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"Design, Analysis and Test of Logic Circuits Under Uncertainty"

Smita Krishnaswamy, Igor L. Markov, John P. Hayes (2013)

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DOI: 10.1007/978-90-481-9644-9

access: closed

type: Book or Thesis

metadata version: 2017-05-16

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Smita Krishnaswamy, Igor L. Markov, John P. Hayes:
Design, Analysis and Test of Logic Circuits Under Uncertainty. Lecture Notes in Electrical Engineering 115, Springer 2013, ISBN 978-90-481-9643-2, pp. 1-120

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