"Interleaving Test Algorithm for Subthreshold Leakage-Current Defects in ..."

Hyoyoung Shin et al. (2014)

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DOI: 10.1109/TVLSI.2013.2255628

access: closed

type: Journal Article

metadata version: 2020-03-11

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Hyoyoung Shin, Youngkyu Park, Gihwa Lee, Jungsik Park, Sungho Kang:
Interleaving Test Algorithm for Subthreshold Leakage-Current Defects in DRAM Considering the Equal Bit Line Stress. IEEE Trans. Very Large Scale Integr. Syst. 22(4): 803-812 (2014)

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