"Built-In Functional Tests for Silicon Validation and System Integration of ..."

Yuejian Wu et al. (2011)

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DOI: 10.1109/TVLSI.2009.2036629

access: closed

type: Journal Article

metadata version: 2020-03-11

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Yuejian Wu, Sandy Thomson, Dale Mutcher, Eric Hall:
Built-In Functional Tests for Silicon Validation and System Integration of Telecom SoC Designs. IEEE Trans. Very Large Scale Integr. Syst. 19(4): 629-637 (2011)

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