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"Statistical Modeling and Simulation of Threshold Variation Under Random ..."

Yun Ye et al. (2011)

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DOI: 10.1109/TVLSI.2010.2043694

access: closed

type: Journal Article

metadata version: 2023-06-23

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Yun Ye, Frank Liu, Min Chen, Sani R. Nassif, Yu Cao:
Statistical Modeling and Simulation of Threshold Variation Under Random Dopant Fluctuations and Line-Edge Roughness. IEEE Trans. Very Large Scale Integr. Syst. 19(6): 987-996 (2011)

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