"Syndrome Signature in Output Compaction for VLSI Built-in Self-Test."

Sunil R. Das et al. (1998)

> Home

Details and statistics

DOI: 10.1155/1998/45472

access: open

type: Journal Article

metadata version: 2023-11-12

- view
  - electronic edition via DOI (open access)
  authority control:
- export record
  dblp key:
  - journals/vlsi/DasGJN98
- ask others
- share record
  persistent URL:
  - https://dblp.org/rec/journals/vlsi/DasGJN98
Sunil R. Das, Nita Goel, Wen-Ben Jone, Amiya R. Nayak:
Syndrome Signature in Output Compaction for VLSI Built-in Self-Test. VLSI Design 7(2): 191-201 (1998)

manage site settings

To protect your privacy, all features that rely on external API calls from your browser are turned off by default. You need to opt-in for them to become active. All settings here will be stored as cookies with your web browser. For more information see our F.A.Q.