = {https://doi.org/10.1109/ATS.2010.16},
doi = {10.1109/ATS.2010.16},
timestamp = {Fri, 24 Mar 2023 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/ats/ElmKW10.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/ats/FangWGC10,
author = {Hongxia Fang and
Zhiyuan Wang and
Xinli Gu and
Krishnendu Chakrabarty},
title = {Mimicking of Functional State Space with Structural Tests for the
Diagnosis of Board-Level Functional Failures},
booktitle = {Proceedings of the 19th {IEEE} Asian Test Symposium, {ATS} 2010, 1-4
December 2010, Shanghai, China},
pages = {421--428},
publisher = {{IEEE} Computer Society},
year = {2010},
url = {https://doi.org/10.1109/ATS.2010.78},
doi = {10.1109/ATS.2010.78},
timestamp = {Fri, 24 Mar 2023 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/ats/FangWGC10.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/ats/FuLL10,
author = {Xiang Fu and
Huawei Li and
Xiaowei Li},
title = {On Selection of Testable Paths with Specified Lengths for Faster-Than-At-Speed
Testing},
booktitle = {Proceedings of the 19th {IEEE} Asian Test Symposium, {ATS} 2010, 1-4
December 2010, Shanghai, China},
pages = {45--48},
publisher = {{IEEE} Computer Society},
year = {2010},
url = {https://doi.org/10.1109/ATS.2010.17},
doi = {10.1109/ATS.2010.17},
timestamp = {Thu, 11 May 2023 01:00:00 +0200},
biburl = {https://dblp.org/rec/conf/ats/FuLL10.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/ats/GoelCYPT10,
author = {Sandeep Kumar Goel and
Krishnendu Chakrabarty and
Mahmut Yilmaz and
Ke Peng and
Mohammad Tehranipoor},
title = {Circuit Topology-Based Test Pattern Generation for Small-Delay Defects},
booktitle = {Proceedings of the 19th {IEEE} Asian Test Symposium, {ATS} 2010, 1-4
December 2010, Shanghai, China},
pages = {307--312},
publisher = {{IEEE} Computer Society},
year = {2010},
url = {https://doi.org/10.1109/ATS.2010.59},
doi = {10.1109/ATS.2010.59},
timestamp = {Fri, 24 Mar 2023 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/ats/GoelCYPT10.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/ats/GoelHRZ10,
author = {Neha Goel and
Michael S. Hsiao and
Naren Ramakrishnan and
Mohammed J. Zaki},
title = {Mining Complex Boolean Expressions for Sequential Equivalence Checking},
booktitle = {Proceedings of the 19th {IEEE} Asian Test Symposium, {ATS} 2010, 1-4
December 2010, Shanghai, China},
pages = {442--447},
publisher = {{IEEE} Computer Society},
year = {2010},
url = {https://doi.org/10.1109/ATS.2010.81},
doi = {10.1109/ATS.2010.81},
timestamp = {Fri, 24 Mar 2023 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/ats/GoelHRZ10.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/ats/GuoCSCH10,
author = {Qi Guo and
Tianshi Chen and
Haihua Shen and
Yunji Chen and
Weiwu Hu},
title = {On-the-Fly Reduction of Stimuli for Functional Verification},
booktitle = {Proceedings of the 19th {IEEE} Asian Test Symposium, {ATS} 2010, 1-4
December 2010, Shanghai, China},
pages = {448--454},
publisher = {{IEEE} Computer Society},
year = {2010},
url = {https://doi.org/10.1109/ATS.2010.82},
doi = {10.1109/ATS.2010.82},
timestamp = {Fri, 24 Mar 2023 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/ats/GuoCSCH10.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/ats/HaghbayanKJN10,
author = {M. H. Haghbayan and
Sara Karamati and
Fatemeh Javaheri and
Zainalabedin Navabi},
title = {Test Pattern Selection and Compaction for Sequential Circuits in an
{HDL} Environment},
booktitle = {Proceedings of the 19th {IEEE} Asian Test Symposium, {ATS} 2010, 1-4
December 2010, Shanghai, China},
pages = {53--56},
publisher = {{IEEE} Computer Society},
year = {2010},
url = {https://doi.org/10.1109/ATS.2010.85},
doi = {10.1109/ATS.2010.85},
timestamp = {Fri, 24 Mar 2023 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/ats/HaghbayanKJN10.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/ats/HeLLL10,
author = {Zijian He and
Tao Lv and
Huawei Li and
Xiaowei Li},
title = {An Efficient Algorithm for Finding a Universal Set of Testable Long
Paths},
booktitle = {Proceedings of the 19th {IEEE} Asian Test Symposium, {ATS} 2010, 1-4
December 2010, Shanghai, China},
pages = {319--324},
publisher = {{IEEE} Computer Society},
year = {2010},
url = {https://doi.org/10.1109/ATS.2010.61},
doi = {10.1109/ATS.2010.61},
timestamp = {Thu, 11 May 2023 01:00:00 +0200},
biburl = {https://dblp.org/rec/conf/ats/HeLLL10.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/ats/HebertBST10,
author = {Nicolas Hebert and
Pascal Benoit and
Gilles Sassatelli and
Lionel Torres},
title = {D-Scale: {A} Scalable System-Level Dependable Method for MPSoCs},
booktitle = {Proceedings of the 19th {IEEE} Asian Test Symposium, {ATS} 2010, 1-4
December 2010, Shanghai, China},
pages = {198--205},
publisher = {{IEEE} Computer Society},
year = {2010},
url = {https://doi.org/10.1109/ATS.2010.43},
doi = {10.1109/ATS.2010.43},
timestamp = {Fri, 24 Mar 2023 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/ats/HebertBST10.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/ats/HopschBHPSVW10,
author = {Fabian Hopsch and
Bernd Becker and
Sybille Hellebrand and
Ilia Polian and
Bernd Straube and
Wolfgang Vermeiren and
Hans{-}Joachim Wunderlich},
title = {Variation-Aware Fault Modeling},
booktitle = {Proceedings of the 19th {IEEE} Asian Test Symposium, {ATS} 2010, 1-4
December 2010, Shanghai, China},
pages = {87--93},
publisher = {{IEEE} Computer Society},
year = {2010},
url = {https://doi.org/10.1109/ATS.2010.24},
doi = {10.1109/ATS.2010.24},
timestamp = {Fri, 24 Mar 2023 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/ats/HopschBHPSVW10.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/ats/HuangLH10,
author = {Tsung{-}Chu Huang and
Kuei{-}Yeh Lu and
Yen{-}Chieh Huang},
title = {{HYPERA:} High-Yield Performance-Efficient Redundancy Analysis},
booktitle = {Proceedings of the 19th {IEEE} Asian Test Symposium, {ATS} 2010, 1-4
December 2010, Shanghai, China},
pages = {231--236},
publisher = {{IEEE} Computer Society},
year = {2010},
url = {https://doi.org/10.1109/ATS.2010.48},
doi = {10.1109/ATS.2010.48},
timestamp = {Fri, 24 Mar 2023 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/ats/HuangLH10.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/ats/HuangSM10,
author = {Ke Huang and
Haralampos{-}G. D. Stratigopoulos and
Salvador Mir},
title = {Bayesian Fault Diagnosis of {RF} Circuits Using Nonparametric Density
Estimation},
booktitle = {Proceedings of the 19th {IEEE} Asian Test Symposium, {ATS} 2010, 1-4
December 2010, Shanghai, China},
pages = {295--298},
publisher = {{IEEE} Computer Society},
year = {2010},
url = {https://doi.org/10.1109/ATS.2010.57},
doi = {10.1109/ATS.2010.57},
timestamp = {Fri, 24 Mar 2023 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/ats/HuangSM10.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/ats/IshikawaYH10,
author = {Masashi Ishikawa and
Hiroyuki Yotsuyanagi and
Masaki Hashizume},
title = {Test Data Reduction for BIST-Aided Scan Test Using Compatible Flip-Flops
and Shifting Inverter Code},
booktitle = {Proceedings of the 19th {IEEE} Asian Test Symposium, {ATS} 2010, 1-4
December 2010, Shanghai, China},
pages = {163--166},
publisher = {{IEEE} Computer Society},
year = {2010},
url = {https://doi.org/10.1109/ATS.2010.37},
doi = {10.1109/ATS.2010.37},
timestamp = {Fri, 24 Mar 2023 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/ats/IshikawaYH10.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/ats/IwataOIF10,
author = {Hiroshi Iwata and
Satoshi Ohtake and
Michiko Inoue and
Hideo Fujiwara},
title = {Bipartite Full Scan Design: {A} {DFT} Method for Asynchronous Circuits},
booktitle = {Proceedings of the 19th {IEEE} Asian Test Symposium, {ATS} 2010, 1-4
December 2010, Shanghai, China},
pages = {206--211},
publisher = {{IEEE} Computer Society},
year = {2010},
url = {https://doi.org/10.1109/ATS.2010.44},
doi = {10.1109/ATS.2010.44},
timestamp = {Fri, 24 Mar 2023 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/ats/IwataOIF10.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/ats/JinHLL10,
author = {Song Jin and
Yinhe Han and
Huawei Li and
Xiaowei Li},
title = {{P(2)CLRAF:} An Pre- and Post-Silicon Cooperated Circuit Lifetime
Reliability Analysis Framework},
booktitle = {Proceedings of the 19th {IEEE} Asian Test Symposium, {ATS} 2010, 1-4
December 2010, Shanghai, China},
pages = {117--120},
publisher = {{IEEE} Computer Society},
year = {2010},
url = {https://doi.org/10.1109/ATS.2010.29},
doi = {10.1109/ATS.2010.29},
timestamp = {Tue, 23 May 2023 01:00:00 +0200},
biburl = {https://dblp.org/rec/conf/ats/JinHLL10.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/ats/KatohNI10,
author = {Kentaroh Katoh and
Kazuteru Namba and
Hideo Ito},
title = {A Low Area On-chip Delay Measurement System Using Embedded Delay Measurement
Circuit},
booktitle = {Proceedings of the 19th {IEEE} Asian Test Symposium, {ATS} 2010, 1-4
December 2010, Shanghai, China},
pages = {343--348},
publisher = {{IEEE} Computer Society},
year = {2010},
url = {https://doi.org/10.1109/ATS.2010.65},
doi = {10.1109/ATS.2010.65},
timestamp = {Fri, 24 Mar 2023 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/ats/KatohNI10.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/ats/KavousianosCKT10,
author = {Xrysovalantis Kavousianos and
Krishnendu Chakrabarty and
Emmanouil Kalligeros and
Vasileios Tenentes},
title = {Defect Coverage-Driven Window-Based Test Compression},
booktitle = {Proceedings of the 19th {IEEE} Asian Test Symposium, {ATS} 2010, 1-4
December 2010, Shanghai, China},
pages = {141--146},
publisher = {{IEEE} Computer Society},
year = {2010},
url = {https://doi.org/10.1109/ATS.2010.33},
doi = {10.1109/ATS.2010.33},
timestamp = {Fri, 24 Mar 2023 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/ats/KavousianosCKT10.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/ats/KimA10,
author = {Hyunjin Kim and
Jacob A. Abraham},
title = {A Low Cost Built-In Self-Test Circuit for High-Speed Source Synchronous
Memory Interfaces},
booktitle = {Proceedings of the 19th {IEEE} Asian Test Symposium, {ATS} 2010, 1-4
December 2010, Shanghai, China},
pages = {123--128},
publisher = {{IEEE} Computer Society},
year = {2010},
url = {https://doi.org/10.1109/ATS.2010.30},
doi = {10.1109/ATS.2010.30},
timestamp = {Fri, 24 Mar 2023 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/ats/KimA10.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/ats/KochteZBIWHCP10,
author = {Michael A. Kochte and
Christian G. Zoellin and
Rafal Baranowski and
Michael E. Imhof and
Hans{-}Joachim Wunderlich and
Nadereh Hatami and
Stefano Di Carlo and
Paolo Prinetto},
title = {Efficient Simulation of Structural Faults for the Reliability Evaluation
at System-Level},
booktitle = {Proceedings of the 19th {IEEE} Asian Test Symposium, {ATS} 2010, 1-4
December 2010, Shanghai, China},
pages = {3--8},
publisher = {{IEEE} Computer Society},
year = {2010},
url = {https://doi.org/10.1109/ATS.2010.10},
doi = {10.1109/ATS.2010.10},
timestamp = {Fri, 24 Mar 2023 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/ats/KochteZBIWHCP10.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/ats/KoleRDB10,
author = {Dipak Kumar Kole and
Hafizur Rahaman and
Debesh K. Das and
Bhargab B. Bhattacharya},
title = {Derivation of Optimal Test Set for Detection of Multiple Missing-Gate
Faults in Reversible Circuits},
booktitle = {Proceedings of the 19th {IEEE} Asian Test Symposium, {ATS} 2010, 1-4
December 2010, Shanghai, China},
pages = {33--38},
publisher = {{IEEE} Computer Society},
year = {2010},
url = {https://doi.org/10.1109/ATS.2010.15},
doi = {10.1109/ATS.2010.15},
timestamp = {Fri, 24 Mar 2023 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/ats/KoleRDB10.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/ats/KongtimR10,
author = {Piyanart Kongtim and
Taweesak Reungpeerakul},
title = {Parallel {LFSR} Reseeding with Selection Register for Mixed-Mode {BIST}},
booktitle = {Proceedings of the 19th {IEEE} Asian Test Symposium, {ATS} 2010, 1-4
December 2010, Shanghai, China},
pages = {153--158},
publisher = {{IEEE} Computer Society},
year = {2010},
url = {https://doi.org/10.1109/ATS.2010.35},
doi = {10.1109/ATS.2010.35},
timestamp = {Fri, 24 Mar 2023 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/ats/KongtimR10.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/ats/KrishnamoorthyHL10,
author = {Saparya Krishnamoorthy and
Michael S. Hsiao and
Loganathan Lingappan},
title = {Tackling the Path Explosion Problem in Symbolic Execution-Driven Test
Generation for Programs},
booktitle = {Proceedings of the 19th {IEEE} Asian Test Symposium, {ATS} 2010, 1-4
December 2010, Shanghai, China},
pages = {59--64},
publisher = {{IEEE} Computer Society},
year = {2010},
url = {https://doi.org/10.1109/ATS.2010.19},
doi = {10.1109/ATS.2010.19},
timestamp = {Fri, 24 Mar 2023 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/ats/KrishnamoorthyHL10.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/ats/KumarKC10,
author = {S. Krishna Kumar and
S. Kaundinya and
Santanu Chattopadhyay},
title = {Particle Swarm Optimization Based Scheme for Low Power March Sequence
Generation for Memory Testing},
booktitle = {Proceedings of the 19th {IEEE} Asian Test Symposium, {ATS} 2010, 1-4
December 2010, Shanghai, China},
pages = {401--406},
publisher = {{IEEE} Computer Society},
year = {2010},
url = {https://doi.org/10.1109/ATS.2010.75},
doi = {10.1109/ATS.2010.75},
timestamp = {Fri, 24 Mar 2023 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/ats/KumarKC10.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/ats/LiH10,
author = {Min Li and
Michael S. Hsiao},
title = {FSimGP2: An Efficient Fault Simulator with {GPGPU}},
booktitle = {Proceedings of the 19th {IEEE} Asian Test Symposium, {ATS} 2010, 1-4
December 2010, Shanghai, China},
pages = {15--20},
publisher = {{IEEE} Computer Society},
year = {2010},
url = {https://doi.org/10.1109/ATS.2010.12},
doi = {10.1109/ATS.2010.12},
timestamp = {Fri, 24 Mar 2023 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/ats/LiH10.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/ats/LiangWH10,
author = {Chun{-}Yong Liang and
Meng{-}Fan Wu and
Jiun{-}Lang Huang},
title = {Power Supply Noise Reduction in Broadcast-Based Compression Environment
for At-speed Scan Testing},
booktitle = {Proceedings of the 19th {IEEE} Asian Test Symposium, {ATS} 2010, 1-4
December 2010, Shanghai, China},
pages = {361--366},
publisher = {{IEEE} Computer Society},
year = {2010},
url = {https://doi.org/10.1109/ATS.2010.68},
doi = {10.1109/ATS.2010.68},
timestamp = {Fri, 24 Mar 2023 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/ats/LiangWH10.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/ats/LienL10,
author = {Wei{-}Cheng Lien and
Kuen{-}Jong Lee},
title = {A Complete Logic {BIST} Technology with No Storage Requirement},
booktitle = {Proceedings of the 19th {IEEE} Asian Test Symposium, {ATS} 2010, 1-4
December 2010, Shanghai, China},
pages = {129--134},
publisher = {{IEEE} Computer Society},
year = {2010},
url = {https://doi.org/10.1109/ATS.2010.31},
doi = {10.1109/ATS.2010.31},
timestamp = {Fri, 24 Mar 2023 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/ats/LienL10.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/ats/LinR10,
author = {Xijiang Lin and
Janusz Rajski},
title = {Adaptive Low Shift Power Test Pattern Generator for Logic {BIST}},
booktitle = {Proceedings of the 19th {IEEE} Asian Test Symposium, {ATS} 2010, 1-4
December 2010, Shanghai, China},
pages = {355--360},
publisher = {{IEEE} Computer Society},
year = {2010},
url = {https://doi.org/10.1109/ATS.2010.67},
doi = {10.1109/ATS.2010.67},
timestamp = {Fri, 24 Mar 2023 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/ats/LinR10.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/ats/LiuM10,
author = {Pan Liu and
Huaikou Miao},
title = {A New Approach to Generating High Quality Test Cases},
booktitle = {Proceedings of the 19th {IEEE} Asian Test Symposium, {ATS} 2010, 1-4
December 2010, Shanghai, China},
pages = {71--76},
publisher = {{IEEE} Computer Society},
year = {2010},
url = {https://doi.org/10.1109/ATS.2010.21},
doi = {10.1109/ATS.2010.21},
timestamp = {Fri, 24 Mar 2023 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/ats/LiuM10.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/ats/LiuX10,
author = {Xiao Liu and
Qiang Xu},
title = {On Signal Tracing for Debugging Speedpath-Related Electrical Errors
in Post-Silicon Validation},
booktitle = {Proceedings of the 19th {IEEE} Asian Test Symposium, {ATS} 2010, 1-4
December 2010, Shanghai, China},
pages = {243--248},
publisher = {{IEEE} Computer Society},
year = {2010},
url = {https://doi.org/10.1109/ATS.2010.50},
doi = {10.1109/ATS.2010.50},
timestamp = {Fri, 24 Mar 2023 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/ats/LiuX10.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/ats/LouJSW10,
author = {Jungang Lou and
Jianhui Jiang and
Chunyan Shuai and
Ying Wu},
title = {A Study on Software Reliability Prediction Based on Transduction Inference},
booktitle = {Proceedings of the 19th {IEEE} Asian Test Symposium, {ATS} 2010, 1-4
December 2010, Shanghai, China},
pages = {77--80},
publisher = {{IEEE} Computer Society},
year = {2010},
url = {https://doi.org/10.1109/ATS.2010.22},
doi = {10.1109/ATS.2010.22},
timestamp = {Fri, 24 Mar 2023 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/ats/LouJSW10.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/ats/MajeedAICL10,
author = {Mudassar Majeed and
Daniel Ahlstrom and
Urban Ingelsson and
Gunnar Carlsson and
Erik Larsson},
title = {Efficient Embedding of Deterministic Test Data},
booktitle = {Proceedings of the 19th {IEEE} Asian Test Symposium, {ATS} 2010, 1-4
December 2010, Shanghai, China},
pages = {159--162},
publisher = {{IEEE} Computer Society},
year = {2010},
url = {https://doi.org/10.1109/ATS.2010.36},
doi = {10.1109/ATS.2010.36},
timestamp = {Fri, 24 Mar 2023 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/ats/MajeedAICL10.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/ats/Mirza-AghatabarBG10,
author = {Mohammad Mirza{-}Aghatabar and
Melvin A. Breuer and
Sandeep K. Gupta},
title = {{HYPER:} {A} Heuristic for Yield/Area imProvEment Using Redundancy
in SoC},
booktitle = {Proceedings of the 19th {IEEE} Asian Test Symposium, {ATS} 2010, 1-4
December 2010, Shanghai, China},
pages = {249--254},
publisher = {{IEEE} Computer Society},
year = {2010},
url = {https://doi.org/10.1109/ATS.2010.51},
doi = {10.1109/ATS.2010.51},
timestamp = {Thu, 21 Sep 2023 01:00:00 +0200},
biburl = {https://dblp.org/rec/conf/ats/Mirza-AghatabarBG10.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/ats/MishraSSSCS10,
author = {Amit Mishra and
Nidhi Sinha and
Satdev and
Virendra Singh and
Sreejit Chakravarty and
Adit D. Singh},
title = {Modified Scan Flip-Flop for Low Power Testing},
booktitle = {Proceedings of the 19th {IEEE} Asian Test Symposium, {ATS} 2010, 1-4
December 2010, Shanghai, China},
pages = {367--370},
publisher = {{IEEE} Computer Society},
year = {2010},
url = {https://doi.org/10.1109/ATS.2010.69},
doi = {10.1109/ATS.2010.69},
timestamp = {Fri, 24 Mar 2023 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/ats/MishraSSSCS10.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/ats/MitraGRCB10,
author = {Debasis Mitra and
Sarmishtha Ghoshal and
Hafizur Rahaman and
Krishnendu Chakrabarty and
Bhargab B. Bhattacharya},
title = {Testing of Digital Microfluidic Biochips Using Improved Eulerization
Techniques and the Chinese Postman Problem},
booktitle = {Proceedings of the 19th {IEEE} Asian Test Symposium, {ATS} 2010, 1-4
December 2010, Shanghai, China},
pages = {111--116},
publisher = {{IEEE} Computer Society},
year = {2010},
url = {https://doi.org/10.1109/ATS.2010.28},
doi = {10.1109/ATS.2010.28},
timestamp = {Fri, 24 Mar 2023 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/ats/MitraGRCB10.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/ats/MohdNoorSYA10,
author = {NurQamarina MohdNoor and
Azilah Saparon and
Yusrina Yusof and
Mahmud Adnan},
title = {New Microcode's Generation Technique for Programmable Memory Built-In
Self Test},
booktitle = {Proceedings of the 19th {IEEE} Asian Test Symposium, {ATS} 2010, 1-4
December 2010, Shanghai, China},
pages = {407--412},
publisher = {{IEEE} Computer Society},
year = {2010},
url = {https://doi.org/10.1109/ATS.2010.76},
doi = {10.1109/ATS.2010.76},
timestamp = {Fri, 24 Mar 2023 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/ats/MohdNoorSYA10.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/ats/PaiL10,
author = {Chih{-}Yun Pai and
Katherine Shu{-}Min Li},
title = {Maximal Resilience for Reliability and Yield Enhancement in Interconnect
Structure},
booktitle = {Proceedings of the 19th {IEEE} Asian Test Symposium, {ATS} 2010, 1-4
December 2010, Shanghai, China},
pages = {261--266},
publisher = {{IEEE} Computer Society},
year = {2010},
url = {https://doi.org/10.1109/ATS.2010.53},
doi = {10.1109/ATS.2010.53},
timestamp = {Fri, 24 Mar 2023 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/ats/PaiL10.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/ats/ParkLCHABWO10,
author = {Joonsung Park and
Jae Wook Lee and
Jaeyong Chung and
Kihyuk Han and
Jacob A. Abraham and
Eonjo Byun and
Cheol{-}Jong Woo and
Sejang Oh},
title = {At-speed Test of High-Speed {DUT} Using Built-Off Test Interface},
booktitle = {Proceedings of the 19th {IEEE} Asian Test Symposium, {ATS} 2010, 1-4
December 2010, Shanghai, China},
pages = {269--274},
publisher = {{IEEE} Computer Society},
year = {2010},
url = {https://doi.org/10.1109/ATS.2010.54},
doi = {10.1109/ATS.2010.54},
timestamp = {Fri, 24 Mar 2023 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/ats/ParkLCHABWO10.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/ats/PengYCT10,
author = {Ke Peng and
Mahmut Yilmaz and
Krishnendu Chakrabarty and
Mohammad Tehranipoor},
title = {A Noise-Aware Hybrid Method for {SDD} Pattern Grading and Selection},
booktitle = {Proceedings of the 19th {IEEE} Asian Test Symposium, {ATS} 2010, 1-4
December 2010, Shanghai, China},
pages = {331--336},
publisher = {{IEEE} Computer Society},
year = {2010},
url = {https://doi.org/10.1109/ATS.2010.63},
doi = {10.1109/ATS.2010.63},
timestamp = {Fri, 24 Mar 2023 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/ats/PengYCT10.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/ats/PomeranzR10,
author = {Irith Pomeranz and
Sudhakar M. Reddy},
title = {On Bias in Transition Coverage of Test Sets for Path Delay Faults},
booktitle = {Proceedings of the 19th {IEEE} Asian Test Symposium, {ATS} 2010, 1-4
December 2010, Shanghai, China},
pages = {349--352},
publisher = {{IEEE} Computer Society},
year = {2010},
url = {https://doi.org/10.1109/ATS.2010.66},
doi = {10.1109/ATS.2010.66},
timestamp = {Fri, 24 Mar 2023 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/ats/PomeranzR10.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/ats/QianS10,
author = {Xi Qian and
Adit D. Singh},
title = {Distinguishing Resistive Small Delay Defects from Random Parameter
Variations},
booktitle = {Proceedings of the 19th {IEEE} Asian Test Symposium, {ATS} 2010, 1-4
December 2010, Shanghai, China},
pages = {325--330},
publisher = {{IEEE} Computer Society},
year = {2010},
url = {https://doi.org/10.1109/ATS.2010.62},
doi = {10.1109/ATS.2010.62},
timestamp = {Fri, 24 Mar 2023 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/ats/QianS10.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/ats/RabenaltRG10,
author = {Thomas Rabenalt and
Michael Richter and
Michael G{\"{o}}ssel},
title = {High Performance Compaction for Test Responses with Many Unknowns},
booktitle = {Proceedings of the 19th {IEEE} Asian Test Symposium, {ATS} 2010, 1-4
December 2010, Shanghai, China},
pages = {179--184},
publisher = {{IEEE} Computer Society},
year = {2010},
url = {https://doi.org/10.1109/ATS.2010.40},
doi = {10.1109/ATS.2010.40},
timestamp = {Fri, 24 Mar 2023 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/ats/RabenaltRG10.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/ats/RahagudeCH10,
author = {Nikhil P. Rahagude and
Maheshwar Chandrasekar and
Michael S. Hsiao},
title = {{DFT} + {DFD:} An Integrated Method for Design for Testability and
Diagnosability},
booktitle = {Proceedings of the 19th {IEEE} Asian Test Symposium, {ATS} 2010, 1-4
December 2010, Shanghai, China},
pages = {218--223},
publisher = {{IEEE} Computer Society},
year = {2010},
url = {https://doi.org/10.1109/ATS.2010.46},
doi = {10.1109/ATS.2010.46},
timestamp = {Fri, 24 Mar 2023 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/ats/RahagudeCH10.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/ats/RechBGPVD10,
author = {Paolo Rech and
Alberto Bosio and
Patrick Girard and
Serge Pravossoudovitch and
Arnaud Virazel and
Luigi Dilillo},
title = {A Memory Fault Simulator for Radiation-Induced Effects in SRAMs},
booktitle = {Proceedings of the 19th {IEEE} Asian Test Symposium, {ATS} 2010, 1-4
December 2010, Shanghai, China},
pages = {100--105},
publisher = {{IEEE} Computer Society},
year = {2010},
url = {https://doi.org/10.1109/ATS.2010.26},
doi = {10.1109/ATS.2010.26},
timestamp = {Fri, 24 Mar 2023 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/ats/RechBGPVD10.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/ats/SaeedS10,
author = {Samah Mohamed Saeed and
Ozgur Sinanoglu},
title = {XOR-Based Response Compactor Adaptive to X-Density Variation},
booktitle = {Proceedings of the 19th {IEEE} Asian Test Symposium, {ATS} 2010, 1-4
December 2010, Shanghai, China},
pages = {212--217},
publisher = {{IEEE} Computer Society},
year = {2010},
url = {https://doi.org/10.1109/ATS.2010.45},
doi = {10.1109/ATS.2010.45},
timestamp = {Fri, 24 Mar 2023 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/ats/SaeedS10.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/ats/SenDC10,
author = {Shreyas Sen and
Shyam Kumar Devarakond and
Abhijit Chatterjee},
title = {Rapid Radio Frequency Amplitude and Phase Distortion Measurement Using
Amplitude Modulated Stimulus},
booktitle = {Proceedings of the 19th {IEEE} Asian Test Symposium, {ATS} 2010, 1-4
December 2010, Shanghai, China},
pages = {277--282},
publisher = {{IEEE} Computer Society},
year = {2010},
url = {https://doi.org/10.1109/ATS.2010.84},
doi = {10.1109/ATS.2010.84},
timestamp = {Fri, 24 Mar 2023 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/ats/SenDC10.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/ats/ShengK10,
author = {Xiaoqin Sheng and
Hans G. Kerkhoff},
title = {The Test Ability of an Adaptive Pulse Wave for {ADC} Testing},
booktitle = {Proceedings of the 19th {IEEE} Asian Test Symposium, {ATS} 2010, 1-4
December 2010, Shanghai, China},
pages = {289--294},
publisher = {{IEEE} Computer Society},
year = {2010},
url = {https://doi.org/10.1109/ATS.2010.56},
doi = {10.1109/ATS.2010.56},
timestamp = {Fri, 24 Mar 2023 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/ats/ShengK10.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/ats/TangCGR10,
author = {Xun Tang and
Wu{-}Tung Cheng and
Ruifeng Guo and
Sudhakar M. Reddy},
title = {Diagnosis of Multiple Physical Defects Using Logic Fault Models},
booktitle = {Proceedings of the 19th {IEEE} Asian Test Symposium, {ATS} 2010, 1-4
December 2010, Shanghai, China},
pages = {94--99},
publisher = {{IEEE} Computer Society},
year = {2010},
url = {https://doi.org/10.1109/ATS.2010.25},
doi = {10.1109/ATS.2010.25},
timestamp = {Fri, 24 Mar 2023 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/ats/TangCGR10.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/ats/TaouilHBM10,
author = {Mottaqiallah Taouil and
Said Hamdioui and
Kees Beenakker and
Erik Jan Marinissen},
title = {Test Cost Analysis for 3D Die-to-Wafer Stacking},
booktitle = {Proceedings of the 19th {IEEE} Asian Test Symposium, {ATS} 2010, 1-4
December 2010, Shanghai, China},
pages = {435--441},
publisher = {{IEEE} Computer Society},
year = {2010},
url = {https://doi.org/10.1109/ATS.2010.80},
doi = {10.1109/ATS.2010.80},
timestamp = {Mon, 05 Feb 2024 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/ats/TaouilHBM10.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/ats/XingF10,
author = {Yizi Xing and
Liquan Fang},
title = {Design-for-Test of Digitally-Assisted Analog IPs for Automotive SoCs},
booktitle = {Proceedings of the 19th {IEEE} Asian Test Symposium, {ATS} 2010, 1-4
December 2010, Shanghai, China},
pages = {185--191},
publisher = {{IEEE} Computer Society},
year = {2010},
url = {https://doi.org/10.1109/ATS.2010.41},
doi = {10.1109/ATS.2010.41},
timestamp = {Fri, 24 Mar 2023 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/ats/XingF10.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/ats/XuX10,
author = {Shiyi Xu and
Peng Xu},
title = {A Quasi-best Random Testing},
booktitle = {Proceedings of the 19th {IEEE} Asian Test Symposium, {ATS} 2010, 1-4
December 2010, Shanghai, China},
pages = {21--26},
publisher = {{IEEE} Computer Society},
year = {2010},
url = {https://doi.org/10.1109/ATS.2010.13},
doi = {10.1109/ATS.2010.13},
timestamp = {Fri, 24 Mar 2023 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/ats/XuX10.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/ats/XuX10a,
author = {Peng Xu and
Shiyi Xu},
title = {A Reliability Model for Object-Oriented Software},
booktitle = {Proceedings of the 19th {IEEE} Asian Test Symposium, {ATS} 2010, 1-4
December 2010, Shanghai, China},
pages = {65--70},
publisher = {{IEEE} Computer Society},
year = {2010},
url = {https://doi.org/10.1109/ATS.2010.20},
doi = {10.1109/ATS.2010.20},
timestamp = {Fri, 24 Mar 2023 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/ats/XuX10a.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/ats/YeZHL10,
author = {Jing Ye and
Xiaolin Zhang and
Yu Hu and
Xiaowei Li},
title = {Substantial Fault Pair At-a-Time {(SFPAT):} An Automatic Diagnostic
Pattern Generation Method},
booktitle = {Proceedings of the 19th {IEEE} Asian Test Symposium, {ATS} 2010, 1-4
December 2010, Shanghai, China},
pages = {192--197},
publisher = {{IEEE} Computer Society},
year = {2010},
url = {https://doi.org/10.1109/ATS.2010.42},
doi = {10.1109/ATS.2010.42},
timestamp = {Mon, 22 May 2023 01:00:00 +0200},
biburl = {https://dblp.org/rec/conf/ats/YeZHL10.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/ats/YehW10,
author = {Tung{-}Hua Yeh and
Sying{-}Jyan Wang},
title = {Thermal Safe High Level Test Synthesis for Hierarchical Testability},
booktitle = {Proceedings of the 19th {IEEE} Asian Test Symposium, {ATS} 2010, 1-4
December 2010, Shanghai, China},
pages = {337--342},
publisher = {{IEEE} Computer Society},
year = {2010},
url = {https://doi.org/10.1109/ATS.2010.64},
doi = {10.1109/ATS.2010.64},
timestamp = {Fri, 24 Mar 2023 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/ats/YehW10.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/ats/YokoyamaTS10,
author = {Hiroshi Yokoyama and
Hideo Tamamoto and
Kewal K. Saluja},
title = {Controlling Peak Power Consumption for Scan Based Multiple Weighted
Random {BIST}},
booktitle = {Proceedings of the 19th {IEEE} Asian Test Symposium, {ATS} 2010, 1-4
December 2010, Shanghai, China},
pages = {147--152},
publisher = {{IEEE} Computer Society},
year = {2010},
url = {https://doi.org/10.1109/ATS.2010.34},
doi = {10.1109/ATS.2010.34},
timestamp = {Fri, 24 Mar 2023 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/ats/YokoyamaTS10.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/ats/YonedaITF10,
author = {Tomokazu Yoneda and
Michiko Inoue and
Akira Taketani and
Hideo Fujiwara},
title = {Seed Ordering and Selection for High Quality Delay Test},
booktitle = {Proceedings of the 19th {IEEE} Asian Test Symposium, {ATS} 2010, 1-4
December 2010, Shanghai, China},
pages = {313--318},
publisher = {{IEEE} Computer Society},
year = {2010},
url = {https://doi.org/10.1109/ATS.2010.60},
doi = {10.1109/ATS.2010.60},
timestamp = {Fri, 24 Mar 2023 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/ats/YonedaITF10.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/ats/YouHIKF10,
author = {Zhiqiang You and
Jiedi Huang and
Michiko Inoue and
Jishun Kuang and
Hideo Fujiwara},
title = {Capture in Turn Scan for Reduction of Test Data Volume, Test Application
Time and Test Power},
booktitle = {Proceedings of the 19th {IEEE} Asian Test Symposium, {ATS} 2010, 1-4
December 2010, Shanghai, China},
pages = {371--374},
publisher = {{IEEE} Computer Society},
year = {2010},
url = {https://doi.org/10.1109/ATS.2010.70},
doi = {10.1109/ATS.2010.70},
timestamp = {Fri, 24 Mar 2023 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/ats/YouHIKF10.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/ats/YouHKCW10,
author = {Jhih{-}Wei You and
Shi{-}Yu Huang and
Ding{-}Ming Kwai and
Yung{-}Fa Chou and
Cheng{-}Wen Wu},
title = {Performance Characterization of {TSV} in 3D {IC} via Sensitivity Analysis},
booktitle = {Proceedings of the 19th {IEEE} Asian Test Symposium, {ATS} 2010, 1-4
December 2010, Shanghai, China},
pages = {389--394},
publisher = {{IEEE} Computer Society},
year = {2010},
url = {https://doi.org/10.1109/ATS.2010.73},
doi = {10.1109/ATS.2010.73},
timestamp = {Sat, 30 Sep 2023 01:00:00 +0200},
biburl = {https://dblp.org/rec/conf/ats/YouHKCW10.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/ats/YuD10,
author = {Jianjun Yu and
Fa Foster Dai},
title = {On-chip Jitter Measurement Using Vernier Ring Time-to-Digital Converter},
booktitle = {Proceedings of the 19th {IEEE} Asian Test Symposium, {ATS} 2010, 1-4
December 2010, Shanghai, China},
pages = {167--170},
publisher = {{IEEE} Computer Society},
year = {2010},
url = {https://doi.org/10.1109/ATS.2010.38},
doi = {10.1109/ATS.2010.38},
timestamp = {Fri, 24 Mar 2023 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/ats/YuD10.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/ats/ZadeganICL10,
author = {Farrokh Ghani Zadegan and
Urban Ingelsson and
Gunnar Carlsson and
Erik Larsson},
title = {Test Time Analysis for {IEEE} {P1687}},
booktitle = {Proceedings of the 19th {IEEE} Asian Test Symposium, {ATS} 2010, 1-4
December 2010, Shanghai, China},
pages = {455--460},
publisher = {{IEEE} Computer Society},
year = {2010},
url = {https://doi.org/10.1109/ATS.2010.83},
doi = {10.1109/ATS.2010.83},
timestamp = {Fri, 24 Mar 2023 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/ats/ZadeganICL10.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/ats/ZhangLL10,
author = {Ying Zhang and
Huawei Li and
Xiaowei Li},
title = {Software-Based Self-Testing of Processors Using Expanded Instructions},
booktitle = {Proceedings of the 19th {IEEE} Asian Test Symposium, {ATS} 2010, 1-4
December 2010, Shanghai, China},
pages = {415--420},
publisher = {{IEEE} Computer Society},
year = {2010},
url = {https://doi.org/10.1109/ATS.2010.77},
doi = {10.1109/ATS.2010.77},
timestamp = {Thu, 11 May 2023 01:00:00 +0200},
biburl = {https://dblp.org/rec/conf/ats/ZhangLL10.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/ats/ZhangWGC10,
author = {Zhaobo Zhang and
Zhanglei Wang and
Xinli Gu and
Krishnendu Chakrabarty},
title = {Optimization and Selection of Diagnosis-Oriented Fault-Insertion Points
for System Test},
booktitle = {Proceedings of the 19th {IEEE} Asian Test Symposium, {ATS} 2010, 1-4
December 2010, Shanghai, China},
pages = {429--432},
publisher = {{IEEE} Computer Society},
year = {2010},
url = {https://doi.org/10.1109/ATS.2010.79},
doi = {10.1109/ATS.2010.79},
timestamp = {Fri, 24 Mar 2023 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/ats/ZhangWGC10.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/ats/ZhaoC10,
author = {Yang Zhao and
Krishnendu Chakrabarty},
title = {Testing of Low-Cost Digital Microfluidic Biochips with Non-regular
Array Layouts},
booktitle = {Proceedings of the 19th {IEEE} Asian Test Symposium, {ATS} 2010, 1-4
December 2010, Shanghai, China},
pages = {27--32},
publisher = {{IEEE} Computer Society},
year = {2010},
url = {https://doi.org/10.1109/ATS.2010.14},
doi = {10.1109/ATS.2010.14},
timestamp = {Fri, 24 Mar 2023 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/ats/ZhaoC10.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/ats/ZhaoMTC10,
author = {Wei Zhao and
Junxia Ma and
Mohammad Tehranipoor and
Sreejit Chakravarty},
title = {Power-Safe Application of Transition Delay Fault Patterns Considering
Current Limit during Wafer Test},
booktitle = {Proceedings of the 19th {IEEE} Asian Test Symposium, {ATS} 2010, 1-4
December 2010, Shanghai, China},
pages = {301--306},
publisher = {{IEEE} Computer Society},
year = {2010},
url = {https://doi.org/10.1109/ATS.2010.58},
doi = {10.1109/ATS.2010.58},
timestamp = {Fri, 24 Mar 2023 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/ats/ZhaoMTC10.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/ats/ZhengWYJG10,
author = {Yan Zheng and
Hong Wang and
Shiyuan Yang and
Chen Jiang and
Feiyu Gao},
title = {Accelerating Strategy for Functional Test of NoC Communication Fabric},
booktitle = {Proceedings of the 19th {IEEE} Asian Test Symposium, {ATS} 2010, 1-4
December 2010, Shanghai, China},
pages = {224--227},
publisher = {{IEEE} Computer Society},
year = {2010},
url = {https://doi.org/10.1109/ATS.2010.47},
doi = {10.1109/ATS.2010.47},
timestamp = {Fri, 24 Mar 2023 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/ats/ZhengWYJG10.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/ats/ZhuLL10,
author = {Dan Zhu and
Tun Li and
Sikun Li},
title = {On Soft Error Immunity of Sequential Circuits},
booktitle = {Proceedings of the 19th {IEEE} Asian Test Symposium, {ATS} 2010, 1-4
December 2010, Shanghai, China},
pages = {106--110},
publisher = {{IEEE} Computer Society},
year = {2010},
url = {https://doi.org/10.1109/ATS.2010.27},
doi = {10.1109/ATS.2010.27},
timestamp = {Fri, 24 Mar 2023 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/ats/ZhuLL10.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@proceedings{DBLP:conf/ats/2010,
title = {Proceedings of the 19th {IEEE} Asian Test Symposium, {ATS} 2010, 1-4
December 2010, Shanghai, China},
publisher = {{IEEE} Computer Society},
year = {2010},
url = {https://ieeexplore.ieee.org/xpl/conhome/5689827/proceeding},
isbn = {978-0-7695-4248-5},
timestamp = {Wed, 16 Oct 2019 01:00:00 +0200},
biburl = {https://dblp.org/rec/conf/ats/2010.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/ats/AdolfssonSML09,
author = {Dan Adolfsson and
Joanna Siew and
Erik Jan Marinissen and
Erik Larsson},
title = {On Scan Chain Diagnosis for Intermittent Faults},
booktitle = {Proceedings of the Eighteentgh Asian Test Symposium, {ATS} 2009, 23-26
November 2009, Taichung, Taiwan},
pages = {47--54},
publisher = {{IEEE} Computer Society},
year = {2009},
url = {https://doi.org/10.1109/ATS.2009.74},
doi = {10.1109/ATS.2009.74},
timestamp = {Mon, 05 Feb 2024 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/ats/AdolfssonSML09.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/ats/Al-ArsH09,
author = {Zaid Al{-}Ars and
Said Hamdioui},
title = {Fault Diagnosis Using Test Primitives in Random Access Memories},
booktitle = {Proceedings of the Eighteentgh Asian Test Symposium, {ATS} 2009, 23-26
November 2009, Taichung, Taiwan},
pages = {403--408},
publisher = {{IEEE} Computer Society},
year = {2009},
url = {https://doi.org/10.1109/ATS.2009.79},
doi = {10.1109/ATS.2009.79},
timestamp = {Fri, 24 Mar 2023 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/ats/Al-ArsH09.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/ats/AsianFVRH09,
author = {Manuel J. Barragan Asian and
Rafaella Fiorelli and
Diego V{\'{a}}zquez and
Adoraci{\'{o}}n Rueda and
Jos{\'{e}} Luis Huertas},
title = {A {BIST} Solution for the Functional Characterization of {RF} Systems
Based on Envelope Response Analysis},
booktitle = {Proceedings of the Eighteentgh Asian Test Symposium, {ATS} 2009, 23-26
November 2009, Taichung, Taiwan},
pages = {255--260},
publisher = {{IEEE} Computer Society},
year = {2009},
url = {https://doi.org/10.1109/ATS.2009.14},
doi = {10.1109/ATS.2009.14},
timestamp = {Fri, 24 Mar 2023 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/ats/AsianFVRH09.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/ats/BenabboudBDGPVR09,
author = {Youssef Benabboud and
Alberto Bosio and
Luigi Dilillo and
Patrick Girard and
Serge Pravossoudovitch and
Arnaud Virazel and
Olivia Riewer},
title = {Delay Fault Diagnosis in Sequential Circuits},
booktitle = {Proceedings of the Eighteentgh Asian Test Symposium, {ATS} 2009, 23-26
November 2009, Taichung, Taiwan},
pages = {355--360},
publisher = {{IEEE} Computer Society},
year = {2009},
url = {https://doi.org/10.1109/ATS.2009.16},
doi = {10.1109/ATS.2009.16},
timestamp = {Fri, 24 Mar 2023 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/ats/BenabboudBDGPVR09.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/ats/CarloPS09,
author = {Stefano Di Carlo and
Paolo Prinetto and
Alberto Scionti},
title = {A FPGA-Based Reconfigurable Software Architecture for Highly Dependable
Systems},
booktitle = {Proceedings of the Eighteentgh Asian Test Symposium, {ATS} 2009, 23-26
November 2009, Taichung, Taiwan},
pages = {125--130},
publisher = {{IEEE} Computer Society},
year = {2009},
url = {https://doi.org/10.1109/ATS.2009.53},
doi = {10.1109/ATS.2009.53},
timestamp = {Fri, 24 Mar 2023 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/ats/CarloPS09.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/ats/ChakrabortyC09,
author = {Rupsa Chakraborty and
Dipanwita Roy Chowdhury},
title = {A Novel Seed Selection Algorithm for Test Time Reduction in {BIST}},
booktitle = {Proceedings of the Eighteentgh Asian Test Symposium, {ATS} 2009, 23-26
November 2009, Taichung, Taiwan},
pages = {15--20},
publisher = {{IEEE} Computer Society},
year = {2009},
url = {https://doi.org/10.1109/ATS.2009.10},
doi = {10.1109/ATS.2009.10},
timestamp = {Fri, 24 Mar 2023 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/ats/ChakrabortyC09.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/ats/ChakravadhanulaCKGU09,
author = {Krishna Chakravadhanula and
Vivek Chickermane and
Brion L. Keller and
Patrick R. Gallagher Jr. and
Anis Uzzaman},
title = {Why is Conventional {ATPG} Not Sufficient for Advanced Low Power Designs?},
booktitle = {Proceedings of the Eighteentgh Asian Test Symposium, {ATS} 2009, 23-26
November 2009, Taichung, Taiwan},
pages = {295--300},
publisher = {{IEEE} Computer Society},
year = {2009},
url = {https://doi.org/10.1109/ATS.2009.80},
doi = {10.1109/ATS.2009.80},
timestamp = {Fri, 24 Mar 2023 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/ats/ChakravadhanulaCKGU09.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/ats/ChangHLS09,
author = {Chin{-}Yao Chang and
Chih{-}Yuan Hsiao and
Kuen{-}Jong Lee and
Alan P. Su},
title = {Transaction Level Modeling and Design Space Exploration for {SOC}
Test Architectures},
booktitle = {Proceedings of the Eighteentgh Asian Test Symposium, {ATS} 2009, 23-26
November 2009, Taichung, Taiwan},
pages = {200--205},
publisher = {{IEEE} Computer Society},
year = {2009},
url = {https://doi.org/10.1109/ATS.2009.33},
doi = {10.1109/ATS.2009.33},
timestamp = {Fri, 24 Mar 2023 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/ats/ChangHLS09.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/ats/ChangLC09,
author = {Hsiu{-}Ming Chang and
Kuan{-}Yu Lin and
Kwang{-}Ting Cheng},
title = {Calibration as a Functional Test: An {ADC} Case Study},
booktitle = {Proceedings of the Eighteentgh Asian Test Symposium, {ATS} 2009, 23-26
November 2009, Taichung, Taiwan},
pages = {85--86},
publisher = {{IEEE} Computer Society},
year = {2009},
url = {https://doi.org/10.1109/ATS.2009.25},
doi = {10.1109/ATS.2009.25},
timestamp = {Fri, 24 Mar 2023 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/ats/ChangLC09.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/ats/ChaoC09,
author = {An{-}Sheng Chao and
Soon{-}Jyh Chang},
title = {A Jitter Characterizing {BIST} with Pulse-Amplifying Technique},
booktitle = {Proceedings of the Eighteentgh Asian Test Symposium, {ATS} 2009, 23-26
November 2009, Taichung, Taiwan},
pages = {379--384},
publisher = {{IEEE} Computer Society},
year = {2009},
url = {https://doi.org/10.1109/ATS.2009.23},
doi = {10.1109/ATS.2009.23},
timestamp = {Fri, 24 Mar 2023 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/ats/ChaoC09.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/ats/ChenCYL09,
author = {Sung{-}Yu Chen and
Ying{-}Yen Chen and
Chun{-}Yu Yang and
Jing{-}Jia Liou},
title = {Multiple-Core under Test Architecture for {HOY} Wireless Testing Platform},
booktitle = {Proceedings of the Eighteentgh Asian Test Symposium, {ATS} 2009, 23-26
November 2009, Taichung, Taiwan},
pages = {275--280},
publisher = {{IEEE} Computer Society},
year = {2009},
url = {https://doi.org/10.1109/ATS.2009.43},
doi = {10.1109/ATS.2009.43},
timestamp = {Fri, 24 Mar 2023 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/ats/ChenCYL09.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/ats/ChenHTN09,
author = {Shomo Chen and
Ning Huang and
Ting{-}Pu Tai and
Actel Niu},
title = {Customized Algorithms for High Performance Memory Test in Advanced
Technology Node},
booktitle = {Proceedings of the Eighteentgh Asian Test Symposium, {ATS} 2009, 23-26
November 2009, Taichung, Taiwan},
pages = {87--89},
publisher = {{IEEE} Computer Society},
year = {2009},
url = {https://doi.org/10.1109/ATS.2009.41},
doi = {10.1109/ATS.2009.41},
timestamp = {Fri, 24 Mar 2023 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/ats/ChenHTN09.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/ats/ChenL09,
author = {Ying{-}Yen Chen and
Jing{-}Jia Liou},
title = {A Non-Intrusive and Accurate Inspection Method for Segment Delay Variabilities},
booktitle = {Proceedings of the Eighteentgh Asian Test Symposium, {ATS} 2009, 23-26
November 2009, Taichung, Taiwan},
pages = {343--348},
publisher = {{IEEE} Computer Society},
year = {2009},
url = {https://doi.org/10.1109/ATS.2009.32},
doi = {10.1109/ATS.2009.32},
timestamp = {Fri, 24 Mar 2023 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/ats/ChenL09.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/ats/ChenLC09,
author = {Po{-}Juei Chen and
James Chien{-}Mo Li and
Hsing Jasmine Chao},
title = {Bridging Fault Diagnosis to Identify the Layer of Systematic Defects},
booktitle = {Proceedings of the Eighteentgh Asian Test Symposium, {ATS} 2009, 23-26
November 2009, Taichung, Taiwan},
pages = {349--354},
publisher = {{IEEE} Computer Society},
year = {2009},
url = {https://doi.org/10.1109/ATS.2009.58},
doi = {10.1109/ATS.2009.58},
timestamp = {Fri, 24 Mar 2023 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/ats/ChenLC09.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/ats/ChenLWR09,
author = {Tsung{-}Tang Chen and
Wei{-}Lin Li and
Po{-}Han Wu and
Jiann{-}Chyi Rau},
title = {New Scheme of Reducing Shift and Capture Power Using the X-Filling
Methodology},
booktitle = {Proceedings of the Eighteentgh Asian Test Symposium, {ATS} 2009, 23-26
November 2009, Taichung, Taiwan},
pages = {105--110},
publisher = {{IEEE} Computer Society},
year = {2009},
url = {https://doi.org/10.1109/ATS.2009.48},
doi = {10.1109/ATS.2009.48},
timestamp = {Fri, 24 Mar 2023 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/ats/ChenLWR09.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/ats/ChenRRP09,
author = {Gang Chen and
Janusz Rajski and
Sudhakar M. Reddy and
Irith Pomeranz},
title = {N-distinguishing Tests for Enhanced Defect Diagnosis},
booktitle = {Proceedings of the Eighteentgh Asian Test Symposium, {ATS} 2009, 23-26
November 2009, Taichung, Taiwan},
pages = {183--186},
publisher = {{IEEE} Computer Society},
year = {2009},
url = {https://doi.org/10.1109/ATS.2009.47},
doi = {10.1109/ATS.2009.47},
timestamp = {Fri, 24 Mar 2023 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/ats/ChenRRP09.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/ats/ChenWK09,
author = {Po{-}Yuan Chen and
Cheng{-}Wen Wu and
Ding{-}Ming Kwai},
title = {On-Chip {TSV} Testing for 3D {IC} before Bonding Using Sense Amplification},
booktitle = {Proceedings of the Eighteentgh Asian Test Symposium, {ATS} 2009, 23-26
November 2009, Taichung, Taiwan},
pages = {450--455},
publisher = {{IEEE} Computer Society},
year = {2009},
url = {https://doi.org/10.1109/ATS.2009.42},
doi = {10.1109/ATS.2009.42},
timestamp = {Sat, 30 Sep 2023 01:00:00 +0200},
biburl = {https://dblp.org/rec/conf/ats/ChenWK09.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/ats/ChiLKW09,
author = {Chun{-}Chuan Chi and
Chih{-}Yen Lo and
Te{-}Wen Ko and
Cheng{-}Wen Wu},
title = {Test Integration for {SOC} Supporting Very Low-Cost Testers},
booktitle = {Proceedings of the Eighteentgh Asian Test Symposium, {ATS} 2009, 23-26
November 2009, Taichung, Taiwan},
pages = {287--292},
publisher = {{IEEE} Computer Society},
year = {2009},
url = {https://doi.org/10.1109/ATS.2009.51},
doi = {10.1109/ATS.2009.51},
timestamp = {Sat, 30 Sep 2023 01:00:00 +0200},
biburl = {https://dblp.org/rec/conf/ats/ChiLKW09.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/ats/ChungJCL09,
author = {Chen{-}I Chung and
Jyun{-}Sian Jhou and
Ching{-}Hwa Cheng and
Sih{-}Yan Li},
title = {Functional Built-In Delay Binning and Calibration Mechanism for On-Chip
at-Speed Self Test},
booktitle = {Proceedings of the Eighteentgh Asian Test Symposium, {ATS} 2009, 23-26
November 2009, Taichung, Taiwan},
pages = {163--168},
publisher = {{IEEE} Computer Society},
year = {2009},
url = {https://doi.org/10.1109/ATS.2009.72},
doi = {10.1109/ATS.2009.72},
timestamp = {Fri, 24 Mar 2023 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/ats/ChungJCL09.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/ats/CzutroPERB09,
author = {Alejandro Czutro and
Ilia Polian and
Piet Engelke and
Sudhakar M. Reddy and
Bernd Becker},
title = {Dynamic Compaction in SAT-Based {ATPG}},
booktitle = {Proceedings of the Eighteentgh Asian Test Symposium, {ATS} 2009, 23-26
November 2009, Taichung, Taiwan},
pages = {187--190},
publisher = {{IEEE} Computer Society},
year = {2009},
url = {https://doi.org/10.1109/ATS.2009.31},
doi = {10.1109/ATS.2009.31},
timestamp = {Fri, 24 Mar 2023 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/ats/CzutroPERB09.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/ats/DasS09,
author = {Sukanta Das and
Biplab K. Sikdar},
title = {{CA} Based Built-In Self-Test Structure for SoC},
booktitle = {Proceedings of the Eighteentgh Asian Test Symposium, {ATS} 2009, 23-26
November 2009, Taichung, Taiwan},
pages = {3--8},
publisher = {{IEEE} Computer Society},
year = {2009},
url = {https://doi.org/10.1109/ATS.2009.71},
doi = {10.1109/ATS.2009.71},
timestamp = {Fri, 24 Mar 2023 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/ats/DasS09.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/ats/DeepakRSS09,
author = {K. G. Deepak and
Robinson Reyna and
Virendra Singh and
Adit D. Singh},
title = {Leveraging Partially Enhanced Scan for Improved Observability in Delay
Fault Testing},
booktitle = {Proceedings of the Eighteentgh Asian Test Symposium, {ATS} 2009, 23-26
November 2009, Taichung, Taiwan},
pages = {237--240},
publisher = {{IEEE} Computer Society},
year = {2009},
url = {https://doi.org/10.1109/ATS.2009.78},
doi = {10.1109/ATS.2009.78},
timestamp = {Fri, 24 Mar 2023 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/ats/DeepakRSS09.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/ats/EggersglussTD09,
author = {Stephan Eggersgl{\"{u}}{\ss} and
Daniel Tille and
Rolf Drechsler},
title = {Speeding up SAT-Based {ATPG} Using Dynamic Clause Activation},
booktitle = {Proceedings of the Eighteentgh Asian Test Symposium, {ATS} 2009, 23-26
November 2009, Taichung, Taiwan},
pages = {177--182},
publisher = {{IEEE} Computer Society},
year = {2009},
url = {https://doi.org/10.1109/ATS.2009.26},
doi = {10.1109/ATS.2009.26},
timestamp = {Fri, 24 Mar 2023 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/ats/EggersglussTD09.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/ats/EnokimotoWYMSKAF09,
author = {Kazunari Enokimoto and
Xiaoqing Wen and
Yuta Yamato and
Kohei Miyase and
H. Sone and
Seiji Kajihara and
Masao Aso and
Hiroshi Furukawa},
title = {{CAT:} {A} Critical-Area-Targeted Test Set Modification Scheme for
Reducing Launch Switching Activity in At-Speed Scan Testing},
booktitle = {Proceedings of the Eighteentgh Asian Test Symposium, {ATS} 2009, 23-26
November 2009, Taichung, Taiwan},
pages = {99--104},
publisher = {{IEEE} Computer Society},
year = {2009},
url = {https://doi.org/10.1109/ATS.2009.22},
doi = {10.1109/ATS.2009.22},
timestamp = {Fri, 24 Mar 2023 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/ats/EnokimotoWYMSKAF09.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/ats/FangCP09,
author = {Hongxia Fang and
Krishnendu Chakrabarty and
Rubin A. Parekhji},
title = {Bit-Operation-Based Seed Augmentation for {LFSR} Reseeding with High
Defect Coverage},
booktitle = {Proceedings of the Eighteentgh Asian Test Symposium, {ATS} 2009, 23-26
November 2009, Taichung, Taiwan},
pages = {331--336},
publisher = {{IEEE} Computer Society},
year = {2009},
url = {https://doi.org/10.1109/ATS.2009.65},
doi = {10.1109/ATS.2009.65},
timestamp = {Fri, 24 Mar 2023 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/ats/FangCP09.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/ats/Fey09,
author = {G{\"{o}}rschwin Fey},
title = {Deterministic Algorithms for {ATPG} under Leakage Constraints},
booktitle = {Proceedings of the Eighteentgh Asian Test Symposium, {ATS} 2009, 23-26
November 2009, Taichung, Taiwan},
pages = {313--316},
publisher = {{IEEE} Computer Society},
year = {2009},
url = {https://doi.org/10.1109/ATS.2009.27},
doi = {10.1109/ATS.2009.27},
timestamp = {Fri, 24 Mar 2023 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/ats/Fey09.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/ats/GaoC09,
author = {Ming Gao and
Kwang{-}Ting Cheng},
title = {Low Overhead Time-Multiplexed Online Checking: {A} Case Study of An
{H.264} Decoder},
booktitle = {Proceedings of the Eighteentgh Asian Test Symposium, {ATS} 2009, 23-26
November 2009, Taichung, Taiwan},
pages = {119--124},
publisher = {{IEEE} Computer Society},
year = {2009},
url = {https://doi.org/10.1109/ATS.2009.24},
doi = {10.1109/ATS.2009.24},
timestamp = {Fri, 24 Mar 2023 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/ats/GaoC09.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/ats/GoorHGA09,
author = {Ad J. van de Goor and
Said Hamdioui and
Georgi Nedeltchev Gaydadjiev and
Zaid Al{-}Ars},
title = {New Algorithms for Address Decoder Delay Faults and Bit Line Imbalance
Faults},
booktitle = {Proceedings of the Eighteentgh Asian Test Symposium, {ATS} 2009, 23-26
November 2009, Taichung, Taiwan},
pages = {391--396},
publisher = {{IEEE} Computer Society},
year = {2009},
url = {https://doi.org/10.1109/ATS.2009.87},
doi = {10.1109/ATS.2009.87},
timestamp = {Fri, 24 Mar 2023 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/ats/GoorHGA09.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/ats/GoyalSC09,
author = {Abhilash Goyal and
Madhavan Swaminathan and
Abhijit Chatterjee},
title = {Self-Calibrating Embedded {RF} Down-Conversion Mixers},
booktitle = {Proceedings of the Eighteentgh Asian Test Symposium, {ATS} 2009, 23-26
November 2009, Taichung, Taiwan},
pages = {249--254},
publisher = {{IEEE} Computer Society},
year = {2009},
url = {https://doi.org/10.1109/ATS.2009.77},
doi = {10.1109/ATS.2009.77},
timestamp = {Fri, 24 Mar 2023 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/ats/GoyalSC09.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/ats/Hamdioui09,
author = {Said Hamdioui},
title = {Testing Embedded Memories in the Nano-Era: Will the Existing Approaches
Survive?},
booktitle = {Proceedings of the Eighteentgh Asian Test Symposium, {ATS} 2009, 23-26
November 2009, Taichung, Taiwan},
pages = {339},
publisher = {{IEEE} Computer Society},
year = {2009},
url = {https://doi.org/10.1109/ATS.2009.92},
doi = {10.1109/ATS.2009.92},
timestamp = {Fri, 24 Mar 2023 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/ats/Hamdioui09.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/ats/HsiaoB09,
author = {Michael S. Hsiao and
Mainak Banga},
title = {Kiss the Scan Goodbye: {A} Non-scan Architecture for High Coverage,
Low Test Data Volume and Low Test Application Time},
booktitle = {Proceedings of the Eighteentgh Asian Test Symposium, {ATS} 2009, 23-26
November 2009, Taichung, Taiwan},
pages = {225--230},
publisher = {{IEEE} Computer Society},
year = {2009},
url = {https://doi.org/10.1109/ATS.2009.17},
doi = {10.1109/ATS.2009.17},
timestamp = {Fri, 24 Mar 2023 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/ats/HsiaoB09.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/ats/HsuP09,
author = {Dragon Hsu and
Ron Press},
title = {Scan Compression Implementation in Industrial Design - Case Study},
booktitle = {Proceedings of the Eighteentgh Asian Test Symposium, {ATS} 2009, 23-26
November 2009, Taichung, Taiwan},
pages = {83--84},
publisher = {{IEEE} Computer Society},
year = {2009},
url = {https://doi.org/10.1109/ATS.2009.89},
doi = {10.1109/ATS.2009.89},
timestamp = {Fri, 24 Mar 2023 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/ats/HsuP09.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/ats/HuangCGTKC09,
author = {Yu Huang and
Wu{-}Tung Cheng and
Ruifeng Guo and
Ting{-}Pu Tai and
Feng{-}Ming Kuo and
Yuan{-}Shih Chen},
title = {Scan Chain Diagnosis by Adaptive Signal Profiling with Manufacturing
{ATPG} Patterns},
booktitle = {Proceedings of the Eighteentgh Asian Test Symposium, {ATS} 2009, 23-26
November 2009, Taichung, Taiwan},
pages = {35--40},
publisher = {{IEEE} Computer Society},
year = {2009},
url = {https://doi.org/10.1109/ATS.2009.36},
doi = {10.1109/ATS.2009.36},
timestamp = {Fri, 24 Mar 2023 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/ats/HuangCGTKC09.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/ats/HuangL09,
author = {Yu{-}Jen Huang and
Jin{-}Fu Li},
title = {Testability Exploration of 3-D RAMs and CAMs},
booktitle = {Proceedings of the Eighteentgh Asian Test Symposium, {ATS} 2009, 23-26
November 2009, Taichung, Taiwan},
pages = {397--402},
publisher = {{IEEE} Computer Society},
year = {2009},
url = {https://doi.org/10.1109/ATS.2009.59},
doi = {10.1109/ATS.2009.59},
timestamp = {Tue, 17 Oct 2023 01:00:00 +0200},
biburl = {https://dblp.org/rec/conf/ats/HuangL09.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/ats/HungHL09,
author = {Shao{-}Feng Hung and
Hao{-}Chiao Hong and
Sheng{-}Chuan Liang},
title = {A Low-Cost Output Response Analyzer for the Built-in-Self-Test S-?
Modulator Based on the Controlled Sine Wave Fitting Method},
booktitle = {Proceedings of the Eighteentgh Asian Test Symposium, {ATS} 2009, 23-26
November 2009, Taichung, Taiwan},
pages = {385--388},
publisher = {{IEEE} Computer Society},
year = {2009},
url = {https://doi.org/10.1109/ATS.2009.88},
doi = {10.1109/ATS.2009.88},
timestamp = {Fri, 24 Mar 2023 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/ats/HungHL09.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/ats/IchiharaSYI09,
author = {Hideyuki Ichihara and
Kenta Sutoh and
Yuki Yoshikawa and
Tomoo Inoue},
title = {A Practical Approach to Threshold Test Generation for Error Tolerant
Circuits},
booktitle = {Proceedings of the Eighteentgh Asian Test Symposium, {ATS} 2009, 23-26
November 2009, Taichung, Taiwan},
pages = {171--176},
publisher = {{IEEE} Computer Society},
year = {2009},
url = {https://doi.org/10.1109/ATS.2009.19},
doi = {10.1109/ATS.2009.19},
timestamp = {Fri, 24 Mar 2023 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/ats/IchiharaSYI09.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/ats/JinHZLLY09,
author = {Song Jin and
Yinhe Han and
Lei Zhang and
Huawei Li and
Xiaowei Li and
Guihai Yan},
title = {{M-IVC:} Using Multiple Input Vectors to Minimize Aging-Induced Delay},
booktitle = {Proceedings of the Eighteentgh Asian Test Symposium, {ATS} 2009, 23-26
November 2009, Taichung, Taiwan},
pages = {437--442},
publisher = {{IEEE} Computer Society},
year = {2009},
url = {https://doi.org/10.1109/ATS.2009.57},
doi = {10.1109/ATS.2009.57},
timestamp = {Tue, 23 May 2023 01:00:00 +0200},
biburl = {https://dblp.org/rec/conf/ats/JinHZLLY09.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/ats/KatohTZNI09,
author = {Kentaroh Katoh and
Toru Tanabe and
Haque Md Zahidul and
Kazuteru Namba and
Hideo Ito},
title = {A Delay Measurement Technique Using Signature Registers},
booktitle = {Proceedings of the Eighteentgh Asian Test Symposium, {ATS} 2009, 23-26
November 2009, Taichung, Taiwan},
pages = {157--162},
publisher = {{IEEE} Computer Society},
year = {2009},
url = {https://doi.org/10.1109/ATS.2009.54},
doi = {10.1109/ATS.2009.54},
timestamp = {Fri, 24 Mar 2023 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/ats/KatohTZNI09.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/ats/KellerMUB09,
author = {Brion L. Keller and
Dale Meehl and
Anis Uzzaman and
Richard Billings},
title = {A Partially-Exhaustive Gate Transition Fault Model},
booktitle = {Proceedings of the Eighteentgh Asian Test Symposium, {ATS} 2009, 23-26
November 2009, Taichung, Taiwan},
pages = {361--364},
publisher = {{IEEE} Computer Society},
year = {2009},
url = {https://doi.org/10.1109/ATS.2009.62},
doi = {10.1109/ATS.2009.62},
timestamp = {Fri, 24 Mar 2023 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/ats/KellerMUB09.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/ats/KifliCTW09,
author = {Augusli Kifli and
Y. W. Chen and
Yu{-}Wen Tsai and
Kun{-}Cheng Wu},
title = {A Practical {DFT} Approach for Complex Low Power Designs},
booktitle = {Proceedings of the Eighteentgh Asian Test Symposium, {ATS} 2009, 23-26
November 2009, Taichung, Taiwan},
pages = {90--91},
publisher = {{IEEE} Computer Society},
year = {2009},
url = {https://doi.org/10.1109/ATS.2009.61},
doi = {10.1109/ATS.2009.61},
timestamp = {Fri, 24 Mar 2023 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/ats/KifliCTW09.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/ats/KimJWW09,
author = {Hyoung{-}Kook Kim and
Wen{-}Ben Jone and
Laung{-}Terng Wang and
Shianling Wu},
title = {Analysis of Resistive Bridging Defects in a Synchronizer},
booktitle = {Proceedings of the Eighteentgh Asian Test Symposium, {ATS} 2009, 23-26
November 2009, Taichung, Taiwan},
pages = {443--449},
publisher = {{IEEE} Computer Society},
year = {2009},
url = {https://doi.org/10.1109/ATS.2009.13},
doi = {10.1109/ATS.2009.13},
timestamp = {Fri, 24 Mar 2023 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/ats/KimJWW09.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/ats/KookCNCGGJ09,
author = {Sehun Kook and
Hyun Woo Choi and
Vishwanath Natarajan and
Abhijit Chatterjee and
Alfred V. Gomes and
Shalabh Goyal and
Le Jin},
title = {Low Cost Dynamic Test Methodology for High Precision {\(\Sigma\)}D
ADCs},
booktitle = {Proceedings of the Eighteentgh Asian Test Symposium, {ATS} 2009, 23-26
November 2009, Taichung, Taiwan},
pages = {69--74},
publisher = {{IEEE} Computer Society},
year = {2009},
url = {https://doi.org/10.1109/ATS.2009.76},
doi = {10.1109/ATS.2009.76},
timestamp = {Fri, 24 Mar 2023 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/ats/KookCNCGGJ09.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/ats/KunduKC09,
author = {Subhadip Kundu and
S. Krishna Kumar and
Santanu Chattopadhyay},
title = {Test Pattern Selection and Customization Targeting Reduced Dynamic
and Leakage Power Consumption},
booktitle = {Proceedings of the Eighteentgh Asian Test Symposium, {ATS} 2009, 23-26
November 2009, Taichung, Taiwan},
pages = {307--312},
publisher = {{IEEE} Computer Society},
year = {2009},
url = {https://doi.org/10.1109/ATS.2009.35},
doi = {10.1109/ATS.2009.35},
timestamp = {Fri, 24 Mar 2023 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/ats/KunduKC09.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/ats/KuoC09,
author = {Feng{-}Ming Kuo and
Yuan{-}Shih Chen},
title = {Yield Ramp up by Scan Chain Diagnosis},
booktitle = {Proceedings of the Eighteentgh Asian Test Symposium, {ATS} 2009, 23-26
November 2009, Taichung, Taiwan},
pages = {94--95},
publisher = {{IEEE} Computer Society},
year = {2009},
url = {https://doi.org/10.1109/ATS.2009.70},
doi = {10.1109/ATS.2009.70},
timestamp = {Fri, 24 Mar 2023 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/ats/KuoC09.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/ats/LeeCA09,
author = {Jae Wook Lee and
Ji Hwan (Paul) Chun and
Jacob A. Abraham},
title = {A Random Jitter {RMS} Estimation Technique for {BIST} Applications},
booktitle = {Proceedings of the Eighteentgh Asian Test Symposium, {ATS} 2009, 23-26
November 2009, Taichung, Taiwan},
pages = {9--14},
publisher = {{IEEE} Computer Society},
year = {2009},
url = {https://doi.org/10.1109/ATS.2009.38},
doi = {10.1109/ATS.2009.38},
timestamp = {Fri, 24 Mar 2023 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/ats/LeeCA09.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/ats/LeeNMF09,
author = {Yeonbok Lee and
Tasuku Nishihara and
Takeshi Matsumoto and
Masahiro Fujita},
title = {A Post-Silicon Debug Support Using High-Level Design Description},
booktitle = {Proceedings of the Eighteentgh Asian Test Symposium, {ATS} 2009, 23-26
November 2009, Taichung, Taiwan},
pages = {137--142},
publisher = {{IEEE} Computer Society},
year = {2009},
url = {https://doi.org/10.1109/ATS.2009.28},
doi = {10.1109/ATS.2009.28},
timestamp = {Fri, 24 Mar 2023 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/ats/LeeNMF09.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/ats/LeeTLL09,
author = {Lung{-}Jen Lee and
Wang{-}Dauh Tseng and
Rung{-}Bin Lin and
Chen{-}Lun Lee},
title = {A Multi-dimensional Pattern Run-Length Method for Test Data Compression},
booktitle = {Proceedings of the Eighteentgh Asian Test Symposium, {ATS} 2009, 23-26
November 2009, Taichung, Taiwan},
pages = {325--330},
publisher = {{IEEE} Computer Society},
year = {2009},
url = {https://doi.org/10.1109/ATS.2009.49},
doi = {10.1109/ATS.2009.49},
timestamp = {Fri, 24 Mar 2023 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/ats/LeeTLL09.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/ats/LeeTLY09,
author = {Lung{-}Jen Lee and
Wang{-}Dauh Tseng and
Rung{-}Bin Lin and
Chi{-}Wei Yu},
title = {Deterministic Built-In Self-Test Using Multiple Linear Feedback Shift
Registers for Low-Power Scan Testing},
booktitle = {Proceedings of the Eighteentgh Asian Test Symposium, {ATS} 2009, 23-26
November 2009, Taichung, Taiwan},
pages = {111--116},
publisher = {{IEEE} Computer Society},
year = {2009},
url = {https://doi.org/10.1109/ATS.2009.50},
doi = {10.1109/ATS.2009.50},
timestamp = {Fri, 24 Mar 2023 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/ats/LeeTLY09.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/ats/LiHH09,
author = {Katherine Shu{-}Min Li and
Yu{-}Chen Hung and
Jr{-}Yang Huang},
title = {Multiple Scan Trees Synthesis for Test Time/Data and Routing Length
Reduction under Output Constraint},
booktitle = {Proceedings of the Eighteentgh Asian Test Symposium, {ATS} 2009, 23-26
November 2009, Taichung, Taiwan},
pages = {231--236},
publisher = {{IEEE} Computer Society},
year = {2009},
url = {https://doi.org/10.1109/ATS.2009.60},
doi = {10.1109/ATS.2009.60},
timestamp = {Fri, 24 Mar 2023 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/ats/LiHH09.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/ats/LiLLH09,
author = {Katherine Shu{-}Min Li and
Yi{-}Yu Liao and
Yuo{-}Wen Liu and
Jr{-}Yang Huang},
title = {{IEEE} 1500 Compatible Interconnect Test with Maximal Test Concurrency},
booktitle = {Proceedings of the Eighteentgh Asian Test Symposium, {ATS} 2009, 23-26
November 2009, Taichung, Taiwan},
pages = {269--274},
publisher = {{IEEE} Computer Society},
year = {2009},
url = {https://doi.org/10.1109/ATS.2009.67},
doi = {10.1109/ATS.2009.67},
timestamp = {Fri, 24 Mar 2023 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/ats/LiLLH09.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/ats/LinCH09,
author = {Jin{-}Fu Lin and
Soon{-}Jyh Chang and
Chih{-}Hao Huang},
title = {Design-for-Test Circuit for the Reduced Code Based Linearity Test
Method in Pipelined ADCs with Digital Error Correction Technique},
booktitle = {Proceedings of the Eighteentgh Asian Test Symposium, {ATS} 2009, 23-26
November 2009, Taichung, Taiwan},
pages = {57--62},
publisher = {{IEEE} Computer Society},
year = {2009},
url = {https://doi.org/10.1109/ATS.2009.18},
doi = {10.1109/ATS.2009.18},
timestamp = {Fri, 24 Mar 2023 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/ats/LinCH09.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/ats/LinK09,
author = {Xijiang Lin and
Mark Kassab},
title = {Test Generation for Designs with On-Chip Clock Generators},
booktitle = {Proceedings of the Eighteentgh Asian Test Symposium, {ATS} 2009, 23-26
November 2009, Taichung, Taiwan},
pages = {411--417},
publisher = {{IEEE} Computer Society},
year = {2009},
url = {https://doi.org/10.1109/ATS.2009.46},
doi = {10.1109/ATS.2009.46},
timestamp = {Fri, 24 Mar 2023 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/ats/LinK09.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/ats/LiuHL09,
author = {Jun Liu and
Yinhe Han and
Xiaowei Li},
title = {Extended Selective Encoding of Scan Slices for Reducing Test Data
and Test Power},
booktitle = {Proceedings of the Eighteentgh Asian Test Symposium, {ATS} 2009, 23-26
November 2009, Taichung, Taiwan},
pages = {319--324},
publisher = {{IEEE} Computer Society},
year = {2009},
url = {https://doi.org/10.1109/ATS.2009.63},
doi = {10.1109/ATS.2009.63},
timestamp = {Tue, 23 May 2023 01:00:00 +0200},
biburl = {https://dblp.org/rec/conf/ats/LiuHL09.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/ats/Mirza-AghatabarBG09,
author = {Mohammad Mirza{-}Aghatabar and
Melvin A. Breuer and
Sandeep K. Gupta},
title = {{SIRUP:} Switch Insertion in RedUndant Pipeline Structures for Yield
and Yield/Area Improvement},
booktitle = {Proceedings of the Eighteentgh Asian Test Symposium, {ATS} 2009, 23-26
November 2009, Taichung, Taiwan},
pages = {193--199},
publisher = {{IEEE} Computer Society},
year = {2009},
url = {https://doi.org/10.1109/ATS.2009.40},
doi = {10.1109/ATS.2009.40},
timestamp = {Thu, 21 Sep 2023 01:00:00 +0200},
biburl = {https://dblp.org/rec/conf/ats/Mirza-AghatabarBG09.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/ats/MittalDV09,
author = {Mukund Mittal and
Subrangshu Das and
S. Vishwanath},
title = {{DFT} Challenges in Next Generation Multi-media {IP}},
booktitle = {Proceedings of the Eighteentgh Asian Test Symposium, {ATS} 2009, 23-26
November 2009, Taichung, Taiwan},
pages = {92--93},
publisher = {{IEEE} Computer Society},
year = {2009},
url = {https://doi.org/10.1109/ATS.2009.73},
doi = {10.1109/ATS.2009.73},
timestamp = {Fri, 24 Mar 2023 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/ats/MittalDV09.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/ats/NatarajanDSC09,
author = {Vishwanath Natarajan and
Shyam Kumar Devarakond and
Shreyas Sen and
Abhijit Chatterjee},
title = {{BIST} Driven Power Conscious Post-Manufacture Tuning of Wireless
Transceiver Systems Using Hardware-Iterated Gradient Search},
booktitle = {Proceedings of the Eighteentgh Asian Test Symposium, {ATS} 2009, 23-26
November 2009, Taichung, Taiwan},
pages = {243--248},
publisher = {{IEEE} Computer Society},
year = {2009},
url = {https://doi.org/10.1109/ATS.2009.75},
doi = {10.1109/ATS.2009.75},
timestamp = {Fri, 24 Mar 2023 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/ats/NatarajanDSC09.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/ats/ParkCA09,
author = {Joonsung Park and
Jaeyong Chung and
Jacob A. Abraham},
title = {LFSR-Based Performance Characterization of Nonlinear Analog and Mixed-Signal
Circuits},
booktitle = {Proceedings of the Eighteentgh Asian Test Symposium, {ATS} 2009, 23-26
November 2009, Taichung, Taiwan},
pages = {373--378},
publisher = {{IEEE} Computer Society},
year = {2009},
url = {https://doi.org/10.1109/ATS.2009.66},
doi = {10.1109/ATS.2009.66},
timestamp = {Fri, 24 Mar 2023 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/ats/ParkCA09.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/ats/PeiLL09,
author = {Songwei Pei and
Huawei Li and
Xiaowei Li},
title = {A Low Overhead On-Chip Path Delay Measurement Circuit},
booktitle = {Proceedings of the Eighteentgh Asian Test Symposium, {ATS} 2009, 23-26
November 2009, Taichung, Taiwan},
pages = {145--150},
publisher = {{IEEE} Computer Society},
year = {2009},
url = {https://doi.org/10.1109/ATS.2009.64},
doi = {10.1109/ATS.2009.64},
timestamp = {Thu, 11 May 2023 01:00:00 +0200},
biburl = {https://dblp.org/rec/conf/ats/PeiLL09.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/ats/PerezRSRT09,
author = {Wilson J. P{\'{e}}rez H. and
Danilo Ravotto and
Edgar E. S{\'{a}}nchez and
Matteo Sonza Reorda and
Alberto Paolo Tonda},
title = {On the Generation of Functional Test Programs for the Cache Replacement
Logic},
booktitle = {Proceedings of the Eighteentgh Asian Test Symposium, {ATS} 2009, 23-26
November 2009, Taichung, Taiwan},
pages = {418--423},
publisher = {{IEEE} Computer Society},
year = {2009},
url = {https://doi.org/10.1109/ATS.2009.37},
doi = {10.1109/ATS.2009.37},
timestamp = {Thu, 27 Jul 2023 01:00:00 +0200},
biburl = {https://dblp.org/rec/conf/ats/PerezRSRT09.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/ats/PomeranzR09,
author = {Irith Pomeranz and
Sudhakar M. Reddy},
title = {Fault Diagnosis under Transparent-Scan},
booktitle = {Proceedings of the Eighteentgh Asian Test Symposium, {ATS} 2009, 23-26
November 2009, Taichung, Taiwan},
pages = {29--34},
publisher = {{IEEE} Computer Society},
year = {2009},
url = {https://doi.org/10.1109/ATS.2009.12},
doi = {10.1109/ATS.2009.12},
timestamp = {Fri, 24 Mar 2023 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/ats/PomeranzR09.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/ats/PousALNR09,
author = {Nicolas Pous and
Florence Aza{\"{\i}}s and
Laurent Latorre and
Pascal Nouet and
Jochen Rivoir},
title = {Exploiting Zero-Crossing for the Analysis of {FM} Modulated Analog/RF
Signals Using Digital {ATE}},
booktitle = {Proceedings of the Eighteentgh Asian Test Symposium, {ATS} 2009, 23-26
November 2009, Taichung, Taiwan},
pages = {261--266},
publisher = {{IEEE} Computer Society},
year = {2009},
url = {https://doi.org/10.1109/ATS.2009.56},
doi = {10.1109/ATS.2009.56},
timestamp = {Fri, 24 Mar 2023 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/ats/PousALNR09.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/ats/PrabhakarH09,
author = {Sandesh Prabhakar and
Michael S. Hsiao},
title = {Using Non-trivial Logic Implications for Trace Buffer-Based Silicon
Debug},
booktitle = {Proceedings of the Eighteentgh Asian Test Symposium, {ATS} 2009, 23-26
November 2009, Taichung, Taiwan},
pages = {131--136},
publisher = {{IEEE} Computer Society},
year = {2009},
url = {https://doi.org/10.1109/ATS.2009.20},
doi = {10.1109/ATS.2009.20},
timestamp = {Fri, 24 Mar 2023 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/ats/PrabhakarH09.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/ats/QiLLWHLH09,
author = {Zichu Qi and
Hui Liu and
Xiangku Li and
Da Wang and
Yinhe Han and
Huawei Li and
Weiwu Hu},
title = {A Scalable Scan Architecture for Godson-3 Multicore Microprocessor},
booktitle = {Proceedings of the Eighteentgh Asian Test Symposium, {ATS} 2009, 23-26
November 2009, Taichung, Taiwan},
pages = {219--224},
publisher = {{IEEE} Computer Society},
year = {2009},
url = {https://doi.org/10.1109/ATS.2009.52},
doi = {10.1109/ATS.2009.52},
timestamp = {Tue, 23 May 2023 01:00:00 +0200},
biburl = {https://dblp.org/rec/conf/ats/QiLLWHLH09.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/ats/QianWYZJLZMLCWYYZW09,
author = {Jun Qian and
Xingang Wang and
Qinfu Yang and
Fei Zhuang and
Junbo Jia and
Xiangfeng Li and
Yuan Zuo and
Jayanth Mekkoth and
Jinsong Liu and
Hao{-}Jan Chao and
Shianling Wu and
Huafeng Yang and
Lizhen Yu and
FeiFei Zhao and
Laung{-}Terng Wang},
title = {Logic {BIST} Architecture for System-Level Test and Diagnosis},
booktitle = {Proceedings of the Eighteentgh Asian Test Symposium, {ATS} 2009, 23-26
November 2009, Taichung, Taiwan},
pages = {21--26},
publisher = {{IEEE} Computer Society},
year = {2009},
url = {https://doi.org/10.1109/ATS.2009.34},
doi = {10.1109/ATS.2009.34},
timestamp = {Fri, 24 Mar 2023 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/ats/QianWYZJLZMLCWYYZW09.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/ats/ShenLMLC09,
author = {Shiue{-}Tsung Shen and
Wei{-}Hsiao Liu and
En{-}Hua Ma and
James Chien{-}Mo Li and
I{-}Chun Cheng},
title = {Very-Low-Voltage Testing of Amorphous Silicon {TFT} Circuits},
booktitle = {Proceedings of the Eighteentgh Asian Test Symposium, {ATS} 2009, 23-26
November 2009, Taichung, Taiwan},
pages = {75--80},
publisher = {{IEEE} Computer Society},
year = {2009},
url = {https://doi.org/10.1109/ATS.2009.68},
doi = {10.1109/ATS.2009.68},
timestamp = {Fri, 24 Mar 2023 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/ats/ShenLMLC09.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/ats/ShintaniUTUSHAM09,
author = {Michihiro Shintani and
Takumi Uezono and
Tomoyuki Takahashi and
Hiroyuki Ueyama and
Takashi Sato and
Kazumi Hatayama and
Takashi Aikyo and
Kazuya Masu},
title = {An Adaptive Test for Parametric Faults Based on Statistical Timing
Information},
booktitle = {Proceedings of the Eighteentgh Asian Test Symposium, {ATS} 2009, 23-26
November 2009, Taichung, Taiwan},
pages = {151--156},
publisher = {{IEEE} Computer Society},
year = {2009},
url = {https://doi.org/10.1109/ATS.2009.90},
doi = {10.1109/ATS.2009.90},
timestamp = {Mon, 17 Jun 2024 01:00:00 +0200},
biburl = {https://dblp.org/rec/conf/ats/ShintaniUTUSHAM09.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/ats/SindiaSA09,
author = {Suraj Sindia and
Virendra Singh and
Vishwani D. Agrawal},
title = {Multi-tone Testing of Linear and Nonlinear Analog Circuits Using Polynomial
Coefficients},
booktitle = {Proceedings of the Eighteentgh Asian Test Symposium, {ATS} 2009, 23-26
November 2009, Taichung, Taiwan},
pages = {63--68},
publisher = {{IEEE} Computer Society},
year = {2009},
url = {https://doi.org/10.1109/ATS.2009.45},
doi = {10.1109/ATS.2009.45},
timestamp = {Fri, 24 Mar 2023 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/ats/SindiaSA09.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/ats/TakahashiHTYTYH09,
author = {Hiroshi Takahashi and
Yoshinobu Higami and
Yuzo Takamatsu and
Koji Yamazaki and
Toshiyuki Tsutsumi and
Hiroyuki Yotsuyanagi and
Masaki Hashizume},
title = {New Class of Tests for Open Faults with Considering Adjacent Lines},
booktitle = {Proceedings of the Eighteentgh Asian Test Symposium, {ATS} 2009, 23-26
November 2009, Taichung, Taiwan},
pages = {301--306},
publisher = {{IEEE} Computer Society},
year = {2009},
url = {https://doi.org/10.1109/ATS.2009.39},
doi = {10.1109/ATS.2009.39},
timestamp = {Fri, 24 Mar 2023 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/ats/TakahashiHTYTYH09.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/ats/TangGCRH09,
author = {Xun Tang and
Ruifeng Guo and
Wu{-}Tung Cheng and
Sudhakar M. Reddy and
Yu Huang},
title = {On Improving Diagnostic Test Generation for Scan Chain Failures},
booktitle = {Proceedings of the Eighteentgh Asian Test Symposium, {ATS} 2009, 23-26
November 2009, Taichung, Taiwan},
pages = {41--46},
publisher = {{IEEE} Computer Society},
year = {2009},
url = {https://doi.org/10.1109/ATS.2009.21},
doi = {10.1109/ATS.2009.21},
timestamp = {Fri, 24 Mar 2023 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/ats/TangGCRH09.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/ats/TsaiGC09,
author = {Kun{-}Han Tsai and
Ruifeng Guo and
Wu{-}Tung Cheng},
title = {At-Speed Scan Test Method for the Timing Optimization and Calibration},
booktitle = {Proceedings of the Eighteentgh Asian Test Symposium, {ATS} 2009, 23-26
November 2009, Taichung, Taiwan},
pages = {430--433},
publisher = {{IEEE} Computer Society},
year = {2009},
url = {https://doi.org/10.1109/ATS.2009.29},
doi = {10.1109/ATS.2009.29},
timestamp = {Fri, 24 Mar 2023 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/ats/TsaiGC09.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/ats/Uzzaman09,
author = {Anis Uzzaman},
title = {Is Low Power Testing Necessary? What does the Test Industry Truly
Need?},
booktitle = {Proceedings of the Eighteentgh Asian Test Symposium, {ATS} 2009, 23-26
November 2009, Taichung, Taiwan},
pages = {215--216},
publisher = {{IEEE} Computer Society},
year = {2009},
url = {https://doi.org/10.1109/ATS.2009.91},
doi = {10.1109/ATS.2009.91},
timestamp = {Fri, 24 Mar 2023 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/ats/Uzzaman09.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/ats/XiangYC09,
author = {Dong Xiang and
Boxue Yin and
Krishnendu Chakrabarty},
title = {Compact Test Generation for Small-Delay Defects Using Testable-Path
Information},
booktitle = {Proceedings of the Eighteentgh Asian Test Symposium, {ATS} 2009, 23-26
November 2009, Taichung, Taiwan},
pages = {424--429},
publisher = {{IEEE} Computer Society},
year = {2009},
url = {https://doi.org/10.1109/ATS.2009.44},
doi = {10.1109/ATS.2009.44},
timestamp = {Fri, 24 Mar 2023 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/ats/XiangYC09.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/ats/YangHH09,
author = {Chen{-}Yuan Yang and
Xuan{-}Lun Huang and
Jiun{-}Lang Huang},
title = {An On-Chip Integrator Leakage Characterization Technique and Its Application
to Switched Capacitor Circuits Testing},
booktitle = {Proceedings of the Eighteentgh Asian Test Symposium, {ATS} 2009, 23-26
November 2009, Taichung, Taiwan},
pages = {367--372},
publisher = {{IEEE} Computer Society},
year = {2009},
url = {https://doi.org/10.1109/ATS.2009.55},
doi = {10.1109/ATS.2009.55},
timestamp = {Fri, 24 Mar 2023 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/ats/YangHH09.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/ats/YaoSR09,
author = {Chunhua Yao and
Kewal K. Saluja and
Parameswaran Ramanathan},
title = {Partition Based SoC Test Scheduling with Thermal and Power Constraints
under Deep Submicron Technologies},
booktitle = {Proceedings of the Eighteentgh Asian Test Symposium, {ATS} 2009, 23-26
November 2009, Taichung, Taiwan},
pages = {281--286},
publisher = {{IEEE} Computer Society},
year = {2009},
url = {https://doi.org/10.1109/ATS.2009.15},
doi = {10.1109/ATS.2009.15},
timestamp = {Fri, 24 Mar 2023 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/ats/YaoSR09.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/ats/ZhangHYX09,
author = {Yubin Zhang and
Lin Huang and
Feng Yuan and
Qiang Xu},
title = {Test Pattern Selection for Potentially Harmful Open Defects in Power
Distribution Networks},
booktitle = {Proceedings of the Eighteentgh Asian Test Symposium, {ATS} 2009, 23-26
November 2009, Taichung, Taiwan},
pages = {456--461},
publisher = {{IEEE} Computer Society},
year = {2009},
url = {https://doi.org/10.1109/ATS.2009.69},
doi = {10.1109/ATS.2009.69},
timestamp = {Fri, 24 Mar 2023 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/ats/ZhangHYX09.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/ats/ZhuLYS09,
author = {Jun{-}Jie Zhu and
Wen{-}Ching Lin and
Jheng{-}Hao Ye and
Ming{-}Der Shieh},
title = {Efficient Software-Based Self-Test Methods for Embedded Digital Signal
Processors},
booktitle = {Proceedings of the Eighteentgh Asian Test Symposium, {ATS} 2009, 23-26
November 2009, Taichung, Taiwan},
pages = {206--211},
publisher = {{IEEE} Computer Society},
year = {2009},
url = {https://doi.org/10.1109/ATS.2009.30},
doi = {10.1109/ATS.2009.30},
timestamp = {Fri, 24 Mar 2023 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/ats/ZhuLYS09.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@proceedings{DBLP:conf/ats/2009,
title = {Proceedings of the Eighteentgh Asian Test Symposium, {ATS} 2009, 23-26
November 2009, Taichung, Taiwan},
publisher = {{IEEE} Computer Society},
year = {2009},
url = {https://ieeexplore.ieee.org/xpl/conhome/5359186/proceeding},
isbn = {978-0-7695-3864-8},
timestamp = {Wed, 16 Oct 2019 01:00:00 +0200},
biburl = {https://dblp.org/rec/conf/ats/2009.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/ats/Abdennadher08,
author = {Salem Abdennadher},
title = {Effects of Advances in Analog, Mixed Signal and {IO} Circuits on Test
Strategies},
booktitle = {17th {IEEE} Asian Test Symposium, {ATS} 2008, Sapporo, Japan, November
24-27, 2008},
pages = {145},
publisher = {{IEEE} Computer Society},
year = {2008},
url = {https://doi.org/10.1109/ATS.2008.94},
doi = {10.1109/ATS.2008.94},
timestamp = {Fri, 24 Mar 2023 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/ats/Abdennadher08.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/ats/AgarwalVRPG08,
author = {Khushboo Agarwal and
Srinivas Vooka and
Srivaths Ravi and
Rubin A. Parekhji and
Arjun Singh Gill},
title = {Power Analysis and Reduction Techniques for Transition Fault Testing},
booktitle = {17th {IEEE} Asian Test Symposium, {ATS} 2008, Sapporo, Japan, November
24-27, 2008},
pages = {403--408},
publisher = {{IEEE} Computer Society},
year = {2008},
url = {https://doi.org/10.1109/ATS.2008.86},
doi = {10.1109/ATS.2008.86},
timestamp = {Fri, 24 Mar 2023 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/ats/AgarwalVRPG08.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/ats/AlampallyAPKW08,
author = {Srinivasulu Alampally and
Jais Abraham and
Rubin A. Parekhji and
Rohit Kapur and
Thomas W. Williams},
title = {Evaluation of Entropy Driven Compression Bounds on Industrial Designs},
booktitle = {17th {IEEE} Asian Test Symposium, {ATS} 2008, Sapporo, Japan, November
24-27, 2008},
pages = {13--18},
publisher = {{IEEE} Computer Society},
year = {2008},
url = {https://doi.org/10.1109/ATS.2008.89},
doi = {10.1109/ATS.2008.89},
timestamp = {Fri, 24 Mar 2023 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/ats/AlampallyAPKW08.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/ats/AsamiSMTK08,
author = {Koji Asami and
Hidetaka Suzuki and
Hiroyuki Miyajima and
Tetsuya Taura and
Haruo Kobayashi},
title = {Technique to Improve the Performance of Time-Interleaved {A-D} Converters
with Mismatches of Non-linearity},
booktitle = {17th {IEEE} Asian Test Symposium, {ATS} 2008, Sapporo, Japan, November
24-27, 2008},
pages = {105--110},
publisher = {{IEEE} Computer Society},
year = {2008},
url = {https://doi.org/10.1109/ATS.2008.34},
doi = {10.1109/ATS.2008.34},
timestamp = {Fri, 24 Mar 2023 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/ats/AsamiSMTK08.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/ats/BahukudumbiC08,
author = {Sudarshan Bahukudumbi and
Krishnendu Chakrabarty},
title = {Power Management for Wafer-Level Test During Burn-In},
booktitle = {17th {IEEE} Asian Test Symposium, {ATS} 2008, Sapporo, Japan, November
24-27, 2008},
pages = {231--236},
publisher = {{IEEE} Computer Society},
year = {2008},
url = {https://doi.org/10.1109/ATS.2008.26},
doi = {10.1109/ATS.2008.26},
timestamp = {Fri, 24 Mar 2023 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/ats/BahukudumbiC08.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/ats/BandoT08,
author = {Koichi Bando and
Kenji Tanaka},
title = {Analyses on Trend of Accidents in Financial Information Systems Reported
by Newspapers from the Viewpoint of Dependability},
booktitle = {17th {IEEE} Asian Test Symposium, {ATS} 2008, Sapporo, Japan, November
24-27, 2008},
pages = {444--450},
publisher = {{IEEE} Computer Society},
year = {2008},
url = {https://doi.org/10.1109/ATS.2008.65},
doi = {10.1109/ATS.2008.65},
timestamp = {Fri, 24 Mar 2023 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/ats/BandoT08.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/ats/BoeyYN08,
author = {Keanhong Boey and
Kok Sing Yap and
Wai Mun Ng},
title = {{USB2.0} Logic Built In Self Test Methodology},
booktitle = {17th {IEEE} Asian Test Symposium, {ATS} 2008, Sapporo, Japan, November
24-27, 2008},
pages = {266},
publisher = {{IEEE} Computer Society},
year = {2008},
url = {https://doi.org/10.1109/ATS.2008.84},
doi = {10.1109/ATS.2008.84},
timestamp = {Fri, 24 Mar 2023 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/ats/BoeyYN08.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/ats/BosioN08,
author = {Alberto Bosio and
Giorgio Di Natale},
title = {{LIFTING:} {A} Flexible Open-Source Fault Simulator},
booktitle = {17th {IEEE} Asian Test Symposium, {ATS} 2008, Sapporo, Japan, November
24-27, 2008},
pages = {35--40},
publisher = {{IEEE} Computer Society},
year = {2008},
url = {https://doi.org/10.1109/ATS.2008.17},
doi = {10.1109/ATS.2008.17},
timestamp = {Fri, 24 Mar 2023 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/ats/BosioN08.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/ats/CarloNM08,
author = {Stefano Di Carlo and
Giorgio Di Natale and
Riccardo Mariani},
title = {On-Line Instruction-Checking in Pipelined Microprocessors},
booktitle = {17th {IEEE} Asian Test Symposium, {ATS} 2008, Sapporo, Japan, November
24-27, 2008},
pages = {377--382},
publisher = {{IEEE} Computer Society},
year = {2008},
url = {https://doi.org/10.1109/ATS.2008.47},
doi = {10.1109/ATS.2008.47},
timestamp = {Fri, 24 Mar 2023 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/ats/CarloNM08.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/ats/CarloSSP08,
author = {Stefano Di Carlo and
Alessandro Savino and
Alberto Scionti and
Paolo Prinetto},
title = {Influence of Parasitic Capacitance Variations on 65 nm and 32 nm Predictive
Technology Model {SRAM} Core-Cells},
booktitle = {17th {IEEE} Asian Test Symposium, {ATS} 2008, Sapporo, Japan, November
24-27, 2008},
pages = {411--416},
publisher = {{IEEE} Computer Society},
year = {2008},
url = {https://doi.org/10.1109/ATS.2008.13},
doi = {10.1109/ATS.2008.13},
timestamp = {Fri, 24 Mar 2023 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/ats/CarloSSP08.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/ats/Chakravadhanula08,
author = {Krishna Chakravadhanula and
Vivek Chickermane and
Brion L. Keller and
Patrick R. Gallagher Jr. and
Steven Gregor},
title = {Test Generation for State Retention Logic},
booktitle = {17th {IEEE} Asian Test Symposium, {ATS} 2008, Sapporo, Japan, November
24-27, 2008},
pages = {237--242},
publisher = {{IEEE} Computer Society},
year = {2008},
url = {https://doi.org/10.1109/ATS.2008.73},
doi = {10.1109/ATS.2008.73},
timestamp = {Fri, 24 Mar 2023 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/ats/Chakravadhanula08.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/ats/ChandraK08,
author = {Anshuman Chandra and
Rohit Kapur},
title = {Not All Xs are Bad for Scan Compression},
booktitle = {17th {IEEE} Asian Test Symposium, {ATS} 2008, Sapporo, Japan, November
24-27, 2008},
pages = {7--12},
publisher = {{IEEE} Computer Society},
year = {2008},
url = {https://doi.org/10.1109/ATS.2008.37},
doi = {10.1109/ATS.2008.37},
timestamp = {Fri, 24 Mar 2023 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/ats/ChandraK08.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/ats/ChangLC08,
author = {Hsiu{-}Ming (Sherman) Chang and
Min{-}Sheng (Mitchell) Lin and
Kwang{-}Ting (Tim) Cheng},
title = {Digitally-Assisted Analog/RF Testing for Mixed-Signal SoCs},
booktitle = {17th {IEEE} Asian Test Symposium, {ATS} 2008, Sapporo, Japan, November
24-27, 2008},
pages = {43--48},
publisher = {{IEEE} Computer Society},
year = {2008},
url = {https://doi.org/10.1109/ATS.2008.24},
doi = {10.1109/ATS.2008.24},
timestamp = {Fri, 24 Mar 2023 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/ats/ChangLC08.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/ats/ChengBGTKMNFO08,
author = {Wu{-}Tung Cheng and
Brady Benware and
Ruifeng Guo and
Kun{-}Han Tsai and
Takeo Kobayashi and
Kazuyuki Maruo and
Michinobu Nakao and
Yoshiaki Fukui and
Hideyuki Otake},
title = {Enhancing Transition Fault Model for Delay Defect Diagnosis},
booktitle = {17th {IEEE} Asian Test Symposium, {ATS} 2008, Sapporo, Japan, November
24-27, 2008},
pages = {179--184},
publisher = {{IEEE} Computer Society},
year = {2008},
url = {https://doi.org/10.1109/ATS.2008.44},
doi = {10.1109/ATS.2008.44},
timestamp = {Fri, 24 Mar 2023 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/ats/ChengBGTKMNFO08.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/ats/ChengLC08,
author = {Nai{-}Chen Daniel Cheng and
Yu Lee and
Ji{-}Jan Chen},
title = {Experimental Results of Built-In Jitter Measurement for Gigahertz
Clock},
booktitle = {17th {IEEE} Asian Test Symposium, {ATS} 2008, Sapporo, Japan, November
24-27, 2008},
pages = {268},
publisher = {{IEEE} Computer Society},
year = {2008},
url = {https://doi.org/10.1109/ATS.2008.50},
doi = {10.1109/ATS.2008.50},
timestamp = {Fri, 24 Mar 2023 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/ats/ChengLC08.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/ats/ChunKKYK08,
author = {Sunghoon Chun and
YongJoon Kim and
Taejin Kim and
Myung{-}Hoon Yang and
Sungho Kang},
title = {{XPDF-ATPG:} An Efficient Test Pattern Generation for Crosstalk-Induced
Faults},
booktitle = {17th {IEEE} Asian Test Symposium, {ATS} 2008, Sapporo, Japan, November
24-27, 2008},
pages = {83--88},
publisher = {{IEEE} Computer Society},
year = {2008},
url = {https://doi.org/10.1109/ATS.2008.57},
doi = {10.1109/ATS.2008.57},
timestamp = {Tue, 27 Feb 2024 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/ats/ChunKKYK08.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/ats/DaiYKH08,
author = {Gui Dai and
Zhiqiang You and
Jishun Kuang and
Jiedi Huang},
title = {DCScan: {A} Power-Aware Scan Testing Architecture},
booktitle = {17th {IEEE} Asian Test Symposium, {ATS} 2008, Sapporo, Japan, November
24-27, 2008},
pages = {348--455},
publisher = {{IEEE} Computer Society},
year = {2008},
url = {https://doi.org/10.1109/ATS.2008.61},
doi = {10.1109/ATS.2008.61},
timestamp = {Fri, 24 Mar 2023 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/ats/DaiYKH08.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/ats/FeyKFF08,
author = {G{\"{o}}rschwin Fey and
Satoshi Komatsu and
Yasuo Furukawa and
Masahiro Fujita},
title = {Targeting Leakage Constraints during {ATPG}},
booktitle = {17th {IEEE} Asian Test Symposium, {ATS} 2008, Sapporo, Japan, November
24-27, 2008},
pages = {225--230},
publisher = {{IEEE} Computer Society},
year = {2008},
url = {https://doi.org/10.1109/ATS.2008.14},
doi = {10.1109/ATS.2008.14},
timestamp = {Fri, 24 Mar 2023 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/ats/FeyKFF08.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/ats/FurukawaWMYKGWT08,
author = {Hiroshi Furukawa and
Xiaoqing Wen and
Kohei Miyase and
Yuta Yamato and
Seiji Kajihara and
Patrick Girard and
Laung{-}Terng Wang and
Mohammad Tehranipoor},
title = {{CTX:} {A} Clock-Gating-Based Test Relaxation and X-Filling Scheme
for Reducing Yield Loss Risk in At-Speed Scan Testing},
booktitle = {17th {IEEE} Asian Test Symposium, {ATS} 2008, Sapporo, Japan, November
24-27, 2008},
pages = {397--402},
publisher = {{IEEE} Computer Society},
year = {2008},
url = {https://doi.org/10.1109/ATS.2008.27},
doi = {10.1109/ATS.2008.27},
timestamp = {Fri, 24 Mar 2023 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/ats/FurukawaWMYKGWT08.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/ats/GaoCLC08,
author = {Ming Gao and
Hsiu{-}Ming (Sherman) Chang and
Peter Lisherness and
Kwang{-}Ting (Tim) Cheng},
title = {Time-Multiplexed Online Checking: {A} Feasibility Study},
booktitle = {17th {IEEE} Asian Test Symposium, {ATS} 2008, Sapporo, Japan, November
24-27, 2008},
pages = {371--376},
publisher = {{IEEE} Computer Society},
year = {2008},
url = {https://doi.org/10.1109/ATS.2008.23},
doi = {10.1109/ATS.2008.23},
timestamp = {Fri, 24 Mar 2023 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/ats/GaoCLC08.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/ats/Goller08,
author = {Hagen Goller},
title = {The HiZ Problem of Power Management {IC} Testing},
booktitle = {17th {IEEE} Asian Test Symposium, {ATS} 2008, Sapporo, Japan, November
24-27, 2008},
pages = {193},
publisher = {{IEEE} Computer Society},
year = {2008},
url = {https://doi.org/10.1109/ATS.2008.21},
doi = {10.1109/ATS.2008.21},
timestamp = {Fri, 24 Mar 2023 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/ats/Goller08.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/ats/GoyalS08,
author = {Abhilash Goyal and
Madhavan Swaminathan},
title = {Low-Cost One-Port Approach for Testing Integrated {RF} Substrates},
booktitle = {17th {IEEE} Asian Test Symposium, {ATS} 2008, Sapporo, Japan, November
24-27, 2008},
pages = {49--54},
publisher = {{IEEE} Computer Society},
year = {2008},
url = {https://doi.org/10.1109/ATS.2008.56},
doi = {10.1109/ATS.2008.56},
timestamp = {Fri, 24 Mar 2023 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/ats/GoyalS08.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/ats/HePE08,
author = {Zhiyuan He and
Zebo Peng and
Petru Eles},
title = {Simulation-Driven Thermal-Safe Test Time Minimization for System-on-Chip},
booktitle = {17th {IEEE} Asian Test Symposium, {ATS} 2008, Sapporo, Japan, November
24-27, 2008},
pages = {283--288},
publisher = {{IEEE} Computer Society},
year = {2008},
url = {https://doi.org/10.1109/ATS.2008.79},
doi = {10.1109/ATS.2008.79},
timestamp = {Fri, 24 Mar 2023 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/ats/HePE08.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/ats/HigamiSTKT08,
author = {Yoshinobu Higami and
Kewal K. Saluja and
Hiroshi Takahashi and
Shin{-}ya Kobayashi and
Yuzo Takamatsu},
title = {Increasing Defect Coverage by Generating Test Vectors for Stuck-Open
Faults},
booktitle = {17th {IEEE} Asian Test Symposium, {ATS} 2008, Sapporo, Japan, November
24-27, 2008},
pages = {97--102},
publisher = {{IEEE} Computer Society},
year = {2008},
url = {https://doi.org/10.1109/ATS.2008.39},
doi = {10.1109/ATS.2008.39},
timestamp = {Fri, 24 Mar 2023 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/ats/HigamiSTKT08.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/ats/Hirai08,
author = {Nobuyuki Hirai},
title = {Detectability of the Two-Dimensional Detector for Time Resolved Emission
Measurement},
booktitle = {17th {IEEE} Asian Test Symposium, {ATS} 2008, Sapporo, Japan, November
24-27, 2008},
pages = {272},
publisher = {{IEEE} Computer Society},
year = {2008},
url = {https://doi.org/10.1109/ATS.2008.30},
doi = {10.1109/ATS.2008.30},
timestamp = {Fri, 24 Mar 2023 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/ats/Hirai08.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/ats/Hirase08,
author = {Junichi Hirase},
title = {Defect Detection Rate through {IDDQ} for Production Testing},
booktitle = {17th {IEEE} Asian Test Symposium, {ATS} 2008, Sapporo, Japan, November
24-27, 2008},
pages = {199--205},
publisher = {{IEEE} Computer Society},
year = {2008},
url = {https://doi.org/10.1109/ATS.2008.88},
doi = {10.1109/ATS.2008.88},
timestamp = {Fri, 24 Mar 2023 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/ats/Hirase08.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/ats/HsiehLLK08,
author = {Ming{-}Ting Hsieh and
Shun{-}Yen Lu and
Jing{-}Jia Liou and
Augusli Kifli},
title = {High Quality Pattern Generation for Delay Defects with Functional
Sensitized Paths},
booktitle = {17th {IEEE} Asian Test Symposium, {ATS} 2008, Sapporo, Japan, November
24-27, 2008},
pages = {131--136},
publisher = {{IEEE} Computer Society},
year = {2008},
url = {https://doi.org/10.1109/ATS.2008.41},
doi = {10.1109/ATS.2008.41},
timestamp = {Fri, 24 Mar 2023 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/ats/HsiehLLK08.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/ats/HsuDWLHW08,
author = {Chun{-}Kai Hsu and
Li{-}Ming Denq and
Mao{-}Yin Wang and
Jing{-}Jia Liou and
Chih{-}Tsun Huang and
Cheng{-}Wen Wu},
title = {Area and Test Cost Reduction for On-Chip Wireless Test Channels with
System-Level Design Techniques},
booktitle = {17th {IEEE} Asian Test Symposium, {ATS} 2008, Sapporo, Japan, November
24-27, 2008},
pages = {245--250},
publisher = {{IEEE} Computer Society},
year = {2008},
url = {https://doi.org/10.1109/ATS.2008.19},
doi = {10.1109/ATS.2008.19},
timestamp = {Sat, 30 Sep 2023 01:00:00 +0200},
biburl = {https://dblp.org/rec/conf/ats/HsuDWLHW08.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/ats/HuangL08,
author = {Yu{-}Jen Huang and
Jin{-}Fu Li},
title = {A Low-Cost Pipelined {BIST} Scheme for Homogeneous RAMs in Multicore
Chips},
booktitle = {17th {IEEE} Asian Test Symposium, {ATS} 2008, Sapporo, Japan, November
24-27, 2008},
pages = {357--362},
publisher = {{IEEE} Computer Society},
year = {2008},
url = {https://doi.org/10.1109/ATS.2008.51},
doi = {10.1109/ATS.2008.51},
timestamp = {Tue, 17 Oct 2023 01:00:00 +0200},
biburl = {https://dblp.org/rec/conf/ats/HuangL08.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/ats/HuangLH08,
author = {Jui{-}Jer Huang and
Chiuan{-}Che Li and
Jiun{-}Lang Huang},
title = {Testing {LCD} Source Driver {IC} with Built-on-Scribe-Line Test Circuitry},
booktitle = {17th {IEEE} Asian Test Symposium, {ATS} 2008, Sapporo, Japan, November
24-27, 2008},
pages = {117--122},
publisher = {{IEEE} Computer Society},
year = {2008},
url = {https://doi.org/10.1109/ATS.2008.68},
doi = {10.1109/ATS.2008.68},
timestamp = {Fri, 24 Mar 2023 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/ats/HuangLH08.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/ats/IngelssonAH08,
author = {Urban Ingelsson and
Bashir M. Al{-}Hashimi and
Peter Harrod},
title = {Variation Aware Analysis of Bridging Fault Testing},
booktitle = {17th {IEEE} Asian Test Symposium, {ATS} 2008, Sapporo, Japan, November
24-27, 2008},
pages = {206--211},
publisher = {{IEEE} Computer Society},
year = {2008},
url = {https://doi.org/10.1109/ATS.2008.18},
doi = {10.1109/ATS.2008.18},
timestamp = {Fri, 24 Mar 2023 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/ats/IngelssonAH08.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/ats/InoueHF08,
author = {Ryoichi Inoue and
Toshinori Hosokawa and
Hideo Fujiwara},
title = {A Test Generation Method for State-Observable FSMs to Increase Defect
Coverage under the Test Length Constraint},
booktitle = {17th {IEEE} Asian Test Symposium, {ATS} 2008, Sapporo, Japan, November
24-27, 2008},
pages = {27--34},
publisher = {{IEEE} Computer Society},
year = {2008},
url = {https://doi.org/10.1109/ATS.2008.32},
doi = {10.1109/ATS.2008.32},
timestamp = {Fri, 24 Mar 2023 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/ats/InoueHF08.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/ats/KellerBBFU08,
author = {Brion L. Keller and
Sandeep Bhatia and
Thomas Bartenstein and
Brian Foutz and
Anis Uzzaman},
title = {Optimizing Test Data Volume Using Hybrid Compression},
booktitle = {17th {IEEE} Asian Test Symposium, {ATS} 2008, Sapporo, Japan, November
24-27, 2008},
pages = {157--162},
publisher = {{IEEE} Computer Society},
year = {2008},
url = {https://doi.org/10.1109/ATS.2008.78},
doi = {10.1109/ATS.2008.78},
timestamp = {Fri, 24 Mar 2023 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/ats/KellerBBFU08.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/ats/Khoo08,
author = {Leslie Khoo},
title = {Electrical Overstress Prevention {\&} Test Best Practices},
booktitle = {17th {IEEE} Asian Test Symposium, {ATS} 2008, Sapporo, Japan, November
24-27, 2008},
pages = {146},
publisher = {{IEEE} Computer Society},
year = {2008},
url = {https://doi.org/10.1109/ATS.2008.49},
doi = {10.1109/ATS.2008.49},
timestamp = {Fri, 24 Mar 2023 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/ats/Khoo08.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/ats/KhusyariNJANAO08,
author = {Khairul Khusyari and
Wei Tee Ng and
Neal Jaarsma and
Robert Abraham and
Peng Weng Ng and
Boon Hui Ang and
Chin Hu Ong},
title = {Diagnosis of Voltage Dependent Scan Chain Failure Using {VBUMP} Scan
Debug Method},
booktitle = {17th {IEEE} Asian Test Symposium, {ATS} 2008, Sapporo, Japan, November
24-27, 2008},
pages = {271},
publisher = {{IEEE} Computer Society},
year = {2008},
url = {https://doi.org/10.1109/ATS.2008.66},
doi = {10.1109/ATS.2008.66},
timestamp = {Fri, 24 Mar 2023 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/ats/KhusyariNJANAO08.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/ats/KimCKYK08,
author = {Taejin Kim and
Sunghoon Chun and
YongJoon Kim and
Myung{-}Hoon Yang and
Sungho Kang},
title = {An Effective Hybrid Test Data Compression Method Using Scan Chain
Compaction and Dictionary-Based Scheme},
booktitle = {17th {IEEE} Asian Test Symposium, {ATS} 2008, Sapporo, Japan, November
24-27, 2008},
pages = {151--156},
publisher = {{IEEE} Computer Society},
year = {2008},
url = {https://doi.org/10.1109/ATS.2008.58},
doi = {10.1109/ATS.2008.58},
timestamp = {Tue, 27 Feb 2024 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/ats/KimCKYK08.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/ats/KimPAV08,
author = {Dongok Kim and
Irith Pomeranz and
M. Enamul Amyeen and
Srikanth Venkataraman},
title = {Prioritizing the Application of {DFM} Guidelines Based on the Detectability
of Systematic Defects},
booktitle = {17th {IEEE} Asian Test Symposium, {ATS} 2008, Sapporo, Japan, November
24-27, 2008},
pages = {217--220},
publisher = {{IEEE} Computer Society},
year = {2008},
url = {https://doi.org/10.1109/ATS.2008.69},
doi = {10.1109/ATS.2008.69},
timestamp = {Fri, 24 Mar 2023 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/ats/KimPAV08.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/ats/KitoT08,
author = {Nobutaka Kito and
Naofumi Takagi},
title = {Level-Testability of Multi-operand Adders},
booktitle = {17th {IEEE} Asian Test Symposium, {ATS} 2008, Sapporo, Japan, November
24-27, 2008},
pages = {260--262},
publisher = {{IEEE} Computer Society},
year = {2008},
url = {https://doi.org/10.1109/ATS.2008.40},
doi = {10.1109/ATS.2008.40},
timestamp = {Fri, 24 Mar 2023 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/ats/KitoT08.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/ats/KojimaNMF08,
author = {Yoshihisa Kojima and
Tasuku Nishihara and
Takeshi Matsumoto and
Masahiro Fujita},
title = {An Interactive Verification and Debugging Environment by Concrete/Symbolic
Simulations for System-Level Designs},
booktitle = {17th {IEEE} Asian Test Symposium, {ATS} 2008, Sapporo, Japan, November
24-27, 2008},
pages = {315--320},
publisher = {{IEEE} Computer Society},
year = {2008},
url = {https://doi.org/10.1109/ATS.2008.62},
doi = {10.1109/ATS.2008.62},
timestamp = {Fri, 24 Mar 2023 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/ats/KojimaNMF08.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/ats/KuangXY08,
author = {Jishun Kuang and
Ouyang Xiong and
Zhiqiang You},
title = {A Novel {BIST} Scheme Using Test Vectors Applied by Circuit-under-Test
Itself},
booktitle = {17th {IEEE} Asian Test Symposium, {ATS} 2008, Sapporo, Japan, November
24-27, 2008},
pages = {75--80},
publisher = {{IEEE} Computer Society},
year = {2008},
url = {https://doi.org/10.1109/ATS.2008.25},
doi = {10.1109/ATS.2008.25},
timestamp = {Fri, 24 Mar 2023 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/ats/KuangXY08.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/ats/LaiW08,
author = {Nan{-}Cheng Lai and
Sying{-}Jyan Wang},
title = {On-Chip Test Generation Mechanism for Scan-Based Two-Pattern Tests},
booktitle = {17th {IEEE} Asian Test Symposium, {ATS} 2008, Sapporo, Japan, November
24-27, 2008},
pages = {251--256},
publisher = {{IEEE} Computer Society},
year = {2008},
url = {https://doi.org/10.1109/ATS.2008.46},
doi = {10.1109/ATS.2008.46},
timestamp = {Fri, 24 Mar 2023 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/ats/LaiW08.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/ats/LarssonZLC08,
author = {Anders Larsson and
Xin Zhang and
Erik Larsson and
Krishnendu Chakrabarty},
title = {Core-Level Compression Technique Selection and {SOC} Test Architecture
Design},
booktitle = {17th {IEEE} Asian Test Symposium, {ATS} 2008, Sapporo, Japan, November
24-27, 2008},
pages = {277--282},
publisher = {{IEEE} Computer Society},
year = {2008},
url = {https://doi.org/10.1109/ATS.2008.71},
doi = {10.1109/ATS.2008.71},
timestamp = {Fri, 24 Mar 2023 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/ats/LarssonZLC08.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/ats/LeeNSC08,
author = {Deuk Lee and
Vishwanath Natarajan and
Rajarajan Senguttuvan and
Abhijit Chatterjee},
title = {Efficient Low-Cost Testing of Wireless {OFDM} Polar Transceiver Systems},
booktitle = {17th {IEEE} Asian Test Symposium, {ATS} 2008, Sapporo, Japan, November
24-27, 2008},
pages = {55--60},
publisher = {{IEEE} Computer Society},
year = {2008},
url = {https://doi.org/10.1109/ATS.2008.87},
doi = {10.1109/ATS.2008.87},
timestamp = {Fri, 24 Mar 2023 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/ats/LeeNSC08.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/ats/LiH08,
author = {Katherine Shu{-}Min Li and
Jr{-}Yang Huang},
title = {Interconnect-Driven Layout-Aware Multiple Scan Tree Synthesis for
Test Time, Data Compression and Routing Optimization},
booktitle = {17th {IEEE} Asian Test Symposium, {ATS} 2008, Sapporo, Japan, November
24-27, 2008},
pages = {63--68},
publisher = {{IEEE} Computer Society},
year = {2008},
url = {https://doi.org/10.1109/ATS.2008.80},
doi = {10.1109/ATS.2008.80},
timestamp = {Fri, 24 Mar 2023 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/ats/LiH08.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/ats/LiXXW08,
author = {Ming Li and
Shiyi Xu and
Enjun Xia and
Fayu Wang},
title = {Design of {FSM} with Concurrent Error Detection Based on Viterbi Decoding},
booktitle = {17th {IEEE} Asian Test Symposium, {ATS} 2008, Sapporo, Japan, November
24-27, 2008},
pages = {383--388},
publisher = {{IEEE} Computer Society},
year = {2008},
url = {https://doi.org/10.1109/ATS.2008.20},
doi = {10.1109/ATS.2008.20},
timestamp = {Fri, 24 Mar 2023 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/ats/LiXXW08.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/ats/LinKC08,
author = {Jin{-}Fu Lin and
Te{-}Chieh Kung and
Soon{-}Jyh Chang},
title = {A Reduced Code Linearity Test Method for Pipelined {A/D} Converters},
booktitle = {17th {IEEE} Asian Test Symposium, {ATS} 2008, Sapporo, Japan, November
24-27, 2008},
pages = {111--116},
publisher = {{IEEE} Computer Society},
year = {2008},
url = {https://doi.org/10.1109/ATS.2008.53},
doi = {10.1109/ATS.2008.53},
timestamp = {Fri, 24 Mar 2023 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/ats/LinKC08.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/ats/LinR08,
author = {Xijiang Lin and
Janusz Rajski},
title = {Test Power Reduction by Blocking Scan Cell Outputs},
booktitle = {17th {IEEE} Asian Test Symposium, {ATS} 2008, Sapporo, Japan, November
24-27, 2008},
pages = {329--336},
publisher = {{IEEE} Computer Society},
year = {2008},
url = {https://doi.org/10.1109/ATS.2008.33},
doi = {10.1109/ATS.2008.33},
timestamp = {Fri, 24 Mar 2023 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/ats/LinR08.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/ats/LinTLYC08,
author = {Yi{-}Cheng Lin and
Yi{-}Ying Tsai and
Kuen{-}Jong Lee and
Cheng{-}Wei Yen and
Chung{-}Ho Chen},
title = {A Software-Based Test Methodology for Direct-Mapped Data Cache},
booktitle = {17th {IEEE} Asian Test Symposium, {ATS} 2008, Sapporo, Japan, November
24-27, 2008},
pages = {363--368},
publisher = {{IEEE} Computer Society},
year = {2008},
url = {https://doi.org/10.1109/ATS.2008.60},
doi = {10.1109/ATS.2008.60},
timestamp = {Fri, 24 Mar 2023 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/ats/LinTLYC08.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/ats/LinWH08,
author = {Yi{-}Tsung Lin and
Meng{-}Fan Wu and
Jiun{-}Lang Huang},
title = {PHS-Fill: {A} Low Power Supply Noise Test Pattern Generation Technique
for At-Speed Scan Testing in Huffman Coding Test Compression Environment},
booktitle = {17th {IEEE} Asian Test Symposium, {ATS} 2008, Sapporo, Japan, November
24-27, 2008},
pages = {391--396},
publisher = {{IEEE} Computer Society},
year = {2008},
url = {https://doi.org/10.1109/ATS.2008.63},
doi = {10.1109/ATS.2008.63},
timestamp = {Fri, 24 Mar 2023 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/ats/LinWH08.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/ats/LiuCTRZS08,
author = {Chen Liu and
Wu{-}Tung Cheng and
Huaxing Tang and
Sudhakar M. Reddy and
Wei Zou and
Manish Sharma},
title = {Hyperactive Faults Dictionary to Increase Diagnosis Throughput},
booktitle = {17th {IEEE} Asian Test Symposium, {ATS} 2008, Sapporo, Japan, November
24-27, 2008},
pages = {173--178},
publisher = {{IEEE} Computer Society},
year = {2008},
url = {https://doi.org/10.1109/ATS.2008.16},
doi = {10.1109/ATS.2008.16},
timestamp = {Fri, 24 Mar 2023 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/ats/LiuCTRZS08.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/ats/LiuX08,
author = {Xiao Liu and
Qiang Xu},
title = {On Reusing Test Access Mechanisms for Debug Data Transfer in SoC Post-Silicon
Validation},
booktitle = {17th {IEEE} Asian Test Symposium, {ATS} 2008, Sapporo, Japan, November
24-27, 2008},
pages = {303--308},
publisher = {{IEEE} Computer Society},
year = {2008},
url = {https://doi.org/10.1109/ATS.2008.83},
doi = {10.1109/ATS.2008.83},
timestamp = {Fri, 24 Mar 2023 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/ats/LiuX08.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/ats/LoCSW08,
author = {Wan{-}Yu Lo and
Ching{-}Yi Chen and
Chin{-}Lung Su and
Cheng{-}Wen Wu},
title = {Test and Diagnosis Algorithm Generation and Evaluation for {MRAM}
Write Disturbance Fault},
booktitle = {17th {IEEE} Asian Test Symposium, {ATS} 2008, Sapporo, Japan, November
24-27, 2008},
pages = {417--422},
publisher = {{IEEE} Computer Society},
year = {2008},
url = {https://doi.org/10.1109/ATS.2008.29},
doi = {10.1109/ATS.2008.29},
timestamp = {Sat, 30 Sep 2023 01:00:00 +0200},
biburl = {https://dblp.org/rec/conf/ats/LoCSW08.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/ats/Maeda08,
author = {Akinori Maeda},
title = {Low Distortion Sine Waveform Generation by an {AWG}},
booktitle = {17th {IEEE} Asian Test Symposium, {ATS} 2008, Sapporo, Japan, November
24-27, 2008},
pages = {147},
publisher = {{IEEE} Computer Society},
year = {2008},
url = {https://doi.org/10.1109/ATS.2008.28},
doi = {10.1109/ATS.2008.28},
timestamp = {Fri, 24 Mar 2023 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/ats/Maeda08.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/ats/MatsushimaMT08,
author = {Jun Matsushima and
Yoichi Maeda and
Masahiro Takakura},
title = {CooLBIST: An Effective Approach of Test Power Reduction for {LBIST}},
booktitle = {17th {IEEE} Asian Test Symposium, {ATS} 2008, Sapporo, Japan, November
24-27, 2008},
pages = {264},
publisher = {{IEEE} Computer Society},
year = {2008},
url = {https://doi.org/10.1109/ATS.2008.36},
doi = {10.1109/ATS.2008.36},
timestamp = {Fri, 24 Mar 2023 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/ats/MatsushimaMT08.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/ats/MitraGRBMC08,
author = {Debasis Mitra and
Sarmishtha Ghoshal and
Hafizur Rahaman and
Bhargab B. Bhattacharya and
D. Dutta Majumder and
Krishnendu Chakrabarty},
title = {Accelerated Functional Testing of Digital Microfluidic Biochips},
booktitle = {17th {IEEE} Asian Test Symposium, {ATS} 2008, Sapporo, Japan, November
24-27, 2008},
pages = {295--300},
publisher = {{IEEE} Computer Society},
year = {2008},
url = {https://doi.org/10.1109/ATS.2008.48},
doi = {10.1109/ATS.2008.48},
timestamp = {Fri, 24 Mar 2023 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/ats/MitraGRBMC08.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/ats/MolaviEC08,
author = {Shawn Molavi and
Andy Evans and
Ray Clancy},
title = {Protocol Aware Test Methodologies Using Today},
booktitle = {17th {IEEE} Asian Test Symposium, {ATS} 2008, Sapporo, Japan, November
24-27, 2008},
pages = {273},
publisher = {{IEEE} Computer Society},
year = {2008},
url = {https://doi.org/10.1109/ATS.2008.74},
doi = {10.1109/ATS.2008.74},
timestamp = {Fri, 24 Mar 2023 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/ats/MolaviEC08.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/ats/MuradaliHS08,
author = {Fidel Muradali and
Suzanne Huh and
Madhavan Swaminathan},
title = {Load-Board/PCB Noise Suppression via Electromagnetic Band Gap Power
Plane Patterning},
booktitle = {17th {IEEE} Asian Test Symposium, {ATS} 2008, Sapporo, Japan, November
24-27, 2008},
pages = {195},
publisher = {{IEEE} Computer Society},
year = {2008},
url = {https://doi.org/10.1109/ATS.2008.43},
doi = {10.1109/ATS.2008.43},
timestamp = {Fri, 24 Mar 2023 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/ats/MuradaliHS08.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/ats/RaikFUK08,
author = {Jaan Raik and
Hideo Fujiwara and
Raimund Ubar and
Anna Krivenko},
title = {Untestable Fault Identification in Sequential Circuits Using Model-Checking},
booktitle = {17th {IEEE} Asian Test Symposium, {ATS} 2008, Sapporo, Japan, November
24-27, 2008},
pages = {21--26},
publisher = {{IEEE} Computer Society},
year = {2008},
url = {https://doi.org/10.1109/ATS.2008.22},
doi = {10.1109/ATS.2008.22},
timestamp = {Fri, 24 Mar 2023 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/ats/RaikFUK08.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/ats/SasakiNA08,
author = {Tomonori Sasaki and
Yoshiyuki Nakamura and
Toshiharu Asaka},
title = {Shared At-Speed {BIST} for Parallel Test of SRAMs with Different Address
Sizes},
booktitle = {17th {IEEE} Asian Test Symposium, {ATS} 2008, Sapporo, Japan, November
24-27, 2008},
pages = {267},
publisher = {{IEEE} Computer Society},
year = {2008},
url = {https://doi.org/10.1109/ATS.2008.31},
doi = {10.1109/ATS.2008.31},
timestamp = {Fri, 24 Mar 2023 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/ats/SasakiNA08.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/ats/ShenWCCG08,
author = {Haihua Shen and
Wenli Wei and
Yunji Chen and
Bowen Chen and
Qi Guo},
title = {Coverage Directed Test Generation: Godson Experience},
booktitle = {17th {IEEE} Asian Test Symposium, {ATS} 2008, Sapporo, Japan, November
24-27, 2008},
pages = {321--326},
publisher = {{IEEE} Computer Society},
year = {2008},
url = {https://doi.org/10.1109/ATS.2008.42},
doi = {10.1109/ATS.2008.42},
timestamp = {Fri, 24 Mar 2023 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/ats/ShenWCCG08.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/ats/ShinG08,
author = {Doochul Shin and
Sandeep K. Gupta},
title = {A Re-design Technique for Datapath Modules in Error Tolerant Applications},
booktitle = {17th {IEEE} Asian Test Symposium, {ATS} 2008, Sapporo, Japan, November
24-27, 2008},
pages = {431--437},
publisher = {{IEEE} Computer Society},
year = {2008},
url = {https://doi.org/10.1109/ATS.2008.75},
doi = {10.1109/ATS.2008.75},
timestamp = {Tue, 26 Sep 2023 01:00:00 +0200},
biburl = {https://dblp.org/rec/conf/ats/ShinG08.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/ats/SinhaGB08,
author = {Arani Sinha and
Sandeep K. Gupta and
Melvin A. Breuer},
title = {A Multi-valued Algebra for Capacitance Induced Crosstalk Delay Faults},
booktitle = {17th {IEEE} Asian Test Symposium, {ATS} 2008, Sapporo, Japan, November
24-27, 2008},
pages = {89--96},
publisher = {{IEEE} Computer Society},
year = {2008},
url = {https://doi.org/10.1109/ATS.2008.82},
doi = {10.1109/ATS.2008.82},
timestamp = {Thu, 21 Sep 2023 01:00:00 +0200},
biburl = {https://dblp.org/rec/conf/ats/SinhaGB08.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/ats/SmithS08,
author = {Ricky Smith and
Jiang Shi},
title = {{DFT} Technique to Conclusively Translate Floating Nodes to High {IDDQ}
Current in Analog Circuits},
booktitle = {17th {IEEE} Asian Test Symposium, {ATS} 2008, Sapporo, Japan, November
24-27, 2008},
pages = {270},
publisher = {{IEEE} Computer Society},
year = {2008},
url = {https://doi.org/10.1109/ATS.2008.70},
doi = {10.1109/ATS.2008.70},
timestamp = {Fri, 24 Mar 2023 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/ats/SmithS08.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/ats/TakayukiEI08,
author = {Katayama Takayuki and
Kou Ebihara and
Goro Imaizumi},
title = {Leading Edge Technology and Test Noise},
booktitle = {17th {IEEE} Asian Test Symposium, {ATS} 2008, Sapporo, Japan, November
24-27, 2008},
pages = {269},
publisher = {{IEEE} Computer Society},
year = {2008},
url = {https://doi.org/10.1109/ATS.2008.85},
doi = {10.1109/ATS.2008.85},
timestamp = {Fri, 24 Mar 2023 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/ats/TakayukiEI08.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/ats/TsaiGC08,
author = {Kun{-}Han Tsai and
Ruifeng Guo and
Wu{-}Tung Cheng},
title = {A Robust Automated Scan Pattern Mismatch Debugger},
booktitle = {17th {IEEE} Asian Test Symposium, {ATS} 2008, Sapporo, Japan, November
24-27, 2008},
pages = {309--314},
publisher = {{IEEE} Computer Society},
year = {2008},
url = {https://doi.org/10.1109/ATS.2008.45},
doi = {10.1109/ATS.2008.45},
timestamp = {Fri, 24 Mar 2023 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/ats/TsaiGC08.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/ats/TzengH08,
author = {Chao{-}Wen Tzeng and
Shi{-}Yu Huang},
title = {Two-Gear Low-Power Scan Test},
booktitle = {17th {IEEE} Asian Test Symposium, {ATS} 2008, Sapporo, Japan, November
24-27, 2008},
pages = {337--342},
publisher = {{IEEE} Computer Society},
year = {2008},
url = {https://doi.org/10.1109/ATS.2008.54},
doi = {10.1109/ATS.2008.54},
timestamp = {Fri, 24 Mar 2023 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/ats/TzengH08.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/ats/Uzzaman08,
author = {Anis Uzzaman},
title = {How To Increase the Effectiveness of Yield Diagnostics-Is {DFM} the
Answer to This?},
booktitle = {17th {IEEE} Asian Test Symposium, {ATS} 2008, Sapporo, Japan, November
24-27, 2008},
pages = {221},
publisher = {{IEEE} Computer Society},
year = {2008},
url = {https://doi.org/10.1109/ATS.2008.95},
doi = {10.1109/ATS.2008.95},
timestamp = {Fri, 24 Mar 2023 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/ats/Uzzaman08.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/ats/WangH0Y008,
author = {Fei Wang and
Yu Hu and
Yu Huang and
Jing Ye and
Xiaowei Li},
title = {Observation Point Oriented Deterministic Diagnosis Pattern Generation
{(DDPG)} for Chain Diagnosis},
booktitle = {17th {IEEE} Asian Test Symposium, {ATS} 2008, Sapporo, Japan, November
24-27, 2008},
pages = {190--192},
publisher = {{IEEE} Computer Society},
year = {2008},
url = {https://doi.org/10.1109/ATS.2008.52},
doi = {10.1109/ATS.2008.52},
timestamp = {Mon, 22 May 2023 01:00:00 +0200},
biburl = {https://dblp.org/rec/conf/ats/WangH0Y008.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/ats/WangW08,
author = {Seongmoon Wang and
Wenlong Wei},
title = {Cost Efficient Methods to Improve Performance of Broadcast Scan},
booktitle = {17th {IEEE} Asian Test Symposium, {ATS} 2008, Sapporo, Japan, November
24-27, 2008},
pages = {163--169},
publisher = {{IEEE} Computer Society},
year = {2008},
url = {https://doi.org/10.1109/ATS.2008.72},
doi = {10.1109/ATS.2008.72},
timestamp = {Fri, 24 Mar 2023 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/ats/WangW08.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/ats/WerkmannKF08,
author = {Hubert Werkmann and
Dong{-}Myong Kim and
Shinji Fujita},
title = {{GDDR5} Training},
booktitle = {17th {IEEE} Asian Test Symposium, {ATS} 2008, Sapporo, Japan, November
24-27, 2008},
pages = {423--428},
publisher = {{IEEE} Computer Society},
year = {2008},
url = {https://doi.org/10.1109/ATS.2008.67},
doi = {10.1109/ATS.2008.67},
timestamp = {Fri, 24 Mar 2023 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/ats/WerkmannKF08.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/ats/WuCTW08,
author = {Sean H. Wu and
Sreejit Chakravarty and
Alexander Tetelbaum and
Li{-}C. Wang},
title = {Refining Delay Test Methodology Using Knowledge of Asymmetric Transition
Delay},
booktitle = {17th {IEEE} Asian Test Symposium, {ATS} 2008, Sapporo, Japan, November
24-27, 2008},
pages = {142--144},
publisher = {{IEEE} Computer Society},
year = {2008},
url = {https://doi.org/10.1109/ATS.2008.76},
doi = {10.1109/ATS.2008.76},
timestamp = {Fri, 24 Mar 2023 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/ats/WuCTW08.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/ats/WuFSWCYWM08,
author = {Shianling Wu and
Hiroshi Furukawa and
Boryau Sheu and
Laung{-}Terng Wang and
Hao{-}Jan Chao and
Lizhen Yu and
Xiaoqing Wen and
Michio Murakami},
title = {Practical Challenges in Logic {BIST} Implementation},
booktitle = {17th {IEEE} Asian Test Symposium, {ATS} 2008, Sapporo, Japan, November
24-27, 2008},
pages = {265},
publisher = {{IEEE} Computer Society},
year = {2008},
url = {https://doi.org/10.1109/ATS.2008.59},
doi = {10.1109/ATS.2008.59},
timestamp = {Fri, 24 Mar 2023 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/ats/WuFSWCYWM08.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/ats/YamaguchiI08,
author = {Takahiro J. Yamaguchi and
Masahiro Ishida},
title = {Total Jitter Measurement for Testing {HSIO} Integrated SoCs},
booktitle = {17th {IEEE} Asian Test Symposium, {ATS} 2008, Sapporo, Japan, November
24-27, 2008},
pages = {194},
publisher = {{IEEE} Computer Society},
year = {2008},
url = {https://doi.org/10.1109/ATS.2008.38},
doi = {10.1109/ATS.2008.38},
timestamp = {Fri, 24 Mar 2023 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/ats/YamaguchiI08.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/ats/YiPK08,
author = {Hyunbean Yi and
Sungju Park and
Sandip Kundu},
title = {A Design-for-Debug (DfD) for NoC-Based SoC Debugging via NoC},
booktitle = {17th {IEEE} Asian Test Symposium, {ATS} 2008, Sapporo, Japan, November
24-27, 2008},
pages = {289--294},
publisher = {{IEEE} Computer Society},
year = {2008},
url = {https://doi.org/10.1109/ATS.2008.15},
doi = {10.1109/ATS.2008.15},
timestamp = {Fri, 24 Mar 2023 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/ats/YiPK08.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/ats/YogiA08,
author = {Nitin Yogi and
Vishwani D. Agrawal},
title = {Sequential Circuit {BIST} Synthesis Using Spectrum and Noise from
{ATPG} Patterns},
booktitle = {17th {IEEE} Asian Test Symposium, {ATS} 2008, Sapporo, Japan, November
24-27, 2008},
pages = {69--74},
publisher = {{IEEE} Computer Society},
year = {2008},
url = {https://doi.org/10.1109/ATS.2008.64},
doi = {10.1109/ATS.2008.64},
timestamp = {Fri, 24 Mar 2023 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/ats/YogiA08.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/ats/YuYOF08,
author = {Thomas Edison Yu and
Tomokazu Yoneda and
Satoshi Ohtake and
Hideo Fujiwara},
title = {Identifying Non-Robust Untestable {RTL} Paths in Circuits with Multi-cycle
Paths},
booktitle = {17th {IEEE} Asian Test Symposium, {ATS} 2008, Sapporo, Japan, November
24-27, 2008},
pages = {125--130},
publisher = {{IEEE} Computer Society},
year = {2008},
url = {https://doi.org/10.1109/ATS.2008.55},
doi = {10.1109/ATS.2008.55},
timestamp = {Fri, 24 Mar 2023 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/ats/YuYOF08.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/ats/ZhangL008,
author = {Ying Zhang and
Huawei Li and
Xiaowei Li},
title = {Reliable Network-on-Chip Router for Crosstalk and Soft Error Tolerance},
booktitle = {17th {IEEE} Asian Test Symposium, {ATS} 2008, Sapporo, Japan, November
24-27, 2008},
pages = {438--443},
publisher = {{IEEE} Computer Society},
year = {2008},
url = {https://doi.org/10.1109/ATS.2008.35},
doi = {10.1109/ATS.2008.35},
timestamp = {Thu, 11 May 2023 01:00:00 +0200},
biburl = {https://dblp.org/rec/conf/ats/ZhangL008.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/ats/ZhuangJL08,
author = {Fei Zhuang and
Junbo Jia and
Xiangfeng Li},
title = {System Level {LBIST} Implementation},
booktitle = {17th {IEEE} Asian Test Symposium, {ATS} 2008, Sapporo, Japan, November
24-27, 2008},
pages = {263},
publisher = {{IEEE} Computer Society},
year = {2008},
url = {https://doi.org/10.1109/ATS.2008.81},
doi = {10.1109/ATS.2008.81},
timestamp = {Fri, 24 Mar 2023 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/ats/ZhuangJL08.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@proceedings{DBLP:conf/ats/2008,
title = {17th {IEEE} Asian Test Symposium, {ATS} 2008, Sapporo, Japan, November
24-27, 2008},
publisher = {{IEEE} Computer Society},
year = {2008},
url = {https://ieeexplore.ieee.org/xpl/conhome/4711536/proceeding},
isbn = {978-0-7695-3396-4},
timestamp = {Wed, 16 Oct 2019 01:00:00 +0200},
biburl = {https://dblp.org/rec/conf/ats/2008.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/ats/Abraham07,
author = {Jacob Abraham},
title = {Keynote Speech 1: New Paths for Test},
booktitle = {16th Asian Test Symposium, {ATS} 2007, Beijing, China, October 8-11,
2007},
pages = {3},
publisher = {{IEEE}},
year = {2007},
url = {https://doi.org/10.1109/ATS.2007.105},
doi = {10.1109/ATS.2007.105},
timestamp = {Wed, 09 Nov 2022 21:30:34 +0100},
biburl = {https://dblp.org/rec/conf/ats/Abraham07.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/ats/AkbaySC07,
author = {Selim Sermet Akbay and
Shreyas Sen and
Abhijit Chatterjee},
title = {Testing {RF} Components with Supply Current Signatures},
booktitle = {16th Asian Test Symposium, {ATS} 2007, Beijing, China, October 8-11,
2007},
pages = {393--398},
publisher = {{IEEE}},
year = {2007},
url = {https://doi.org/10.1109/ATS.2007.87},
doi = {10.1109/ATS.2007.87},
timestamp = {Wed, 09 Nov 2022 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/ats/AkbaySC07.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/ats/AzaisLR07,
author = {Florence Aza{\"{\i}}s and
Laurent Larguier and
Michel Renovell},
title = {Impact of Simultaneous Switching Noise on the Static behavior of Digital
{CMOS} Circuits},
booktitle = {16th Asian Test Symposium, {ATS} 2007, Beijing, China, October 8-11,
2007},
pages = {239--244},
publisher = {{IEEE}},
year = {2007},
url = {https://doi.org/10.1109/ATS.2007.73},
doi = {10.1109/ATS.2007.73},
timestamp = {Wed, 09 Nov 2022 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/ats/AzaisLR07.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/ats/BastianGGLNPV07,
author = {Magali Bastian and
Vincent Gouin and
Patrick Girard and
Christian Landrault and
Alexandre Ney and
Serge Pravossoudovitch and
Arnaud Virazel},
title = {Influence of Threshold Voltage Deviations on 90nm {SRAM} Core-Cell
Behavior},
booktitle = {16th Asian Test Symposium, {ATS} 2007, Beijing, China, October 8-11,
2007},
pages = {507--510},
publisher = {{IEEE}},
year = {2007},
url = {https://doi.org/10.1109/ATS.2007.121},
doi = {10.1109/ATS.2007.121},
timestamp = {Tue, 21 Mar 2023 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/ats/BastianGGLNPV07.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/ats/BementK07,
author = {David Bement and
David Karr},
title = {Bluetooth Hopping {BER} Testing Methodologies on a Production Test
Platform},
booktitle = {16th Asian Test Symposium, {ATS} 2007, Beijing, China, October 8-11,
2007},
pages = {517},
publisher = {{IEEE}},
year = {2007},
url = {https://doi.org/10.1109/ATS.2007.44},
doi = {10.1109/ATS.2007.44},
timestamp = {Wed, 09 Nov 2022 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/ats/BementK07.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/ats/Chakravadhanula07,
author = {Krishna Chakravadhanula and
Nitin Parimi and
Brian Foutz and
Bing Li and
Vivek Chickermane},
title = {Low Power Reduced Pin Count Test Methodology},
booktitle = {16th Asian Test Symposium, {ATS} 2007, Beijing, China, October 8-11,
2007},
pages = {251--258},
publisher = {{IEEE}},
year = {2007},
url = {https://doi.org/10.1109/ATS.2007.81},
doi = {10.1109/ATS.2007.81},
timestamp = {Wed, 09 Nov 2022 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/ats/Chakravadhanula07.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/ats/ChenKBSL07,
author = {Bo{-}Hua Chen and
Wei{-}Chung Kao and
Bing{-}Chuan Bai and
Shyue{-}Tsong Shen and
James C.{-}M. Li},
title = {Response Inversion Scan Cell {(RISC):} {A} Peak Capture Power Reduction
Technique},
booktitle = {16th Asian Test Symposium, {ATS} 2007, Beijing, China, October 8-11,
2007},
pages = {425--432},
publisher = {{IEEE}},
year = {2007},
url = {https://doi.org/10.1109/ATS.2007.74},
doi = {10.1109/ATS.2007.74},
timestamp = {Tue, 06 Dec 2022 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/ats/ChenKBSL07.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/ats/ChenO07,
author = {Mingjing Chen and
Alex Orailoglu},
title = {Improving Circuit Robustness with Cost-Effective Soft-Error-Tolerant
Sequential Elements},
booktitle = {16th Asian Test Symposium, {ATS} 2007, Beijing, China, October 8-11,
2007},
pages = {307--312},
publisher = {{IEEE}},
year = {2007},
url = {https://doi.org/10.1109/ATS.2007.51},
doi = {10.1109/ATS.2007.51},
timestamp = {Wed, 09 Nov 2022 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/ats/ChenO07.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/ats/ChenS07,
author = {Hung{-}Kai Chen and
Chauchin Su},
title = {A Test and Diagnosis Methodology for {RF} Transceivers},
booktitle = {16th Asian Test Symposium, {ATS} 2007, Beijing, China, October 8-11,
2007},
pages = {135--138},
publisher = {{IEEE}},
year = {2007},
url = {https://doi.org/10.1109/ATS.2007.29},
doi = {10.1109/ATS.2007.29},
timestamp = {Fri, 11 Nov 2022 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/ats/ChenS07.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/ats/ChengAMMWW07,
author = {Jacob Abraham and
Salvador Mir and
Yinghua Min and
Jeremy Wang and
Cheng{-}Wen Wu},
title = {Test Education in the Global Economy},
booktitle = {16th Asian Test Symposium, {ATS} 2007, Beijing, China, October 8-11,
2007},
pages = {53},
publisher = {{IEEE}},
year = {2007},
url = {https://doi.org/10.1109/ATS.2007.110},
doi = {10.1109/ATS.2007.110},
timestamp = {Thu, 11 May 2023 01:00:00 +0200},
biburl = {https://dblp.org/rec/conf/ats/ChengAMMWW07.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/ats/ChengLC07,
author = {Nai{-}Chen Daniel Cheng and
Yu Lee and
Ji{-}Jan Chen},
title = {A 2-ps Resolution Wide Range {BIST} Circuit for Jitter Measurement},
booktitle = {16th Asian Test Symposium, {ATS} 2007, Beijing, China, October 8-11,
2007},
pages = {219--223},
publisher = {{IEEE}},
year = {2007},
url = {https://doi.org/10.1109/ATS.2007.46},
doi = {10.1109/ATS.2007.46},
timestamp = {Wed, 09 Nov 2022 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/ats/ChengLC07.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/ats/Chew07,
author = {Choon{-}Sang Chew},
title = {Issues Regarding New Product Release in Semiconductor Manufacturing},
booktitle = {16th Asian Test Symposium, {ATS} 2007, Beijing, China, October 8-11,
2007},
pages = {473},
publisher = {{IEEE}},
year = {2007},
url = {https://doi.org/10.1109/ATS.2007.16},
doi = {10.1109/ATS.2007.16},
timestamp = {Wed, 09 Nov 2022 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/ats/Chew07.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/ats/Chien07,
author = {Kary Chien},
title = {Invited Talk 3: Foundry Full-Scale Reliability Testing Capability
Setup for Advanced Technology},
booktitle = {16th Asian Test Symposium, {ATS} 2007, Beijing, China, October 8-11,
2007},
pages = {9},
publisher = {{IEEE}},
year = {2007},
url = {https://doi.org/10.1109/ATS.2007.109},
doi = {10.1109/ATS.2007.109},
timestamp = {Wed, 09 Nov 2022 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/ats/Chien07.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/ats/ChunKK07,
author = {Sunghoon Chun and
YongJoon Kim and
Sungho Kang},
title = {High-MDSI: {A} High-level Signal Integrity Fault Test Pattern Generation
Method for Interconnects},
booktitle = {16th Asian Test Symposium, {ATS} 2007, Beijing, China, October 8-11,
2007},
pages = {115--120},
publisher = {{IEEE}},
year = {2007},
url = {https://doi.org/10.1109/ATS.2007.58},
doi = {10.1109/ATS.2007.58},
timestamp = {Tue, 27 Feb 2024 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/ats/ChunKK07.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/ats/DasH07,
author = {Ramashis Das and
John P. Hayes},
title = {Monitoring Transient Errors in Sequential Circuits},
booktitle = {16th Asian Test Symposium, {ATS} 2007, Beijing, China, October 8-11,
2007},
pages = {319--322},
publisher = {{IEEE}},
year = {2007},
url = {https://doi.org/10.1109/ATS.2007.84},
doi = {10.1109/ATS.2007.84},
timestamp = {Wed, 09 Nov 2022 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/ats/DasH07.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/ats/DenqW07,
author = {Li{-}Ming Denq and
Cheng{-}Wen Wu},
title = {A Hybrid {BIST} Scheme for Multiple Heterogeneous Embedded Memories},
booktitle = {16th Asian Test Symposium, {ATS} 2007, Beijing, China, October 8-11,
2007},
pages = {349--354},
publisher = {{IEEE}},
year = {2007},
url = {https://doi.org/10.1109/ATS.2007.12},
doi = {10.1109/ATS.2007.12},
timestamp = {Wed, 09 Nov 2022 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/ats/DenqW07.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/ats/EggersglussD07,
author = {Stephan Eggersgl{\"{u}}{\ss} and
Rolf Drechsler},
title = {Improving Test Pattern Compactness in SAT-based {ATPG}},
booktitle = {16th Asian Test Symposium, {ATS} 2007, Beijing, China, October 8-11,
2007},
pages = {445--452},
publisher = {{IEEE}},
year = {2007},
url = {https://doi.org/10.1109/ATS.2007.14},
doi = {10.1109/ATS.2007.14},
timestamp = {Wed, 09 Nov 2022 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/ats/EggersglussD07.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/ats/El-MalehAA07,
author = {Aiman H. El{-}Maleh and
Mustafa Imran Ali and
Ahmad A. Al{-}Yamani},
title = {A Reconfigurable Broadcast Scan Compression Scheme Using Relaxation
Based Test Vector Decompos},
booktitle = {16th Asian Test Symposium, {ATS} 2007, Beijing, China, October 8-11,
2007},
pages = {91--94},
publisher = {{IEEE}},
year = {2007},
url = {https://doi.org/10.1109/ATS.2007.41},
doi = {10.1109/ATS.2007.41},
timestamp = {Wed, 09 Nov 2022 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/ats/El-MalehAA07.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/ats/EngelkeBPRB07,
author = {Piet Engelke and
Bettina Braitling and
Ilia Polian and
Michel Renovell and
Bernd Becker},
title = {{SUPERB:} Simulator Utilizing Parallel Evaluation of Resistive Bridges},
booktitle = {16th Asian Test Symposium, {ATS} 2007, Beijing, China, October 8-11,
2007},
pages = {433--438},
publisher = {{IEEE}},
year = {2007},
url = {https://doi.org/10.1109/ATS.2007.71},
doi = {10.1109/ATS.2007.71},
timestamp = {Wed, 09 Nov 2022 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/ats/EngelkeBPRB07.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/ats/FanHW07,
author = {Xiaoxin Fan and
Yu Hu and
Laung{-}Terng Wang},
title = {An On-Chip Test Clock Control Scheme for Multi-Clock At-Speed Testing},
booktitle = {16th Asian Test Symposium, {ATS} 2007, Beijing, China, October 8-11,
2007},
pages = {341--348},
publisher = {{IEEE}},
year = {2007},
url = {https://doi.org/10.1109/ATS.2007.61},
doi = {10.1109/ATS.2007.61},
timestamp = {Wed, 09 Nov 2022 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/ats/FanHW07.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/ats/FanLH07,
author = {Jenny Fan and
Xiao{-}Yu Li and
Ismed Hartanto},
title = {Using {FPGA} configuration memory to accelerate yield learning for
advanced process},
booktitle = {16th Asian Test Symposium, {ATS} 2007, Beijing, China, October 8-11,
2007},
pages = {511--516},
publisher = {{IEEE}},
year = {2007},
url = {https://doi.org/10.1109/ATS.2007.24},
doi = {10.1109/ATS.2007.24},
timestamp = {Wed, 09 Nov 2022 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/ats/FanLH07.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/ats/FangZDX07,
author = {Liquan Fang and
Yang Zhong and
H. van de Donk and
Yizi Xing},
title = {Implementation of Defect Oriented Testing and {ICCQ} testing for industrial
mixed-signal {IC}},
booktitle = {16th Asian Test Symposium, {ATS} 2007, Beijing, China, October 8-11,
2007},
pages = {404--412},
publisher = {{IEEE}},
year = {2007},
url = {https://doi.org/10.1109/ATS.2007.93},
doi = {10.1109/ATS.2007.93},
timestamp = {Wed, 09 Nov 2022 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/ats/FangZDX07.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/ats/GiriCC07,
author = {Chandan Giri and
Pradeep Kumar Choudhary and
Santanu Chattopadhyay},
title = {Scan Power Reduction Through Scan Architecture Modification And Test
Vector Reordering},
booktitle = {16th Asian Test Symposium, {ATS} 2007, Beijing, China, October 8-11,
2007},
pages = {419--424},
publisher = {{IEEE}},
year = {2007},
url = {https://doi.org/10.1109/ATS.2007.23},
doi = {10.1109/ATS.2007.23},
timestamp = {Wed, 09 Nov 2022 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/ats/GiriCC07.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/ats/GuoHC07,
author = {Ruifeng Guo and
Yu Huang and
Wu{-}Tung Cheng},
title = {Fault Dictionary Based Scan Chain Failure Diagnosis},
booktitle = {16th Asian Test Symposium, {ATS} 2007, Beijing, China, October 8-11,
2007},
pages = {45--52},
publisher = {{IEEE}},
year = {2007},
url = {https://doi.org/10.1109/ATS.2007.43},
doi = {10.1109/ATS.2007.43},
timestamp = {Wed, 09 Nov 2022 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/ats/GuoHC07.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/ats/HashizumeHNYM07,
author = {Masaki Hashizume and
Yutaka Hata and
Tomomi Nishida and
Hiroyuki Yotsuyanagi and
Yukiya Miura},
title = {Current Testable Design of Resistor String DACs},
booktitle = {16th Asian Test Symposium, {ATS} 2007, Beijing, China, October 8-11,
2007},
pages = {399--403},
publisher = {{IEEE}},
year = {2007},
url = {https://doi.org/10.1109/ATS.2007.94},
doi = {10.1109/ATS.2007.94},
timestamp = {Wed, 09 Nov 2022 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/ats/HashizumeHNYM07.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/ats/HigamiSTKT07,
author = {Yoshinobu Higami and
Kewal K. Saluja and
Hiroshi Takahashi and
Shin{-}ya Kobayashi and
Yuzo Takamatsu},
title = {Test Generation for Transistor Shorts using Stuck-at Fault Simulator
and Test Generator},
booktitle = {16th Asian Test Symposium, {ATS} 2007, Beijing, China, October 8-11,
2007},
pages = {271--274},
publisher = {{IEEE}},
year = {2007},
url = {https://doi.org/10.1109/ATS.2007.64},
doi = {10.1109/ATS.2007.64},
timestamp = {Wed, 09 Nov 2022 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/ats/HigamiSTKT07.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/ats/HongC07,
author = {Dongwoo Hong and
Kwang{-}Ting Cheng},
title = {An Accurate Jitter Estimation Technique for Efficient High Speed {I/O}
Testing},
booktitle = {16th Asian Test Symposium, {ATS} 2007, Beijing, China, October 8-11,
2007},
pages = {224--229},
publisher = {{IEEE}},
year = {2007},
url = {https://doi.org/10.1109/ATS.2007.77},
doi = {10.1109/ATS.2007.77},
timestamp = {Wed, 09 Nov 2022 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/ats/HongC07.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/ats/HosokawaIF07,
author = {Toshinori Hosokawa and
Ryoichi Inoue and
Hideo Fujiwara},
title = {Fault-dependent/independent Test Generation Methods for State Observable
FSMs},
booktitle = {16th Asian Test Symposium, {ATS} 2007, Beijing, China, October 8-11,
2007},
pages = {275--280},
publisher = {{IEEE}},
year = {2007},
url = {https://doi.org/10.1109/ATS.2007.59},
doi = {10.1109/ATS.2007.59},
timestamp = {Wed, 09 Nov 2022 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/ats/HosokawaIF07.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/ats/HsiehHLH07,
author = {Hsieh{-}Hung Hsieh and
Yen{-}Chih Huang and
Liang{-}Hung Lu and
Guo{-}Wei Huang},
title = {A {BIST} Technique for {RF} Voltage-Controlled Oscillators},
booktitle = {16th Asian Test Symposium, {ATS} 2007, Beijing, China, October 8-11,
2007},
pages = {143--148},
publisher = {{IEEE}},
year = {2007},
url = {https://doi.org/10.1109/ATS.2007.31},
doi = {10.1109/ATS.2007.31},
timestamp = {Wed, 09 Nov 2022 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/ats/HsiehHLH07.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/ats/HsiehLY07,
author = {Tong{-}Yu Hsieh and
Kuen{-}Jong Lee and
Jian{-}Jhih You},
title = {Test Efficiency Analysis and Improvement of {SOC} Test Platforms},
booktitle = {16th Asian Test Symposium, {ATS} 2007, Beijing, China, October 8-11,
2007},
pages = {463--466},
publisher = {{IEEE}},
year = {2007},
url = {https://doi.org/10.1109/ATS.2007.67},
doi = {10.1109/ATS.2007.67},
timestamp = {Wed, 09 Nov 2022 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/ats/HsiehLY07.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/ats/HsuTH07,
author = {Hsuan{-}Jung Hsu and
Chun{-}Chieh Tu and
Shi{-}Yu Huang},
title = {Built-In Speed Grading with a Process-Tolerant {ADPLL}},
booktitle = {16th Asian Test Symposium, {ATS} 2007, Beijing, China, October 8-11,
2007},
pages = {384--392},
publisher = {{IEEE}},
year = {2007},
url = {https://doi.org/10.1109/ATS.2007.38},
doi = {10.1109/ATS.2007.38},
timestamp = {Wed, 09 Nov 2022 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/ats/HsuTH07.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/ats/HuangG07,
author = {I{-}De Huang and
Sandeep K. Gupta},
title = {On Generating Vectors That Invoke High Circuit Delays - Delay Testing
and Dynamic Timing Analysis},
booktitle = {16th Asian Test Symposium, {ATS} 2007, Beijing, China, October 8-11,
2007},
pages = {485--492},
publisher = {{IEEE}},
year = {2007},
url = {https://doi.org/10.1109/ATS.2007.119},
doi = {10.1109/ATS.2007.119},
timestamp = {Fri, 22 Sep 2023 01:00:00 +0200},
biburl = {https://dblp.org/rec/conf/ats/HuangG07.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/ats/HuangL07,
author = {Yu Huang and
Xijiang Lin},
title = {Programmable Logic {BIST} for At-speed Test},
booktitle = {16th Asian Test Symposium, {ATS} 2007, Beijing, China, October 8-11,
2007},
pages = {295--300},
publisher = {{IEEE}},
year = {2007},
url = {https://doi.org/10.1109/ATS.2007.83},
doi = {10.1109/ATS.2007.83},
timestamp = {Wed, 09 Nov 2022 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/ats/HuangL07.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/ats/HuangMCA07,
author = {Yu Huang and
Nilanjan Mukherjee and
Wu{-}Tung Cheng and
Greg Aldrich},
title = {A {RTL} Testability Analyzer Based on Logical Virtual Prototyping},
booktitle = {16th Asian Test Symposium, {ATS} 2007, Beijing, China, October 8-11,
2007},
pages = {121--124},
publisher = {{IEEE}},
year = {2007},
url = {https://doi.org/10.1109/ATS.2007.82},
doi = {10.1109/ATS.2007.82},
timestamp = {Wed, 09 Nov 2022 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/ats/HuangMCA07.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/ats/HussinYF07,
author = {Fawnizu Azmadi Hussin and
Tomokazu Yoneda and
Hideo Fujiwara},
title = {Area Overhead and Test Time Co-Optimization through NoC Bandwidth
Sharing},
booktitle = {16th Asian Test Symposium, {ATS} 2007, Beijing, China, October 8-11,
2007},
pages = {459--462},
publisher = {{IEEE}},
year = {2007},
url = {https://doi.org/10.1109/ATS.2007.22},
doi = {10.1109/ATS.2007.22},
timestamp = {Wed, 09 Nov 2022 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/ats/HussinYF07.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/ats/IchiharaSNI07,
author = {Hideyuki Ichihara and
Yukinori Setohara and
Yusuke Nakashima and
Tomoo Inoue},
title = {Test Compression / Decompression Based on {JPEG} {VLC} Algorithm},
booktitle = {16th Asian Test Symposium, {ATS} 2007, Beijing, China, October 8-11,
2007},
pages = {87--90},
publisher = {{IEEE}},
year = {2007},
url = {https://doi.org/10.1109/ATS.2007.60},
doi = {10.1109/ATS.2007.60},
timestamp = {Wed, 09 Nov 2022 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/ats/IchiharaSNI07.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/ats/IngelssonRKAH07,
author = {Urban Ingelsson and
Paul M. Rosinger and
S. Saqib Khursheed and
Bashir M. Al{-}Hashimi and
Peter Harrod},
title = {Resistive Bridging Faults {DFT} with Adaptive Power Management Awareness},
booktitle = {16th Asian Test Symposium, {ATS} 2007, Beijing, China, October 8-11,
2007},
pages = {101--106},
publisher = {{IEEE}},
year = {2007},
url = {https://doi.org/10.1109/ATS.2007.69},
doi = {10.1109/ATS.2007.69},
timestamp = {Wed, 09 Nov 2022 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/ats/IngelssonRKAH07.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/ats/IrajpourGB07,
author = {Shahdad Irajpour and
Sandeep K. Gupta and
Melvin A. Breuer},
title = {Improving Timing-Independent Testing of Crosstalk Using Realistic
Assumptions on Delay Faults},
booktitle = {16th Asian Test Symposium, {ATS} 2007, Beijing, China, October 8-11,
2007},
pages = {57--64},
publisher = {{IEEE}},
year = {2007},
url = {https://doi.org/10.1109/ATS.2007.86},
doi = {10.1109/ATS.2007.86},
timestamp = {Thu, 21 Sep 2023 01:00:00 +0200},
biburl = {https://dblp.org/rec/conf/ats/IrajpourGB07.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/ats/JasNP07,
author = {Abhijit Jas and
Suriyaprakash Natarajan and
Srinivas Patil},
title = {The Region-Exhaustive Fault Model},
booktitle = {16th Asian Test Symposium, {ATS} 2007, Beijing, China, October 8-11,
2007},
pages = {13--18},
publisher = {{IEEE}},
year = {2007},
url = {https://doi.org/10.1109/ATS.2007.78},
doi = {10.1109/ATS.2007.78},
timestamp = {Wed, 09 Nov 2022 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/ats/JasNP07.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/ats/KangSM07,
author = {Jian Kang and
Sharad C. Seth and
Shashank K. Mehta},
title = {Symbolic Path Sensitization Analysis and Applications},
booktitle = {16th Asian Test Symposium, {ATS} 2007, Beijing, China, October 8-11,
2007},
pages = {439--444},
publisher = {{IEEE}},
year = {2007},
url = {https://doi.org/10.1109/ATS.2007.21},
doi = {10.1109/ATS.2007.21},
timestamp = {Wed, 09 Nov 2022 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/ats/KangSM07.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/ats/KawamuraO07,
author = {Wataru Kawamura and
Takeshi Onodera},
title = {Experimental Results of Transition Fault Simulation with {DC} Scan
Tests},
booktitle = {16th Asian Test Symposium, {ATS} 2007, Beijing, China, October 8-11,
2007},
pages = {212},
publisher = {{IEEE}},
year = {2007},
url = {https://doi.org/10.1109/ATS.2007.50},
doi = {10.1109/ATS.2007.50},
timestamp = {Wed, 09 Nov 2022 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/ats/KawamuraO07.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/ats/KellerJU07,
author = {Brion L. Keller and
Tom Jackson and
Anis Uzzaman},
title = {A Review of Power Strategies for {DFT} and {ATPG}},
booktitle = {16th Asian Test Symposium, {ATS} 2007, Beijing, China, October 8-11,
2007},
pages = {213},
publisher = {{IEEE}},
year = {2007},
url = {https://doi.org/10.1109/ATS.2007.88},
doi = {10.1109/ATS.2007.88},
timestamp = {Wed, 09 Nov 2022 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/ats/KellerJU07.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/ats/KellerULS07,
author = {Brion L. Keller and
Anis Uzzaman and
Bibo Li and
Thomas J. Snethen},
title = {Using Programmable On-Product Clock Generation {(OPCG)} for Delay
Test},
booktitle = {16th Asian Test Symposium, {ATS} 2007, Beijing, China, October 8-11,
2007},
pages = {69--72},
publisher = {{IEEE}},
year = {2007},
url = {https://doi.org/10.1109/ATS.2007.76},
doi = {10.1109/ATS.2007.76},
timestamp = {Wed, 09 Nov 2022 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/ats/KellerULS07.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/ats/KohiyamaRSWZ07,
author = {Yasuharu Kohiyama and
C. P. Ravikumar and
Yasuo Sato and
Laung{-}Terng Wang and
Yervant Zorian},
title = {Next Generation Test, Diagnostics and Yield Challenges for EDA, ATE,
{IP} and Fab - {A} Perspective from All Sides},
booktitle = {16th Asian Test Symposium, {ATS} 2007, Beijing, China, October 8-11,
2007},
pages = {207},
publisher = {{IEEE}},
year = {2007},
url = {https://doi.org/10.1109/ATS.2007.111},
doi = {10.1109/ATS.2007.111},
timestamp = {Wed, 09 Nov 2022 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/ats/KohiyamaRSWZ07.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/ats/LaiCR07,
author = {Liyang Lai and
Wu{-}Tung Cheng and
Thomas Rinderknecht},
title = {Programmable Scan-Based Logic Built-In Self Test},
booktitle = {16th Asian Test Symposium, {ATS} 2007, Beijing, China, October 8-11,
2007},
pages = {371--377},
publisher = {{IEEE}},
year = {2007},
url = {https://doi.org/10.1109/ATS.2007.45},
doi = {10.1109/ATS.2007.45},
timestamp = {Wed, 09 Nov 2022 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/ats/LaiCR07.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/ats/LaiW07,
author = {Nan{-}Cheng Lai and
Sying{-}Jyan Wang},
title = {Low-Capture-Power Test Generation by Specifying {A} Minimum Set of
Controlling Inputs},
booktitle = {16th Asian Test Symposium, {ATS} 2007, Beijing, China, October 8-11,
2007},
pages = {413--418},
publisher = {{IEEE}},
year = {2007},
url = {https://doi.org/10.1109/ATS.2007.32},
doi = {10.1109/ATS.2007.32},
timestamp = {Tue, 06 Dec 2022 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/ats/LaiW07.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/ats/LeiHL07,
author = {Shaohua Lei and
Yinhe Han and
Xiaowei Li},
title = {Frequency Analysis Method for Propagation of Transient Errors in Combinational
Logic},
booktitle = {16th Asian Test Symposium, {ATS} 2007, Beijing, China, October 8-11,
2007},
pages = {323--328},
publisher = {{IEEE}},
year = {2007},
url = {https://doi.org/10.1109/ATS.2007.35},
doi = {10.1109/ATS.2007.35},
timestamp = {Tue, 23 May 2023 01:00:00 +0200},
biburl = {https://dblp.org/rec/conf/ats/LeiHL07.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/ats/Li07,
author = {Jin{-}Fu Li},
title = {Testing Comparison Faults of Ternary Content Addressable Memories
with Asymmetric Cells},
booktitle = {16th Asian Test Symposium, {ATS} 2007, Beijing, China, October 8-11,
2007},
pages = {501--506},
publisher = {{IEEE}},
year = {2007},
url = {https://doi.org/10.1109/ATS.2007.68},
doi = {10.1109/ATS.2007.68},
timestamp = {Tue, 17 Oct 2023 01:00:00 +0200},
biburl = {https://dblp.org/rec/conf/ats/Li07.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/ats/LinKR07,
author = {Xijiang Lin and
Mark Kassab and
Janusz Rajski},
title = {Test Generation for Timing-Critical Transition Faults},
booktitle = {16th Asian Test Symposium, {ATS} 2007, Beijing, China, October 8-11,
2007},
pages = {493--500},
publisher = {{IEEE}},
year = {2007},
url = {https://doi.org/10.1109/ATS.2007.120},
doi = {10.1109/ATS.2007.120},
timestamp = {Wed, 09 Nov 2022 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/ats/LinKR07.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/ats/LiuWH07,
author = {Chunsheng Liu and
Yang Wu and
Yu Huang},
title = {Effect of IR-Drop on Path Delay Testing Using Statistical Analysis},
booktitle = {16th Asian Test Symposium, {ATS} 2007, Beijing, China, October 8-11,
2007},
pages = {245--250},
publisher = {{IEEE}},
year = {2007},
url = {https://doi.org/10.1109/ATS.2007.89},
doi = {10.1109/ATS.2007.89},
timestamp = {Wed, 09 Nov 2022 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/ats/LiuWH07.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/ats/LizarragaMS07,
author = {Livier Lizarraga and
Salvador Mir and
Gilles Sicard},
title = {Evaluation of a {BIST} Technique for {CMOS} Imagers},
booktitle = {16th Asian Test Symposium, {ATS} 2007, Beijing, China, October 8-11,
2007},
pages = {378--383},
publisher = {{IEEE}},
year = {2007},
url = {https://doi.org/10.1109/ATS.2007.62},
doi = {10.1109/ATS.2007.62},
timestamp = {Wed, 09 Nov 2022 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/ats/LizarragaMS07.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/ats/LuL07,
author = {Sean Lu and
Dee{-}Won Lee},
title = {Integrated Test Solution for embedded {UHF/RF} {SOC}},
booktitle = {16th Asian Test Symposium, {ATS} 2007, Beijing, China, October 8-11,
2007},
pages = {475},
publisher = {{IEEE}},
year = {2007},
url = {https://doi.org/10.1109/ATS.2007.117},
doi = {10.1109/ATS.2007.117},
timestamp = {Wed, 09 Nov 2022 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/ats/LuL07.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/ats/Maeda07,
author = {Akinori Maeda},
title = {How the noise floor affects the production yield},
booktitle = {16th Asian Test Symposium, {ATS} 2007, Beijing, China, October 8-11,
2007},
pages = {474},
publisher = {{IEEE}},
year = {2007},
url = {https://doi.org/10.1109/ATS.2007.116},
doi = {10.1109/ATS.2007.116},
timestamp = {Wed, 09 Nov 2022 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/ats/Maeda07.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/ats/Mak07,
author = {T. M. Mak},
title = {Invited Talk 1: Testing of Power Constraint Computing},
booktitle = {16th Asian Test Symposium, {ATS} 2007, Beijing, China, October 8-11,
2007},
pages = {6},
publisher = {{IEEE}},
year = {2007},
url = {https://doi.org/10.1109/ATS.2007.107},
doi = {10.1109/ATS.2007.107},
timestamp = {Wed, 09 Nov 2022 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/ats/Mak07.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/ats/MoghaddamH07,
author = {Elham K. Moghaddam and
Shaahin Hessabi},
title = {An On-Line {BIST} Technique for Delay Fault Detection in {CMOS} Circuits},
booktitle = {16th Asian Test Symposium, {ATS} 2007, Beijing, China, October 8-11,
2007},
pages = {73--78},
publisher = {{IEEE}},
year = {2007},
url = {https://doi.org/10.1109/ATS.2007.100},
doi = {10.1109/ATS.2007.100},
timestamp = {Wed, 09 Nov 2022 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/ats/MoghaddamH07.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/ats/MolaviM07,
author = {Shawn Molavi and
Toby McPheeters},
title = {Concurrent Test Implementations},
booktitle = {16th Asian Test Symposium, {ATS} 2007, Beijing, China, October 8-11,
2007},
pages = {214},
publisher = {{IEEE}},
year = {2007},
url = {https://doi.org/10.1109/ATS.2007.101},
doi = {10.1109/ATS.2007.101},
timestamp = {Wed, 09 Nov 2022 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/ats/MolaviM07.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/ats/MuradaliR07,
author = {Fidel Muradali and
Jochen Rivoir},
title = {Special Session: Analog Production Test},
booktitle = {16th Asian Test Symposium, {ATS} 2007, Beijing, China, October 8-11,
2007},
pages = {523},
publisher = {{IEEE}},
year = {2007},
url = {https://doi.org/10.1109/ATS.2007.56},
doi = {10.1109/ATS.2007.56},
timestamp = {Wed, 09 Nov 2022 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/ats/MuradaliR07.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/ats/NabiSMN07,
author = {Majid Nabi and
Hamid Shojaei and
Siamak Mohammadi and
Zainalabedin Navabi},
title = {Optimized Assignment Coverage Computation in Formal Verification of
Digital Systems},
booktitle = {16th Asian Test Symposium, {ATS} 2007, Beijing, China, October 8-11,
2007},
pages = {172--177},
publisher = {{IEEE}},
year = {2007},
url = {https://doi.org/10.1109/ATS.2007.40},
doi = {10.1109/ATS.2007.40},
timestamp = {Wed, 09 Nov 2022 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/ats/NabiSMN07.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/ats/PngLNO07,
author = {Yu Wei P'ng and
Moo Kit Lee and
Peng Weng Ng and
Chin Hu Ong},
title = {{IDDQ} Test Challenges in Nanotechnologies: {A} Manufacturing Test
Strategy},
booktitle = {16th Asian Test Symposium, {ATS} 2007, Beijing, China, October 8-11,
2007},
pages = {211},
publisher = {{IEEE}},
year = {2007},
url = {https://doi.org/10.1109/ATS.2007.36},
doi = {10.1109/ATS.2007.36},
timestamp = {Wed, 09 Nov 2022 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/ats/PngLNO07.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/ats/PomeranzPP07,
author = {Irith Pomeranz and
Praveen Parvathala and
Srinivas Patil},
title = {Estimating the Fault Coverage of Functional Test Sequences Without
Fault Simulation},
booktitle = {16th Asian Test Symposium, {ATS} 2007, Beijing, China, October 8-11,
2007},
pages = {25--32},
publisher = {{IEEE}},
year = {2007},
url = {https://doi.org/10.1109/ATS.2007.18},
doi = {10.1109/ATS.2007.18},
timestamp = {Wed, 09 Nov 2022 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/ats/PomeranzPP07.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/ats/PomeranzR07,
author = {Irith Pomeranz and
Sudhakar M. Reddy},
title = {Diagnostic Test Generation Targeting Equivalence Classes},
booktitle = {16th Asian Test Symposium, {ATS} 2007, Beijing, China, October 8-11,
2007},
pages = {301--306},
publisher = {{IEEE}},
year = {2007},
url = {https://doi.org/10.1109/ATS.2007.15},
doi = {10.1109/ATS.2007.15},
timestamp = {Wed, 09 Nov 2022 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/ats/PomeranzR07.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/ats/PomeranzR07a,
author = {Irith Pomeranz and
Sudhakar M. Reddy},
title = {Enhanced Broadside Testing for Improved Transition Fault Coverage},
booktitle = {16th Asian Test Symposium, {ATS} 2007, Beijing, China, October 8-11,
2007},
pages = {479--484},
publisher = {{IEEE}},
year = {2007},
url = {https://doi.org/10.1109/ATS.2007.85},
doi = {10.1109/ATS.2007.85},
timestamp = {Wed, 09 Nov 2022 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/ats/PomeranzR07a.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/ats/QianJ07,
author = {Feng{-}An Qian and
Jian{-}Hui Jiang},
title = {An Improved Test Case Generation Method of Pair-Wise Testing},
booktitle = {16th Asian Test Symposium, {ATS} 2007, Beijing, China, October 8-11,
2007},
pages = {149--154},
publisher = {{IEEE}},
year = {2007},
url = {https://doi.org/10.1109/ATS.2007.65},
doi = {10.1109/ATS.2007.65},
timestamp = {Wed, 09 Nov 2022 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/ats/QianJ07.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/ats/RahamanKDB07,
author = {Hafizur Rahaman and
Dipak Kumar Kole and
Debesh K. Das and
Bhargab B. Bhattacharya},
title = {Optimum Test Set for Bridging Fault Detection in Reversible Circuits},
booktitle = {16th Asian Test Symposium, {ATS} 2007, Beijing, China, October 8-11,
2007},
pages = {125--128},
publisher = {{IEEE}},
year = {2007},
url = {https://doi.org/10.1109/ATS.2007.91},
doi = {10.1109/ATS.2007.91},
timestamp = {Wed, 09 Nov 2022 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/ats/RahamanKDB07.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/ats/Rivoir07,
author = {Jochen Rivoir},
title = {Fast and Low Cost {HW} Bit Map for Memory Test Based on Residue Polynomial
System over {GF(2)}},
booktitle = {16th Asian Test Symposium, {ATS} 2007, Beijing, China, October 8-11,
2007},
pages = {361--366},
publisher = {{IEEE}},
year = {2007},
url = {https://doi.org/10.1109/ATS.2007.48},
doi = {10.1109/ATS.2007.48},
timestamp = {Wed, 09 Nov 2022 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/ats/Rivoir07.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/ats/RoussetBGLPV07,
author = {Alexandre Rousset and
Alberto Bosio and
Patrick Girard and
Christian Landrault and
Serge Pravossoudovitch and
Arnaud Virazel},
title = {Fast Bridging Fault Diagnosis using Logic Information},
booktitle = {16th Asian Test Symposium, {ATS} 2007, Beijing, China, October 8-11,
2007},
pages = {33--38},
publisher = {{IEEE}},
year = {2007},
url = {https://doi.org/10.1109/ATS.2007.75},
doi = {10.1109/ATS.2007.75},
timestamp = {Wed, 09 Nov 2022 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/ats/RoussetBGLPV07.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/ats/SarmaM07,
author = {Monalisa Sarma and
Rajib Mall},
title = {System Testing using {UML} Models},
booktitle = {16th Asian Test Symposium, {ATS} 2007, Beijing, China, October 8-11,
2007},
pages = {155--158},
publisher = {{IEEE}},
year = {2007},
url = {https://doi.org/10.1109/ATS.2007.102},
doi = {10.1109/ATS.2007.102},
timestamp = {Wed, 09 Nov 2022 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/ats/SarmaM07.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/ats/SedghiAKN07,
author = {Mahshid Sedghi and
Armin Alaghi and
Elnaz Koopahi and
Zainalabedin Navabi},
title = {An HDL-Based Platform for High Level NoC Switch Testing},
booktitle = {16th Asian Test Symposium, {ATS} 2007, Beijing, China, October 8-11,
2007},
pages = {453--458},
publisher = {{IEEE}},
year = {2007},
url = {https://doi.org/10.1109/ATS.2007.97},
doi = {10.1109/ATS.2007.97},
timestamp = {Wed, 09 Nov 2022 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/ats/SedghiAKN07.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/ats/ShenZ07,
author = {Haihua Shen and
Heng Zhang},
title = {An Accurate Analysis of Microprocessor Design Verification},
booktitle = {16th Asian Test Symposium, {ATS} 2007, Beijing, China, October 8-11,
2007},
pages = {165--171},
publisher = {{IEEE}},
year = {2007},
url = {https://doi.org/10.1109/ATS.2007.95},
doi = {10.1109/ATS.2007.95},
timestamp = {Wed, 09 Nov 2022 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/ats/ShenZ07.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/ats/SongHKYP07,
author = {Jaehoon Song and
Juhee Han and
Dooyoung Kim and
Hyunbean Yi and
Sungju Park},
title = {Design Reuse of on/off-Chip Bus Bridge for Efficient Test Access to
AMBA-based SoC},
booktitle = {16th Asian Test Symposium, {ATS} 2007, Beijing, China, October 8-11,
2007},
pages = {193--198},
publisher = {{IEEE}},
year = {2007},
url = {https://doi.org/10.1109/ATS.2007.13},
doi = {10.1109/ATS.2007.13},
timestamp = {Wed, 09 Nov 2022 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/ats/SongHKYP07.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/ats/SpinnerJPEB07,
author = {Stefan Spinner and
Jie Jiang and
Ilia Polian and
Piet Engelke and
Bernd Becker},
title = {Simulating Open-Via Defects},
booktitle = {16th Asian Test Symposium, {ATS} 2007, Beijing, China, October 8-11,
2007},
pages = {265--270},
publisher = {{IEEE}},
year = {2007},
url = {https://doi.org/10.1109/ATS.2007.72},
doi = {10.1109/ATS.2007.72},
timestamp = {Thu, 11 Apr 2024 01:00:00 +0200},
biburl = {https://dblp.org/rec/conf/ats/SpinnerJPEB07.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/ats/SrinivasanCN07,
author = {Ganesh Srinivasan and
Abhijit Chatterjee and
Vishwanath Natarajan},
title = {Fourier Spectrum-Based Signature Test: {A} Genetic {CAD} Toolbox for
Reliable {RF} Testing Using Low-Performance Test Resources},
booktitle = {16th Asian Test Symposium, {ATS} 2007, Beijing, China, October 8-11,
2007},
pages = {139--142},
publisher = {{IEEE}},
year = {2007},
url = {https://doi.org/10.1109/ATS.2007.98},
doi = {10.1109/ATS.2007.98},
timestamp = {Wed, 09 Nov 2022 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/ats/SrinivasanCN07.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/ats/Taenzler07,
author = {Friedrich Taenzler},
title = {Production Test of High Volume Commercial {RFIC}},
booktitle = {16th Asian Test Symposium, {ATS} 2007, Beijing, China, October 8-11,
2007},
pages = {476},
publisher = {{IEEE}},
year = {2007},
url = {https://doi.org/10.1109/ATS.2007.118},
doi = {10.1109/ATS.2007.118},
timestamp = {Wed, 09 Nov 2022 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/ats/Taenzler07.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/ats/TakahashiHKATYT07,
author = {Hiroshi Takahashi and
Yoshinobu Higami and
Shuhei Kadoyama and
Takashi Aikyo and
Yuzo Takamatsu and
Koji Yamazaki and
Toshiyuki Tsutsumi and
Hiroyuki Yotsuyanagi and
Masaki Hashizume},
title = {Clues for Modeling and Diagnosing Open Faults with Considering Adjacent
Lines},
booktitle = {16th Asian Test Symposium, {ATS} 2007, Beijing, China, October 8-11,
2007},
pages = {39--44},
publisher = {{IEEE}},
year = {2007},
url = {https://doi.org/10.1109/ATS.2007.34},
doi = {10.1109/ATS.2007.34},
timestamp = {Wed, 09 Nov 2022 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/ats/TakahashiHKATYT07.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/ats/Taneja07,
author = {Sanjiv Taneja},
title = {Keynote Speech 2: Consumerization of Electronics and Nanometer Technologies:
Implications on Test},
booktitle = {16th Asian Test Symposium, {ATS} 2007, Beijing, China, October 8-11,
2007},
pages = {4--5},
publisher = {{IEEE}},
year = {2007},
url = {https://doi.org/10.1109/ATS.2007.106},
doi = {10.1109/ATS.2007.106},
timestamp = {Wed, 09 Nov 2022 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/ats/Taneja07.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/ats/TangLCRZ07,
author = {Huaxing Tang and
Chen Liu and
Wu{-}Tung Cheng and
Sudahkar M. Reddy and
Wei Zou},
title = {Improving Performance of Effect-Cause Diagnosis with Minimal Memory
Overhead},
booktitle = {16th Asian Test Symposium, {ATS} 2007, Beijing, China, October 8-11,
2007},
pages = {281--287},
publisher = {{IEEE}},
year = {2007},
url = {https://doi.org/10.1109/ATS.2007.47},
doi = {10.1109/ATS.2007.47},
timestamp = {Wed, 09 Nov 2022 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/ats/TangLCRZ07.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/ats/UzzamanMAAJGO07,
author = {Anis Uzzaman and
Fidel Muradali and
Takashi Aikyo and
Robert C. Aitken and
Tom Jackson and
Rajesh Galivanche and
Takeshi Onodera},
title = {Test Roles in Diagnosis and Silicon Debug},
booktitle = {16th Asian Test Symposium, {ATS} 2007, Beijing, China, October 8-11,
2007},
pages = {367},
publisher = {{IEEE}},
year = {2007},
url = {https://doi.org/10.1109/ATS.2007.112},
doi = {10.1109/ATS.2007.112},
timestamp = {Wed, 09 Nov 2022 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/ats/UzzamanMAAJGO07.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/ats/WangLL07,
author = {Sying{-}Jyan Wang and
Xin{-}Long Li and
Katherine Shu{-}Min Li},
title = {Layout-Aware Multi-Layer Multi-Level Scan Tree Synthesis},
booktitle = {16th Asian Test Symposium, {ATS} 2007, Beijing, China, October 8-11,
2007},
pages = {129--134},
publisher = {{IEEE}},
year = {2007},
url = {https://doi.org/10.1109/ATS.2007.37},
doi = {10.1109/ATS.2007.37},
timestamp = {Wed, 09 Nov 2022 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/ats/WangLL07.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/ats/WangTWL07,
author = {Sying{-}Jyan Wang and
Po{-}Chang Tsai and
Hung{-}Ming Weng and
Katherine Shu{-}Min Li},
title = {Test Data and Test Time Reduction for {LOS} Transition Test in Multi-Mode
Segmented Scan Architecture},
booktitle = {16th Asian Test Symposium, {ATS} 2007, Beijing, China, October 8-11,
2007},
pages = {95--100},
publisher = {{IEEE}},
year = {2007},
url = {https://doi.org/10.1109/ATS.2007.33},
doi = {10.1109/ATS.2007.33},
timestamp = {Wed, 09 Nov 2022 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/ats/WangTWL07.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/ats/WangWC07,
author = {Seongmoon Wang and
Wenlong Wei and
Srimat T. Chakradhar},
title = {A High Compression and Short Test Sequence Test Compression Technique
to Enhance Compressions of {LFSR} Reseeding},
booktitle = {16th Asian Test Symposium, {ATS} 2007, Beijing, China, October 8-11,
2007},
pages = {79--86},
publisher = {{IEEE}},
year = {2007},
url = {https://doi.org/10.1109/ATS.2007.52},
doi = {10.1109/ATS.2007.52},
timestamp = {Wed, 09 Nov 2022 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/ats/WangWC07.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/ats/Williams07,
author = {T. W. Williams},
title = {Invited Talk 2: {EDA} to the Rescue of the Silicon Roadmap},
booktitle = {16th Asian Test Symposium, {ATS} 2007, Beijing, China, October 8-11,
2007},
pages = {7--8},
publisher = {{IEEE}},
year = {2007},
url = {https://doi.org/10.1109/ATS.2007.108},
doi = {10.1109/ATS.2007.108},
timestamp = {Wed, 09 Nov 2022 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/ats/Williams07.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/ats/WuH07,
author = {Weixin Wu and
Michael S. Hsiao},
title = {Mining Sequential Constraints for Pseudo-Functional Testing},
booktitle = {16th Asian Test Symposium, {ATS} 2007, Beijing, China, October 8-11,
2007},
pages = {19--24},
publisher = {{IEEE}},
year = {2007},
url = {https://doi.org/10.1109/ATS.2007.66},
doi = {10.1109/ATS.2007.66},
timestamp = {Wed, 09 Nov 2022 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/ats/WuH07.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/ats/WuHH07,
author = {Meng{-}Fan Wu and
Kai{-}Shun Hu and
Jiun{-}Lang Huang},
title = {An Efficient Peak Power Reduction Technique for Scan Testing},
booktitle = {16th Asian Test Symposium, {ATS} 2007, Beijing, China, October 8-11,
2007},
pages = {111--114},
publisher = {{IEEE}},
year = {2007},
url = {https://doi.org/10.1109/ATS.2007.54},
doi = {10.1109/ATS.2007.54},
timestamp = {Wed, 09 Nov 2022 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/ats/WuHH07.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/ats/WuLWW07,
author = {Hsiang{-}Huang Wu and
Jin{-}Fu Li and
Chi{-}Feng Wu and
Cheng{-}Wen Wu},
title = {{CAMEL:} An Efficient Fault Simulator with Coupling Fault Simulation
Enhancement for CAMs},
booktitle = {16th Asian Test Symposium, {ATS} 2007, Beijing, China, October 8-11,
2007},
pages = {355--360},
publisher = {{IEEE}},
year = {2007},
url = {https://doi.org/10.1109/ATS.2007.27},
doi = {10.1109/ATS.2007.27},
timestamp = {Tue, 17 Oct 2023 01:00:00 +0200},
biburl = {https://dblp.org/rec/conf/ats/WuLWW07.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/ats/XiangCHF07,
author = {Dong Xiang and
Krishnendu Chakrabarty and
Dianwei Hu and
Hideo Fujiwara},
title = {Scan Testing for Complete Coverage of Path Delay Faults with Reduced
Test Data Volume, Test Application Time, and Hardware Cost},
booktitle = {16th Asian Test Symposium, {ATS} 2007, Beijing, China, October 8-11,
2007},
pages = {329--334},
publisher = {{IEEE}},
year = {2007},
url = {https://doi.org/10.1109/ATS.2007.20},
doi = {10.1109/ATS.2007.20},
timestamp = {Wed, 09 Nov 2022 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/ats/XiangCHF07.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/ats/Xu07,
author = {Shiyi Xu},
title = {Reconsideration of Software Reliability Measurements},
booktitle = {16th Asian Test Symposium, {ATS} 2007, Beijing, China, October 8-11,
2007},
pages = {159--164},
publisher = {{IEEE}},
year = {2007},
url = {https://doi.org/10.1109/ATS.2007.39},
doi = {10.1109/ATS.2007.39},
timestamp = {Wed, 09 Nov 2022 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/ats/Xu07.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/ats/XuS07,
author = {Gefu Xu and
Adit D. Singh},
title = {Flip-flop Selection to Maximize {TDF} Coverage with Partial Enhanced
Scan},
booktitle = {16th Asian Test Symposium, {ATS} 2007, Beijing, China, October 8-11,
2007},
pages = {335--340},
publisher = {{IEEE}},
year = {2007},
url = {https://doi.org/10.1109/ATS.2007.96},
doi = {10.1109/ATS.2007.96},
timestamp = {Wed, 09 Nov 2022 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/ats/XuS07.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/ats/Yamaguchi07,
author = {Takahiro J. Yamaguchi},
title = {Top 5 Issues in Practical Testing of High-Speed Interface Devices},
booktitle = {16th Asian Test Symposium, {ATS} 2007, Beijing, China, October 8-11,
2007},
pages = {519},
publisher = {{IEEE}},
year = {2007},
url = {https://doi.org/10.1109/ATS.2007.122},
doi = {10.1109/ATS.2007.122},
timestamp = {Wed, 09 Nov 2022 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/ats/Yamaguchi07.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/ats/YangBDZ07,
author = {Xiaoqing Yang and
Jinian Bian and
Shujun Deng and
Yanni Zhao},
title = {{EHSAT} Modeling from Algorithm Description for {RTL} Model Checking},
booktitle = {16th Asian Test Symposium, {ATS} 2007, Beijing, China, October 8-11,
2007},
pages = {178--186},
publisher = {{IEEE}},
year = {2007},
url = {https://doi.org/10.1109/ATS.2007.92},
doi = {10.1109/ATS.2007.92},
timestamp = {Wed, 09 Nov 2022 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/ats/YangBDZ07.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/ats/YangCHKK07,
author = {Wu Yang and
Wu{-}Tung Cheng and
Yu Huang and
Martin Keim and
Randy Klingenberg},
title = {Scan Diagnosis and Its Successful Industrial Applications},
booktitle = {16th Asian Test Symposium, {ATS} 2007, Beijing, China, October 8-11,
2007},
pages = {215},
publisher = {{IEEE}},
year = {2007},
url = {https://doi.org/10.1109/ATS.2007.99},
doi = {10.1109/ATS.2007.99},
timestamp = {Wed, 09 Nov 2022 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/ats/YangCHKK07.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/ats/YonedaFF07,
author = {Tomokazu Yoneda and
Yuusuke Fukuda and
Hideo Fujiwara},
title = {Test Scheduling for Memory Cores with Built-In Self-Repair},
booktitle = {16th Asian Test Symposium, {ATS} 2007, Beijing, China, October 8-11,
2007},
pages = {199--206},
publisher = {{IEEE}},
year = {2007},
url = {https://doi.org/10.1109/ATS.2007.26},
doi = {10.1109/ATS.2007.26},
timestamp = {Wed, 09 Nov 2022 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/ats/YonedaFF07.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/ats/YoshikawaOF07,
author = {Yuki Yoshikawa and
Satoshi Ohtake and
Hideo Fujiwara},
title = {False Path Identification using {RTL} Information and Its Application
to Over-testing Reduction for Delay Faults},
booktitle = {16th Asian Test Symposium, {ATS} 2007, Beijing, China, October 8-11,
2007},
pages = {65--68},
publisher = {{IEEE}},
year = {2007},
url = {https://doi.org/10.1109/ATS.2007.70},
doi = {10.1109/ATS.2007.70},
timestamp = {Wed, 09 Nov 2022 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/ats/YoshikawaOF07.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/ats/YuYCF07,
author = {Thomas Edison Yu and
Tomokazu Yoneda and
Krishnendu Chakrabarty and
Hideo Fujiwara},
title = {Thermal-Safe Test Access Mechanism and Wrapper Co-optimization for
System-on-Chip},
booktitle = {16th Asian Test Symposium, {ATS} 2007, Beijing, China, October 8-11,
2007},
pages = {187--192},
publisher = {{IEEE}},
year = {2007},
url = {https://doi.org/10.1109/ATS.2007.53},
doi = {10.1109/ATS.2007.53},
timestamp = {Wed, 09 Nov 2022 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/ats/YuYCF07.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/ats/Yue07,
author = {Deng Yue},
title = {Understanding {GSM/EDGE} Modulated Signal Test on Cellular {BB} {SOC}},
booktitle = {16th Asian Test Symposium, {ATS} 2007, Beijing, China, October 8-11,
2007},
pages = {518},
publisher = {{IEEE}},
year = {2007},
url = {https://doi.org/10.1109/ATS.2007.90},
doi = {10.1109/ATS.2007.90},
timestamp = {Wed, 09 Nov 2022 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/ats/Yue07.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/ats/ZhangAC07,
author = {Xinsong Zhang and
Simon S. Ang and
Chandra Carter},
title = {Test Point Selections for a Programmable Gain Amplifier Using {NIST}
and Wavelet Transform Methods},
booktitle = {16th Asian Test Symposium, {ATS} 2007, Beijing, China, October 8-11,
2007},
pages = {230--238},
publisher = {{IEEE}},
year = {2007},
url = {https://doi.org/10.1109/ATS.2007.28},
doi = {10.1109/ATS.2007.28},
timestamp = {Wed, 09 Nov 2022 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/ats/ZhangAC07.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/ats/ZhangH07,
author = {Shijian Zhang and
Weiwu Hu},
title = {{CREA:} {A} Checkpoint Based Reliable Micro-architecture for Superscalar
Processors},
booktitle = {16th Asian Test Symposium, {ATS} 2007, Beijing, China, October 8-11,
2007},
pages = {313--318},
publisher = {{IEEE}},
year = {2007},
url = {https://doi.org/10.1109/ATS.2007.19},
doi = {10.1109/ATS.2007.19},
timestamp = {Wed, 09 Nov 2022 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/ats/ZhangH07.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/ats/ZhangL07,
author = {Minjin Zhang and
Xiaowei Li},
title = {Test Generation for Crosstalk Glitches Considering Multiple Coupling
Effects},
booktitle = {16th Asian Test Symposium, {ATS} 2007, Beijing, China, October 8-11,
2007},
pages = {259--264},
publisher = {{IEEE}},
year = {2007},
url = {https://doi.org/10.1109/ATS.2007.30},
doi = {10.1109/ATS.2007.30},
timestamp = {Wed, 09 Nov 2022 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/ats/ZhangL07.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/ats/ZhangLZJ07,
author = {Lei Zhang and
Huaguo Liang and
Wenfa Zhan and
Cuiyun Jiang},
title = {Block Marking and Updating Coding in Test Data Compression for SoC},
booktitle = {16th Asian Test Symposium, {ATS} 2007, Beijing, China, October 8-11,
2007},
pages = {467--472},
publisher = {{IEEE}},
year = {2007},
url = {https://doi.org/10.1109/ATS.2007.57},
doi = {10.1109/ATS.2007.57},
timestamp = {Wed, 09 Nov 2022 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/ats/ZhangLZJ07.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/ats/ZhaoHF07,
author = {Dan Zhao and
Ronghua Huang and
Hideo Fujiwara},
title = {Multi-Frequency Modular Testing of SoCs by Dynamically Reconfiguring
Multi-Port {ATE}},
booktitle = {16th Asian Test Symposium, {ATS} 2007, Beijing, China, October 8-11,
2007},
pages = {107--110},
publisher = {{IEEE}},
year = {2007},
url = {https://doi.org/10.1109/ATS.2007.79},
doi = {10.1109/ATS.2007.79},
timestamp = {Wed, 09 Nov 2022 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/ats/ZhaoHF07.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/ats/ZhengCYMH07,
author = {Feijun Zheng and
Kwang{-}Ting Cheng and
Xiaolang Yan and
John Moondanos and
Ziyad Hanna},
title = {An Efficient Diagnostic Test Pattern Generation Framework Using Boolean
Satisfiability},
booktitle = {16th Asian Test Symposium, {ATS} 2007, Beijing, China, October 8-11,
2007},
pages = {288--294},
publisher = {{IEEE}},
year = {2007},
url = {https://doi.org/10.1109/ATS.2007.80},
doi = {10.1109/ATS.2007.80},
timestamp = {Wed, 09 Nov 2022 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/ats/ZhengCYMH07.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@proceedings{DBLP:conf/ats/2007,
title = {16th Asian Test Symposium, {ATS} 2007, Beijing, China, October 8-11,
2007},
publisher = {{IEEE}},
year = {2007},
url = {https://doi.org/10.1109/ATS12312.2007},
doi = {10.1109/ATS12312.2007},
isbn = {0-7695-2890-2},
timestamp = {Wed, 09 Nov 2022 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/ats/2007.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/ats/AlaghiYN06,
author = {Armin Alaghi and
Mahnaz Sadoughi Yarandi and
Zainalabedin Navabi},
title = {An Optimum {ORA} {BIST} for Multiple Fault {FPGA} Look-Up Table Testing},
booktitle = {15th Asian Test Symposium, {ATS} 2006, Fukuoka, Japan, November 20-23,
2006},
pages = {293--298},
publisher = {{IEEE}},
year = {2006},
url = {https://doi.org/10.1109/ATS.2006.261034},
doi = {10.1109/ATS.2006.261034},
timestamp = {Mon, 07 Nov 2022 17:39:00 +0100},
biburl = {https://dblp.org/rec/conf/ats/AlaghiYN06.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/ats/AldrichPKS06,
author = {Greg Aldrich and
Ron Press and
Takeo Kobayashi and
Tatsuo Sakajiri},
title = {Mentor Graphics {DFT} to Navigate Nanometer Test Challenges},
booktitle = {15th Asian Test Symposium, {ATS} 2006, Fukuoka, Japan, November 20-23,
2006},
pages = {130},
publisher = {{IEEE}},
year = {2006},
url = {https://doi.org/10.1109/ATS.2006.261008},
doi = {10.1109/ATS.2006.261008},
timestamp = {Mon, 07 Nov 2022 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/ats/AldrichPKS06.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/ats/AraiFI06,
author = {Masayuki Arai and
Satoshi Fukumoto and
Kazuhiko Iwasaki},
title = {Expansion of Convolutional Compactors over Galois Field},
booktitle = {15th Asian Test Symposium, {ATS} 2006, Fukuoka, Japan, November 20-23,
2006},
pages = {401--408},
publisher = {{IEEE}},
year = {2006},
url = {https://doi.org/10.1109/ATS.2006.260962},
doi = {10.1109/ATS.2006.260962},
timestamp = {Mon, 07 Nov 2022 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/ats/AraiFI06.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/ats/BadereddineWGCP06,
author = {Nabil Badereddine and
Zhanglei Wang and
Patrick Girard and
Krishnendu Chakrabarty and
Serge Pravossoudovitch and
Christian Landrault},
title = {Power-Aware Test Data Compression for Embedded {IP} Cores},
booktitle = {15th Asian Test Symposium, {ATS} 2006, Fukuoka, Japan, November 20-23,
2006},
pages = {5--10},
publisher = {{IEEE}},
year = {2006},
url = {https://doi.org/10.1109/ATS.2006.260985},
doi = {10.1109/ATS.2006.260985},
timestamp = {Tue, 06 Dec 2022 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/ats/BadereddineWGCP06.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/ats/BensoBCNP06,
author = {Alfredo Benso and
Alberto Bosio and
Stefano Di Carlo and
Giorgio Di Natale and
Paolo Prinetto},
title = {Memory Fault Simulator for Static-Linked Faults},
booktitle = {15th Asian Test Symposium, {ATS} 2006, Fukuoka, Japan, November 20-23,
2006},
pages = {31--36},
publisher = {{IEEE}},
year = {2006},
url = {https://doi.org/10.1109/ATS.2006.260989},
doi = {10.1109/ATS.2006.260989},
timestamp = {Tue, 07 May 2024 01:00:00 +0200},
biburl = {https://dblp.org/rec/conf/ats/BensoBCNP06.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/ats/BensoBCNP06a,
author = {Alfredo Benso and
Alberto Bosio and
Stefano Di Carlo and
Giorgio Di Natale and
Paolo Prinetto},
title = {{ATPG} for Dynamic Burn-In Test in Full-Scan Circuits},
booktitle = {15th Asian Test Symposium, {ATS} 2006, Fukuoka, Japan, November 20-23,
2006},
pages = {75--82},
publisher = {{IEEE}},
year = {2006},
url = {https://doi.org/10.1109/ATS.2006.260996},
doi = {10.1109/ATS.2006.260996},
timestamp = {Tue, 07 May 2024 01:00:00 +0200},
biburl = {https://dblp.org/rec/conf/ats/BensoBCNP06a.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/ats/BushardCFK06,
author = {Louis Bushard and
Nathan Chelstrom and
Steven Ross Ferguson and
Brion Keller},
title = {{DFT} of the Cell Processor and its Impact on {EDA} Test Softwar},
booktitle = {15th Asian Test Symposium, {ATS} 2006, Fukuoka, Japan, November 20-23,
2006},
pages = {369--374},
publisher = {{IEEE}},
year = {2006},
url = {https://doi.org/10.1109/ATS.2006.260957},
doi = {10.1109/ATS.2006.260957},
timestamp = {Mon, 07 Nov 2022 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/ats/BushardCFK06.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/ats/ChouHS06,
author = {Maohsuan Chou and
Jen{-}Chien Hsu and
Chauchin Su},
title = {A Digital {BIST} Methodology for Spread Spectrum Clock Generators},
booktitle = {15th Asian Test Symposium, {ATS} 2006, Fukuoka, Japan, November 20-23,
2006},
pages = {251--254},
publisher = {{IEEE}},
year = {2006},
url = {https://doi.org/10.1109/ATS.2006.261028},
doi = {10.1109/ATS.2006.261028},
timestamp = {Mon, 07 Nov 2022 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/ats/ChouHS06.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/ats/DenqWW06,
author = {Li{-}Ming Denq and
Tzu{-}chiang Wang and
Cheng{-}Wen Wu},
title = {An Enhanced {SRAM} {BISR} Design with Reduced Timing Penalty},
booktitle = {15th Asian Test Symposium, {ATS} 2006, Fukuoka, Japan, November 20-23,
2006},
pages = {25--30},
publisher = {{IEEE}},
year = {2006},
url = {https://doi.org/10.1109/ATS.2006.260988},
doi = {10.1109/ATS.2006.260988},
timestamp = {Sat, 30 Sep 2023 01:00:00 +0200},
biburl = {https://dblp.org/rec/conf/ats/DenqWW06.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/ats/DuMHCR06,
author = {Xiaogang Du and
Nilanjan Mukherjee and
Chris Hill and
Wu{-}Tung Cheng and
Sudhakar M. Reddy},
title = {A Field Programmable Memory {BIST} Architecture Supporting Algorithms
with Multiple Nested Loops},
booktitle = {15th Asian Test Symposium, {ATS} 2006, Fukuoka, Japan, November 20-23,
2006},
pages = {287--292},
publisher = {{IEEE}},
year = {2006},
url = {https://doi.org/10.1109/ATS.2006.261033},
doi = {10.1109/ATS.2006.261033},
timestamp = {Mon, 07 Nov 2022 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/ats/DuMHCR06.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/ats/EngelkePMRB06,
author = {Piet Engelke and
Ilia Polian and
Hans Manhaeve and
Michel Renovell and
Bernd Becker},
title = {Delta-IDDQ Testing of Resistive Short Defects},
booktitle = {15th Asian Test Symposium, {ATS} 2006, Fukuoka, Japan, November 20-23,
2006},
pages = {63--68},
publisher = {{IEEE}},
year = {2006},
url = {https://doi.org/10.1109/ATS.2006.260994},
doi = {10.1109/ATS.2006.260994},
timestamp = {Tue, 21 Mar 2023 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/ats/EngelkePMRB06.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/ats/FoutzCLLK06,
author = {Brian Foutz and
Vivek Chickermane and
Bing Li and
Harry Linzer and
Gary Kunselman},
title = {Automation of {IEEE} 1149.6 Boundary Scan Synthesis in an {ASIC} Methodology},
booktitle = {15th Asian Test Symposium, {ATS} 2006, Fukuoka, Japan, November 20-23,
2006},
pages = {381--388},
publisher = {{IEEE}},
year = {2006},
url = {https://doi.org/10.1109/ATS.2006.260959},
doi = {10.1109/ATS.2006.260959},
timestamp = {Mon, 07 Nov 2022 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/ats/FoutzCLLK06.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/ats/FujiwaraSCZXFSC06,
author = {Hideo Fujiwara and
Jiaguang Sun and
Krishnendu Chakrabarty and
Yang Zhao and
Dong Xiang},
title = {Compressing Test Data for Deterministic {BIST} Using a Reconfigurable
Scan Arhcitecture},
booktitle = {15th Asian Test Symposium, {ATS} 2006, Fukuoka, Japan, November 20-23,
2006},
pages = {299--306},
publisher = {{IEEE}},
year = {2006},
url = {https://doi.org/10.1109/ATS.2006.261035},
doi = {10.1109/ATS.2006.261035},
timestamp = {Tue, 06 Dec 2022 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/ats/FujiwaraSCZXFSC06.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/ats/GoswamiTKKRSWSA06,
author = {Dhiraj Goswami and
Kun{-}Han Tsai and
Mark Kassab and
Takeo Kobayashi and
Janusz Rajski and
Bruce Swanson and
Darryl Walters and
Yasuo Sato and
Toshiharu Asaka and
Takashi Aikyo},
title = {At-Speed Testing with Timing Exceptions and Constraints-Case Studies},
booktitle = {15th Asian Test Symposium, {ATS} 2006, Fukuoka, Japan, November 20-23,
2006},
pages = {153--162},
publisher = {{IEEE}},
year = {2006},
url = {https://doi.org/10.1109/ATS.2006.261014},
doi = {10.1109/ATS.2006.261014},
timestamp = {Mon, 07 Nov 2022 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/ats/GoswamiTKKRSWSA06.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/ats/GoyalCS06,
author = {Shalabh Goyal and
Abhijit Chatterjee and
Yanan Shieh},
title = {Enhanced {A/D} Converter Signal-to-Noise-Ratio Testing in the Presence
of Sampling Clock Jitter},
booktitle = {15th Asian Test Symposium, {ATS} 2006, Fukuoka, Japan, November 20-23,
2006},
pages = {307--312},
publisher = {{IEEE}},
year = {2006},
url = {https://doi.org/10.1109/ATS.2006.261036},
doi = {10.1109/ATS.2006.261036},
timestamp = {Mon, 07 Nov 2022 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/ats/GoyalCS06.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/ats/HayashiISTK06,
author = {Terumine Hayashi and
Naotsugu Ikeda and
Tsuyoshi Shinogi and
Haruhiko Takase and
Hidehiko Kita},
title = {Low Power Oriented Test Modification and Compression Techniques for
Scan Based Core Testing},
booktitle = {15th Asian Test Symposium, {ATS} 2006, Fukuoka, Japan, November 20-23,
2006},
pages = {327--332},
publisher = {{IEEE}},
year = {2006},
url = {https://doi.org/10.1109/ATS.2006.260951},
doi = {10.1109/ATS.2006.260951},
timestamp = {Mon, 07 Nov 2022 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/ats/HayashiISTK06.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/ats/HigamiSTKT06,
author = {Yoshinobu Higami and
Kewal K. Saluja and
Hiroshi Takahashi and
Sin{-}ya Kobayashi and
Yuzo Takamatsu},
title = {Diagnosis of Transistor Shorts in Logic Test Environment},
booktitle = {15th Asian Test Symposium, {ATS} 2006, Fukuoka, Japan, November 20-23,
2006},
pages = {354--359},
publisher = {{IEEE}},
year = {2006},
url = {https://doi.org/10.1109/ATS.2006.260955},
doi = {10.1109/ATS.2006.260955},
timestamp = {Mon, 07 Nov 2022 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/ats/HigamiSTKT06.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/ats/HongL06,
author = {Hao{-}Chiao Hong and
Sheng{-}Chuan Liang},
title = {A Cost Effective Output Response Analyzer for {\textbackslash}sum
- {\textbackslash}delta Modulation Based {BIST} Systems},
booktitle = {15th Asian Test Symposium, {ATS} 2006, Fukuoka, Japan, November 20-23,
2006},
pages = {255--264},
publisher = {{IEEE}},
year = {2006},
url = {https://doi.org/10.1109/ATS.2006.261029},
doi = {10.1109/ATS.2006.261029},
timestamp = {Tue, 06 Dec 2022 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/ats/HongL06.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/ats/HuLLHLWLWW06,
author = {Yu Hu and
Cheng Li and
Jia Li and
Yinhe Han and
Xiaowei Li and
Wei Wang and
Hua{-}Wei Li and
Laung{-}Terng Wang and
Xiaoqing Wen},
title = {Test data compression based on clustered random access scan},
booktitle = {15th Asian Test Symposium, {ATS} 2006, Fukuoka, Japan, November 20-23,
2006},
pages = {231--236},
publisher = {{IEEE}},
year = {2006},
url = {https://doi.org/10.1109/ATS.2006.261025},
doi = {10.1109/ATS.2006.261025},
timestamp = {Mon, 15 Apr 2024 01:00:00 +0200},
biburl = {https://dblp.org/rec/conf/ats/HuLLHLWLWW06.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/ats/Huang06,
author = {Jiun{-}Lang Huang},
title = {A Random Jitter Extraction Technique in the Presence of Sinusoidal
Jitter},
booktitle = {15th Asian Test Symposium, {ATS} 2006, Fukuoka, Japan, November 20-23,
2006},
pages = {318--326},
publisher = {{IEEE}},
year = {2006},
url = {https://doi.org/10.1109/ATS.2006.260950},
doi = {10.1109/ATS.2006.260950},
timestamp = {Mon, 07 Nov 2022 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/ats/Huang06.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/ats/IrajpourGB06,
author = {Shahdad Irajpour and
Sandeep K. Gupta and
Melvin A. Breuer},
title = {Test Generation for Weak Resistive Bridges},
booktitle = {15th Asian Test Symposium, {ATS} 2006, Fukuoka, Japan, November 20-23,
2006},
pages = {265--272},
publisher = {{IEEE}},
year = {2006},
url = {https://doi.org/10.1109/ATS.2006.261030},
doi = {10.1109/ATS.2006.261030},
timestamp = {Thu, 21 Sep 2023 01:00:00 +0200},
biburl = {https://dblp.org/rec/conf/ats/IrajpourGB06.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/ats/KarimiMN06,
author = {Naghmeh Karimi and
Shahrzad Mirkhani and
Zainalabedin Navabi},
title = {{ESTA:} An Efficient Method for Reliability Enhancement of RT-Level
Designs},
booktitle = {15th Asian Test Symposium, {ATS} 2006, Fukuoka, Japan, November 20-23,
2006},
pages = {195--202},
publisher = {{IEEE}},
year = {2006},
url = {https://doi.org/10.1109/ATS.2006.261020},
doi = {10.1109/ATS.2006.261020},
timestamp = {Mon, 07 Nov 2022 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/ats/KarimiMN06.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/ats/KimSKKK06,
author = {Youbean Kim and
Dongsup Song and
Kicheol Kim and
Incheol Kim and
Sungho Kang},
title = {{TOSCA:} Total Scan Power Reduction Architecture based on Pseudo-Random
Built-in Self Test Structure},
booktitle = {15th Asian Test Symposium, {ATS} 2006, Fukuoka, Japan, November 20-23,
2006},
pages = {17--24},
publisher = {{IEEE}},
year = {2006},
url = {https://doi.org/10.1109/ATS.2006.260987},
doi = {10.1109/ATS.2006.260987},
timestamp = {Mon, 07 Nov 2022 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/ats/KimSKKK06.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/ats/KimYPLK06,
author = {YongJoon Kim and
Myung{-}Hoon Yang and
Youngkyu Park and
Daeyeal Lee and
Sungho Kang},
title = {An Effective Test Pattern Generation for Testing Signal Integrity},
booktitle = {15th Asian Test Symposium, {ATS} 2006, Fukuoka, Japan, November 20-23,
2006},
pages = {279--286},
publisher = {{IEEE}},
year = {2006},
url = {https://doi.org/10.1109/ATS.2006.261032},
doi = {10.1109/ATS.2006.261032},
timestamp = {Tue, 27 Feb 2024 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/ats/KimYPLK06.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/ats/KonishiEH06,
author = {Hideaki Konishi and
Michiaki Emori and
Takahisa Hiraide},
title = {The Application of BIST-Aided Scan Test for Real Chips},
booktitle = {15th Asian Test Symposium, {ATS} 2006, Fukuoka, Japan, November 20-23,
2006},
pages = {131},
publisher = {{IEEE}},
year = {2006},
url = {https://doi.org/10.1109/ATS.2006.261009},
doi = {10.1109/ATS.2006.261009},
timestamp = {Mon, 07 Nov 2022 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/ats/KonishiEH06.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/ats/LeeT06,
author = {Jinkyu Lee and
Nur A. Touba},
title = {Efficiently Utilizing {ATE} Vector Repeat for Compression by Scan
Vector Decomposition},
booktitle = {15th Asian Test Symposium, {ATS} 2006, Fukuoka, Japan, November 20-23,
2006},
pages = {237--244},
publisher = {{IEEE}},
year = {2006},
url = {https://doi.org/10.1109/ATS.2006.261026},
doi = {10.1109/ATS.2006.261026},
timestamp = {Mon, 07 Nov 2022 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/ats/LeeT06.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/ats/LeiningerKFTCKY06,
author = {Andreas Leininger and
Ajay Khoche and
Martin Fischer and
Nagesh Tamarapalli and
Wu{-}Tung Cheng and
Randy Klingenberg and
Wu Yang},
title = {The Next Step in Volume Scan Diagnosis: Standard Fail Data Format},
booktitle = {15th Asian Test Symposium, {ATS} 2006, Fukuoka, Japan, November 20-23,
2006},
pages = {360--368},
publisher = {{IEEE}},
year = {2006},
url = {https://doi.org/10.1109/ATS.2006.260956},
doi = {10.1109/ATS.2006.260956},
timestamp = {Mon, 07 Nov 2022 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/ats/LeiningerKFTCKY06.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/ats/LiCC06,
author = {Chung{-}Yi Li and
Chia{-}yuan Chou and
Tsin{-}Yuan Chang},
title = {A Self-Referred Clock Jitter Measurement Circuit in Wide Frequency
Range},
booktitle = {15th Asian Test Symposium, {ATS} 2006, Fukuoka, Japan, November 20-23,
2006},
pages = {313--317},
publisher = {{IEEE}},
year = {2006},
url = {https://doi.org/10.1109/ATS.2006.261037},
doi = {10.1109/ATS.2006.261037},
timestamp = {Mon, 07 Nov 2022 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/ats/LiCC06.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/ats/LiHL06,
author = {Jia Li and
Yu Hu and
Xiaowei Li},
title = {A Scan Chain Adjustment Technology for Test Power Reduction},
booktitle = {15th Asian Test Symposium, {ATS} 2006, Fukuoka, Japan, November 20-23,
2006},
pages = {11--16},
publisher = {{IEEE}},
year = {2006},
url = {https://doi.org/10.1109/ATS.2006.260986},
doi = {10.1109/ATS.2006.260986},
timestamp = {Mon, 15 Apr 2024 01:00:00 +0200},
biburl = {https://dblp.org/rec/conf/ats/LiHL06.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/ats/LiW06,
author = {Jin{-}Fu Li and
Chun{-}Hsien Wu},
title = {Verification Methodology for Self-Repairable Memory Systems},
booktitle = {15th Asian Test Symposium, {ATS} 2006, Fukuoka, Japan, November 20-23,
2006},
pages = {109--114},
publisher = {{IEEE}},
year = {2006},
url = {https://doi.org/10.1109/ATS.2006.261001},
doi = {10.1109/ATS.2006.261001},
timestamp = {Tue, 17 Oct 2023 01:00:00 +0200},
biburl = {https://dblp.org/rec/conf/ats/LiW06.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/ats/LiXCRM06,
author = {Ming Li and
Shiyi Xu and
Jialin Cao and
Feng Ran and
Shiwei Ma},
title = {A Design of Pipelined Carry-dependent Sum Adder With its Self-checking
Structure},
booktitle = {15th Asian Test Symposium, {ATS} 2006, Fukuoka, Japan, November 20-23,
2006},
pages = {189--194},
publisher = {{IEEE}},
year = {2006},
url = {https://doi.org/10.1109/ATS.2006.261019},
doi = {10.1109/ATS.2006.261019},
timestamp = {Mon, 07 Nov 2022 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/ats/LiXCRM06.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/ats/LinTWKRKKSHA06,
author = {Xijiang Lin and
Kun{-}Han Tsai and
Chen Wang and
Mark Kassab and
Janusz Rajski and
Takeo Kobayashi and
Randy Klingenberg and
Yasuo Sato and
Shuji Hamada and
Takashi Aikyo},
title = {Timing-Aware {ATPG} for High Quality At-speed Testing of Small Delay
Defects},
booktitle = {15th Asian Test Symposium, {ATS} 2006, Fukuoka, Japan, November 20-23,
2006},
pages = {139--146},
publisher = {{IEEE}},
year = {2006},
url = {https://doi.org/10.1109/ATS.2006.261012},
doi = {10.1109/ATS.2006.261012},
timestamp = {Mon, 07 Nov 2022 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/ats/LinTWKRKKSHA06.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/ats/Liu06,
author = {Chunsheng Liu},
title = {Testing Hierarchical Network-on-Chip Systems with Hard Cores Using
Bandwidth Matching and On-Chip Variable Clocking},
booktitle = {15th Asian Test Symposium, {ATS} 2006, Fukuoka, Japan, November 20-23,
2006},
pages = {431--436},
publisher = {{IEEE}},
year = {2006},
url = {https://doi.org/10.1109/ATS.2006.260966},
doi = {10.1109/ATS.2006.260966},
timestamp = {Mon, 07 Nov 2022 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/ats/Liu06.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/ats/LvLZLL06,
author = {Tao Lv and
Ling{-}Yi Liu and
Yang Zhao and
Huawei Li and
Xiaowei Li},
title = {An Observability Branch Coverage Metric Based on Dynamic Factored
Use-Define Chains},
booktitle = {15th Asian Test Symposium, {ATS} 2006, Fukuoka, Japan, November 20-23,
2006},
pages = {89--94},
publisher = {{IEEE}},
year = {2006},
url = {https://doi.org/10.1109/ATS.2006.260998},
doi = {10.1109/ATS.2006.260998},
timestamp = {Mon, 15 May 2023 01:00:00 +0200},
biburl = {https://dblp.org/rec/conf/ats/LvLZLL06.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
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