"Reliability and failure mechanisms of GaN HEMT devices suitable for ..."

Antonio Stocco (2012)

> Home

Details and statistics

DOI: —

access: closed

type: Book or Thesis

metadata version: 2023-05-10

- view
  - electronic edition @ sbn.it
- export record
  dblp key:
  - phd/it/Stocco12
- ask others
- share record
  persistent URL:
  - https://dblp.org/rec/phd/it/Stocco12
Antonio Stocco:
Reliability and failure mechanisms of GaN HEMT devices suitable for high-frequency and high-power applications. University of Padua, Italy, 2012

manage site settings

To protect your privacy, all features that rely on external API calls from your browser are turned off by default. You need to opt-in for them to become active. All settings here will be stored as cookies with your web browser. For more information see our F.A.Q.