"Integrating ontological modelling and Bayesian inference for pattern ..."

Patrick Lüscher, Robert Weibel, Dirk Burghardt (2009)

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DOI: 10.1016/J.COMPENVURBSYS.2009.07.005

access: closed

type: Journal Article

metadata version: 2020-02-25

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Patrick Lüscher, Robert Weibel, Dirk Burghardt:
Integrating ontological modelling and Bayesian inference for pattern classification in topographic vector data. Comput. Environ. Urban Syst. 33(5): 363-374 (2009)

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