"Write Disturbance Modeling and Testing for MRAM."

Chin-Lung Su et al. (2008)

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DOI: 10.1109/TVLSI.2007.915402

access: closed

type: Journal Article

metadata version: 2023-09-30

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Chin-Lung Su, Chih-Wea Tsai, Cheng-Wen Wu, Chien-Chung Hung, Young-Shying Chen, Ding-Yeong Wang, Yuan-Jen Lee, Ming-Jer Kao:
Write Disturbance Modeling and Testing for MRAM. IEEE Trans. Very Large Scale Integr. Syst. 16(3): 277-288 (2008)

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