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"High-Dimensional and Multiple-Failure-Region Importance Sampling for SRAM ..."
Mengshuo Wang et al. (2017)
- Mengshuo Wang, Changhao Yan, Xin Li, Dian Zhou, Xuan Zeng:
High-Dimensional and Multiple-Failure-Region Importance Sampling for SRAM Yield Analysis. IEEE Trans. Very Large Scale Integr. Syst. 25(3): 806-819 (2017)
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