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"BIST-Based Fault Diagnosis for PCM With Enhanced Test Scheme and ..."

Chenchen Xie et al. (2020)

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DOI: 10.1109/TVLSI.2020.2986469

access: closed

type: Journal Article

metadata version: 2022-12-15

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  - https://dblp.org/rec/journals/tvlsi/XieLLCWGMLS20
Chenchen Xie, Xi Li, Yu Lei, Houpeng Chen, Qian Wang, Jiashu Guo, Jie Miao, Yi Lv, Zhitang Song:
BIST-Based Fault Diagnosis for PCM With Enhanced Test Scheme and Fault-Free Region Finding Algorithm. IEEE Trans. Very Large Scale Integr. Syst. 28(7): 1652-1664 (2020)

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