"Trace-Based Post-Silicon Validation for VLSI Circuits"

Xiao Liu, Qiang Xu (2014)

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DOI: 10.1007/978-3-319-00533-1

access: closed

type: Book or Thesis

metadata version: 2018-09-10

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Xiao Liu, Qiang Xu:
Trace-Based Post-Silicon Validation for VLSI Circuits. Lecture Notes in Electrical Engineering 252, Springer 2014, ISBN 978-3-319-00532-4, pp. 1-102

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