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"Defect Level Estimation for Pseudorandom Testing Using Stochastic Analysis."
Wen-Ben Jone et al. (2001)
- Wen-Ben Jone, Der-Cheng Huang, Shih-Chieh Chang, Sunil R. Das:
Defect Level Estimation for Pseudorandom Testing Using Stochastic Analysis. VLSI Design 12(4): 457-474 (2001)
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