"Prévision des effets de vieillissement par électromigration ..."

Boukary Ouattara (2014)

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type: Book or Thesis

metadata version: 2020-07-21

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Boukary Ouattara:
Prévision des effets de vieillissement par électromigration dans les circuits intégrés CMOS en nœuds technologiques submicroniques. (Forecasting the effects of aging by electromigration in the circuits integrated CMOS submicron technology nodes). Pierre and Marie Curie University, Paris, France, 2014

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