"Simple Testing Can Prevent Most Critical Failures: An Analysis of ..."

Ding Yuan et al. (2015)

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type: Journal Article

metadata version: 2024-03-27

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Ding Yuan, Yu Luo, Xin Zhuang, Guilherme Renna Rodrigues, Xu Zhao, Yongle Zhang, Pranay Jain, Michael Stumm:
Simple Testing Can Prevent Most Critical Failures: An Analysis of Production Failures in Distributed Data-Intensive Systems. login Usenix Mag. 40(1) (2015)

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