"Accurate Prediction of Substrate Parasitics in Heavily Doped CMOS ..."

Ajit Sharma et al. (2005)

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DOI: 10.1109/TVLSI.2005.850106

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type: Journal Article

metadata version: 2020-03-11

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Ajit Sharma, Patrick Birrer, Sasi Kumar Arunachalam, Chenggang Xu, Terri S. Fiez, Kartikeya Mayaram:
Accurate Prediction of Substrate Parasitics in Heavily Doped CMOS Processes Using a Calibrated Boundary Element Solver. IEEE Trans. Very Large Scale Integr. Syst. 13(7): 843-851 (2005)

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