"Partitioning algorithm to enhance pseudoexhaustive testing of digital VLSI ..."

Bassam Shaer, David L. Landis, Sami A. Al-Arian (2000)

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DOI: 10.1109/92.902271

access: closed

type: Journal Article

metadata version: 2020-03-11

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Bassam Shaer, David L. Landis, Sami A. Al-Arian:
Partitioning algorithm to enhance pseudoexhaustive testing of digital VLSI circuits. IEEE Trans. Very Large Scale Integr. Syst. 8(6): 750-754 (2000)

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