"Channel Hot Electron Degradation-Delay in MOS Transistors Due to Deuterium ..."

Isik C. Kizilyalli, Karl Hess, Joseph W. Lyding (1999)

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DOI: 10.1201/9781420049671.CH13

access: closed

type: Reference Work

metadata version: 2017-07-12

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Isik C. Kizilyalli, Karl Hess, Joseph W. Lyding:
Channel Hot Electron Degradation-Delay in MOS Transistors Due to Deuterium Anneal. The VLSI Handbook 1999

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