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"An on-chip march pattern generator for testing embedded memory cores."

Wei-Lun Wang, Kuen-Jong Lee, Jhing-Fa Wang (2001)

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DOI: 10.1109/92.953506

access: closed

type: Journal Article

metadata version: 2020-03-11

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  - journals/tvlsi/WangLW01
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  - https://dblp.org/rec/journals/tvlsi/WangLW01
Wei-Lun Wang, Kuen-Jong Lee, Jhing-Fa Wang:
An on-chip march pattern generator for testing embedded memory cores. IEEE Trans. Very Large Scale Integr. Syst. 9(5): 730-735 (2001)

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