"A Case Study of Self-Checking Circuits Reliability."

Jien-Chung Lo (1998)

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DOI: 10.1155/1998/71348

access: open

type: Journal Article

metadata version: 2022-11-04

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Jien-Chung Lo:
A Case Study of Self-Checking Circuits Reliability. VLSI Design 5(4): 373-383 (1998)

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