"Charged device model electrostatic discharge protection and test methods ..."

Nathan Jack (2012)

> Home

Details and statistics

DOI: —

access: closed

type: Book or Thesis

metadata version: 2023-10-13

- view
  - electronic edition via handle.net
- export record
  dblp key:
  - phd/us/Jack12
- ask others
- share record
  persistent URL:
  - https://dblp.org/rec/phd/us/Jack12
Nathan Jack:
Charged device model electrostatic discharge protection and test methods for integrated circuits. University of Illinois Urbana-Champaign, USA, 2012

manage site settings

To protect your privacy, all features that rely on external API calls from your browser are turned off by default. You need to opt-in for them to become active. All settings here will be stored as cookies with your web browser. For more information see our F.A.Q.