"Spectral Testing of Digital Circuits."

Bogdan J. Falkowski (2002)

> Home

Details and statistics

DOI: 10.1080/10655140290009828

access: open

type: Journal Article

metadata version: 2023-05-08

- view
  - electronic edition via DOI (open access)
  authority control:
- export record
  dblp key:
  - journals/vlsi/Falkowski02a
- ask others
- share record
  persistent URL:
  - https://dblp.org/rec/journals/vlsi/Falkowski02a
Bogdan J. Falkowski:
Spectral Testing of Digital Circuits. VLSI Design 14(1): 83-105 (2002)

manage site settings

To protect your privacy, all features that rely on external API calls from your browser are turned off by default. You need to opt-in for them to become active. All settings here will be stored as cookies with your web browser. For more information see our F.A.Q.